JP6291416B2 - 放射線を検出する検出装置 - Google Patents

放射線を検出する検出装置 Download PDF

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Publication number
JP6291416B2
JP6291416B2 JP2014545399A JP2014545399A JP6291416B2 JP 6291416 B2 JP6291416 B2 JP 6291416B2 JP 2014545399 A JP2014545399 A JP 2014545399A JP 2014545399 A JP2014545399 A JP 2014545399A JP 6291416 B2 JP6291416 B2 JP 6291416B2
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Japan
Prior art keywords
radiation
light
optical filter
scintillation light
detection
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JP2014545399A
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English (en)
Japanese (ja)
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JP2015505038A (ja
JP2015505038A5 (enExample
Inventor
レインデル ロンダ，コルネリス
レインデル ロンダ，コルネリス
プロクサ，ロラント
トラン，アクセル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
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Koninklijke Philips NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2002—Optical details, e.g. reflecting or diffusing layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20181—Stacked detectors, e.g. for measuring energy and positional information
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2014545399A 2011-12-05 2012-11-23 放射線を検出する検出装置 Expired - Fee Related JP6291416B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161566752P 2011-12-05 2011-12-05
US61/566,752 2011-12-05
PCT/IB2012/056684 WO2013084106A2 (en) 2011-12-05 2012-11-23 Detection apparatus for detecting radiation

Publications (3)

Publication Number Publication Date
JP2015505038A JP2015505038A (ja) 2015-02-16
JP2015505038A5 JP2015505038A5 (enExample) 2015-12-17
JP6291416B2 true JP6291416B2 (ja) 2018-03-14

Family

ID=47599134

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014545399A Expired - Fee Related JP6291416B2 (ja) 2011-12-05 2012-11-23 放射線を検出する検出装置

Country Status (8)

Country Link
US (1) US9958554B2 (enExample)
EP (1) EP2748637B1 (enExample)
JP (1) JP6291416B2 (enExample)
CN (1) CN103988095B (enExample)
BR (1) BR112014013362A2 (enExample)
IN (1) IN2014CN04514A (enExample)
RU (1) RU2607719C2 (enExample)
WO (1) WO2013084106A2 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI531233B (zh) * 2012-12-13 2016-04-21 財團法人工業技術研究院 感測裝置及其像素結構
WO2015028042A1 (en) * 2013-08-26 2015-03-05 Teledyne Dalsa B.V. A radiation detector and a method thereof
US20150092912A1 (en) * 2013-10-02 2015-04-02 General Electric Company Systems and methods for filtering emissions from scintillators
US11156727B2 (en) * 2015-10-02 2021-10-26 Varian Medical Systems, Inc. High DQE imaging device
JP7661243B2 (ja) * 2020-01-15 2025-04-14 株式会社小糸製作所 シンチレータおよびシンチレータの製造方法
CN111190216B (zh) * 2020-01-23 2023-03-24 中国工程物理研究院激光聚变研究中心 一种辐射流探测器阵列

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3002571B2 (ja) * 1991-08-13 2000-01-24 株式会社日立製作所 放射線検出器
JPH0784054A (ja) * 1993-09-16 1995-03-31 Toshiba Corp 放射線検出器および放射線測定装置
JP3302463B2 (ja) * 1993-09-20 2002-07-15 富士写真フイルム株式会社 放射線検出器およびその使用方法
EP0746778A1 (en) 1994-02-25 1996-12-11 Massachusetts Institute Of Technology Methods and apparatus for detecting and imaging particles
JPH09152485A (ja) * 1995-11-30 1997-06-10 Hitachi Metals Ltd 放射線検出器
US6031234A (en) * 1997-12-08 2000-02-29 General Electric Company High resolution radiation imager
EP1016881B1 (en) * 1998-12-28 2005-12-21 Kabushiki Kaisha Toshiba Radiation detecting apparatus
JP4303393B2 (ja) 2000-03-10 2009-07-29 富士通株式会社 分光強度分布測定方法および分光強度分布測定装置
JP4274839B2 (ja) * 2002-06-04 2009-06-10 株式会社日立メディコ Ｘ線検出器用シンチレータ、その製造方法並びにそれを用いたｘ線検出器及びｘ線ｃｔ装置
JP4451112B2 (ja) * 2003-10-24 2010-04-14 株式会社日立メディコ 放射線検出器及びそれを用いた放射線画像診断装置
US7138633B1 (en) * 2004-01-23 2006-11-21 Saint-Gobain Ceramics & Plastics, Inc. Apparatus employing a filtered scintillator and method of using same
US7388208B2 (en) 2006-01-11 2008-06-17 Ruvin Deych Dual energy x-ray detector
JP2010515075A (ja) * 2007-01-05 2010-05-06 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 高速放射線検出器
JP5045468B2 (ja) 2008-02-01 2012-10-10 株式会社アドヴィックス 制動制御装置
US8492724B2 (en) * 2008-08-07 2013-07-23 Koninklijke Philips Electronics N.V. Scintillating material and related spectral filter
US20100072376A1 (en) * 2008-09-22 2010-03-25 Koninklijke Philips Electronics N.V. Spectral filter for use with lutetium-based scintillators
RU2407437C2 (ru) * 2009-01-22 2010-12-27 Общество с ограниченной ответственностью "Унискан" Способ регистрации рентгеновского изображения объекта в различных диапазонах спектра рентгеновского излучения
US8363917B2 (en) 2009-10-14 2013-01-29 General Electric Company System and method of image artifact reduction in fast kVp switching CT
DE202012012506U1 (de) * 2011-02-11 2013-03-22 Koninklijke Philips Electronics N.V. Verbesserte SPECT-Bewegungskorrektur
JP5911274B2 (ja) * 2011-11-28 2016-04-27 キヤノン株式会社 放射線検出装置及び放射線撮像システム

Also Published As

Publication number Publication date
CN103988095A (zh) 2014-08-13
US20140321617A1 (en) 2014-10-30
EP2748637A2 (en) 2014-07-02
JP2015505038A (ja) 2015-02-16
RU2014124932A (ru) 2016-02-10
CN103988095B (zh) 2018-04-06
EP2748637B1 (en) 2016-10-26
WO2013084106A3 (en) 2013-11-21
RU2607719C2 (ru) 2017-01-10
BR112014013362A2 (pt) 2017-06-13
US9958554B2 (en) 2018-05-01
WO2013084106A2 (en) 2013-06-13
IN2014CN04514A (enExample) 2015-09-11

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