JP2002214283A - Electronic component characteristics measuring device and selecting device - Google Patents
Electronic component characteristics measuring device and selecting deviceInfo
- Publication number
- JP2002214283A JP2002214283A JP2001011808A JP2001011808A JP2002214283A JP 2002214283 A JP2002214283 A JP 2002214283A JP 2001011808 A JP2001011808 A JP 2001011808A JP 2001011808 A JP2001011808 A JP 2001011808A JP 2002214283 A JP2002214283 A JP 2002214283A
- Authority
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- Japan
- Prior art keywords
- electronic component
- characteristic measuring
- temperature
- unit
- temperature setting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Description
【０００１】[0001]
【発明の属する技術分野】この発明は、加熱および冷却
をして所定の温度状態となった圧電素子等の電子部品に
ついて、インピーダンスや容量等の電気的特性を測定す
る装置、および該測定結果に基づいて電子部品を選別す
る装置に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for measuring electrical characteristics such as impedance and capacitance of an electronic component such as a piezoelectric element which has been heated and cooled to a predetermined temperature state, and to a measurement result. The present invention relates to an apparatus for sorting electronic components based on the information.
【０００２】[0002]
【従来の技術】異なる温度域で異なる温度特性を有する
電子部品にあっては、高温域、常温域および低温域のそ
れぞれの温度域における電気的特性が、所定の規格値を
満たさなければならない。このような電子部品の特性測
定および選別装置としては、図４または図５に示す方法
がある。2. Description of the Related Art For electronic components having different temperature characteristics in different temperature ranges, the electrical characteristics in each of a high temperature range, a normal temperature range, and a low temperature range must satisfy predetermined standard values. As an apparatus for measuring and sorting characteristics of such electronic components, there is a method shown in FIG. 4 or FIG.
【０００３】図４は、従来の恒温槽を用いた電子部品特
性測定装置の部分側面図である。図４において、１は電
子部品、２は搬送ユニット、３は恒温槽である。恒温槽
３は、所定の電気特性値を得るための温度に予め設定さ
れている。ここで、搬送ユニット２により恒温槽３に搬
入された電子部品１は、恒温槽３の中を通り抜けること
により、所定の温度に加熱または冷却された後、恒温槽
３から搬出されて、即時に特性測定が行われ、その結果
に基づき選別される。FIG. 4 is a partial side view of a conventional electronic component characteristic measuring apparatus using a thermostat. In FIG. 4, 1 is an electronic component, 2 is a transport unit, and 3 is a thermostat. The constant temperature bath 3 is preset at a temperature for obtaining a predetermined electric characteristic value. Here, the electronic component 1 carried into the thermostat 3 by the transport unit 2 is heated or cooled to a predetermined temperature by passing through the thermostat 3, and then is carried out of the thermostat 3 and immediately Characteristic measurement is performed, and selection is performed based on the result.
【０００４】また、図５は、従来の加熱もしくは冷却ツ
ールを用いた電子部品特性測定装置の部分側面図であ
る。図５において、１は電子部品、２は搬送ユニット、
４は加熱（冷却）ツールである。ここで、搬送ユニット
２により搬送される電子部品１は、所定の位置まで搬送
されると一旦停止し、加熱（冷却）ツール４の近接もし
くは接触により所定の温度に加熱（冷却）される。その
後、電子部品１は再び搬送ユニット２により搬送され
て、即時に特性測定が行われ、その結果に基づき選別さ
れる。FIG. 5 is a partial side view of a conventional electronic component characteristic measuring apparatus using a heating or cooling tool. In FIG. 5, 1 is an electronic component, 2 is a transport unit,
4 is a heating (cooling) tool. Here, the electronic component 1 transported by the transport unit 2 stops once it is transported to a predetermined position, and is heated (cooled) to a predetermined temperature by the proximity or contact of the heating (cooling) tool 4. After that, the electronic component 1 is transported again by the transport unit 2, where the characteristic measurement is immediately performed, and the electronic component 1 is sorted based on the result.
【０００５】[0005]
【発明が解決しようとする課題】このような従来の電子
部品選別装置においては、以下に示す解決すべき課題が
あった。In such a conventional electronic component sorting apparatus, there are the following problems to be solved.
【０００６】図４に示した電子部品測定装置において
は、恒温槽内の温度を一定とすることが難しく、部品の
到達温度にばらつきが生じてしまう。また、槽内の温度
分布を一定とするには、槽自体を大きくしなければなら
ず、大きくなった恒温槽全体の温度を一定に保持するに
は、多大なエネルギーが必要となり、工場内で大きなス
ペースが必要となるとともに、維持費が増加し、製造コ
ストが増大する。In the electronic component measuring device shown in FIG. 4, it is difficult to keep the temperature in the thermostatic chamber constant, and the temperature reached by the components varies. Also, in order to keep the temperature distribution in the tank constant, the tank itself must be enlarged, and in order to keep the temperature of the entire thermostat tank constant, a large amount of energy is required. A large space is required, maintenance costs are increased, and manufacturing costs are increased.
【０００７】また、図５に示した電子部品測定装置にお
いては、加熱（冷却）ツールを電子部品に接触させるた
めに、搬送ユニットを一旦停止させなければならず、電
子部品を長時間停止させることとなり、生産スピードが
低下する。また、前記停止時間を短くし、加熱（冷却）
回数を複数に分割すると、複数の加熱（冷却）部を搬送
する間に温度が低下してしまい、加熱（冷却）効率が低
下する。In the electronic component measuring apparatus shown in FIG. 5, the transport unit must be temporarily stopped in order to bring the heating (cooling) tool into contact with the electronic component, and the electronic component must be stopped for a long time. And the production speed decreases. Further, the stop time is shortened, and heating (cooling) is performed.
When the number of times is divided into a plurality of times, the temperature decreases during the transportation of the plurality of heating (cooling) units, and the heating (cooling) efficiency decreases.
【０００８】この発明の目的は、単一の搬送系上に、電
子部品を複数段階に、または複数回にわたって加熱また
は冷却でき、安定した電気特性測定を行える、小型の電
子部品特性測定装置および電子部品選別装置を構成する
ことにある。SUMMARY OF THE INVENTION An object of the present invention is to provide a small-sized electronic component characteristic measuring device and an electronic device capable of heating or cooling an electronic component in a plurality of stages or a plurality of times on a single transport system and capable of performing stable electrical characteristic measurement. Another object of the present invention is to configure a component selection device.
【０００９】[0009]
【課題を解決するための手段】この発明は、電子部品を
搬送する搬送路の複数の所定箇所に、温度設定部を配置
し、該温度設定部で加熱または冷却された電子部品の電
気特性を測定する特性測定部を設けて電子部品特性測定
装置を構成する。SUMMARY OF THE INVENTION According to the present invention, a temperature setting section is arranged at a plurality of predetermined locations on a transport path for transporting electronic components, and the electrical characteristics of the electronic component heated or cooled by the temperature setting section are determined. An electronic component characteristic measuring device is provided by providing a characteristic measuring unit for measurement.
【００１０】また、この発明は、温度設定部と特性測定
部とを、電子部品の搬送方向に対して交互に複数組配置
して電子部品特性測定装置を構成する。Further, according to the present invention, a plurality of sets of temperature setting units and characteristic measuring units are alternately arranged in the electronic component conveying direction to constitute an electronic component characteristic measuring device.
【００１１】また、この発明は、加熱を行う温度設定部
と冷却を行う温度設定部とを、電子部品の搬送方向に対
して交互に複数組配置し、該複数組の温度設定部の電子
部品の搬送方向の後に特性測定部を配置して電子部品特
性測定装置を構成する。According to the present invention, a plurality of sets of temperature setting sections for heating and a plurality of temperature setting sections for cooling are alternately arranged in the direction of transport of the electronic components. A characteristic measuring unit is arranged after the transport direction of the electronic component to constitute an electronic component characteristic measuring device.
【００１２】また、この発明は、前記電子部品特性測定
装置に、特性測定部で測定された電気特性に基づき、電
子部品を良否選別する手段を備えて電子部品選別装置を
構成する。Further, according to the present invention, the electronic component characteristic measuring device is provided with a means for selecting the quality of the electronic component based on the electrical characteristics measured by the characteristic measuring section, thereby constituting an electronic component selecting device.
【００１３】[0013]
【発明の実施の形態】第１の実施形態に係る電子部品選
別装置の構成について、図１、図２を参照して説明す
る。図１は電子部品選別装置の平面図である。また、図
２の（Ａ）は図１に示す電子部品選別装置の一部側面図
であり、図２の（Ｂ）は図１に示す電子部品選別装置の
特性測定部の構成を変更した電子部品選別装置の一部側
面図である。DESCRIPTION OF THE PREFERRED EMBODIMENTS The structure of an electronic component sorting apparatus according to a first embodiment will be described with reference to FIGS. FIG. 1 is a plan view of the electronic component sorting device. 2A is a partial side view of the electronic component sorting device shown in FIG. 1, and FIG. 2B is an electronic component of the electronic component sorting device shown in FIG. It is a partial side view of a parts sorting device.
【００１４】図１および図２において、１は電子部品、
５はパーツフィーダ、６はリニアフィーダ、７は下搬送
テーブル、１３は上搬送テーブル、８ａ〜８ｆは電気特
性測定ユニット、９ａ〜９ｆは排出ユニット、１０ａ〜
１０ｃはヒータ、１１はテーピングユニット、１４はパ
ッケージングテープ、１５は測定用プローブ、１６は搬
送ユニットカバーである。1 and 2, reference numeral 1 denotes an electronic component;
5 is a parts feeder, 6 is a linear feeder, 7 is a lower transport table, 13 is an upper transport table, 8a to 8f are electrical characteristic measurement units, 9a to 9f are discharge units, and 10a to
10c is a heater, 11 is a taping unit, 14 is a packaging tape, 15 is a measurement probe, and 16 is a transport unit cover.
【００１５】上搬送テーブル１３は、図１に示すように
歯車形状であり、隣接する歯の間にリニアフィーダ６か
ら電子部品１が挿入される。なお、パーツフィーダ５
は、上搬送テーブル１３の隣接する歯の間に電子部品１
が一つずつ挿入されるタイミングでリニアフィーダ６に
電子部品１を供給する。The upper transport table 13 is gear-shaped as shown in FIG. 1, and the electronic component 1 is inserted from the linear feeder 6 between adjacent teeth. The parts feeder 5
Is the electronic component 1 between adjacent teeth of the upper transport table 13.
The electronic component 1 is supplied to the linear feeder 6 at a timing when the electronic components 1 are inserted one by one.
【００１６】上搬送テーブル１３が所定のピッチで間欠
回転を行うことにより、電子部品１は、下搬送テーブル
７上を搬送される。そして、電子部品１が特性測定ユニ
ット８ａ，８ｂ，８ｃの位置にそれぞれ達すると、常温
で所定の電気特性測定が行われる。この電気特性測定の
結果に基づき排出ユニット９ａ、９ｂ、９ｃによって不
良品は排出され、良品のみが搬送される。The electronic component 1 is transported on the lower transport table 7 by the intermittent rotation of the upper transport table 13 at a predetermined pitch. Then, when the electronic component 1 reaches the positions of the characteristic measurement units 8a, 8b, 8c, predetermined electric characteristic measurement is performed at room temperature. Defective products are discharged by the discharge units 9a, 9b, 9c based on the result of the electrical characteristic measurement, and only good products are transported.
【００１７】次に、電子部品１が下搬送テーブル７に組
み込まれたヒータ１０ａ上に達すると、電子部品１はヒ
ータ１０ａにより加熱される。ここで、ヒータ１０ａは
電子部品１が加熱により所定の温度に達するように予め
温度設定されており、電子部品１がヒータ１０ａ上を通
過し電気特性測定部８ｄに到達したところで、所定の温
度にて電気特性が測定される。Next, when the electronic component 1 reaches the heater 10a incorporated in the lower transfer table 7, the electronic component 1 is heated by the heater 10a. Here, the temperature of the heater 10a is set in advance so that the electronic component 1 reaches a predetermined temperature by heating. When the electronic component 1 passes over the heater 10a and reaches the electrical characteristic measuring unit 8d, the temperature is raised to the predetermined temperature. The electrical properties are measured.
【００１８】ヒータ１０ｂ，１０ｃは上記ヒータ１０ａ
と同様の構造である。電気特性測定ユニット８ｅ，８ｆ
も上記８ｄと同様の構造である。ヒータ１０ｂおよびヒ
ータ１０ｃを、ヒータ１０ａとはそれぞれ違う温度に設
定することにより、異なる三つの温度での電子部品１の
電気特性の測定順次を行う。ここで、ヒータ１０ａの設
定温度をＴａ、ヒータ１０ｂの設定温度をＴｂ、および
ヒータ１０ｃの設定温度をＴｃとし、Ｔａ＜Ｔｂ＜Ｔｃ
とすると、順々に電子部品を昇温することができ加熱効
率が良好になり、さらに効率の良い電気特性の測定工程
が構成できる。これらの特性測定結果に基づき、不良品
が排出ユニット９ｄ，９ｅ，９ｆにて排出され、良品の
みがテーピングユニット１１に送られ、パッケージング
テープ１４にパッケージングされる。The heaters 10b and 10c correspond to the heater 10a.
It has the same structure as. Electrical characteristic measurement units 8e, 8f
Has the same structure as the above 8d. By setting the heater 10b and the heater 10c to different temperatures from those of the heater 10a, the measurement of the electrical characteristics of the electronic component 1 at three different temperatures is sequentially performed. Here, the set temperature of the heater 10a is Ta, the set temperature of the heater 10b is Tb, and the set temperature of the heater 10c is Tc, where Ta <Tb <Tc.
In this case, the temperature of the electronic component can be raised one by one, the heating efficiency can be improved, and a more efficient electrical characteristic measurement process can be configured. Based on these characteristic measurement results, defective products are discharged by the discharge units 9d, 9e, 9f, and only good products are sent to the taping unit 11 and packaged on the packaging tape 14.
【００１９】ここで、電気特性測定ユニット８ｄは、図
２の（Ａ）に示すように、電子部品１が所定の位置に搬
送されると、搬送テーブル上部の待機位置から移動し、
電子部品１の測定端子に測定用プローブ１５を接続して
電気特性を測定し、電気特性測定後は上搬送テーブル１
３と接触しない搬送テーブル上部の待機位置に移動す
る。Here, as shown in FIG. 2A, when the electronic component 1 is transported to a predetermined position, the electrical characteristic measuring unit 8d moves from the standby position above the transport table,
The measurement probe 15 is connected to the measurement terminal of the electronic component 1 to measure the electric characteristics.
3. Move to the standby position on the upper part of the transfer table that does not contact with 3.
【００２０】図２の（Ｂ）は電気特性測定ユニット部分
の他の構成例である。このように、電気特性測定ユニッ
ト８ｄ’を下搬送テーブル７の下部に配し、電気特性測
定ユニット８ｄ’を移動させて、電気特性を測定する構
造もある。ここで、測定用プローブ１５により電子部品
１は突き上げられるため、電子部品を固定する搬送カバ
ー１６を電気特性測定ユニット８ｄ’の対向する位置に
配しておく。この構造により安定した電気特性測定がで
きる。FIG. 2B shows another example of the configuration of the electrical characteristic measuring unit. As described above, there is also a structure in which the electric characteristic measuring unit 8d 'is arranged below the lower transfer table 7, and the electric characteristic measuring unit 8d' is moved to measure the electric characteristics. Here, since the electronic component 1 is pushed up by the measuring probe 15, the transport cover 16 for fixing the electronic component is arranged at a position facing the electrical characteristic measuring unit 8d '. With this structure, stable measurement of electric characteristics can be performed.
【００２１】他の電気特性測定ユニット８ａ〜８ｃ、８
ｅおよび８ｆについても同様の構造を用いている。Other electrical characteristic measuring units 8a to 8c, 8
A similar structure is used for e and 8f.
【００２２】このような構造とすることにより、所定の
搬送スピードを維持しつつ、電子部品を安定した温度に
昇温する電子部品特性測定装置および選別装置を省スペ
ースで容易に構成できる。With such a structure, an electronic component characteristic measuring device and a sorting device for raising the temperature of an electronic component to a stable temperature while maintaining a predetermined transport speed can be easily configured in a small space.
【００２３】なお、ヒータ１０ａ〜１０ｃを冷却ユニッ
トにそれぞれ変更することにより、同様にして低温での
電気特性を測定することができる。また、その一部を冷
却ユニットに変更して、１０ａ〜１０ｃで示す部分にヒ
ータと冷却ユニットを混在させてもよい。これにより、
所定の温度サイクルをかけた後の電子部品の電気特性を
電気特性測定ユニット８ｆで測定することができる。ま
た、８ｄ，８ｅでは、その温度サイクルを与えている途
中段階での電気特性を測定することもできる。By changing each of the heaters 10a to 10c to a cooling unit, the electrical characteristics at a low temperature can be measured in the same manner. Further, a part thereof may be changed to a cooling unit, and a heater and a cooling unit may be mixed in the portions indicated by 10a to 10c. This allows
The electrical characteristics of the electronic component after a predetermined temperature cycle can be measured by the electrical characteristic measuring unit 8f. In 8d and 8e, it is also possible to measure the electrical characteristics in the middle stage of giving the temperature cycle.
【００２４】次に、第２の実施形態に係る電子部品特性
測定装置の構成を、図３を参照して説明する。図３は電
子部品特性測定装置の平面図である。図３において、１
は電子部品、５はパーツフィーダ、６はリニアフィー
ダ、７は下搬送テーブル、１３は上搬送テーブル、８ａ
〜８ｄは電気特性測定ユニット、９ａ〜９ｄは排出ユニ
ット、１０ａ、１０ｂはヒータ、１２ａ、１２ｂは冷却
ユニット、１１はテーピングユニット、１４はパッケー
ジングテープである。Next, the configuration of an electronic component characteristic measuring apparatus according to a second embodiment will be described with reference to FIG. FIG. 3 is a plan view of the electronic component characteristic measuring device. In FIG. 3, 1
Is an electronic component, 5 is a parts feeder, 6 is a linear feeder, 7 is a lower transport table, 13 is an upper transport table, 8a
Numeral 8d is an electrical characteristic measuring unit, 9a to 9d are discharge units, 10a and 10b are heaters, 12a and 12b are cooling units, 11 is a taping unit, and 14 is a packaging tape.
【００２５】上搬送テーブル１３は、図３に示すように
歯車形状であり、隣接する歯の間にリニアフィーダ６か
ら電子部品１が挿入される。なお、パーツフィーダ５
は、上搬送テーブル１３の隣接する歯の間に電子部品１
が一つずつ挿入されるタイミングでリニアフィーダ６に
電子部品１を供給する。The upper transport table 13 is gear-shaped as shown in FIG. 3, and the electronic component 1 is inserted from the linear feeder 6 between adjacent teeth. The parts feeder 5
Is the electronic component 1 between adjacent teeth of the upper transport table 13.
The electronic component 1 is supplied to the linear feeder 6 at a timing when the electronic components 1 are inserted one by one.
【００２６】上搬送テーブル１３が所定のピッチで間欠
回転を行うことにより、電子部品１は、下搬送テーブル
７上を搬送される。そして、電子部品１が特性測定ユニ
ット８ａ，８ｂ，８ｃの位置にそれぞれ達すると、常温
で所定の電気特性測定が行われ、その結果に基づき排出
ユニット９ａ、９ｂ、９ｃによって不良品は排出され、
良品のみが搬送される。The electronic component 1 is transported on the lower transport table 7 by the intermittent rotation of the upper transport table 13 at a predetermined pitch. When the electronic component 1 reaches the position of each of the characteristic measuring units 8a, 8b, and 8c, predetermined electric characteristics are measured at room temperature. Based on the results, defective units are discharged by the discharging units 9a, 9b, and 9c.
Only good products are transported.
【００２７】次に、電子部品１が下搬送テーブル７に組
み込まれたヒータ１０ａ上に達すると、電子部品１はヒ
ータ１０ａにより加熱される。ここで、ヒータ１０ａは
電子部品１が加熱により所定の温度に達するように予め
温度が設定されている。所定の温度まで電子部品１が昇
温すると、上搬送テーブル１３にて、下搬送テーブル７
に組み込まれた冷却ユニット１２ａ上に搬送され、電子
部品１は逆に所定の温度まで冷却される。ここで、冷却
ユニット１２ａについても、電子部品１が所定の温度ま
で降温するように予め温度が設定されている。その後、
電子部品１は、ヒータ１０ｂで再び加熱、冷却ユニット
１２ｂで再び冷却され、電気特性測定ユニット８ｄの位
置まで搬送されてくると電気特性が測定され、その結果
に基づき不良品なら排出ユニット９ｄで排出され、良品
ならばテーピングユニット１１にまで搬送される。搬送
された電子部品１は、テーピングユニット１１にて、パ
ッケージングテープ１４にパッケージングされる。Next, when the electronic component 1 reaches the heater 10a incorporated in the lower transfer table 7, the electronic component 1 is heated by the heater 10a. Here, the temperature of the heater 10a is set in advance so that the electronic component 1 reaches a predetermined temperature by heating. When the temperature of the electronic component 1 rises to a predetermined temperature, the upper transfer table 13
The electronic component 1 is conveyed onto a cooling unit 12a incorporated in the electronic component 1, and is cooled to a predetermined temperature. Here, the temperature of the cooling unit 12a is set in advance so that the temperature of the electronic component 1 drops to a predetermined temperature. afterwards,
The electronic component 1 is heated again by the heater 10b and cooled again by the cooling unit 12b. When the electronic component 1 is conveyed to the position of the electric characteristic measuring unit 8d, the electric characteristics are measured. If it is a good product, it is transported to the taping unit 11. The transported electronic component 1 is packaged on a packaging tape 14 by a taping unit 11.
【００２８】ここで、電気特性測定ユニット８ａ〜８ｄ
は、第１の実施形態に示した電気特性測定ユニットと同
様の構造である。Here, the electrical characteristic measuring units 8a to 8d
Has a structure similar to that of the electrical characteristic measuring unit shown in the first embodiment.
【００２９】このような構造とすることにより、所定の
搬送スピードを維持しつつ、電子部品に安定した温度で
ヒートサイクルを与えることができ、そのヒートサイク
ルの後の電子部品の電気特性の測定および選別を、限ら
れたスペースの下で行うことができる。By adopting such a structure, a heat cycle can be given to the electronic component at a stable temperature while maintaining a predetermined transport speed, and the electrical characteristics of the electronic component after the heat cycle can be measured and measured. Sorting can be performed under limited space.
【００３０】[0030]
【発明の効果】この発明によれば、電子部品を搬送する
搬送路の複数の所定箇所に、温度設定部を配置し、該温
度設定部で加熱または冷却された電子部品の電気特性を
測定する特性測定部を設けるこにより、所定の搬送スピ
ードを維持しつつ、電子部品を所定の温度に安定して維
持する電子部品特性測定装置を省スペースで容易に構成
できる。According to the present invention, a temperature setting section is disposed at a plurality of predetermined locations on a transport path for transporting electronic components, and the electrical characteristics of the electronic component heated or cooled by the temperature setting section are measured. By providing the characteristic measuring unit, an electronic component characteristic measuring device that stably maintains the electronic component at a predetermined temperature while maintaining a predetermined transport speed can be easily configured in a space-saving manner.
【００３１】また、この発明によれば、温度設定部と特
性測定部とを、電子部品の搬送方向に沿って交互に複数
組配置することにより、所定の搬送スピードを維持しつ
つ、電子部品を複数の所定温度に安定して維持する電子
部品特性測定装置を省スペースで容易に構成できる。According to the present invention, a plurality of sets of the temperature setting section and the characteristic measuring section are alternately arranged along the transport direction of the electronic component, so that the electronic component can be maintained while maintaining a predetermined transport speed. An electronic component characteristic measuring device that stably maintains a plurality of predetermined temperatures can be easily configured in a small space.
【００３２】また、この発明によれば、加熱を行う温度
設定部と冷却を行う温度設定部とを、電子部品の搬送方
向に対して交互に複数組配置し、該複数組の温度設定部
の電子部品の搬送方向の後に特性測定部を配置すること
により、所定の搬送スピードを維持しつつ、電子部品に
それぞれ安定した高温部および低温部をもつヒートサイ
クルを与える電子部品特性測定装置を省スペースで容易
に構成できる。Further, according to the present invention, a plurality of temperature setting units for performing heating and a plurality of temperature setting units for performing cooling are alternately arranged in the transport direction of the electronic component. By arranging the characteristic measuring unit after the transport direction of the electronic component, the electronic component characteristic measuring device that gives the electronic component a heat cycle having stable high-temperature parts and low-temperature parts, while maintaining a predetermined transport speed, saves space. Can be easily configured.
【００３３】また、この発明によれば、前記電子部品特
性測定装置に、特性測定部で測定された電気特性に基づ
き、電子部品を良否選別する手段を備えることにより、
所定の搬送スピードを維持しつつ、電子部品を所定の複
数の温度に安定して維持する電子部品選別装置もしく
は、電子部品に安定した温度でのヒートサイクルを与え
る電子部品選別装置を省スペースで容易に構成できる。Further, according to the present invention, the electronic component characteristic measuring device is provided with a means for selecting the quality of the electronic component based on the electric characteristic measured by the characteristic measuring section.
Space-saving and easy electronic component sorting device that stably maintains electronic components at multiple predetermined temperatures while maintaining a predetermined transport speed, or that provides a heat cycle to electronic components at a stable temperature. Can be configured.
【図１】第１の実施形態に係る電子部品選別装置の平面
図FIG. 1 is a plan view of an electronic component sorting device according to a first embodiment.
【図２】第１の実施形態に係る電子部品選別装置の部分
側面図FIG. 2 is a partial side view of the electronic component sorting device according to the first embodiment.
【図３】第２の実施形態に係る電子部品選別装置の平面
図FIG. 3 is a plan view of an electronic component sorting apparatus according to a second embodiment.
【図４】従来の電子部品選別装置の部分側面図FIG. 4 is a partial side view of a conventional electronic component sorting apparatus.
【図５】従来の電子部品選別装置の部分側面図FIG. 5 is a partial side view of a conventional electronic component sorting apparatus.
１−電子部品 ２−搬送ユニット ３−恒温槽 ４−加熱ツール ５−パーツフィーダ ６−リニアフィーダ ７−下搬送テーブル ８ａ〜８ｆ−電気特性測定ユニット ９ａ〜９ｆ−排出ユニット １０ａ〜１０ｃ−ヒータ １１−テーピングユニット １２ａ，１２ｂ−冷却ユニット １３−上搬送テーブル １４−パッケージングテープ １５−測定用プローブ １６−搬送ユニットカバー 1-Electronic components 2-Transport unit 3-Constant temperature bath 4-Heating tool 5-Parts feeder 6-Linear feeder 7-Lower transfer table 8a-8f-Electrical property measurement unit 9a-9f-Discharge unit 10a-10c-Heater 11- Taping unit 12a, 12b-Cooling unit 13-Upper transport table 14-Packaging tape 15-Measurement probe 16-Transport unit cover
Claims (4)
する搬送路の複数の所定箇所に、電子部品を加熱または
冷却する温度設定部と、当該温度設定部で加熱または冷
却された電子部品の電気特性を測定する特性測定部とを
設けた電子部品特性測定装置。1. A temperature setting unit for heating or cooling an electronic component at a plurality of predetermined locations on a transport path for transporting an electronic component supplied from outside the main body, and a temperature setting unit for heating or cooling the electronic component. An electronic component characteristic measuring device provided with a characteristic measuring unit for measuring electric characteristics.
前記電子部品の搬送方向に沿って交互に複数組配置した
請求項１に記載の電子部品特性測定装置。2. The temperature setting unit and the characteristic measuring unit,
The electronic component characteristic measuring device according to claim 1, wherein a plurality of sets are alternately arranged along a transport direction of the electronic component.
して加熱を行う温度設定部と冷却を行う温度設定部と
を、前記電子部品の搬送方向に対して交互に複数組配置
するとともに、当該複数組の温度設定部の前記電子部品
の搬送方向の後に前記特性測定部を配置した請求項１に
記載の電子部品特性測定装置。3. A temperature setting unit for heating the electronic component and a temperature setting unit for cooling the electronic component as the temperature setting unit, and a plurality of sets are alternately arranged in the transport direction of the electronic component. The electronic component characteristic measuring device according to claim 1, wherein the characteristic measuring unit is disposed after a plurality of sets of the temperature setting units in the transport direction of the electronic component.
特性測定装置に、前記特性測定部で測定された電気特性
に応じて前記電子部品を良否選別する手段を備えた電子
部品選別装置。4. An electronic component sorting apparatus according to claim 1, further comprising: means for sorting the electronic components according to the electrical characteristics measured by said characteristic measuring section. .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001011808A JP2002214283A (en) | 2001-01-19 | 2001-01-19 | Electronic component characteristics measuring device and selecting device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001011808A JP2002214283A (en) | 2001-01-19 | 2001-01-19 | Electronic component characteristics measuring device and selecting device |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009241779A Division JP5170057B2 (en) | 2009-10-20 | 2009-10-20 | Electronic component characteristic measuring device and electronic component sorting device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP2002214283A true JP2002214283A (en) | 2002-07-31 |
Family
ID=18878898
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2001011808A Pending JP2002214283A (en) | 2001-01-19 | 2001-01-19 | Electronic component characteristics measuring device and selecting device |
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| Country | Link |
|---|---|
| JP (1) | JP2002214283A (en) |
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| JP2002243784A (en) * | 2001-02-15 | 2002-08-28 | Tdk Corp | Measuring instrument for electrical characteristics of electronic component in normal and high temperature |
| JP4513943B2 (en) * | 2001-02-15 | 2010-07-28 | Ｔｄｋ株式会社 | Measuring device for normal / high temperature electrical characteristics of electronic components |
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| JP2009008652A (en) * | 2007-05-25 | 2009-01-15 | Ueno Seiki Kk | To-high temperature-low temperature changing device and test handler with to-high temperature-low temperature changing device |
| JP2009139157A (en) * | 2007-12-04 | 2009-06-25 | Ueno Seiki Kk | Temperature heightening/lowering unit and temperature heightening/lowering test handler |
| JP2010133716A (en) * | 2008-12-02 | 2010-06-17 | Ueno Seiki Kk | Temperature raising/lowering device, and test handler including the same |
| JP2011112553A (en) * | 2009-11-27 | 2011-06-09 | Tokyo Weld Co Ltd | Work classification exhaust system and method of classifying and exhausting work |
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| TWI422842B (en) * | 2009-11-27 | 2014-01-11 | Tokyo Weld Co Ltd | Classification of workpiece sorting system and workpiece sorting method |
| CN102170767B (en) * | 2009-11-27 | 2014-07-30 | 东京威尔斯股份有限公司 | Workpiece classification discharge system and workpiece classification discharge method |
| CN106395266A (en) * | 2015-07-29 | 2017-02-15 | 株式会社村田制作所 | Electronic component transmission bench, feature testing device, sorting device and braiding device |
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