JP2000150441A - Roller brush washing device - Google Patents
Roller brush washing deviceInfo
- Publication number
- JP2000150441A JP2000150441A JP10335006A JP33500698A JP2000150441A JP 2000150441 A JP2000150441 A JP 2000150441A JP 10335006 A JP10335006 A JP 10335006A JP 33500698 A JP33500698 A JP 33500698A JP 2000150441 A JP2000150441 A JP 2000150441A
- Authority
- JP
- Japan
- Prior art keywords
- roller brush
- wafer
- roller
- suction
- cleaning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、半導体ウエハ、液
晶ディスプレイ用基板等の板状物の表面を洗浄するロー
ラブラシ洗浄装置に関する。[0001] 1. Field of the Invention [0002] The present invention relates to a roller brush cleaning apparatus for cleaning the surface of a plate-like object such as a semiconductor wafer and a substrate for a liquid crystal display.
【0002】[0002]
【従来技術】従来のローラブラシ洗浄装置を図4、図5
に示す。図4、図5において、31はウエハで、ウエハ
31はウエハサポートローラ32上に載置され、ウエハ
サポートローラ32との接触摩擦により回転する。33
a及び33bはウエハの表面及び裏面を洗浄するローラ
ブラシで、図示しない駆動源に接続し、矢印にて示す方
向にウエハ31にわずかに接触して回転する。ローラブ
ラシ33a、33bはポリビニルアルコールスポンジ体
をロール状に成形してつくられている。34及び35は
ウエハ31に純水を滴下及び噴出させるノズルである。2. Description of the Related Art A conventional roller brush cleaning apparatus is shown in FIGS.
Shown in 4 and 5, reference numeral 31 denotes a wafer, and the wafer 31 is placed on a wafer support roller 32 and rotated by contact friction with the wafer support roller 32. 33
Reference numerals a and 33b denote roller brushes for cleaning the front and back surfaces of the wafer, which are connected to a drive source (not shown) and rotate while slightly contacting the wafer 31 in the direction shown by the arrow. The roller brushes 33a and 33b are formed by forming a polyvinyl alcohol sponge into a roll. Reference numerals 34 and 35 denote nozzles for dropping and ejecting pure water onto the wafer 31.
【0003】次に、ウエハ31を洗浄する動作について
説明する。まず、ローラブラシ33a、33bを上下方
向に離れる方向に移動させておく。 図示しない搬送装
置によりウエハ31をウエハサポートローラ32(図4
では6箇所)上に搬送し載置する。次に、ウエハサポー
トローラ32を回転駆動しウエハ31を回転させ、回転
しているウエハ31にノズル34及び35から純水を滴
下及び噴出させる。これと同時にローラブラシ33a、
33bを接近させ、ウエハ31にわずかに接触する状態
で回転させながらウエハに付着したゴミを除去してい
た。Next, an operation of cleaning the wafer 31 will be described. First, the roller brushes 33a and 33b are moved in a direction in which the roller brushes are vertically separated. A wafer support roller 32 (FIG. 4)
(6 places) and transported. Next, the wafer support roller 32 is rotated to rotate the wafer 31, and pure water is dropped and ejected from the nozzles 34 and 35 onto the rotating wafer 31. At the same time, the roller brush 33a,
The dust adhering to the wafer has been removed while rotating the nozzle 33b close to and slightly touching the wafer 31.
【0004】しかしながら、上述した従来のローラブラ
シ洗浄装置では、ウエハ31から除去した付着物がロー
ラブラシ33a、33bに付着したまま、再び回転し、
ウエハ31に接触する。その為、洗浄したウエハ31を
搬送装置(ロボット等)で送り出した後、ローラブラシ
部にウエハ31がない状態で、上下2本のローラブラシ
33a、33bを接触させて正転あるいは逆転させて、
お互いに清浄化するいわゆるセルフクリーニングを採用
していたが、ウエハ31がない状態で行わねばならない
ので、アイドルタイムが生じること、清浄化するのに時
間がかかると共に清浄度が安定しないという問題点があ
った。However, in the above-described conventional roller brush cleaning apparatus, the adhered matter removed from the wafer 31 rotates again while adhering to the roller brushes 33a and 33b,
It contacts the wafer 31. For this reason, after the washed wafer 31 is sent out by a transfer device (a robot or the like), the upper and lower two roller brushes 33a and 33b are brought into contact with each other to rotate forward or backward in a state where the wafer 31 is not present in the roller brush portion.
Although so-called self-cleaning for cleaning each other has been adopted, since the cleaning must be performed without the wafer 31, there is a problem that an idle time occurs, it takes time to perform cleaning, and the cleanliness is not stable. there were.
【0005】[0005]
【発明が解決しようとする課題】本発明は、以上の様な
従来のローラブラシ洗浄装置の問題点に鑑みなされたも
ので、ウエハの洗浄工程中にローラブラシを常時洗浄す
ることができ、従って、アイドルタイムが生じることが
なく、また、洗浄液やゴミ等の異物を直接吸引して、配
管を介して別な場所へ送出してウエハやローラブラシが
再汚染されることのないローラブラシ洗浄装置を提供す
ることを目的とする。SUMMARY OF THE INVENTION The present invention has been made in view of the above-described problems of the conventional roller brush cleaning apparatus, and can constantly clean the roller brush during the wafer cleaning process. A roller brush cleaning device that does not cause idle time, and directly suctions foreign substances such as cleaning liquid and dust and sends it to another place via piping so that wafers and roller brushes are not recontaminated. The purpose is to provide.
【0006】[0006]
【課題を解決するための手段】上記目的を達成するた
め、本発明は、回転している半導体ウエハに純水を滴下
し、回転するローラブラシをウエハ表面に接触させてウ
エハを洗浄するローラブラシ洗浄装置において、回転す
るローラブラシのウエハと反対側に軸方向全長に亘って
配置され、ローラブラシの円周に沿って小間隙を保った
一部の角度範囲の凹面に吸引孔を有する吸引ダクトを設
けているローラブラシ洗浄装置を提供する。なお、吸引
ダクトは配管を介して真空源に接続させることが好まし
い。In order to achieve the above object, the present invention provides a roller brush for cleaning a wafer by dropping pure water onto a rotating semiconductor wafer and bringing the rotating roller brush into contact with the wafer surface. In the cleaning device, a suction duct is disposed over the entire length in the axial direction on the side opposite to the wafer of the rotating roller brush, and has a suction hole in a concave surface in a part of an angular range that keeps a small gap along the circumference of the roller brush. The present invention provides a roller brush cleaning device provided with: Preferably, the suction duct is connected to a vacuum source via a pipe.
【0007】[0007]
【発明の実施の形態】図1及至図3に、本発明のローラ
ブラシ洗浄装置を示す。なお、図1はローラブラシ洗浄
装置の上面図、図2は図1のA−A断面図であり、図3
は図2のB−B矢視図に吸引、後処理回路を付加したも
のである。図2、図3に示すように、中空の吸引ダクト
1a、1bと、真空ポンプ2及び気液分離器などの後処
理装置3が新たに設けられ、それ以外は従来装置(図
3、図4)と同じである。従って、従来装置と同様の部
分には同じ符号を付し、詳しい説明は省略する。1 to 3 show a roller brush cleaning apparatus according to the present invention. 1 is a top view of the roller brush cleaning device, FIG. 2 is a sectional view taken along line AA of FIG.
Is a drawing in which a suction and post-processing circuit is added to the view taken in the direction of arrow BB in FIG. As shown in FIGS. 2 and 3, hollow suction ducts 1a and 1b, and a post-processing device 3 such as a vacuum pump 2 and a gas-liquid separator are newly provided. Is the same as). Therefore, the same parts as those of the conventional device are denoted by the same reference numerals, and detailed description is omitted.
【0008】図1及び図2において、中空の吸引ダクト
1a、1bはローラブラシ33a、33bのウエハ31
と反対側に設けられ、吸引ダクト1a、1bのローラブ
ラシ33a、33b側に吸引孔4a、4bを多数設けて
いる。吸引孔4a、4bを設けている面は、ローラブラ
シ33a、33bの全長に亘って、一部の角度範囲がロ
−ラブラシと同心円をなす円筒状の凹面になっており、
ローラブラシ33a、33b外周から小間隙を保ってい
る。このようにすると、ローラブラシ33a、33bが
吸引ダクト1a、1bに接触して擦れることはない。そ
のため、ローラブラシを損傷することがなく、耐久性を
損うこともなく、また、ローラブラシが逆汚染されない
などの利点を有する。なお、図2においては、ウエハ3
1の両面を2本のローラブラシ33a、33bで洗浄す
る場合を示したが、ウエハの片面のみを1本のローラブ
ラシで洗浄する場合においても同様に適用できる。In FIGS. 1 and 2, hollow suction ducts 1a and 1b are provided with wafers 31 of roller brushes 33a and 33b.
The suction ducts 1a, 1b are provided with a large number of suction holes 4a, 4b on the roller brush 33a, 33b side. The surface provided with the suction holes 4a and 4b is a cylindrical concave surface in which a part of the angular range is concentric with the roller brush over the entire length of the roller brushes 33a and 33b.
A small gap is kept from the outer circumference of the roller brushes 33a, 33b. In this case, the roller brushes 33a and 33b do not come into contact with the suction ducts 1a and 1b to be rubbed. Therefore, there are advantages that the roller brush is not damaged, durability is not impaired, and the roller brush is not contaminated reversely. In FIG. 2, the wafer 3
Although the case where two surfaces of one wafer are cleaned with two roller brushes 33a and 33b is shown, the present invention can be similarly applied to the case where only one surface of a wafer is cleaned with one roller brush.
【0009】図3において、2は真空ポンプで、吸引ダ
クト1a、1bの両端に接続した配管5を介して洗浄液
や異物を真空吸引する。3は、気液分離器などの後処理
装置を示す。このように構成すると、ローラブラシ33
a、33bに付着している洗浄液や異物を真空ポンプ2
で直接吸引して、配管5を介して別な場所へ送出できる
ので、ウエハやローラブラシが再汚染されることがな
い。In FIG. 3, reference numeral 2 denotes a vacuum pump for vacuum-suctioning a cleaning liquid or foreign matter through a pipe 5 connected to both ends of suction ducts 1a and 1b. Reference numeral 3 denotes a post-processing device such as a gas-liquid separator. With this configuration, the roller brush 33
a, a cleaning liquid or foreign matter adhering to 33b
, And can be sent to another place via the pipe 5, so that the wafer and the roller brush are not re-contaminated.
【0010】[0010]
【発明の効果】本発明のローラブラシ洗浄装置によれ
ば、吸引ダクトが、ローラブラシのウエハと反対側に配
置されているので、ウエハの洗浄工程中にローラブラシ
を常時洗浄することができる。また、吸引ダクトの吸引
孔のある凹面部とローラブラシが小間隙を保っているの
で、回転するローラブラシを損傷することがない。更
に、吸引ダクトを配管を介して真空源に接続しているの
で、洗浄液や異物を直接吸引して、配管を介して別な場
所へ送出できるので、ウエハやローラブラシが再汚染さ
れることがない。According to the roller brush cleaning apparatus of the present invention, since the suction duct is disposed on the opposite side of the roller brush from the wafer, the roller brush can be constantly cleaned during the wafer cleaning process. In addition, since the roller brush has a small gap between the concave portion of the suction duct having the suction hole and the roller brush, the rotating roller brush is not damaged. Furthermore, since the suction duct is connected to the vacuum source via the pipe, the cleaning liquid or foreign matter can be directly suctioned and sent to another place via the pipe, so that the wafer and the roller brush may be re-contaminated. Absent.
【図面の簡単な説明】[Brief description of the drawings]
【図1】本発明のローラブラシ洗浄装置の上面図。FIG. 1 is a top view of a roller brush cleaning device of the present invention.
【図2】図1のA−A断面図。FIG. 2 is a sectional view taken along line AA of FIG.
【図3】図2のB−B矢視図に吸引、後処理回路を付加
した図。FIG. 3 is a diagram in which a suction and post-processing circuit is added to the BB arrow view of FIG. 2;
【図4】従来のローラブラシ洗浄装置の上面図。FIG. 4 is a top view of a conventional roller brush cleaning device.
【図5】図4のC−C断面図。FIG. 5 is a sectional view taken along line CC of FIG. 4;
1 吸引ダクト 2 真空ポンプ 3 後処理装置 4 吸引孔 31 ウエハ 32 ウエハサポートローラ 33 ローラブラシ 34 ノズル 35 ノズル DESCRIPTION OF SYMBOLS 1 Suction duct 2 Vacuum pump 3 Post-processing device 4 Suction hole 31 Wafer 32 Wafer support roller 33 Roller brush 34 Nozzle 35 Nozzle
Claims (2)
し、回転するローラブラシをウエハ表面に接触させて前
記ウエハを洗浄するローラブラシ洗浄装置において、 前記回転するローラブラシの前記ウエハと反対側に軸方
向全長に亘って配置され、前記ローラブラシの円周に沿
って小間隙を保った一部の角度範囲の凹面に吸引孔を有
する吸引ダクトを設けているローラブラシ洗浄装置。1. A roller brush cleaning apparatus for cleaning a wafer by dropping pure water onto a rotating semiconductor wafer and bringing a rotating roller brush into contact with a wafer surface, wherein the rotating roller brush is opposite to the wafer. A roller brush cleaning device provided with a suction duct having a suction hole in a concave surface of a part of an angular range which keeps a small gap along a circumference of the roller brush and which is arranged along an entire length in an axial direction on a side of the roller brush.
接続していることを特徴とする請求項1記載のローラブ
ラシ洗浄装置。2. The roller brush cleaning device according to claim 1, wherein the suction duct is connected to a vacuum source via a pipe.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10335006A JP2000150441A (en) | 1998-11-10 | 1998-11-10 | Roller brush washing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10335006A JP2000150441A (en) | 1998-11-10 | 1998-11-10 | Roller brush washing device |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2000150441A true JP2000150441A (en) | 2000-05-30 |
Family
ID=18283694
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10335006A Pending JP2000150441A (en) | 1998-11-10 | 1998-11-10 | Roller brush washing device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2000150441A (en) |
Cited By (7)
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---|---|---|---|---|
CN102265425A (en) * | 2008-12-27 | 2011-11-30 | E.I.内穆尔杜邦公司 | Apparatus and method for preventing splatter for continuous printing |
KR101423666B1 (en) * | 2014-04-21 | 2014-07-25 | (주)슈퍼세미콘 | A vacuun clean roller |
KR20150061105A (en) * | 2013-11-25 | 2015-06-04 | 세메스 주식회사 | Cleaning unit and substrate treating apparatus |
CN105895556A (en) * | 2015-02-18 | 2016-08-24 | 株式会社荏原制作所 | Substrate Cleaning Apparatus,Substrate Cleaning Method, And Substrate Processing Apparatus |
JP2016167514A (en) * | 2015-03-09 | 2016-09-15 | 株式会社荏原製作所 | Substrate cleaning device, substrate cleaning method, and substrate processing device |
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-
1998
- 1998-11-10 JP JP10335006A patent/JP2000150441A/en active Pending
Cited By (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102265425A (en) * | 2008-12-27 | 2011-11-30 | E.I.内穆尔杜邦公司 | Apparatus and method for preventing splatter for continuous printing |
JP2012514300A (en) * | 2008-12-27 | 2012-06-21 | イー・アイ・デュポン・ドウ・ヌムール・アンド・カンパニー | Apparatus and method for preventing scattering for continuous printing |
KR20150061105A (en) * | 2013-11-25 | 2015-06-04 | 세메스 주식회사 | Cleaning unit and substrate treating apparatus |
KR102134434B1 (en) * | 2013-11-25 | 2020-07-16 | 세메스 주식회사 | Cleaning unit and substrate treating apparatus |
KR101423666B1 (en) * | 2014-04-21 | 2014-07-25 | (주)슈퍼세미콘 | A vacuun clean roller |
US10562076B2 (en) | 2015-02-18 | 2020-02-18 | Ebara Corporation | Substrate cleaning apparatus, substrate cleaning method, and substrate processing apparatus |
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CN105895556A (en) * | 2015-02-18 | 2016-08-24 | 株式会社荏原制作所 | Substrate Cleaning Apparatus,Substrate Cleaning Method, And Substrate Processing Apparatus |
CN105895556B (en) * | 2015-02-18 | 2021-02-26 | 株式会社荏原制作所 | Substrate cleaning apparatus, substrate cleaning method, and substrate processing apparatus |
CN112908901A (en) * | 2015-02-18 | 2021-06-04 | 株式会社荏原制作所 | Substrate cleaning apparatus, substrate cleaning method, and substrate processing apparatus |
US11285517B2 (en) | 2015-02-18 | 2022-03-29 | Ebara Corporation | Substrate cleaning apparatus, substrate cleaning method, and substrate processing apparatus |
KR102454775B1 (en) * | 2015-02-18 | 2022-10-17 | 가부시키가이샤 에바라 세이사꾸쇼 | Substrate cleaning apparatus, substrate cleaning method and substrate processing apparatus |
JP2016167514A (en) * | 2015-03-09 | 2016-09-15 | 株式会社荏原製作所 | Substrate cleaning device, substrate cleaning method, and substrate processing device |
US11367629B2 (en) | 2019-01-30 | 2022-06-21 | Ebara Corporation | Cleaning apparatus of cleaning tool, substrate processing apparatus, and cleaning method of cleaning tool |
CN110241765A (en) * | 2019-07-20 | 2019-09-17 | 华北水利水电大学 | A kind of air/water composite cleaning device and positive pressure vacuum dust collecting system |
CN110241765B (en) * | 2019-07-20 | 2024-02-23 | 华北水利水电大学 | Air/water composite cleaning device and positive pressure vacuum dust collection system |
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