JP2001513902A - ディフラクトグラムによる無標準相分析法 - Google Patents
ディフラクトグラムによる無標準相分析法Info
- Publication number
- JP2001513902A JP2001513902A JP53352399A JP53352399A JP2001513902A JP 2001513902 A JP2001513902 A JP 2001513902A JP 53352399 A JP53352399 A JP 53352399A JP 53352399 A JP53352399 A JP 53352399A JP 2001513902 A JP2001513902 A JP 2001513902A
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- JP
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- mixture
- determined
- relative
- substance
- concentration
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20016—Goniometers
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- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1. 物質それぞれについて、関連する回折反射の組を放射線ディフラクトグラ ムにて識別し、回折反射のそれぞれの組の相対強度が求められる、物質の混合物 の成分の濃度を決定する方法であって、 各物質について、すべての相対的な分散力(相対パワー・スペクトル)が前記 相対強度から求められ、 各物質について、電子密度の2乗の体積積分がその化学組成式から求められ、 各物質について、前記体積積分と相対パワー・スペクトルとの比率と等しいス ケール・ファクターSが求められ、前記スケール・ファクターSは混合物のそれ ぞれの成分の濃度を決定するために利用されることを特徴をする、物質の混合物 の成分の濃度を決定する方法。 2. 上記相対パワー・スペクトルが、補外によって測定された相対強度から求 められることを特徴とする、請求項1記載の方法。 3. 上記補外の補外関数が、対応する成分のそれぞれの原子の電子密度のフー リエ変換を含むことを特徴とする、請求項2記載の方法。 4. 上記補外関数が、対応する物質の温度によって可変の項を含むことを特徴 とする、請求項3記載の方法。 5. それぞれの物質について、上記電子密度の2乗の体積積分はその化学構造 式から求められることを特徴とする、請求項1記載の方法。 6. 既知の物質を既知の濃度で試料に加えることを特徴とする、請求項1記載 の方法。 7. 検査される物質の混合物の試料を保持する試料保持部と、 分析放射によって試料位置を照射する放射線源と、 試料から発せられる回折放射を検知する検知器とを含み、 上記3つの手段で試料の放射線ディフラクトグラムを形成する、回折分析、特 にX線回折のための装置であって、 上記の物質それぞれに関連付けられた回折反射の組を識別する手段と、 回折反射のそれぞれの組の相対強度を決定する手段と、 上記相対強度から、それぞれの物質についてすべての相対的な分散力(相対パ ワー・スペクトル)を決定する手段と、 物質の化学組成式から、それぞれの物質について電子密度の2乗の体積積分を 決定する手段と、 それぞれの物質について、上記体積積分と相対パワー・スペクトルとの比率に 等しいスケール・ファクターを決定する手段と、 上記の決定されたスケール・ファクターから、混合物の成分それぞれの濃度を 決定する手段と、 を備えてなることを特徴とする、回折分析、特にX線回折のための装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP97204064.6 | 1997-12-22 | ||
EP97204064 | 1997-12-22 | ||
PCT/IB1998/002016 WO1999032880A1 (en) | 1997-12-22 | 1998-12-14 | Method of standard-less phase analysis by means of a diffractogram |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2001513902A true JP2001513902A (ja) | 2001-09-04 |
JP4115542B2 JP4115542B2 (ja) | 2008-07-09 |
Family
ID=8229108
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP53352399A Expired - Fee Related JP4115542B2 (ja) | 1997-12-22 | 1998-12-14 | ディフラクトグラムによる無標準相分析法 |
Country Status (5)
Country | Link |
---|---|
US (1) | US6108401A (ja) |
EP (1) | EP0961931B1 (ja) |
JP (1) | JP4115542B2 (ja) |
DE (1) | DE69839390T2 (ja) |
WO (1) | WO1999032880A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012026963A (ja) * | 2010-07-27 | 2012-02-09 | Nippon Steel Corp | 酸化物の構造評価方法 |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3950239B2 (ja) * | 1998-09-28 | 2007-07-25 | 株式会社リガク | X線装置 |
JP3722454B2 (ja) * | 1998-11-02 | 2005-11-30 | 株式会社リガク | ソーラスリット及びその製造方法 |
US7127037B2 (en) * | 2002-07-26 | 2006-10-24 | Bede Scientific Instruments Ltd. | Soller slit using low density materials |
US6678347B1 (en) | 2002-07-26 | 2004-01-13 | Hypernex, Inc. | Method and apparatus for quantitative phase analysis of textured polycrystalline materials |
CN108169255B (zh) * | 2016-12-07 | 2020-06-30 | 同方威视技术股份有限公司 | 多能谱x射线成像系统和用于利用多能谱x射线成像系统对待测物品进行物质识别的方法 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5067599A (ja) * | 1973-10-09 | 1975-06-06 | ||
US4592082A (en) * | 1984-08-10 | 1986-05-27 | The United States Of America As Represented By The United States Department Of Energy | Quantitative determination of mineral composition by powder X-ray diffraction |
US4991191A (en) * | 1990-02-05 | 1991-02-05 | The Regents Of The University Of Minnesota | Quantitative analysis of the active table ingredient by power x-ray diffractometry |
JPH03226580A (ja) * | 1990-01-30 | 1991-10-07 | Japan Aviation Electron Ind Ltd | アモルファス監視装置 |
JPH07174720A (ja) * | 1993-09-15 | 1995-07-14 | Philips Electron Nv | 位置依存スペクトラム評価の試験方法 |
JPH09178675A (ja) * | 1995-12-27 | 1997-07-11 | Kawasaki Steel Corp | 深さ方向集合組織の測定方法 |
-
1998
- 1998-12-14 EP EP98957075A patent/EP0961931B1/en not_active Expired - Lifetime
- 1998-12-14 JP JP53352399A patent/JP4115542B2/ja not_active Expired - Fee Related
- 1998-12-14 DE DE69839390T patent/DE69839390T2/de not_active Expired - Lifetime
- 1998-12-14 WO PCT/IB1998/002016 patent/WO1999032880A1/en active IP Right Grant
- 1998-12-18 US US09/216,255 patent/US6108401A/en not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5067599A (ja) * | 1973-10-09 | 1975-06-06 | ||
US4592082A (en) * | 1984-08-10 | 1986-05-27 | The United States Of America As Represented By The United States Department Of Energy | Quantitative determination of mineral composition by powder X-ray diffraction |
JPH03226580A (ja) * | 1990-01-30 | 1991-10-07 | Japan Aviation Electron Ind Ltd | アモルファス監視装置 |
US4991191A (en) * | 1990-02-05 | 1991-02-05 | The Regents Of The University Of Minnesota | Quantitative analysis of the active table ingredient by power x-ray diffractometry |
JPH07174720A (ja) * | 1993-09-15 | 1995-07-14 | Philips Electron Nv | 位置依存スペクトラム評価の試験方法 |
JPH09178675A (ja) * | 1995-12-27 | 1997-07-11 | Kawasaki Steel Corp | 深さ方向集合組織の測定方法 |
Non-Patent Citations (2)
Title |
---|
L. S. ZEVIN: ""A method of Quantitative Phase Analysis without Standards"", JOURNAL OF APPLIED CRYSTALLOGRAPHY, vol. 第10巻、Part 3, JPN4007007049, 1 June 1977 (1977-06-01), pages 147 - 150, ISSN: 0000839917 * |
L. S. ZEVIN: ""A method of Quantitative Phase Analysis without Standards"", JOURNAL OF APPLIED CRYSTALLOGRAPHY, vol. 第10巻、Part 3, JPN6008012460, 1 June 1977 (1977-06-01), pages 147 - 150, ISSN: 0001003433 * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012026963A (ja) * | 2010-07-27 | 2012-02-09 | Nippon Steel Corp | 酸化物の構造評価方法 |
Also Published As
Publication number | Publication date |
---|---|
WO1999032880A1 (en) | 1999-07-01 |
EP0961931A1 (en) | 1999-12-08 |
EP0961931B1 (en) | 2008-04-23 |
DE69839390T2 (de) | 2009-05-20 |
JP4115542B2 (ja) | 2008-07-09 |
DE69839390D1 (de) | 2008-06-05 |
US6108401A (en) | 2000-08-22 |
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