JP2002507852A - リーク電流を低減する回路装置 - Google Patents

リーク電流を低減する回路装置

Info

Publication number
JP2002507852A
JP2002507852A JP2000537311A JP2000537311A JP2002507852A JP 2002507852 A JP2002507852 A JP 2002507852A JP 2000537311 A JP2000537311 A JP 2000537311A JP 2000537311 A JP2000537311 A JP 2000537311A JP 2002507852 A JP2002507852 A JP 2002507852A
Authority
JP
Japan
Prior art keywords
transistor
circuit
circuit device
voltage
switching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2000537311A
Other languages
English (en)
Japanese (ja)
Inventor
ベルトホルト イェルク
アイゼーレ マルティン
エーベルライン マッティアス
Original Assignee
インフィネオン テクノロジース アクチエンゲゼルシャフト
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by インフィネオン テクノロジース アクチエンゲゼルシャフト filed Critical インフィネオン テクノロジース アクチエンゲゼルシャフト
Publication of JP2002507852A publication Critical patent/JP2002507852A/ja
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/0008—Arrangements for reducing power consumption
    • H03K19/0016—Arrangements for reducing power consumption by using a control or a clock signal, e.g. in order to apply power supply

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Logic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Electronic Switches (AREA)
  • Control Of Electrical Variables (AREA)
JP2000537311A 1998-03-16 1999-03-11 リーク電流を低減する回路装置 Withdrawn JP2002507852A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE19811353A DE19811353C1 (de) 1998-03-16 1998-03-16 Schaltungsanordnung zur Reduzierung des Leckstromes
DE19811353.6 1998-03-16
PCT/DE1999/000677 WO1999048208A1 (de) 1998-03-16 1999-03-11 Schaltungsanordnung zur reduzierung des leckstromes

Publications (1)

Publication Number Publication Date
JP2002507852A true JP2002507852A (ja) 2002-03-12

Family

ID=7861059

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000537311A Withdrawn JP2002507852A (ja) 1998-03-16 1999-03-11 リーク電流を低減する回路装置

Country Status (8)

Country Link
EP (1) EP1064726A1 (de)
JP (1) JP2002507852A (de)
KR (1) KR20010041927A (de)
CN (1) CN1301430A (de)
BR (1) BR9909652A (de)
DE (1) DE19811353C1 (de)
RU (1) RU2000125907A (de)
WO (1) WO1999048208A1 (de)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007536771A (ja) * 2004-02-19 2007-12-13 モスエイド テクノロジーズ コーポレーション 低漏出のデータ保持回路
US7940081B2 (en) 2004-02-19 2011-05-10 Mosaid Technologies Incorporated Low leakage and data retention circuitry

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6166985A (en) * 1999-04-30 2000-12-26 Intel Corporation Integrated circuit low leakage power circuitry for use with an advanced CMOS process
JP3727838B2 (ja) * 2000-09-27 2005-12-21 株式会社東芝 半導体集積回路
DE10128732C1 (de) * 2001-06-13 2002-05-29 Infineon Technologies Ag Verfahren und Vorrichtung zur Abschätzung der Stromaufnahme von Schaltungsteilen
US6515935B1 (en) * 2001-10-19 2003-02-04 Hewlett-Packard Company Method and apparatus for reducing average power in memory arrays by switching a diode in or out of the ground path
FR2838256A1 (fr) * 2002-04-08 2003-10-10 St Microelectronics Sa Procede de mise en veille d'un composant et circuit integre associe
US6611451B1 (en) * 2002-06-28 2003-08-26 Texas Instruments Incorporated Memory array and wordline driver supply voltage differential in standby
WO2004075406A1 (en) * 2003-02-19 2004-09-02 Koninklijke Philips Electronics, N.V. Leakage power control
WO2009144661A1 (en) * 2008-05-27 2009-12-03 Nxp B.V. Integrated circuit and integrated circuit control method
DE102008053533A1 (de) * 2008-10-28 2010-04-29 Atmel Automotive Gmbh Schaltung, Verfahren zur Steuerung und Verwendung einer Schaltung für einen Ruhemodus und einen Betriebsmodus
DE102014107545A1 (de) * 2014-05-28 2015-12-03 Phoenix Contact Gmbh & Co. Kg Energieversorgungsgerät
US11599185B2 (en) * 2015-07-22 2023-03-07 Synopsys, Inc. Internet of things (IoT) power and performance management technique and circuit methodology

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5614847A (en) * 1992-04-14 1997-03-25 Hitachi, Ltd. Semiconductor integrated circuit device having power reduction mechanism
US5596286A (en) * 1993-11-12 1997-01-21 Texas Instruments Incorporated Current limiting devices to reduce leakage, photo, or stand-by current in an integrated circuit
JP3725911B2 (ja) * 1994-06-02 2005-12-14 株式会社ルネサステクノロジ 半導体装置
DE19515417C2 (de) * 1995-04-26 1998-10-15 Siemens Ag Schaltungsanordnung zum Ansteuern eines Leistungs-MOSFET

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007536771A (ja) * 2004-02-19 2007-12-13 モスエイド テクノロジーズ コーポレーション 低漏出のデータ保持回路
US7940081B2 (en) 2004-02-19 2011-05-10 Mosaid Technologies Incorporated Low leakage and data retention circuitry
JP2012039644A (ja) * 2004-02-19 2012-02-23 Mosaid Technologies Corp 低漏出のデータ保持回路を有する集積回路およびその方法
US8253438B2 (en) 2004-02-19 2012-08-28 Mosaid Technologies Incorporated Low leakage and data retention circuitry
JP2013179660A (ja) * 2004-02-19 2013-09-09 Mosaid Technologies Inc 低漏出のデータ保持回路を有する集積回路およびその方法
US8854077B2 (en) 2004-02-19 2014-10-07 Conversant Intellectual Property Management Inc. Low leakage and data retention circuitry

Also Published As

Publication number Publication date
CN1301430A (zh) 2001-06-27
EP1064726A1 (de) 2001-01-03
RU2000125907A (ru) 2002-09-10
DE19811353C1 (de) 1999-07-22
BR9909652A (pt) 2000-11-21
KR20010041927A (ko) 2001-05-25
WO1999048208A1 (de) 1999-09-23

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Legal Events

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A300 Application deemed to be withdrawn because no request for examination was validly filed

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Effective date: 20060606