IN2014CN02540A - - Google Patents

Info

Publication number
IN2014CN02540A
IN2014CN02540A IN2540CHN2014A IN2014CN02540A IN 2014CN02540 A IN2014CN02540 A IN 2014CN02540A IN 2540CHN2014 A IN2540CHN2014 A IN 2540CHN2014A IN 2014CN02540 A IN2014CN02540 A IN 2014CN02540A
Authority
IN
India
Prior art keywords
heights
test pulses
signal indicative
generate
pulses
Prior art date
Application number
Other languages
English (en)
Inventor
Booker Roger Steadman
Randall Peter Luhta
Christoph Herrmann
Original Assignee
Koninkl Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Nv filed Critical Koninkl Philips Nv
Publication of IN2014CN02540A publication Critical patent/IN2014CN02540A/en

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00—Details of radiation-measuring instruments
    • G01T7/005—Details of radiation-measuring instruments calibration techniques

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Toxicology (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Measurement Of Radiation (AREA)
IN2540CHN2014 2011-10-19 2012-10-12 IN2014CN02540A (enExample)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161548749P 2011-10-19 2011-10-19
PCT/IB2012/055554 WO2013057645A2 (en) 2011-10-19 2012-10-12 Photon counting detector

Publications (1)

Publication Number Publication Date
IN2014CN02540A true IN2014CN02540A (enExample) 2015-08-07

Family

ID=47428774

Family Applications (1)

Application Number Title Priority Date Filing Date
IN2540CHN2014 IN2014CN02540A (enExample) 2011-10-19 2012-10-12

Country Status (7)

Country Link
US (1) US9301378B2 (enExample)
EP (2) EP3290959B1 (enExample)
JP (1) JP2014530704A (enExample)
CN (1) CN103890610B (enExample)
IN (1) IN2014CN02540A (enExample)
RU (1) RU2594602C2 (enExample)
WO (1) WO2013057645A2 (enExample)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5593338B2 (ja) * 2012-01-30 2014-09-24 富士フイルム株式会社 放射線照射開始判定装置、放射線画像撮影装置、放射線画像撮影制御装置、放射線照射開始判定方法、及び放射線照射開始判定プログラム
BR112015013392A2 (pt) * 2012-12-12 2017-07-11 Koninklijke Philips Nv sistema de imagem, e método
CN104812305B (zh) * 2012-12-27 2018-03-30 东芝医疗系统株式会社 X射线ct装置以及控制方法
CN105073010B (zh) * 2013-04-04 2018-04-03 东芝医疗系统株式会社 X射线计算机断层摄影装置
EP2871496B1 (en) * 2013-11-12 2020-01-01 Samsung Electronics Co., Ltd Radiation detector and computed tomography apparatus using the same
WO2015078753A1 (en) * 2013-11-27 2015-06-04 Koninklijke Philips N.V. Detection device for detecting photons and method therefore
KR101635980B1 (ko) * 2013-12-30 2016-07-05 삼성전자주식회사 방사선 디텍터 및 그에 따른 컴퓨터 단층 촬영 장치
WO2016034976A1 (en) * 2014-09-02 2016-03-10 Koninklijke Philips N.V. Window-based spectrum measurement in a spectral ct detector
US10159450B2 (en) * 2014-10-01 2018-12-25 Toshiba Medical Systems Corporation X-ray CT apparatus including a photon-counting detector, and an image processing apparatus and an image processing method for correcting detection signals detected by the photon-counting detector
EP3218876B1 (en) 2014-11-10 2020-04-08 Prismatic Sensors AB X-ray imaging based on image data from a photon-counting multi bin x-ray detector
JP6262919B2 (ja) * 2014-12-05 2018-01-17 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. 傾斜角度でx線放射線を検出するx線検出器装置
KR101725099B1 (ko) * 2014-12-05 2017-04-26 삼성전자주식회사 컴퓨터 단층 촬영장치 및 그 제어방법
JP6277331B1 (ja) * 2014-12-11 2018-02-07 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. X線検出器、イメージング装置及び較正方法
RU2699307C2 (ru) * 2014-12-16 2019-09-04 Конинклейке Филипс Н.В. Определение смещения базовой линии детектора фотонов
US10098595B2 (en) * 2015-08-06 2018-10-16 Texas Instruments Incorporated Low power photon counting system
CN108139494B (zh) * 2015-10-20 2022-07-26 皇家飞利浦有限公司 用于直接转换x射线检测器的极化校正
EP3374803B1 (en) * 2015-11-12 2020-04-01 Prismatic Sensors AB High-resolution computed tomography using edge-on detectors with temporally offset depth-segments
JP6786709B2 (ja) * 2016-08-31 2020-11-18 プリズマティック、センサーズ、アクチボラグPrismatic Sensors Ab 変換器の相対利得およびオフセットを推定するための方法およびシステム
US10067240B1 (en) * 2017-03-06 2018-09-04 Prismatic Sensors Ab X-ray detector system based on photon counting
CN106989835B (zh) * 2017-04-12 2023-07-11 东北大学 基于压缩感知的光子计数x射线能谱探测装置及成像系统
JP2019010426A (ja) * 2017-06-30 2019-01-24 ゼネラル・エレクトリック・カンパニイ 放射線断層撮影装置およびプログラム
US10151845B1 (en) 2017-08-02 2018-12-11 Texas Instruments Incorporated Configurable analog-to-digital converter and processing for photon counting
US10024979B1 (en) 2017-11-01 2018-07-17 Texas Instruments Incorporated Photon counting with coincidence detection
CN108897030B (zh) * 2018-05-09 2020-12-25 中国科学院近代物理研究所 信号的定时提取装置及方法
CN108903961A (zh) * 2018-07-19 2018-11-30 深圳市倍康美医疗电子商务有限公司 一种cbct成像方法、存储介质及系统
US11219114B2 (en) * 2018-10-03 2022-01-04 Konica Minolta, Inc. Radiation generation control device, radiation generation control system, and radiography system
US10890674B2 (en) 2019-01-15 2021-01-12 Texas Instruments Incorporated Dynamic noise shaping in a photon counting system
CN110456404B (zh) * 2019-08-14 2023-07-28 苏州瑞迈斯科技有限公司 辐射探测装置和成像系统
CN110412644A (zh) * 2019-08-14 2019-11-05 苏州瑞迈斯医疗科技有限公司 光子计数方法和装置
JP7610030B2 (ja) * 2020-12-09 2025-01-07 エーエムエス・インターナショナル・アーゲー 光子計数システムにおける基線抽出のための電気回路機構
EP4495636A1 (en) * 2023-07-21 2025-01-22 Koninklijke Philips N.V. Photon counting detector flicker noise correction

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5943388A (en) * 1996-07-30 1999-08-24 Nova R & D, Inc. Radiation detector and non-destructive inspection
US5804833A (en) 1996-10-10 1998-09-08 Advanced Scientific Concepts, Inc. Advanced semiconductor emitter technology photocathodes
JP2004325183A (ja) * 2003-04-23 2004-11-18 M & C:Kk 放射線検出方法、放射線検出器、及び、この検出器を搭載した放射線撮像システム
US7599465B2 (en) * 2004-11-19 2009-10-06 General Electric Company Detection of thrombi in CT using energy discrimination
WO2006064403A2 (en) * 2004-12-17 2006-06-22 Koninklijke Philips Electronics, N.V. Pulsed x-ray for continuous detector correction
JP2009513220A (ja) * 2005-10-28 2009-04-02 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 分光コンピュータ断層撮影の方法および装置
JP5340524B2 (ja) * 2006-03-23 2013-11-13 浜松ホトニクス株式会社 放射線検出器及び放射線検出方法
US8044681B2 (en) * 2007-10-08 2011-10-25 General Electric Company Apparatus and method for channel-specific configuration in a readout ASIC
JP2011521212A (ja) * 2008-04-30 2011-07-21 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 計数検出器
WO2009141760A2 (en) 2008-05-19 2009-11-26 Koninklijke Philips Electronics N.V. A photon detector with converter unit
WO2010004460A1 (en) * 2008-07-07 2010-01-14 Koninklijke Philips Electronics N.V. K-edge imaging
US20100316184A1 (en) * 2008-10-17 2010-12-16 Jan Iwanczyk Silicon photomultiplier detector for computed tomography
US8198577B2 (en) 2009-02-25 2012-06-12 Caeleste Cvba High dynamic range analog X-ray photon counting
US8384038B2 (en) 2009-06-24 2013-02-26 General Electric Company Readout electronics for photon counting and energy discriminating detectors
JP2011085479A (ja) * 2009-10-15 2011-04-28 Tele Systems:Kk 光子計数型放射線検出器のキャリブレーション装置及びそのキャリブレーション方法
JP5744903B2 (ja) * 2009-12-21 2015-07-08 コーニンクレッカ フィリップス エヌ ヴェ 信号処理回路の電気的試験を行う装置及び方法
US8080780B2 (en) * 2009-12-29 2011-12-20 Kabushiki Kaisha Toshiba Apparatus and associated methodology for improving timing resolution in gamma ray detection

Also Published As

Publication number Publication date
JP2014530704A (ja) 2014-11-20
WO2013057645A2 (en) 2013-04-25
RU2014119870A (ru) 2015-11-27
EP2745143B1 (en) 2019-04-03
EP2745143A2 (en) 2014-06-25
EP3290959B1 (en) 2020-05-27
CN103890610A (zh) 2014-06-25
RU2594602C2 (ru) 2016-08-20
US20140254749A1 (en) 2014-09-11
EP3290959A1 (en) 2018-03-07
CN103890610B (zh) 2017-08-29
US9301378B2 (en) 2016-03-29
WO2013057645A3 (en) 2014-03-06

Similar Documents

Publication Publication Date Title
WO2013057645A3 (en) Photon counting detector
WO2019143972A3 (en) Imaging system and methods of high resolution cherenkov dose images utilizing radio-optical triggering
US10338236B2 (en) Radiation detection apparatus and method, data processing method and processor
WO2013093684A3 (en) X-ray detector
GB2488079A (en) Time of flight backscatter imaging system
Khachatryan et al. Coherent J/ψ photoproduction in ultra-peripheral PbPb collisions at sNN= 2.76 TeV with the CMS experiment
GB2565026A (en) Radiation signal processing system
EA201300364A1 (ru) Система и способ рентгеновского досмотра физических лиц с определением дозы облучения, превышающей пороговое значение
WO2014027260A3 (en) Photon counting x-ray detector
WO2012095710A3 (en) Detection device for detecting photons emitted by a radiation source
SG10201903148WA (en) Repeater detection
WO2012103211A3 (en) Image acquisition optimization
EA033177B1 (ru) Система быстрого досмотра транспортного средства
WO2012177863A3 (en) Hybrid multi-row detector and flat panel imaging system
WO2014075792A3 (en) Apparatus and method for inspecting seals of items
MX2015004816A (es) Aparato y metodo para determinar la desviacion de posicion objetivo de dos cuerpos.
PH12014502793B1 (en) Foreign-matter detecting apparatus and method for detecting foreign-matter in powder using terahertz pulse wave
WO2017202793A9 (en) System and method of stabilization of a gamma and neutron detecting device
MX2016005949A (es) Metodo y aparato para imagenologia de fotones en el interior del pozo.
CA3010426A1 (en) Apparatus, system, and method for increasing measurement accuracy in a particle imaging device
GB201315125D0 (en) X-ray inspection system and method
EP2341370A3 (en) Nuclear medicine diagnosis apparatus
GB2558505A (en) High dynamic range radiographic imaging system
MX2016010257A (es) Sistemas de exploracion por rayos de energia dual, metodos de exploracion y sistemas de inspeccion.
EP4386381A3 (en) Sensor for detection of gas and method for detection of gas