JP2001148195A - 連続検索サイクルを中断させない読み出し／書き込み機能を有するコンテントアドレサブルメモリ - Google Patents

連続検索サイクルを中断させない読み出し／書き込み機能を有するコンテントアドレサブルメモリ

Info

Publication number
JP2001148195A
JP2001148195A JP2000273235A JP2000273235A JP2001148195A JP 2001148195 A JP2001148195 A JP 2001148195A JP 2000273235 A JP2000273235 A JP 2000273235A JP 2000273235 A JP2000273235 A JP 2000273235A JP 2001148195 A JP2001148195 A JP 2001148195A
Authority
JP
Japan
Prior art keywords
search
port
addressable memory
content addressable
clock
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000273235A
Other languages
English (en)
Japanese (ja)
Other versions
JP2001148195A5 (enExample
Inventor
G F Randall Gibson
ジー．エフ．・ランダル・ギブソン
Aburamesuku Radu
ラドゥ・アブラメスク
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sibercore Technologies Inc
Original Assignee
Sibercore Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sibercore Technologies Inc filed Critical Sibercore Technologies Inc
Publication of JP2001148195A publication Critical patent/JP2001148195A/ja
Publication of JP2001148195A5 publication Critical patent/JP2001148195A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled
    • G06F7/74—Selecting or encoding within a word the position of one or more bits having a specified value, e.g. most or least significant one or zero detection, priority encoders
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C15/00—Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C15/00—Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores
    • G11C15/04—Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores using semiconductor elements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/14—Implementation of control logic, e.g. test mode decoders
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/26—Accessing multiple arrays
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
    • G11C29/816—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout for an application-specific layout
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/26—Accessing multiple arrays
    • G11C2029/2602—Concurrent test

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
  • Static Random-Access Memory (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
JP2000273235A 1999-09-10 2000-09-08 連続検索サイクルを中断させない読み出し／書き込み機能を有するコンテントアドレサブルメモリ Pending JP2001148195A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15338899P 1999-09-10 1999-09-10
US60/153388 1999-09-10

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2011260527A Division JP5634386B2 (ja) 1999-09-10 2011-11-29 連続検索サイクルを中断させない読み出し／書き込み機能を有するコンテントアドレサブルメモリ

Publications (2)

Publication Number Publication Date
JP2001148195A true JP2001148195A (ja) 2001-05-29
JP2001148195A5 JP2001148195A5 (enExample) 2008-09-25

Family

ID=22547011

Family Applications (3)

Application Number Title Priority Date Filing Date
JP2000273259A Expired - Fee Related JP4927247B2 (ja) 1999-09-10 2000-09-08 可変幅のデータを検索するための可変幅のコンテントアドレサブルメモリデバイス
JP2000273235A Pending JP2001148195A (ja) 1999-09-10 2000-09-08 連続検索サイクルを中断させない読み出し／書き込み機能を有するコンテントアドレサブルメモリ
JP2011260527A Expired - Fee Related JP5634386B2 (ja) 1999-09-10 2011-11-29 連続検索サイクルを中断させない読み出し／書き込み機能を有するコンテントアドレサブルメモリ

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP2000273259A Expired - Fee Related JP4927247B2 (ja) 1999-09-10 2000-09-08 可変幅のデータを検索するための可変幅のコンテントアドレサブルメモリデバイス

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2011260527A Expired - Fee Related JP5634386B2 (ja) 1999-09-10 2011-11-29 連続検索サイクルを中断させない読み出し／書き込み機能を有するコンテントアドレサブルメモリ

Country Status (3)

Country Link
US (4) US6392910B1 (enExample)
EP (1) EP1083573A1 (enExample)
JP (3) JP4927247B2 (enExample)

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USRE41659E1 (en) 2010-09-07
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