RU2594602C2 - Детектор для подсчета фотонов - Google Patents

Детектор для подсчета фотонов Download PDF

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RU2594602C2
RU2594602C2 RU2014119870/28A RU2014119870A RU2594602C2 RU 2594602 C2 RU2594602 C2 RU 2594602C2 RU 2014119870/28 A RU2014119870/28 A RU 2014119870/28A RU 2014119870 A RU2014119870 A RU 2014119870A RU 2594602 C2 RU2594602 C2 RU 2594602C2
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Russia
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thresholds
pulses
amplitudes
energy
test pulses
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RU2014119870/28A
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Russian (ru)
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RU2014119870A (ru
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БУКЕР Роджер СТЕДМЭН
Рэндалл Питер ЛУХТА
Кристоф ХЕРРМАНН
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Конинклейке Филипс Н.В.
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    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00—Details of radiation-measuring instruments
    • G01T7/005—Details of radiation-measuring instruments calibration techniques

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  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Toxicology (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Measurement Of Radiation (AREA)
RU2014119870/28A 2011-10-19 2012-10-12 Детектор для подсчета фотонов RU2594602C2 (ru)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161548749P 2011-10-19 2011-10-19
US61/548,749 2011-10-19
PCT/IB2012/055554 WO2013057645A2 (en) 2011-10-19 2012-10-12 Photon counting detector

Publications (2)

Publication Number Publication Date
RU2014119870A RU2014119870A (ru) 2015-11-27
RU2594602C2 true RU2594602C2 (ru) 2016-08-20

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RU2014119870/28A RU2594602C2 (ru) 2011-10-19 2012-10-12 Детектор для подсчета фотонов

Country Status (7)

Country Link
US (1) US9301378B2 (enExample)
EP (2) EP3290959B1 (enExample)
JP (1) JP2014530704A (enExample)
CN (1) CN103890610B (enExample)
IN (1) IN2014CN02540A (enExample)
RU (1) RU2594602C2 (enExample)
WO (1) WO2013057645A2 (enExample)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5593338B2 (ja) * 2012-01-30 2014-09-24 富士フイルム株式会社 放射線照射開始判定装置、放射線画像撮影装置、放射線画像撮影制御装置、放射線照射開始判定方法、及び放射線照射開始判定プログラム
BR112015013392A2 (pt) * 2012-12-12 2017-07-11 Koninklijke Philips Nv sistema de imagem, e método
CN104812305B (zh) * 2012-12-27 2018-03-30 东芝医疗系统株式会社 X射线ct装置以及控制方法
CN105073010B (zh) * 2013-04-04 2018-04-03 东芝医疗系统株式会社 X射线计算机断层摄影装置
EP2871496B1 (en) * 2013-11-12 2020-01-01 Samsung Electronics Co., Ltd Radiation detector and computed tomography apparatus using the same
WO2015078753A1 (en) * 2013-11-27 2015-06-04 Koninklijke Philips N.V. Detection device for detecting photons and method therefore
KR101635980B1 (ko) * 2013-12-30 2016-07-05 삼성전자주식회사 방사선 디텍터 및 그에 따른 컴퓨터 단층 촬영 장치
WO2016034976A1 (en) * 2014-09-02 2016-03-10 Koninklijke Philips N.V. Window-based spectrum measurement in a spectral ct detector
US10159450B2 (en) * 2014-10-01 2018-12-25 Toshiba Medical Systems Corporation X-ray CT apparatus including a photon-counting detector, and an image processing apparatus and an image processing method for correcting detection signals detected by the photon-counting detector
EP3218876B1 (en) 2014-11-10 2020-04-08 Prismatic Sensors AB X-ray imaging based on image data from a photon-counting multi bin x-ray detector
JP6262919B2 (ja) * 2014-12-05 2018-01-17 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 傾斜角度でｘ線放射線を検出するｘ線検出器装置
KR101725099B1 (ko) * 2014-12-05 2017-04-26 삼성전자주식회사 컴퓨터 단층 촬영장치 및 그 제어방법
JP6277331B1 (ja) * 2014-12-11 2018-02-07 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． Ｘ線検出器、イメージング装置及び較正方法
RU2699307C2 (ru) * 2014-12-16 2019-09-04 Конинклейке Филипс Н.В. Определение смещения базовой линии детектора фотонов
US10098595B2 (en) * 2015-08-06 2018-10-16 Texas Instruments Incorporated Low power photon counting system
CN108139494B (zh) * 2015-10-20 2022-07-26 皇家飞利浦有限公司 用于直接转换x射线检测器的极化校正
EP3374803B1 (en) * 2015-11-12 2020-04-01 Prismatic Sensors AB High-resolution computed tomography using edge-on detectors with temporally offset depth-segments
JP6786709B2 (ja) * 2016-08-31 2020-11-18 プリズマティック、センサーズ、アクチボラグＰｒｉｓｍａｔｉｃ Ｓｅｎｓｏｒｓ Ａｂ 変換器の相対利得およびオフセットを推定するための方法およびシステム
US10067240B1 (en) * 2017-03-06 2018-09-04 Prismatic Sensors Ab X-ray detector system based on photon counting
CN106989835B (zh) * 2017-04-12 2023-07-11 东北大学 基于压缩感知的光子计数x射线能谱探测装置及成像系统
JP2019010426A (ja) * 2017-06-30 2019-01-24 ゼネラル・エレクトリック・カンパニイ 放射線断層撮影装置およびプログラム
US10151845B1 (en) 2017-08-02 2018-12-11 Texas Instruments Incorporated Configurable analog-to-digital converter and processing for photon counting
US10024979B1 (en) 2017-11-01 2018-07-17 Texas Instruments Incorporated Photon counting with coincidence detection
CN108897030B (zh) * 2018-05-09 2020-12-25 中国科学院近代物理研究所 信号的定时提取装置及方法
CN108903961A (zh) * 2018-07-19 2018-11-30 深圳市倍康美医疗电子商务有限公司 一种cbct成像方法、存储介质及系统
US11219114B2 (en) * 2018-10-03 2022-01-04 Konica Minolta, Inc. Radiation generation control device, radiation generation control system, and radiography system
US10890674B2 (en) 2019-01-15 2021-01-12 Texas Instruments Incorporated Dynamic noise shaping in a photon counting system
CN110456404B (zh) * 2019-08-14 2023-07-28 苏州瑞迈斯科技有限公司 辐射探测装置和成像系统
CN110412644A (zh) * 2019-08-14 2019-11-05 苏州瑞迈斯医疗科技有限公司 光子计数方法和装置
JP7610030B2 (ja) * 2020-12-09 2025-01-07 エーエムエス・インターナショナル・アーゲー 光子計数システムにおける基線抽出のための電気回路機構
EP4495636A1 (en) * 2023-07-21 2025-01-22 Koninklijke Philips N.V. Photon counting detector flicker noise correction

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5943388A (en) * 1996-07-30 1999-08-24 Nova R & D, Inc. Radiation detector and non-destructive inspection
US20100316184A1 (en) * 2008-10-17 2010-12-16 Jan Iwanczyk Silicon photomultiplier detector for computed tomography

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5804833A (en) 1996-10-10 1998-09-08 Advanced Scientific Concepts, Inc. Advanced semiconductor emitter technology photocathodes
JP2004325183A (ja) * 2003-04-23 2004-11-18 M & C:Kk 放射線検出方法、放射線検出器、及び、この検出器を搭載した放射線撮像システム
US7599465B2 (en) * 2004-11-19 2009-10-06 General Electric Company Detection of thrombi in CT using energy discrimination
WO2006064403A2 (en) * 2004-12-17 2006-06-22 Koninklijke Philips Electronics, N.V. Pulsed x-ray for continuous detector correction
JP2009513220A (ja) * 2005-10-28 2009-04-02 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 分光コンピュータ断層撮影の方法および装置
JP5340524B2 (ja) * 2006-03-23 2013-11-13 浜松ホトニクス株式会社 放射線検出器及び放射線検出方法
US8044681B2 (en) * 2007-10-08 2011-10-25 General Electric Company Apparatus and method for channel-specific configuration in a readout ASIC
JP2011521212A (ja) * 2008-04-30 2011-07-21 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 計数検出器
WO2009141760A2 (en) 2008-05-19 2009-11-26 Koninklijke Philips Electronics N.V. A photon detector with converter unit
WO2010004460A1 (en) * 2008-07-07 2010-01-14 Koninklijke Philips Electronics N.V. K-edge imaging
US8198577B2 (en) 2009-02-25 2012-06-12 Caeleste Cvba High dynamic range analog X-ray photon counting
US8384038B2 (en) 2009-06-24 2013-02-26 General Electric Company Readout electronics for photon counting and energy discriminating detectors
JP2011085479A (ja) * 2009-10-15 2011-04-28 Tele Systems:Kk 光子計数型放射線検出器のキャリブレーション装置及びそのキャリブレーション方法
JP5744903B2 (ja) * 2009-12-21 2015-07-08 コーニンクレッカ フィリップス エヌ ヴェ 信号処理回路の電気的試験を行う装置及び方法
US8080780B2 (en) * 2009-12-29 2011-12-20 Kabushiki Kaisha Toshiba Apparatus and associated methodology for improving timing resolution in gamma ray detection

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5943388A (en) * 1996-07-30 1999-08-24 Nova R & D, Inc. Radiation detector and non-destructive inspection
US20100316184A1 (en) * 2008-10-17 2010-12-16 Jan Iwanczyk Silicon photomultiplier detector for computed tomography

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
ROGER STEADMAN ET AL: "ChromAIX: a high-rate energy-resolving photon-counting ASIC for spectral computed tomography", PROCEEDINGS OF SPIE, 1 January 2010 (2010-01-01), ISSN: 0277-786X, DOI: 10.1117/12.844222. *

Also Published As

Publication number Publication date
JP2014530704A (ja) 2014-11-20
IN2014CN02540A (enExample) 2015-08-07
WO2013057645A2 (en) 2013-04-25
RU2014119870A (ru) 2015-11-27
EP2745143B1 (en) 2019-04-03
EP2745143A2 (en) 2014-06-25
EP3290959B1 (en) 2020-05-27
CN103890610A (zh) 2014-06-25
US20140254749A1 (en) 2014-09-11
EP3290959A1 (en) 2018-03-07
CN103890610B (zh) 2017-08-29
US9301378B2 (en) 2016-03-29
WO2013057645A3 (en) 2014-03-06

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