CN103890610B - 光子计数探测器 - Google Patents
光子计数探测器 Download PDFInfo
- Publication number
- CN103890610B CN103890610B CN201280051041.2A CN201280051041A CN103890610B CN 103890610 B CN103890610 B CN 103890610B CN 201280051041 A CN201280051041 A CN 201280051041A CN 103890610 B CN103890610 B CN 103890610B
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Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/26—Measuring, controlling or protecting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/17—Circuit arrangements not adapted to a particular type of detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/247—Detector read-out circuitry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
- G01T7/005—Details of radiation-measuring instruments calibration techniques
Landscapes
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Engineering & Computer Science (AREA)
- Toxicology (AREA)
- Pulmonology (AREA)
- Radiology & Medical Imaging (AREA)
- Theoretical Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161548749P | 2011-10-19 | 2011-10-19 | |
| US61/548,749 | 2011-10-19 | ||
| PCT/IB2012/055554 WO2013057645A2 (en) | 2011-10-19 | 2012-10-12 | Photon counting detector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103890610A CN103890610A (zh) | 2014-06-25 |
| CN103890610B true CN103890610B (zh) | 2017-08-29 |
Family
ID=47428774
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201280051041.2A Active CN103890610B (zh) | 2011-10-19 | 2012-10-12 | 光子计数探测器 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US9301378B2 (enExample) |
| EP (2) | EP3290959B1 (enExample) |
| JP (1) | JP2014530704A (enExample) |
| CN (1) | CN103890610B (enExample) |
| IN (1) | IN2014CN02540A (enExample) |
| RU (1) | RU2594602C2 (enExample) |
| WO (1) | WO2013057645A2 (enExample) |
Families Citing this family (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5593338B2 (ja) * | 2012-01-30 | 2014-09-24 | 富士フイルム株式会社 | 放射線照射開始判定装置、放射線画像撮影装置、放射線画像撮影制御装置、放射線照射開始判定方法、及び放射線照射開始判定プログラム |
| CN104838287B (zh) * | 2012-12-12 | 2018-08-17 | 皇家飞利浦有限公司 | 用于光子计数探测器的自适应持续电流补偿 |
| CN104812305B (zh) * | 2012-12-27 | 2018-03-30 | 东芝医疗系统株式会社 | X射线ct装置以及控制方法 |
| CN105073010B (zh) * | 2013-04-04 | 2018-04-03 | 东芝医疗系统株式会社 | X射线计算机断层摄影装置 |
| EP2871496B1 (en) * | 2013-11-12 | 2020-01-01 | Samsung Electronics Co., Ltd | Radiation detector and computed tomography apparatus using the same |
| WO2015078753A1 (en) | 2013-11-27 | 2015-06-04 | Koninklijke Philips N.V. | Detection device for detecting photons and method therefore |
| KR101635980B1 (ko) * | 2013-12-30 | 2016-07-05 | 삼성전자주식회사 | 방사선 디텍터 및 그에 따른 컴퓨터 단층 촬영 장치 |
| CN106687825B (zh) * | 2014-09-02 | 2020-06-23 | 皇家飞利浦有限公司 | 谱ct探测器中的基于窗口的谱测量 |
| US10159450B2 (en) * | 2014-10-01 | 2018-12-25 | Toshiba Medical Systems Corporation | X-ray CT apparatus including a photon-counting detector, and an image processing apparatus and an image processing method for correcting detection signals detected by the photon-counting detector |
| EP3218876B1 (en) * | 2014-11-10 | 2020-04-08 | Prismatic Sensors AB | X-ray imaging based on image data from a photon-counting multi bin x-ray detector |
| KR101725099B1 (ko) * | 2014-12-05 | 2017-04-26 | 삼성전자주식회사 | 컴퓨터 단층 촬영장치 및 그 제어방법 |
| EP3161522B1 (en) * | 2014-12-05 | 2018-02-28 | Koninklijke Philips N.V. | X-ray detector device for inclined angle x-ray radiation |
| WO2016091981A1 (en) * | 2014-12-11 | 2016-06-16 | Koninklijke Philips N.V. | X-ray detector, imaging apparatus and calibration method |
| US10660589B2 (en) * | 2014-12-16 | 2020-05-26 | Koninklijke Philips N.V. | Baseline shift determination for a photon detector |
| US10098595B2 (en) * | 2015-08-06 | 2018-10-16 | Texas Instruments Incorporated | Low power photon counting system |
| EP3365706B1 (en) * | 2015-10-20 | 2023-12-06 | Koninklijke Philips N.V. | Polarization correction for direct conversion x-ray detectors |
| JP6633201B2 (ja) * | 2015-11-12 | 2020-01-22 | プリズマティック、センサーズ、アクチボラグPrismatic Sensors Ab | 時間オフセット深度セグメントを有するエッジオン検出器を用いた高分解能コンピュータ断層撮影 |
| KR102605320B1 (ko) * | 2016-08-31 | 2023-11-23 | 프리스매틱 센서즈 에이비 | 컨버터의 상대적인 이득 및 오프셋 추정을 위한 방법 및 시스템 |
| US10067240B1 (en) * | 2017-03-06 | 2018-09-04 | Prismatic Sensors Ab | X-ray detector system based on photon counting |
| CN106989835B (zh) * | 2017-04-12 | 2023-07-11 | 东北大学 | 基于压缩感知的光子计数x射线能谱探测装置及成像系统 |
| JP2019010426A (ja) * | 2017-06-30 | 2019-01-24 | ゼネラル・エレクトリック・カンパニイ | 放射線断層撮影装置およびプログラム |
| US10151845B1 (en) | 2017-08-02 | 2018-12-11 | Texas Instruments Incorporated | Configurable analog-to-digital converter and processing for photon counting |
| US10024979B1 (en) | 2017-11-01 | 2018-07-17 | Texas Instruments Incorporated | Photon counting with coincidence detection |
| CN108897030B (zh) * | 2018-05-09 | 2020-12-25 | 中国科学院近代物理研究所 | 信号的定时提取装置及方法 |
| CN108903961A (zh) * | 2018-07-19 | 2018-11-30 | 深圳市倍康美医疗电子商务有限公司 | 一种cbct成像方法、存储介质及系统 |
| US11219114B2 (en) * | 2018-10-03 | 2022-01-04 | Konica Minolta, Inc. | Radiation generation control device, radiation generation control system, and radiography system |
| US10890674B2 (en) | 2019-01-15 | 2021-01-12 | Texas Instruments Incorporated | Dynamic noise shaping in a photon counting system |
| CN110456404B (zh) * | 2019-08-14 | 2023-07-28 | 苏州瑞迈斯科技有限公司 | 辐射探测装置和成像系统 |
| CN110412644A (zh) * | 2019-08-14 | 2019-11-05 | 苏州瑞迈斯医疗科技有限公司 | 光子计数方法和装置 |
| WO2022122545A1 (en) * | 2020-12-09 | 2022-06-16 | Ams International Ag | Electric circuitry for baseline extraction in a photon counting system |
| EP4495636A1 (en) * | 2023-07-21 | 2025-01-22 | Koninklijke Philips N.V. | Photon counting detector flicker noise correction |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5943388A (en) * | 1996-07-30 | 1999-08-24 | Nova R & D, Inc. | Radiation detector and non-destructive inspection |
| WO2011077302A2 (en) * | 2009-12-21 | 2011-06-30 | Koninklijke Philips Electronics N.V. | Radiation detector assembly with test circuitry |
| CN102141632A (zh) * | 2009-12-29 | 2011-08-03 | 株式会社东芝 | 提高γ射线检测中的定时分辨率的装置和相关方法 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5804833A (en) | 1996-10-10 | 1998-09-08 | Advanced Scientific Concepts, Inc. | Advanced semiconductor emitter technology photocathodes |
| JP2004325183A (ja) * | 2003-04-23 | 2004-11-18 | M & C:Kk | 放射線検出方法、放射線検出器、及び、この検出器を搭載した放射線撮像システム |
| US7599465B2 (en) * | 2004-11-19 | 2009-10-06 | General Electric Company | Detection of thrombi in CT using energy discrimination |
| EP1828810B1 (en) * | 2004-12-17 | 2012-06-06 | Koninklijke Philips Electronics N.V. | Pulsed x-ray for continuous detector correction |
| EP1943545A2 (en) * | 2005-10-28 | 2008-07-16 | Koninklijke Philips Electronics N.V. | Method and apparatus for spectral computed tomography |
| JP5340524B2 (ja) * | 2006-03-23 | 2013-11-13 | 浜松ホトニクス株式会社 | 放射線検出器及び放射線検出方法 |
| US8044681B2 (en) * | 2007-10-08 | 2011-10-25 | General Electric Company | Apparatus and method for channel-specific configuration in a readout ASIC |
| WO2009133481A2 (en) * | 2008-04-30 | 2009-11-05 | Koninklijke Philips Electronics N.V. | Counting detector |
| WO2009141760A2 (en) | 2008-05-19 | 2009-11-26 | Koninklijke Philips Electronics N.V. | A photon detector with converter unit |
| RU2508053C2 (ru) * | 2008-07-07 | 2014-02-27 | Конинклейке Филипс Электроникс Н.В. | Визуализация к-края |
| US20100316184A1 (en) * | 2008-10-17 | 2010-12-16 | Jan Iwanczyk | Silicon photomultiplier detector for computed tomography |
| US8198577B2 (en) | 2009-02-25 | 2012-06-12 | Caeleste Cvba | High dynamic range analog X-ray photon counting |
| US8384038B2 (en) | 2009-06-24 | 2013-02-26 | General Electric Company | Readout electronics for photon counting and energy discriminating detectors |
| JP2011085479A (ja) * | 2009-10-15 | 2011-04-28 | Tele Systems:Kk | 光子計数型放射線検出器のキャリブレーション装置及びそのキャリブレーション方法 |
-
2012
- 2012-10-12 IN IN2540CHN2014 patent/IN2014CN02540A/en unknown
- 2012-10-12 EP EP17187549.5A patent/EP3290959B1/en active Active
- 2012-10-12 US US14/350,370 patent/US9301378B2/en active Active
- 2012-10-12 RU RU2014119870/28A patent/RU2594602C2/ru not_active IP Right Cessation
- 2012-10-12 WO PCT/IB2012/055554 patent/WO2013057645A2/en not_active Ceased
- 2012-10-12 JP JP2014536375A patent/JP2014530704A/ja not_active Ceased
- 2012-10-12 CN CN201280051041.2A patent/CN103890610B/zh active Active
- 2012-10-12 EP EP12805762.7A patent/EP2745143B1/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5943388A (en) * | 1996-07-30 | 1999-08-24 | Nova R & D, Inc. | Radiation detector and non-destructive inspection |
| WO2011077302A2 (en) * | 2009-12-21 | 2011-06-30 | Koninklijke Philips Electronics N.V. | Radiation detector assembly with test circuitry |
| CN102667526A (zh) * | 2009-12-21 | 2012-09-12 | 皇家飞利浦电子股份有限公司 | 具有测试电路的辐射探测器组件 |
| CN102141632A (zh) * | 2009-12-29 | 2011-08-03 | 株式会社东芝 | 提高γ射线检测中的定时分辨率的装置和相关方法 |
Non-Patent Citations (2)
| Title |
|---|
| ChromAIX: a high-rate energy-resolving photon-counting ASIC for spectral computed tomography;ROGER STEADMAN ET AL.;<PROCEEDINGS OF SPIE>;20100101;762220-762220-8 * |
| Photon counting X-ray imaging with CdTe pixel detectros based on XPAD2 circuit;FRANCHI R ET AL.;<NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A: ACCELERATORS, SPECTROMETERS, DETECTORS, AND ASSOCIATED EQUIPMENT>;20060701;第563卷(第1期);249-253 * |
Also Published As
| Publication number | Publication date |
|---|---|
| US9301378B2 (en) | 2016-03-29 |
| WO2013057645A3 (en) | 2014-03-06 |
| WO2013057645A2 (en) | 2013-04-25 |
| EP3290959B1 (en) | 2020-05-27 |
| EP2745143A2 (en) | 2014-06-25 |
| RU2014119870A (ru) | 2015-11-27 |
| EP2745143B1 (en) | 2019-04-03 |
| JP2014530704A (ja) | 2014-11-20 |
| RU2594602C2 (ru) | 2016-08-20 |
| CN103890610A (zh) | 2014-06-25 |
| IN2014CN02540A (enExample) | 2015-08-07 |
| EP3290959A1 (en) | 2018-03-07 |
| US20140254749A1 (en) | 2014-09-11 |
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| GR01 | Patent grant | ||
| GR01 | Patent grant |