JP2001313529A5

JP2001313529A5 -

Info

Publication number: JP2001313529A5
Application number: JP2001070245A
Authority: JP
Filing date: 2001-03-13
Publication date: 2004-12-24

Description

【発明の名称】定電圧発生回路、半導体装置、及びこれらを具備した携帯用電子機器および時計[Description of the invention] A constant voltage generating circuit, a semiconductor device, and a portable electronic device and a clock provided with the same

【０００１】
【発明の属する技術分野】
本発明は、定電圧発生回路、半導体装置及びそれらを具備した携帯用の電子機器および時計に関するものである。[0001]
Field of the Invention
The present invention relates to a constant voltage generating circuit, semiconductor device and electronic equipment and timepiece portable equipped them.

【００２９】
【課題を解決するための手段】
本発明の定電圧発生回路は、
一端側が第１の電位側、他端側が定電圧出力側に接続され、閾値電圧が夫々異なる複数のトランジスタを含み、いずれかのトランジスタが選択使用される定電圧制御回路と、
前記定電圧制御回路の参照電圧が一方の端子へ入力され、他方の端子へ所与の基準電圧が入力されたオペアンプと、
一端が前記定電圧制御回路の前記各トランジスタの他端側に接続され、他端側が第２の電位側に接続され、前記オペアンプの出力を受けてゲート入力電圧が制御されるトランジスタと、
を含み、
前記定電圧発生回路は、前記定電圧制御回路における複数のトランジスタからいずれかのトランジスタを選択する選択回路を含み、
前記定電圧発生回路はモニタ端子と接続されるとともに、テスト回路と同一の基板上に設けられ、
検査工程において、前記テスト回路は、前記定電圧制御回路における各トランジスタを選択し、前記定電圧制御回路における各トランジスタによる出力電圧を前記モニタ端子にて夫々測定することにより、前記定電圧制御回路における複数のトランジスタの中からいずれかのトランジスタを特定し、前記選択回路にて、前記トランジスタを選択することを特徴とする。[0029]
[Means for Solving the Problems]
The constant voltage generation circuit of the present invention is
A constant voltage control circuit including a plurality of transistors having one end side connected to the first potential side and the other end side connected to the constant voltage output side and having different threshold voltages, and any one of the transistors is selectively used;
An operational amplifier in which a reference voltage of the constant voltage control circuit is input to one terminal and a given reference voltage is input to the other terminal;
A transistor whose one end is connected to the other end side of each transistor of the constant voltage control circuit, the other end side is connected to the second potential side, and the gate input voltage is controlled by receiving the output of the operational amplifier;
Including
The constant voltage generation circuit includes a selection circuit which selects any one of a plurality of transistors in the constant voltage control circuit,
The constant voltage generation circuit is connected to the monitor terminal and provided on the same substrate as the test circuit,
In the inspection step, the test circuit selects each transistor in the constant voltage control circuit, and measures an output voltage of each transistor in the constant voltage control circuit at the monitor terminal to thereby select the constant voltage control circuit. One of the plurality of transistors is specified, and the selection circuit selects the transistor .

【００３０】
本発明の半導体装置は、
発振回路と、定電圧発生回路と、テスト回路とを含む半導体装置であって、
前記発振回路は、
発振用インバータと、
外付けされた水晶振動子と出力側及び入力側が接続された前記発振用インバータの出力信号を位相反転して、前記発振用インバータにフィードバック入力するフィードバック回路と、
を含み、
前記定電圧発生回路は、
一端側が第１の電位側、他端側が定電圧出力側に接続され、閾値電圧が夫々異なる複数のトランジスタを含み、いずれかのトランジスタが選択使用される定電圧制御回路と、
前記定電圧制御回路の参照電圧が一方の端子へ入力され、他方の端子へ所与の基準電圧が入力されたオペアンプと、
一端が前記定電圧制御回路の前記各トランジスタの他端側に接続され、他端側が第２の電位側に接続され、前記オペアンプ出力を受けてゲート入力電圧が制御されるトランジスタと、
前記定電圧制御回路における複数のトランジスタからいずれかのトランジスタを選択する選択回路と、
を含み、
前記テスト回路は、前記発振回路および前記定電圧発生回路と夫々接続されるとともに、
前記定電圧発生回路の出力電圧をモニタするモニタ端子と、テスト用パッドと接続されて設けられ、
検査工程において、前記モニタ端子に電圧を印加した状態で、前記テスト用パッドへの印加電圧を制御することにより、前記テスト回路を介して前記発振用インバータのショート電流を測定し、
前記ショート電流測定後に、前記テスト用パッドへの印加電圧を制御することにより、前記テスト回路を介して前記定電圧制御回路における各トランジスタを夫々選択して、前記各トランジスタの出力電圧を前記モニタ端子にて夫々測定し、
前記発振用インバータの発振動作を確保できる範囲で、前記定電圧発生回路内の定電圧制御回路におけるトランジスタを前記選択回路にて選択することを特徴とする。 [0030]
The semiconductor device of the present invention is
A semiconductor device including an oscillation circuit, a constant voltage generation circuit, and a test circuit,
The oscillation circuit is
An oscillation inverter,
A feedback circuit for inverting the phase of the output signal of the oscillation inverter connected to the output side and the input side from an externally attached crystal unit and for feedback input to the oscillation inverter;
Including
The constant voltage generation circuit
A constant voltage control circuit including a plurality of transistors having one end side connected to the first potential side and the other end side connected to the constant voltage output side and having different threshold voltages, and any one of the transistors is selectively used;
An operational amplifier in which a reference voltage of the constant voltage control circuit is input to one terminal and a given reference voltage is input to the other terminal;
A transistor of which one end is connected to the other end of each transistor of the constant voltage control circuit, the other end is connected to the second potential side, and the gate input voltage is controlled by receiving the output of the operational amplifier;
A selection circuit for selecting any one of a plurality of transistors in the constant voltage control circuit;
Including
The test circuit is connected to the oscillation circuit and the constant voltage generation circuit, respectively.
A monitor terminal for monitoring the output voltage of the constant voltage generation circuit, and a test pad,
In the inspection step, while the voltage is applied to the monitor terminal, the voltage applied to the test pad is controlled to measure the short current of the oscillation inverter through the test circuit.
After the measurement of the short-circuit current, each transistor in the constant voltage control circuit is selected via the test circuit by controlling the voltage applied to the test pad, and the output voltage of each transistor is monitored. Measure each at
The transistor in the constant voltage control circuit in the constant voltage generation circuit is selected by the selection circuit as long as the oscillation operation of the oscillation inverter can be secured.

Claims

A constant voltage control circuit including a plurality of transistors having one end side connected to the first potential side and the other end side connected to the constant voltage output side and having different threshold voltages, and any one of the transistors is selectively used;
  An operational amplifier in which a reference voltage of the constant voltage control circuit is input to one terminal and a given reference voltage is input to the other terminal;
  A transistor whose one end is connected to the other end side of each transistor of the constant voltage control circuit, the other end side is connected to the second potential side, and the gate input voltage is controlled by receiving the output of the operational amplifier;
  Including
  The constant voltage generation circuit includes a selection circuit which selects any one of a plurality of transistors in the constant voltage control circuit,
  The constant voltage generation circuit is connected to the monitor terminal and provided on the same substrate as the test circuit,
  In the inspection step, the test circuit selects each transistor in the constant voltage control circuit, and measures an output voltage of each transistor in the constant voltage control circuit at the monitor terminal to thereby select the constant voltage control circuit. A constant voltage generating circuit, wherein any one of a plurality of transistors is specified, and the selection circuit selects the transistor.

In claim 1,
The test circuit is connected to a test pad, and by controlling a voltage applied to the test pad, each transistor in the constant voltage control circuit is selected via the test circuit. Constant voltage generation circuit.

In any one of claims 1 and 2,
The selection circuit includes a plurality of unit circuits formed corresponding to the plurality of transistors in the constant voltage control circuit and connected to a plurality of pads,
Each of the plurality of unit circuits includes any one of a fuse, a non-volatile memory, and a storage element, and a constant voltage generation circuit that selects the transistor by applying a voltage to the pad. .

In any one of claims 1 to 3,
The constant voltage control circuit includes a transistor having a fourth threshold voltage, a transistor having a fifth threshold voltage different from the fourth threshold voltage, and a sixth that differs from the fourth and fifth threshold voltages. A constant voltage generating circuit including at least a transistor having a threshold voltage, wherein one end of each of the transistors is connected to the first potential side, and the other end is connected to the constant voltage output side.

In any one of claims 1 to 4,
A constant voltage generating circuit characterized in that an output voltage of the constant voltage generating circuit is supplied to an oscillating circuit.

In claim 5,
  The oscillation circuit is
  An oscillation inverter,
  A feedback circuit for inverting the phase of the output signal of the oscillation inverter connected to the output side and the input side from an externally attached crystal unit and for feedback input to the oscillation inverter;
  Including
  The constant voltage generation circuit
  A constant voltage control circuit including a plurality of transistors having one end side connected to the first potential side and the other end side connected to the constant voltage output side and having different threshold voltages, and any one of the transistors is selectively used;
  An operational amplifier in which a reference voltage of the constant voltage control circuit is input to one terminal and a given reference voltage is input to the other terminal;
  A transistor of which one end is connected to the other end of each transistor of the constant voltage control circuit, the other end is connected to the second potential side, and the gate input voltage is controlled by receiving the output of the operational amplifier;
  A selection circuit for selecting any one of a plurality of transistors in the constant voltage control circuit;
  Including
  The test circuit is connected to the oscillation circuit and the constant voltage generation circuit, respectively.
  A monitor terminal for monitoring the output voltage of the constant voltage generation circuit, and a test pad,
  In the inspection step, while the voltage is applied to the monitor terminal, the voltage applied to the test pad is controlled to measure the short current of the oscillation inverter through the test circuit.
  After the measurement of the short-circuit current, each transistor in the constant voltage control circuit is selected via the test circuit by controlling the voltage applied to the test pad, and the output voltage of each transistor is monitored. Measure each at
  A constant voltage generation circuit, wherein the transistor in the constant voltage control circuit in the constant voltage generation circuit is selected by the selection circuit as long as the oscillation operation of the oscillation inverter can be secured.

A semiconductor device including an oscillation circuit, a constant voltage generation circuit, and a test circuit,
  The oscillation circuit is
  An oscillation inverter,
  A feedback circuit for inverting the phase of the output signal of the oscillation inverter connected to the output side and the input side from an externally attached crystal unit and for feedback input to the oscillation inverter;
  Including
  The constant voltage generation circuit
  A constant voltage control circuit including a plurality of transistors having one end side connected to the first potential side and the other end side connected to the constant voltage output side and having different threshold voltages, and any one of the transistors is selectively used;
  An operational amplifier in which a reference voltage of the constant voltage control circuit is input to one terminal and a given reference voltage is input to the other terminal;
  A transistor of which one end is connected to the other end of each transistor of the constant voltage control circuit, the other end is connected to the second potential side, and the gate input voltage is controlled by receiving the output of the operational amplifier;
  A selection circuit for selecting any one of a plurality of transistors in the constant voltage control circuit;
  Including
  The test circuit is connected to the oscillation circuit and the constant voltage generation circuit, respectively.
  A monitor terminal for monitoring the output voltage of the constant voltage generation circuit, and a test pad,
  In the inspection step, while the voltage is applied to the monitor terminal, the voltage applied to the test pad is controlled to measure the short current of the oscillation inverter through the test circuit.
  After the measurement of the short-circuit current, each transistor in the constant voltage control circuit is selected via the test circuit by controlling the voltage applied to the test pad, and the output voltage of each transistor is monitored. Measure each at
  A semiconductor device characterized in that a transistor in a constant voltage control circuit in the constant voltage generation circuit is selected by the selection circuit as long as the oscillation operation of the oscillation inverter can be secured. .

A portable electronic device comprising the constant voltage generation circuit according to any one of claims 1 to 6.

A timepiece comprising the constant voltage generating circuit according to any one of claims 1 to 6.

A portable electronic device comprising the semiconductor device according to claim 7.

A timepiece comprising the semiconductor device according to claim 7.