IN2014DE02511A - - Google Patents

Info

Publication number
IN2014DE02511A
IN2014DE02511A IN2511DE2014A IN2014DE02511A IN 2014DE02511 A IN2014DE02511 A IN 2014DE02511A IN 2511DE2014 A IN2511DE2014 A IN 2511DE2014A IN 2014DE02511 A IN2014DE02511 A IN 2014DE02511A
Authority
IN
India
Prior art keywords
state
output
predetermined timing
interruption
signal
Prior art date
Application number
Other languages
English (en)
Inventor
Mouri Fumitaka
Toko Makoto
Nakatani Hiroshi
Ohnishi Naoya
Nojima Akira
Original Assignee
Toshiba Kk
Toshiba Mitsubishi Elec Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Kk, Toshiba Mitsubishi Elec Inc filed Critical Toshiba Kk
Publication of IN2014DE02511A publication Critical patent/IN2014DE02511A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
    • G05B19/0423—Input/output
    • G05B19/0425—Safety, monitoring

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Electronic Switches (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Power Conversion In General (AREA)
IN2511DE2014 2013-09-18 2014-09-02 IN2014DE02511A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013193473A JP6121853B2 (ja) 2013-09-18 2013-09-18 出力装置およびその診断方法

Publications (1)

Publication Number Publication Date
IN2014DE02511A true IN2014DE02511A (ja) 2015-06-26

Family

ID=52668658

Family Applications (1)

Application Number Title Priority Date Filing Date
IN2511DE2014 IN2014DE02511A (ja) 2013-09-18 2014-09-02

Country Status (5)

Country Link
US (1) US20150081041A1 (ja)
JP (1) JP6121853B2 (ja)
KR (1) KR101560493B1 (ja)
CN (1) CN104460405B (ja)
IN (1) IN2014DE02511A (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11175638B2 (en) * 2015-11-09 2021-11-16 Otis Elevator Company Self-diagnostic electrical circuit
CN110376932B (zh) * 2018-04-13 2021-05-07 沈阳中科博微科技股份有限公司 一种高诊断覆盖率的功能安全开关量输出模块
CN111775978B (zh) * 2020-06-25 2023-03-10 中车永济电机有限公司 机车牵引控制单元的安全架构

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000148241A (ja) 1998-11-09 2000-05-26 Mitsubishi Electric Corp 故障警報装置
JP3630583B2 (ja) * 1999-04-14 2005-03-16 株式会社日立製作所 フェールセーフスイッチのオンライン診断方法および装置
DE10043483A1 (de) * 2000-09-04 2002-07-25 Infineon Technologies Ag Optisches Sendemodul
JP2002082714A (ja) * 2000-09-08 2002-03-22 Tokyo Electron Ltd 入出力回路系の自己診断回路
CN1257411C (zh) * 2002-06-14 2006-05-24 三菱电机株式会社 车载电气负载驱动系统的异常检测装置
JP4266358B2 (ja) * 2004-04-12 2009-05-20 三菱電機株式会社 車載電子制御装置
KR100714482B1 (ko) * 2005-07-11 2007-05-04 삼성전자주식회사 반도체 장치, 테스트 기판, 반도체 장치의 테스트 시스템및 반도체 장치의 테스트 방법
US7502974B2 (en) * 2006-02-22 2009-03-10 Verigy (Singapore) Pte. Ltd. Method and apparatus for determining which timing sets to pre-load into the pin electronics of a circuit test system, and for pre-loading or storing said timing sets
JP4584223B2 (ja) 2006-09-27 2010-11-17 日本制禦機器株式会社 監視装置
US20090085598A1 (en) * 2007-09-28 2009-04-02 Qimonda Ag Integrated circuit test system and method with test driver sharing
JP5397604B2 (ja) 2009-05-27 2014-01-22 横河電機株式会社 デジタル出力モジュール
JP5020307B2 (ja) * 2009-12-07 2012-09-05 三菱電機株式会社 電気負荷の駆動制御装置
JP5404437B2 (ja) * 2010-01-13 2014-01-29 株式会社東芝 安全出力装置
JP5740791B2 (ja) * 2011-04-15 2015-07-01 横河電機株式会社 ディジタル出力回路
JP2013054427A (ja) * 2011-09-01 2013-03-21 Toshiba Corp 診断付き出力装置

Also Published As

Publication number Publication date
JP6121853B2 (ja) 2017-04-26
CN104460405B (zh) 2017-04-12
KR20150032474A (ko) 2015-03-26
CN104460405A (zh) 2015-03-25
KR101560493B1 (ko) 2015-10-14
US20150081041A1 (en) 2015-03-19
JP2015060398A (ja) 2015-03-30

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