IN2014DN06514A - - Google Patents
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- IN2014DN06514A IN2014DN06514A IN6514DEN2014A IN2014DN06514A IN 2014DN06514 A IN2014DN06514 A IN 2014DN06514A IN 6514DEN2014 A IN6514DEN2014 A IN 6514DEN2014A IN 2014DN06514 A IN2014DN06514 A IN 2014DN06514A
- Authority
- IN
- India
- Prior art keywords
- ray
- pixellated detectors
- sources
- view
- ray sources
- Prior art date
Links
- 238000003491 array Methods 0.000 abstract 1
- 238000007689 inspection Methods 0.000 abstract 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/223—Mixed interrogation beams, e.g. using more than one type of radiation beam
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/232—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays having relative motion between the source, detector and object other than by conveyor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/26—Passive interrogation, i.e. by measuring radiation emitted by objects or goods
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- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
- G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
- G21K1/043—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers changing time structure of beams by mechanical means, e.g. choppers, spinning filter wheels
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
- G01N2201/104—Mechano-optical scan, i.e. object and beam moving
- G01N2201/1047—Mechano-optical scan, i.e. object and beam moving with rotating optics and moving stage
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/03—Investigating materials by wave or particle radiation by transmission
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/70—Circuit arrangements for X-ray tubes with more than one anode; Circuit arrangements for apparatus comprising more than one X ray tube or more than one cathode
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Geophysics (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201261594625P | 2012-02-03 | 2012-02-03 | |
PCT/US2013/024191 WO2013116549A1 (en) | 2012-02-03 | 2013-01-31 | Combined scatter and transmission multi-view imaging system |
Publications (1)
Publication Number | Publication Date |
---|---|
IN2014DN06514A true IN2014DN06514A (de) | 2015-06-12 |
Family
ID=48905841
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IN6514DEN2014 IN2014DN06514A (de) | 2012-02-03 | 2013-01-31 |
Country Status (14)
Country | Link |
---|---|
US (5) | US9057679B2 (de) |
EP (3) | EP2810296A4 (de) |
JP (1) | JP6170070B2 (de) |
KR (2) | KR101997948B1 (de) |
CN (1) | CN104170051B (de) |
AU (1) | AU2013215064B2 (de) |
BR (1) | BR112014019198A2 (de) |
CA (1) | CA2863659C (de) |
GB (1) | GB2513073B (de) |
HK (1) | HK1245995A1 (de) |
IN (1) | IN2014DN06514A (de) |
MX (1) | MX340345B (de) |
PL (1) | PL3242315T3 (de) |
WO (1) | WO2013116549A1 (de) |
Families Citing this family (58)
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US9958569B2 (en) | 2002-07-23 | 2018-05-01 | Rapiscan Systems, Inc. | Mobile imaging system and method for detection of contraband |
US9069532B2 (en) | 2011-07-25 | 2015-06-30 | International Business Machines Corporation | Valve controlled, node-level vapor condensation for two-phase heat sink(s) |
CA3069211C (en) | 2011-09-07 | 2022-06-21 | Rapiscan Systems, Inc. | X-ray inspection system that integrates manifest data with imaging/detection processing |
IN2014DN06514A (de) | 2012-02-03 | 2015-06-12 | Rapiscan Systems Inc | |
US10670740B2 (en) * | 2012-02-14 | 2020-06-02 | American Science And Engineering, Inc. | Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors |
WO2013122763A1 (en) | 2012-02-14 | 2013-08-22 | American Science And Engineering, Inc. | X-ray inspection using wavelength-shifting fiber-coupled scintillation detectors |
US11756110B2 (en) * | 2012-11-30 | 2023-09-12 | Bwi Acquisition, Llc | Inspection and identification system and method |
AU2014212158B2 (en) | 2013-01-31 | 2017-04-20 | Rapiscan Systems, Inc. | Portable security inspection system |
US9778391B2 (en) * | 2013-03-15 | 2017-10-03 | Varex Imaging Corporation | Systems and methods for multi-view imaging and tomography |
US9680520B2 (en) | 2013-03-22 | 2017-06-13 | University Of Washington Through Its Center For Commercialization | Ambient backscatter tranceivers, apparatuses, systems, and methods for communicating using backscatter of ambient RF signals |
KR102049445B1 (ko) | 2013-05-31 | 2019-11-28 | 삼성디스플레이 주식회사 | 레이저 빔 조사 장치 및 이를 이용한 유기 발광 디스플레이 장치의 제조 방법 |
CN105637350A (zh) | 2013-07-23 | 2016-06-01 | 拉皮斯坎系统股份有限公司 | 用于提高物体检查的处理速度的方法 |
CN104340627B (zh) * | 2013-07-23 | 2017-03-01 | 同方威视技术股份有限公司 | 车辆拖动装置、车辆双模式通过系统和检查系统 |
RO130582B1 (ro) * | 2014-01-23 | 2021-12-30 | Mb Telecom Ltd. S.R.L. | Sistem şi metodă pentru inspecţia completă şi neintruzivă a aeronavelor |
CN103852797A (zh) * | 2014-02-08 | 2014-06-11 | 东莞市二郎神影像设备有限公司 | 一种探测器 |
US10382161B2 (en) | 2014-02-11 | 2019-08-13 | University Of Washington | Wireless networking communication methods, systems, and devices operable using harvested power |
US9973367B2 (en) | 2014-02-11 | 2018-05-15 | University Of Washington | Apparatuses, systems, and methods for communicating using MIMO and spread spectrum coding in backscatter of ambient signals |
US10228487B2 (en) | 2014-06-30 | 2019-03-12 | American Science And Engineering, Inc. | Rapidly relocatable modular cargo container scanner |
US9594033B2 (en) * | 2014-07-22 | 2017-03-14 | The Boeing Company | Visible X-ray indication and detection system for X-ray backscatter applications |
CN105438755A (zh) * | 2014-08-22 | 2016-03-30 | 清华大学 | 车辆拖动系统和车辆检查系统 |
US10079616B2 (en) | 2014-12-19 | 2018-09-18 | University Of Washington | Devices and methods for backscatter communication using one or more wireless communication protocols including bluetooth low energy examples |
WO2016154044A1 (en) | 2015-03-20 | 2016-09-29 | Rapiscan Systems, Inc. | Hand-held portable backscatter inspection system |
CN108141646B (zh) | 2015-08-12 | 2021-09-21 | 华盛顿大学 | 反向散射装置及结合反向散射装置的网络系统 |
KR20180041763A (ko) | 2015-09-10 | 2018-04-24 | 아메리칸 사이언스 앤 엔지니어링, 인크. | 선형 적응적 전자기 x-선 스캐닝을 이용한 후방산란 특성화 |
US10345479B2 (en) | 2015-09-16 | 2019-07-09 | Rapiscan Systems, Inc. | Portable X-ray scanner |
CN108496094B (zh) | 2016-01-26 | 2023-04-28 | 华盛顿大学 | 包含单边带操作的实例的反向散射装置 |
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EP3440454A4 (de) | 2016-04-04 | 2019-12-18 | The University of Washington | Rückstreuvorrichtungen und systeme zur bereitstellung von rückstreusignalen mit ofdm-paketen |
WO2018036265A1 (zh) * | 2016-08-25 | 2018-03-01 | 北京华力兴科技发展有限责任公司 | 一种用于车辆安全检查的成像装置及其方法 |
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US10812130B2 (en) | 2016-10-18 | 2020-10-20 | University Of Washington | Backscatter systems, devices, and techniques utilizing CSS modulation and/or higher order harmonic cancellation |
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CN110199373B (zh) | 2017-01-31 | 2021-09-28 | 拉皮斯坎系统股份有限公司 | 大功率x射线源与操作方法 |
CN106841256B (zh) * | 2017-02-17 | 2023-11-21 | 清华大学 | 多视角背散射检查系统和多视角背散射检查方法 |
US10461783B2 (en) | 2017-03-16 | 2019-10-29 | University Of Washington | Radio frequency communication devices having backscatter and non-backscatter communication modes and hardware re-use |
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CN101413905B (zh) * | 2008-10-10 | 2011-03-16 | 深圳大学 | X射线微分干涉相衬成像系统 |
US8300763B2 (en) * | 2009-07-24 | 2012-10-30 | Nucsafe, Inc. | Spatial sequenced backscatter portal |
PL2526410T3 (pl) * | 2010-01-19 | 2022-02-21 | Rapiscan Systems, Inc. | Skaner wielowidokowy do ładunków |
IN2014DN06514A (de) * | 2012-02-03 | 2015-06-12 | Rapiscan Systems Inc |
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2013
- 2013-01-31 IN IN6514DEN2014 patent/IN2014DN06514A/en unknown
- 2013-01-31 KR KR1020147021843A patent/KR101997948B1/ko active IP Right Grant
- 2013-01-31 KR KR1020197019150A patent/KR102065318B1/ko active IP Right Grant
- 2013-01-31 EP EP13743168.0A patent/EP2810296A4/de not_active Withdrawn
- 2013-01-31 CA CA2863659A patent/CA2863659C/en active Active
- 2013-01-31 JP JP2014555714A patent/JP6170070B2/ja active Active
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- 2013-01-31 WO PCT/US2013/024191 patent/WO2013116549A1/en active Application Filing
- 2013-01-31 EP EP17175557.2A patent/EP3242315B1/de active Active
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- 2013-01-31 MX MX2014009412A patent/MX340345B/es active IP Right Grant
- 2013-01-31 CN CN201380014384.6A patent/CN104170051B/zh active Active
- 2013-01-31 BR BR112014019198-0A patent/BR112014019198A2/pt not_active Application Discontinuation
- 2013-01-31 EP EP18161030.4A patent/EP3358597A1/de active Pending
- 2013-01-31 PL PL17175557.2T patent/PL3242315T3/pl unknown
- 2013-01-31 US US13/756,211 patent/US9057679B2/en active Active
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