JP2000065900A5 - - Google Patents

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Publication number
JP2000065900A5
JP2000065900A5 JP1998231740A JP23174098A JP2000065900A5 JP 2000065900 A5 JP2000065900 A5 JP 2000065900A5 JP 1998231740 A JP1998231740 A JP 1998231740A JP 23174098 A JP23174098 A JP 23174098A JP 2000065900 A5 JP2000065900 A5 JP 2000065900A5
Authority
JP
Japan
Prior art keywords
circuit
semiconductor chip
output
switching
switching circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1998231740A
Other languages
English (en)
Japanese (ja)
Other versions
JP3904737B2 (ja
JP2000065900A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP23174098A priority Critical patent/JP3904737B2/ja
Priority claimed from JP23174098A external-priority patent/JP3904737B2/ja
Priority to US09/233,209 priority patent/US6329669B1/en
Priority to KR10-1999-0013814A priority patent/KR100490495B1/ko
Publication of JP2000065900A publication Critical patent/JP2000065900A/ja
Publication of JP2000065900A5 publication Critical patent/JP2000065900A5/ja
Application granted granted Critical
Publication of JP3904737B2 publication Critical patent/JP3904737B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP23174098A 1998-08-18 1998-08-18 半導体装置及びその製造方法 Expired - Fee Related JP3904737B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP23174098A JP3904737B2 (ja) 1998-08-18 1998-08-18 半導体装置及びその製造方法
US09/233,209 US6329669B1 (en) 1998-08-18 1999-01-20 Semiconductor device able to test changeover circuit which switches connection between terminals
KR10-1999-0013814A KR100490495B1 (ko) 1998-08-18 1999-04-19 반도체 장치 및 반도체 장치의 테스트 방법

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23174098A JP3904737B2 (ja) 1998-08-18 1998-08-18 半導体装置及びその製造方法

Publications (3)

Publication Number Publication Date
JP2000065900A JP2000065900A (ja) 2000-03-03
JP2000065900A5 true JP2000065900A5 (https=) 2005-09-29
JP3904737B2 JP3904737B2 (ja) 2007-04-11

Family

ID=16928305

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23174098A Expired - Fee Related JP3904737B2 (ja) 1998-08-18 1998-08-18 半導体装置及びその製造方法

Country Status (3)

Country Link
US (1) US6329669B1 (https=)
JP (1) JP3904737B2 (https=)
KR (1) KR100490495B1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1977262A2 (en) * 2006-01-09 2008-10-08 Nxp B.V. Testable integrated circuit and ic test method

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5772341A (en) * 1980-10-24 1982-05-06 Toshiba Corp Semiconductor integrated circuit device
JPH01111364A (ja) * 1987-10-24 1989-04-28 Nec Corp 半導体集積回路装置の信号切換回路
JP2672408B2 (ja) * 1991-03-19 1997-11-05 シャープ株式会社 半導体集積回路
JPH05264647A (ja) 1992-03-18 1993-10-12 Nec Corp 半導体装置のテスト回路
JP2869314B2 (ja) 1992-11-25 1999-03-10 松下電器産業株式会社 バウンダリースキャンセル回路，バウンダリースキャンテスト回路及びその使用方法
JP3099739B2 (ja) 1996-06-21 2000-10-16 日本電気株式会社 半導体記憶装置
JPH10303366A (ja) * 1997-04-30 1998-11-13 Mitsubishi Electric Corp 半導体装置

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