JP2002048649A5 - - Google Patents

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Publication number
JP2002048649A5
JP2002048649A5 JP2000238744A JP2000238744A JP2002048649A5 JP 2002048649 A5 JP2002048649 A5 JP 2002048649A5 JP 2000238744 A JP2000238744 A JP 2000238744A JP 2000238744 A JP2000238744 A JP 2000238744A JP 2002048649 A5 JP2002048649 A5 JP 2002048649A5
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JP
Japan
Prior art keywords
temperature
thermoelectric
infrared
measurement value
banks
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Application number
JP2000238744A
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English (en)
Japanese (ja)
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JP3733847B2 (ja
JP2002048649A (ja
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Priority to JP2000238744A priority Critical patent/JP3733847B2/ja
Priority claimed from JP2000238744A external-priority patent/JP3733847B2/ja
Publication of JP2002048649A publication Critical patent/JP2002048649A/ja
Publication of JP2002048649A5 publication Critical patent/JP2002048649A5/ja
Application granted granted Critical
Publication of JP3733847B2 publication Critical patent/JP3733847B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2000238744A 2000-08-07 2000-08-07 測温計 Expired - Fee Related JP3733847B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000238744A JP3733847B2 (ja) 2000-08-07 2000-08-07 測温計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000238744A JP3733847B2 (ja) 2000-08-07 2000-08-07 測温計

Publications (3)

Publication Number Publication Date
JP2002048649A JP2002048649A (ja) 2002-02-15
JP2002048649A5 true JP2002048649A5 (da) 2005-03-03
JP3733847B2 JP3733847B2 (ja) 2006-01-11

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ID=18730397

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000238744A Expired - Fee Related JP3733847B2 (ja) 2000-08-07 2000-08-07 測温計

Country Status (1)

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JP (1) JP3733847B2 (da)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4226985B2 (ja) 2003-10-06 2009-02-18 日本航空電子工業株式会社 光学センサの製造方法
JP4042707B2 (ja) * 2004-02-13 2008-02-06 株式会社デンソー 赤外線検出器
TW200936996A (en) * 2008-02-18 2009-09-01 Fortune Semiconductor Corp Temperature sensing module
JP5890261B2 (ja) 2012-06-21 2016-03-22 アズビル株式会社 温度検出範囲特定装置および方法
JP6773089B2 (ja) * 2013-02-21 2020-10-21 株式会社リコー デバイス
JP6166150B2 (ja) * 2013-10-29 2017-07-19 アルプス電気株式会社 受光装置
DE102013114202A1 (de) * 2013-12-17 2015-06-18 Endress + Hauser Wetzer Gmbh + Co. Kg PYROMETER und Verfahren zur Temperaturmessung
CN111854959B (zh) * 2019-04-26 2023-10-24 肖殿清 一种耳机式远红外连续耳温及生理参数测量装置
CN114858289B (zh) * 2022-07-07 2022-10-04 深圳市兆兴博拓科技股份有限公司 一种红外传感测试装置

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