IN2014CN04514A - - Google Patents
Info
- Publication number
- IN2014CN04514A IN2014CN04514A IN4514CHN2014A IN2014CN04514A IN 2014CN04514 A IN2014CN04514 A IN 2014CN04514A IN 4514CHN2014 A IN4514CHN2014 A IN 4514CHN2014A IN 2014CN04514 A IN2014CN04514 A IN 2014CN04514A
- Authority
- IN
- India
- Prior art keywords
- scintillation light
- detection apparatus
- detection
- detected
- detecting
- Prior art date
Links
- 238000001514 detection method Methods 0.000 abstract 7
- 238000000034 method Methods 0.000 abstract 2
- 230000005855 radiation Effects 0.000 abstract 2
- 238000002591 computed tomography Methods 0.000 abstract 1
- 238000001914 filtration Methods 0.000 abstract 1
- 230000003287 optical effect Effects 0.000 abstract 1
- 230000002123 temporal effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2002—Optical details, e.g. reflecting or diffusing layers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20181—Stacked detectors, e.g. for measuring energy and positional information
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Measurement Of Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161566752P | 2011-12-05 | 2011-12-05 | |
| PCT/IB2012/056684 WO2013084106A2 (en) | 2011-12-05 | 2012-11-23 | Detection apparatus for detecting radiation |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IN2014CN04514A true IN2014CN04514A (enExample) | 2015-09-11 |
Family
ID=47599134
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IN4514CHN2014 IN2014CN04514A (enExample) | 2011-12-05 | 2012-11-23 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US9958554B2 (enExample) |
| EP (1) | EP2748637B1 (enExample) |
| JP (1) | JP6291416B2 (enExample) |
| CN (1) | CN103988095B (enExample) |
| BR (1) | BR112014013362A2 (enExample) |
| IN (1) | IN2014CN04514A (enExample) |
| RU (1) | RU2607719C2 (enExample) |
| WO (1) | WO2013084106A2 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI531233B (zh) * | 2012-12-13 | 2016-04-21 | 財團法人工業技術研究院 | 感測裝置及其像素結構 |
| WO2015028042A1 (en) * | 2013-08-26 | 2015-03-05 | Teledyne Dalsa B.V. | A radiation detector and a method thereof |
| US20150092912A1 (en) * | 2013-10-02 | 2015-04-02 | General Electric Company | Systems and methods for filtering emissions from scintillators |
| US11156727B2 (en) * | 2015-10-02 | 2021-10-26 | Varian Medical Systems, Inc. | High DQE imaging device |
| JP7661243B2 (ja) * | 2020-01-15 | 2025-04-14 | 株式会社小糸製作所 | シンチレータおよびシンチレータの製造方法 |
| CN111190216B (zh) * | 2020-01-23 | 2023-03-24 | 中国工程物理研究院激光聚变研究中心 | 一种辐射流探测器阵列 |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3002571B2 (ja) * | 1991-08-13 | 2000-01-24 | 株式会社日立製作所 | 放射線検出器 |
| JPH0784054A (ja) * | 1993-09-16 | 1995-03-31 | Toshiba Corp | 放射線検出器および放射線測定装置 |
| JP3302463B2 (ja) * | 1993-09-20 | 2002-07-15 | 富士写真フイルム株式会社 | 放射線検出器およびその使用方法 |
| EP0746778A1 (en) | 1994-02-25 | 1996-12-11 | Massachusetts Institute Of Technology | Methods and apparatus for detecting and imaging particles |
| JPH09152485A (ja) * | 1995-11-30 | 1997-06-10 | Hitachi Metals Ltd | 放射線検出器 |
| US6031234A (en) * | 1997-12-08 | 2000-02-29 | General Electric Company | High resolution radiation imager |
| EP1016881B1 (en) * | 1998-12-28 | 2005-12-21 | Kabushiki Kaisha Toshiba | Radiation detecting apparatus |
| JP4303393B2 (ja) | 2000-03-10 | 2009-07-29 | 富士通株式会社 | 分光強度分布測定方法および分光強度分布測定装置 |
| JP4274839B2 (ja) * | 2002-06-04 | 2009-06-10 | 株式会社日立メディコ | Ｘ線検出器用シンチレータ、その製造方法並びにそれを用いたｘ線検出器及びｘ線ｃｔ装置 |
| JP4451112B2 (ja) * | 2003-10-24 | 2010-04-14 | 株式会社日立メディコ | 放射線検出器及びそれを用いた放射線画像診断装置 |
| US7138633B1 (en) * | 2004-01-23 | 2006-11-21 | Saint-Gobain Ceramics & Plastics, Inc. | Apparatus employing a filtered scintillator and method of using same |
| US7388208B2 (en) | 2006-01-11 | 2008-06-17 | Ruvin Deych | Dual energy x-ray detector |
| JP2010515075A (ja) * | 2007-01-05 | 2010-05-06 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 高速放射線検出器 |
| JP5045468B2 (ja) | 2008-02-01 | 2012-10-10 | 株式会社アドヴィックス | 制動制御装置 |
| US8492724B2 (en) * | 2008-08-07 | 2013-07-23 | Koninklijke Philips Electronics N.V. | Scintillating material and related spectral filter |
| US20100072376A1 (en) * | 2008-09-22 | 2010-03-25 | Koninklijke Philips Electronics N.V. | Spectral filter for use with lutetium-based scintillators |
| RU2407437C2 (ru) * | 2009-01-22 | 2010-12-27 | Общество с ограниченной ответственностью "Унискан" | Способ регистрации рентгеновского изображения объекта в различных диапазонах спектра рентгеновского излучения |
| US8363917B2 (en) | 2009-10-14 | 2013-01-29 | General Electric Company | System and method of image artifact reduction in fast kVp switching CT |
| DE202012012506U1 (de) * | 2011-02-11 | 2013-03-22 | Koninklijke Philips Electronics N.V. | Verbesserte SPECT-Bewegungskorrektur |
| JP5911274B2 (ja) * | 2011-11-28 | 2016-04-27 | キヤノン株式会社 | 放射線検出装置及び放射線撮像システム |
-
2012
- 2012-11-23 JP JP2014545399A patent/JP6291416B2/ja not_active Expired - Fee Related
- 2012-11-23 BR BR112014013362A patent/BR112014013362A2/pt not_active IP Right Cessation
- 2012-11-23 RU RU2014124932A patent/RU2607719C2/ru not_active IP Right Cessation
- 2012-11-23 US US14/359,337 patent/US9958554B2/en active Active
- 2012-11-23 CN CN201280059842.3A patent/CN103988095B/zh not_active Expired - Fee Related
- 2012-11-23 IN IN4514CHN2014 patent/IN2014CN04514A/en unknown
- 2012-11-23 EP EP12816790.5A patent/EP2748637B1/en not_active Not-in-force
- 2012-11-23 WO PCT/IB2012/056684 patent/WO2013084106A2/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| CN103988095A (zh) | 2014-08-13 |
| JP6291416B2 (ja) | 2018-03-14 |
| US20140321617A1 (en) | 2014-10-30 |
| EP2748637A2 (en) | 2014-07-02 |
| JP2015505038A (ja) | 2015-02-16 |
| RU2014124932A (ru) | 2016-02-10 |
| CN103988095B (zh) | 2018-04-06 |
| EP2748637B1 (en) | 2016-10-26 |
| WO2013084106A3 (en) | 2013-11-21 |
| RU2607719C2 (ru) | 2017-01-10 |
| BR112014013362A2 (pt) | 2017-06-13 |
| US9958554B2 (en) | 2018-05-01 |
| WO2013084106A2 (en) | 2013-06-13 |
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