IN2014DN01848A - - Google Patents
Info
- Publication number
- IN2014DN01848A IN2014DN01848A IN1848DEN2014A IN2014DN01848A IN 2014DN01848 A IN2014DN01848 A IN 2014DN01848A IN 1848DEN2014 A IN1848DEN2014 A IN 1848DEN2014A IN 2014DN01848 A IN2014DN01848 A IN 2014DN01848A
- Authority
- IN
- India
- Prior art keywords
- sample
- biosample
- thin film
- electron microscope
- electron
- Prior art date
Links
- 238000000034 method Methods 0.000 abstract 3
- 239000010409 thin film Substances 0.000 abstract 3
- 230000008020 evaporation Effects 0.000 abstract 2
- 238000001704 evaporation Methods 0.000 abstract 2
- 230000005764 inhibitory process Effects 0.000 abstract 2
- 230000005540 biological transmission Effects 0.000 abstract 1
- 150000001875 compounds Chemical class 0.000 abstract 1
- 238000001493 electron microscopy Methods 0.000 abstract 1
- 239000004615 ingredient Substances 0.000 abstract 1
- 239000002608 ionic liquid Substances 0.000 abstract 1
- 235000014593 oils and fats Nutrition 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
- G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
- G01N23/2252—Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/2853—Shadowing samples
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/44—Sample treatment involving radiation, e.g. heat
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/612—Specific applications or type of materials biological material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
- H01J2237/2002—Controlling environment of sample
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
- H01J2237/2002—Controlling environment of sample
- H01J2237/2003—Environmental cells
- H01J2237/2004—Biological samples
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011197685 | 2011-09-09 | ||
| JP2012044383 | 2012-02-29 | ||
| PCT/JP2012/072982 WO2013035866A1 (ja) | 2011-09-09 | 2012-09-07 | 生物試料をそのままの姿で観察するための電子顕微鏡による観察方法とそれに用いられる真空下での蒸発抑制用組成物、走査型電子顕微鏡および透過型電子顕微鏡 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IN2014DN01848A true IN2014DN01848A (enrdf_load_html_response) | 2015-05-15 |
Family
ID=47832305
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IN1848DEN2014 IN2014DN01848A (enrdf_load_html_response) | 2011-09-09 | 2012-09-07 |
Country Status (7)
Families Citing this family (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5922908B2 (ja) * | 2011-10-27 | 2016-05-24 | 富士フイルム株式会社 | 硬化物の製造方法および硬化物 |
| US10128078B2 (en) | 2014-01-29 | 2018-11-13 | Japan Science And Technology Agency | Protective agent for electron microscopic observation of biological sample in water-containing state, kit for electron microscopic observation, methods for observation, diagnosis, evaluation, and quantification by electron microscope, and sample stage |
| JP6496184B2 (ja) * | 2014-06-27 | 2019-04-03 | 日本電子株式会社 | 試料導入方法、試料ステージ、および荷電粒子線装置 |
| KR101792832B1 (ko) * | 2014-10-29 | 2017-11-20 | 충남대학교산학협력단 | 기-액 계면 플라즈마 중합에 의한 고분자 박막의 제조방법 및 이에 의해 제조된 고분자 박막 |
| JP6569151B2 (ja) * | 2015-02-25 | 2019-09-04 | 学校法人日本大学 | イオン液体を用いた透過型電子顕微鏡による錯体の観察方法及び観察用試料 |
| CN104908063A (zh) * | 2015-06-24 | 2015-09-16 | 中山安荞生物科技有限公司 | 一种真空手套箱 |
| DE102016202379A1 (de) * | 2016-02-17 | 2017-08-17 | Carl Zeiss Microscopy Gmbh | Verfahren zur Präparation von Objekten für Untersuchungen mit geladenen Teilchenstrahlen |
| TWI594288B (zh) * | 2016-03-14 | 2017-08-01 | 台灣電鏡儀器股份有限公司 | 電子顯微鏡 |
| EP3509651B1 (en) | 2016-09-06 | 2022-12-28 | Miromatrix Medical Inc. | Use of resected liver serum for whole liver engineering |
| JP2018078028A (ja) * | 2016-11-09 | 2018-05-17 | 株式会社メルビル | 試料ホルダー |
| CN107860783B (zh) * | 2017-10-23 | 2019-09-24 | 中国科学院化学研究所 | Xps进样装置 |
| JP7001425B2 (ja) * | 2017-10-26 | 2022-01-19 | シンフォニアテクノロジー株式会社 | マウンタ用エア制御装置 |
| EP3737927B1 (en) * | 2018-01-10 | 2023-09-20 | University Of Kansas | Conductive fixation for electron microscopy |
| CN110243640B (zh) * | 2018-03-08 | 2022-01-25 | 中国科学院海洋研究所 | 深海有孔虫的内腔磨片快速制备方法 |
| CN108802080A (zh) * | 2018-08-16 | 2018-11-13 | 扬州大学 | 一种玉米成熟种子中胚乳淀粉生长环的原位观察方法 |
| AU2020241583A1 (en) * | 2019-03-21 | 2021-10-14 | Miromatrix Medical Inc. | Improved decellularization of isolated organs |
| CN109916942B (zh) * | 2019-04-18 | 2021-09-21 | 攀钢集团攀枝花钢铁研究院有限公司 | 捕收剂的电子显微镜表征方法 |
| CN110441084A (zh) * | 2019-09-04 | 2019-11-12 | 海南省农业科学院热带果树研究所 | 一种菠萝蜜果肉的冰冻切片方法 |
| WO2021070338A1 (ja) * | 2019-10-10 | 2021-04-15 | 株式会社日立ハイテク | 荷電粒子線装置 |
| WO2021256412A1 (ja) | 2020-06-16 | 2021-12-23 | 学校法人中部大学 | 走査型電子顕微鏡を用いた観察方法、及びそのための試料ホルダ |
| CN111855507A (zh) * | 2020-07-17 | 2020-10-30 | 北方民族大学 | 一种空气颗粒物的检测装置及检测方法 |
| JP7665174B2 (ja) * | 2020-09-26 | 2025-04-21 | ＮａｎｏＳｕｉｔ株式会社 | 食品のコーティング方法及びコーティング装置 |
| CN112611775B (zh) * | 2020-12-16 | 2023-08-11 | 聚束科技（北京）有限公司 | 一种用于观察生物组织的方法及电子显微镜 |
| KR102740532B1 (ko) | 2021-11-03 | 2024-12-16 | 대한민국 | 스마트 온실 로봇을 위한 농약 자동 공급 장치 및 그 동작 방법 |
| JP7685158B2 (ja) * | 2022-01-28 | 2025-05-30 | 国立大学法人千葉大学 | 被覆装置、被覆方法 |
| CN114773216A (zh) * | 2022-03-24 | 2022-07-22 | 天津大学 | 一种l-亮氨酸球形晶体及其制备方法和应用 |
| CN116396809A (zh) * | 2023-03-30 | 2023-07-07 | 橙的(福建)卫生用品有限责任公司 | 一种厨房湿巾的制备方法 |
| CN118330207B (zh) * | 2024-06-12 | 2024-08-09 | 成都海默云因医学检验实验室有限公司 | 一种改善固定细胞免疫荧光法中荧光背景的固定剂及其固定细胞的方法 |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57147857A (en) * | 1981-03-06 | 1982-09-11 | Koichi Kanetani | Sample observation through scanning electron microscope |
| JPS612250A (ja) * | 1984-06-15 | 1986-01-08 | Hitachi Ltd | 走査電子顕微鏡およびその類似装置における試料導入装置 |
| JPS6188442A (ja) * | 1984-10-05 | 1986-05-06 | Hitachi Ltd | イオンビ−ム照射装置 |
| JPS6176676U (enrdf_load_html_response) * | 1984-10-25 | 1986-05-23 | ||
| JPS6378116A (ja) | 1986-09-22 | 1988-04-08 | Mitsubishi Electric Corp | 広帯域光学撮像装置 |
| JPH01197626A (ja) * | 1988-02-02 | 1989-08-09 | Ushio Inc | 封入検鏡試料の作製方法 |
| JPH0621165Y2 (ja) * | 1988-06-13 | 1994-06-01 | 株式会社エイコー・エンジニアリング | 電子顕微鏡用試料凍結乾燥装置 |
| JPH04106853A (ja) * | 1990-08-28 | 1992-04-08 | Jeol Ltd | 走査電子顕微鏡 |
| JPH078116A (ja) | 1993-06-29 | 1995-01-13 | Kubota Corp | 育苗箱構造 |
| JPH1012173A (ja) * | 1996-06-20 | 1998-01-16 | Hitachi Ltd | 電子顕微鏡の汚染防止システム |
| JPH10134751A (ja) * | 1996-10-29 | 1998-05-22 | Nikon Corp | 環境制御型の走査型電子顕微鏡 |
| JP3019038B2 (ja) * | 1997-09-17 | 2000-03-13 | 日本電気株式会社 | 半導体装置 |
| JP2001153760A (ja) * | 1999-11-30 | 2001-06-08 | Shimadzu Corp | 搬送用試料容器 |
| JP2003203595A (ja) * | 2002-01-08 | 2003-07-18 | Jeol Ltd | 電子顕微鏡 |
| JP3946602B2 (ja) * | 2002-09-03 | 2007-07-18 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置 |
| JP2005026530A (ja) * | 2003-07-04 | 2005-01-27 | Jeol Ltd | 試料ホルダ移動機構及び真空装置並びに荷電粒子ビーム装置 |
| DE10344492B4 (de) * | 2003-09-24 | 2006-09-07 | Carl Zeiss Nts Gmbh | Teilchenstrahlgerät |
| JP2005285485A (ja) * | 2004-03-29 | 2005-10-13 | Toudai Tlo Ltd | プラズマ発生装置及び低真空走査電子顕微鏡 |
| JP4004490B2 (ja) * | 2004-07-22 | 2007-11-07 | 株式会社トプコン | 走査型電子顕微鏡装置 |
| EP3078962B1 (en) | 2006-01-20 | 2018-06-27 | Hitachi High-Technologies Corporation | Liquid medium for preventing charge-up in electron microscope and method of observing sample using the same |
| JP5226378B2 (ja) * | 2008-04-28 | 2013-07-03 | 株式会社日立ハイテクノロジーズ | 透過型電子顕微鏡、及び試料観察方法 |
| JP2010002300A (ja) * | 2008-06-20 | 2010-01-07 | Jeol Ltd | 試料保持体、試料検査装置及び試料検査方法 |
| JP2010025656A (ja) * | 2008-07-17 | 2010-02-04 | Jeol Ltd | イオン液体を用いた試料の処理方法及び処理システム |
| JP4799690B2 (ja) | 2009-12-01 | 2011-10-26 | 国立大学法人北海道大学 | 電子顕微鏡による試料観察用の液状媒体とそれを用いた電子顕微鏡による試料観察方法 |
| JP5422416B2 (ja) * | 2010-01-28 | 2014-02-19 | 株式会社日立製作所 | 試料搬送装置 |
-
2012
- 2012-09-07 IN IN1848DEN2014 patent/IN2014DN01848A/en unknown
- 2012-09-07 CN CN201280044046.2A patent/CN103843106B/zh active Active
- 2012-09-07 EP EP12829935.1A patent/EP2755225B1/en active Active
- 2012-09-07 KR KR1020147006126A patent/KR101650054B1/ko active Active
- 2012-09-07 WO PCT/JP2012/072982 patent/WO2013035866A1/ja active Application Filing
- 2012-09-07 US US14/343,537 patent/US9557253B2/en active Active
- 2012-09-07 JP JP2013532684A patent/JP6055766B2/ja active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN103843106B (zh) | 2016-12-07 |
| KR20140074287A (ko) | 2014-06-17 |
| US20140227734A1 (en) | 2014-08-14 |
| US9557253B2 (en) | 2017-01-31 |
| EP2755225A1 (en) | 2014-07-16 |
| CN103843106A (zh) | 2014-06-04 |
| EP2755225A4 (en) | 2015-08-05 |
| WO2013035866A1 (ja) | 2013-03-14 |
| JPWO2013035866A1 (ja) | 2015-03-23 |
| KR101650054B1 (ko) | 2016-08-22 |
| JP6055766B2 (ja) | 2016-12-27 |
| EP2755225B1 (en) | 2017-05-10 |
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