US6108401A - Method of standard-less phase analysis by means of a diffractogram - Google Patents

Method of standard-less phase analysis by means of a diffractogram Download PDF

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Publication number
US6108401A
US6108401A US09/216,255 US21625598A US6108401A US 6108401 A US6108401 A US 6108401A US 21625598 A US21625598 A US 21625598A US 6108401 A US6108401 A US 6108401A
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United States
Prior art keywords
substance
determined
mixture
sample
diffraction
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Expired - Fee Related
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US09/216,255
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English (en)
Inventor
Derk Reefman
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Malvern Panalytical BV
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US Philips Corp
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Assigned to U.S. PHILIPS CORPORATION reassignment U.S. PHILIPS CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: REEFMAN, DERK
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20016—Goniometers
US09/216,255 1997-12-22 1998-12-18 Method of standard-less phase analysis by means of a diffractogram Expired - Fee Related US6108401A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP97204064 1997-12-22
EP97204064 1997-12-22

Publications (1)

Publication Number Publication Date
US6108401A true US6108401A (en) 2000-08-22

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US09/216,255 Expired - Fee Related US6108401A (en) 1997-12-22 1998-12-18 Method of standard-less phase analysis by means of a diffractogram

Country Status (5)

Country Link
US (1) US6108401A (ja)
EP (1) EP0961931B1 (ja)
JP (1) JP4115542B2 (ja)
DE (1) DE69839390T2 (ja)
WO (1) WO1999032880A1 (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6266392B1 (en) * 1998-11-02 2001-07-24 Rigaku Corporation Soller slit and manufacturing method of the same
US6307917B1 (en) * 1998-09-28 2001-10-23 Rigaku Corporation Soller slit and X-ray apparatus
US6678347B1 (en) 2002-07-26 2004-01-13 Hypernex, Inc. Method and apparatus for quantitative phase analysis of textured polycrystalline materials
US20040131147A1 (en) * 2002-07-26 2004-07-08 Bede Scientific Instruments Ltd. Soller slit using low density materials

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5381925B2 (ja) * 2010-07-27 2014-01-08 新日鐵住金株式会社 酸化物の構造評価方法
CN108181326B (zh) * 2016-12-07 2020-08-18 同方威视技术股份有限公司 多能谱x射线成像系统和用于利用多能谱x射线成像系统对待测物品进行物质识别的方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3961186A (en) * 1973-10-09 1976-06-01 Ib Leunbach Method and apparatus for the determination of electron density in a part volume of a body
US4592082A (en) * 1984-08-10 1986-05-27 The United States Of America As Represented By The United States Department Of Energy Quantitative determination of mineral composition by powder X-ray diffraction
US4991191A (en) * 1990-02-05 1991-02-05 The Regents Of The University Of Minnesota Quantitative analysis of the active table ingredient by power x-ray diffractometry
US5812630A (en) * 1993-09-15 1998-09-22 U.S. Philips Corporation Examination method for the evaluation of location-dependent spectra

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2976305B2 (ja) * 1990-01-30 1999-11-10 日本航空電子工業株式会社 アモルファス監視装置
JPH09178675A (ja) * 1995-12-27 1997-07-11 Kawasaki Steel Corp 深さ方向集合組織の測定方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3961186A (en) * 1973-10-09 1976-06-01 Ib Leunbach Method and apparatus for the determination of electron density in a part volume of a body
US4592082A (en) * 1984-08-10 1986-05-27 The United States Of America As Represented By The United States Department Of Energy Quantitative determination of mineral composition by powder X-ray diffraction
US4991191A (en) * 1990-02-05 1991-02-05 The Regents Of The University Of Minnesota Quantitative analysis of the active table ingredient by power x-ray diffractometry
US5812630A (en) * 1993-09-15 1998-09-22 U.S. Philips Corporation Examination method for the evaluation of location-dependent spectra

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
"A Method of Quantitative Phase Analysis Without Standards", by L.S. Zevin, J. Appl. Cryst., vol. 10, (1977) pp. 147-150.
A Method of Quantitative Phase Analysis Without Standards , by L.S. Zevin, J. Appl. Cryst., vol. 10, (1977) pp. 147 150. *
International Tables for Crystallography, vol. C, 1992, Section 6.1, p. 476. *

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6307917B1 (en) * 1998-09-28 2001-10-23 Rigaku Corporation Soller slit and X-ray apparatus
US6266392B1 (en) * 1998-11-02 2001-07-24 Rigaku Corporation Soller slit and manufacturing method of the same
US6678347B1 (en) 2002-07-26 2004-01-13 Hypernex, Inc. Method and apparatus for quantitative phase analysis of textured polycrystalline materials
US20040131147A1 (en) * 2002-07-26 2004-07-08 Bede Scientific Instruments Ltd. Soller slit using low density materials
US7127037B2 (en) * 2002-07-26 2006-10-24 Bede Scientific Instruments Ltd. Soller slit using low density materials

Also Published As

Publication number Publication date
JP4115542B2 (ja) 2008-07-09
DE69839390T2 (de) 2009-05-20
JP2001513902A (ja) 2001-09-04
EP0961931B1 (en) 2008-04-23
DE69839390D1 (de) 2008-06-05
EP0961931A1 (en) 1999-12-08
WO1999032880A1 (en) 1999-07-01

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Free format text: PATENT EXPIRED DUE TO NONPAYMENT OF MAINTENANCE FEES UNDER 37 CFR 1.362

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Effective date: 20120822