JP2000022213A5 - - Google Patents

Download PDF

Info

Publication number
JP2000022213A5
JP2000022213A5 JP1998183460A JP18346098A JP2000022213A5 JP 2000022213 A5 JP2000022213 A5 JP 2000022213A5 JP 1998183460 A JP1998183460 A JP 1998183460A JP 18346098 A JP18346098 A JP 18346098A JP 2000022213 A5 JP2000022213 A5 JP 2000022213A5
Authority
JP
Japan
Prior art keywords
groove
gallium nitride
substrate
based semiconductor
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1998183460A
Other languages
English (en)
Japanese (ja)
Other versions
JP2000022213A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP18346098A priority Critical patent/JP2000022213A/ja
Priority claimed from JP18346098A external-priority patent/JP2000022213A/ja
Publication of JP2000022213A publication Critical patent/JP2000022213A/ja
Publication of JP2000022213A5 publication Critical patent/JP2000022213A5/ja
Pending legal-status Critical Current

Links

JP18346098A 1998-06-30 1998-06-30 窒化ガリウム系半導体素子及びその製造方法 Pending JP2000022213A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18346098A JP2000022213A (ja) 1998-06-30 1998-06-30 窒化ガリウム系半導体素子及びその製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18346098A JP2000022213A (ja) 1998-06-30 1998-06-30 窒化ガリウム系半導体素子及びその製造方法

Publications (2)

Publication Number Publication Date
JP2000022213A JP2000022213A (ja) 2000-01-21
JP2000022213A5 true JP2000022213A5 (enExample) 2005-10-20

Family

ID=16136176

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18346098A Pending JP2000022213A (ja) 1998-06-30 1998-06-30 窒化ガリウム系半導体素子及びその製造方法

Country Status (1)

Country Link
JP (1) JP2000022213A (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20060131774A (ko) * 2003-11-12 2006-12-20 크리 인코포레이티드 반도체 웨이퍼 후면들 상에 발광 소자들을 가지는 상기반도체 웨이퍼 후면들의 가공 방법들 및 상기 방법들에의해 형성된 발광 소자들
JP4527197B2 (ja) * 2007-02-21 2010-08-18 パナソニック株式会社 半導体発光素子および半導体発光装置の製造方法
US8357996B2 (en) * 2009-11-17 2013-01-22 Cree, Inc. Devices with crack stops
WO2015008189A2 (en) * 2013-07-18 2015-01-22 Koninklijke Philips N.V. Dicing a wafer of light emitting devices
JP2015050390A (ja) 2013-09-03 2015-03-16 ルネサスエレクトロニクス株式会社 半導体装置
CN111223771A (zh) * 2020-03-10 2020-06-02 江苏丽隽功率半导体有限公司 一种垂直型硅基氮化镓功率器件减薄方法
CN112287543B (zh) * 2020-10-28 2024-12-06 华天科技(西安)有限公司 一种氮化镓晶圆生产工艺参数设计方法
CN113725069B (zh) * 2021-08-27 2026-05-05 华天科技(西安)有限公司 一种晶圆贴膜工艺优化方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63188808A (ja) * 1987-01-30 1988-08-04 Nec Kansai Ltd 磁気ヘツドの製造方法
JP2780618B2 (ja) * 1993-11-06 1998-07-30 日亜化学工業株式会社 窒化ガリウム系化合物半導体チップの製造方法
JP3199594B2 (ja) * 1995-02-10 2001-08-20 日亜化学工業株式会社 窒化物半導体レーザ素子の光共振面の形成方法
JPH08274371A (ja) * 1995-03-31 1996-10-18 Toyoda Gosei Co Ltd 半導体発光素子及びその製造方法
JP3250411B2 (ja) * 1995-04-07 2002-01-28 ソニー株式会社 半導体装置の製造方法
JPH1027769A (ja) * 1996-07-10 1998-01-27 Toshiba Corp 半導体チップとその製造方法
JP3604550B2 (ja) * 1997-12-16 2004-12-22 日亜化学工業株式会社 窒化物半導体素子の製造方法

Similar Documents

Publication Publication Date Title
CN101015070B (zh) 制造半导体发光器件的方法以及采用该方法制造的器件
US7169669B2 (en) Method of making thin silicon sheets for solar cells
TWI248110B (en) Semiconductor device and manufacturing method thereof
CA2432300A1 (en) Semiconductor wafer processing to increase the usable planar surface area
JP2006024914A5 (enExample)
EP1098365A3 (en) Method for manufacturing semiconductor chips
US20080258265A1 (en) Methods for forming an assembly for transfer of a useful layer
US20100102351A1 (en) Semiconductor Light Emitting Device and Method of Manufacturing the Same
WO2003065464A1 (en) Nitride semiconductor device having support substrate and its manufacturing method
CN100499072C (zh) 晶片分割方法
JP2000091636A (ja) 半導体発光素子の製法
JP2001284292A (ja) 半導体ウエハーのチップ分割方法
JP2001284291A (ja) 半導体ウエハーのチップ分割方法
JP2006344816A (ja) 半導体チップの製造方法
KR20160009554A (ko) 광전자 반도체칩을 제조하기 위한 방법
TWI327340B (en) Production method for semiconductor device
JP4872753B2 (ja) 窒化物led素子の製造方法
US7214568B2 (en) Semiconductor device configured for reducing post-fabrication damage
JPH1064854A (ja) ウェーハのカット方法
US20030203589A1 (en) Method of wafer marking for multi-layer metal processes
JP5716524B2 (ja) 発光素子の製造方法
JP2005191551A (ja) 半導体チップ製造方法および半導体チップ
JP2005044901A (ja) 半導体ウェハ分割方法
KR102501898B1 (ko) GaN 기판의 분단 방법
US20050124140A1 (en) Pre-fabrication scribing