RU2607719C2 - Устройство обнаружения для обнаружения излучения - Google Patents

Устройство обнаружения для обнаружения излучения Download PDF

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Publication number
RU2607719C2
RU2607719C2 RU2014124932A RU2014124932A RU2607719C2 RU 2607719 C2 RU2607719 C2 RU 2607719C2 RU 2014124932 A RU2014124932 A RU 2014124932A RU 2014124932 A RU2014124932 A RU 2014124932A RU 2607719 C2 RU2607719 C2 RU 2607719C2
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RU
Russia
Prior art keywords
radiation
optical filter
scintillation light
detection device
detection
Prior art date
Application number
RU2014124932A
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English (en)
Russian (ru)
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RU2014124932A (ru
Inventor
Корнелис Рейндер РОНДА
Роланд ПРОКСА
Аксель ТРАН
Original Assignee
Конинклейке Филипс Н.В.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by Конинклейке Филипс Н.В. filed Critical Конинклейке Филипс Н.В.
Publication of RU2014124932A publication Critical patent/RU2014124932A/ru
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Publication of RU2607719C2 publication Critical patent/RU2607719C2/ru

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2002—Optical details, e.g. reflecting or diffusing layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20181—Stacked detectors, e.g. for measuring energy and positional information
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
RU2014124932A 2011-12-05 2012-11-23 Устройство обнаружения для обнаружения излучения RU2607719C2 (ru)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161566752P 2011-12-05 2011-12-05
US61/566,752 2011-12-05
PCT/IB2012/056684 WO2013084106A2 (en) 2011-12-05 2012-11-23 Detection apparatus for detecting radiation

Publications (2)

Publication Number Publication Date
RU2014124932A RU2014124932A (ru) 2016-02-10
RU2607719C2 true RU2607719C2 (ru) 2017-01-10

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Family Applications (1)

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RU2014124932A RU2607719C2 (ru) 2011-12-05 2012-11-23 Устройство обнаружения для обнаружения излучения

Country Status (8)

Country Link
US (1) US9958554B2 (enExample)
EP (1) EP2748637B1 (enExample)
JP (1) JP6291416B2 (enExample)
CN (1) CN103988095B (enExample)
BR (1) BR112014013362A2 (enExample)
IN (1) IN2014CN04514A (enExample)
RU (1) RU2607719C2 (enExample)
WO (1) WO2013084106A2 (enExample)

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TWI531233B (zh) * 2012-12-13 2016-04-21 財團法人工業技術研究院 感測裝置及其像素結構
WO2015028042A1 (en) * 2013-08-26 2015-03-05 Teledyne Dalsa B.V. A radiation detector and a method thereof
US20150092912A1 (en) * 2013-10-02 2015-04-02 General Electric Company Systems and methods for filtering emissions from scintillators
US11156727B2 (en) * 2015-10-02 2021-10-26 Varian Medical Systems, Inc. High DQE imaging device
JP7661243B2 (ja) * 2020-01-15 2025-04-14 株式会社小糸製作所 シンチレータおよびシンチレータの製造方法
CN111190216B (zh) * 2020-01-23 2023-03-24 中国工程物理研究院激光聚变研究中心 一种辐射流探测器阵列

Citations (4)

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WO1995023348A1 (en) * 1994-02-25 1995-08-31 Massachusetts Institute Of Technology Methods and apparatus for detecting and imaging particles
US20010024274A1 (en) * 2000-03-10 2001-09-27 Fujitsu Limited Method and apparatus for measuring spectral irradiance distribution
WO2010015955A2 (en) * 2008-08-07 2010-02-11 Koninklijke Philips Electronics N.V. Scintillating material and related spectral filter
RU2407437C2 (ru) * 2009-01-22 2010-12-27 Общество с ограниченной ответственностью "Унискан" Способ регистрации рентгеновского изображения объекта в различных диапазонах спектра рентгеновского излучения

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JP3002571B2 (ja) * 1991-08-13 2000-01-24 株式会社日立製作所 放射線検出器
JPH0784054A (ja) * 1993-09-16 1995-03-31 Toshiba Corp 放射線検出器および放射線測定装置
JP3302463B2 (ja) * 1993-09-20 2002-07-15 富士写真フイルム株式会社 放射線検出器およびその使用方法
JPH09152485A (ja) * 1995-11-30 1997-06-10 Hitachi Metals Ltd 放射線検出器
US6031234A (en) * 1997-12-08 2000-02-29 General Electric Company High resolution radiation imager
EP1016881B1 (en) * 1998-12-28 2005-12-21 Kabushiki Kaisha Toshiba Radiation detecting apparatus
JP4274839B2 (ja) * 2002-06-04 2009-06-10 株式会社日立メディコ Ｘ線検出器用シンチレータ、その製造方法並びにそれを用いたｘ線検出器及びｘ線ｃｔ装置
JP4451112B2 (ja) * 2003-10-24 2010-04-14 株式会社日立メディコ 放射線検出器及びそれを用いた放射線画像診断装置
US7138633B1 (en) * 2004-01-23 2006-11-21 Saint-Gobain Ceramics & Plastics, Inc. Apparatus employing a filtered scintillator and method of using same
US7388208B2 (en) 2006-01-11 2008-06-17 Ruvin Deych Dual energy x-ray detector
JP2010515075A (ja) * 2007-01-05 2010-05-06 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 高速放射線検出器
JP5045468B2 (ja) 2008-02-01 2012-10-10 株式会社アドヴィックス 制動制御装置
US20100072376A1 (en) * 2008-09-22 2010-03-25 Koninklijke Philips Electronics N.V. Spectral filter for use with lutetium-based scintillators
US8363917B2 (en) 2009-10-14 2013-01-29 General Electric Company System and method of image artifact reduction in fast kVp switching CT
DE202012012506U1 (de) * 2011-02-11 2013-03-22 Koninklijke Philips Electronics N.V. Verbesserte SPECT-Bewegungskorrektur
JP5911274B2 (ja) * 2011-11-28 2016-04-27 キヤノン株式会社 放射線検出装置及び放射線撮像システム

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1995023348A1 (en) * 1994-02-25 1995-08-31 Massachusetts Institute Of Technology Methods and apparatus for detecting and imaging particles
US20010024274A1 (en) * 2000-03-10 2001-09-27 Fujitsu Limited Method and apparatus for measuring spectral irradiance distribution
WO2010015955A2 (en) * 2008-08-07 2010-02-11 Koninklijke Philips Electronics N.V. Scintillating material and related spectral filter
RU2407437C2 (ru) * 2009-01-22 2010-12-27 Общество с ограниченной ответственностью "Унискан" Способ регистрации рентгеновского изображения объекта в различных диапазонах спектра рентгеновского излучения

Also Published As

Publication number Publication date
CN103988095A (zh) 2014-08-13
JP6291416B2 (ja) 2018-03-14
US20140321617A1 (en) 2014-10-30
EP2748637A2 (en) 2014-07-02
JP2015505038A (ja) 2015-02-16
RU2014124932A (ru) 2016-02-10
CN103988095B (zh) 2018-04-06
EP2748637B1 (en) 2016-10-26
WO2013084106A3 (en) 2013-11-21
BR112014013362A2 (pt) 2017-06-13
US9958554B2 (en) 2018-05-01
WO2013084106A2 (en) 2013-06-13
IN2014CN04514A (enExample) 2015-09-11

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Effective date: 20171124