JP2014530704A - 光子計数検出器 - Google Patents

光子計数検出器 Download PDF

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Publication number
JP2014530704A
JP2014530704A JP2014536375A JP2014536375A JP2014530704A JP 2014530704 A JP2014530704 A JP 2014530704A JP 2014536375 A JP2014536375 A JP 2014536375A JP 2014536375 A JP2014536375 A JP 2014536375A JP 2014530704 A JP2014530704 A JP 2014530704A
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Prior art keywords
threshold
energy
pulse
height
thresholds
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Ceased
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JP2014536375A
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English (en)
Japanese (ja)
Inventor
ステッドマンブッカー，ロジャー
ブッカー，ロジャー ステッドマン
ピーター ルータ，ランドール
ピーター ルータ，ランドール
ヘルマン，クリストフ
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Koninklijke Philips NV
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Koninklijke Philips NV
Koninklijke Philips Electronics NV
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Publication of JP2014530704A publication Critical patent/JP2014530704A/ja
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    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00—Details of radiation-measuring instruments
    • G01T7/005—Details of radiation-measuring instruments calibration techniques

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  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Molecular Biology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Health & Medical Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Radiology & Medical Imaging (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Pulmonology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Toxicology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Measurement Of Radiation (AREA)
JP2014536375A 2011-10-19 2012-10-12 光子計数検出器 Ceased JP2014530704A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161548749P 2011-10-19 2011-10-19
US61/548,749 2011-10-19

Publications (1)

Publication Number Publication Date
JP2014530704A true JP2014530704A (ja) 2014-11-20

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Family Applications (1)

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JP2014536375A Ceased JP2014530704A (ja) 2011-10-19 2012-10-12 光子計数検出器

Country Status (7)

Country Link
US (1) US9301378B2 (enExample)
EP (2) EP2745143B1 (enExample)
JP (1) JP2014530704A (enExample)
CN (1) CN103890610B (enExample)
IN (1) IN2014CN02540A (enExample)
RU (1) RU2594602C2 (enExample)
WO (1) WO2013057645A2 (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6277331B1 (ja) * 2014-12-11 2018-02-07 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． Ｘ線検出器、イメージング装置及び較正方法
JP2018506023A (ja) * 2014-12-16 2018-03-01 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 処理ユニット、ｘ線検査装置、判定方法、プログラム・エレメント及び記憶媒体
JP2019010426A (ja) * 2017-06-30 2019-01-24 ゼネラル・エレクトリック・カンパニイ 放射線断層撮影装置およびプログラム
JP2023553762A (ja) * 2020-12-09 2023-12-25 エーエムエス・インターナショナル・アーゲー 光子計数システムにおける基線抽出のための電気回路機構

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JP5593338B2 (ja) * 2012-01-30 2014-09-24 富士フイルム株式会社 放射線照射開始判定装置、放射線画像撮影装置、放射線画像撮影制御装置、放射線照射開始判定方法、及び放射線照射開始判定プログラム
WO2014091278A1 (en) * 2012-12-12 2014-06-19 Koninklijke Philips N.V. Adaptive persistent current compensation for photon counting detectors
CN104812305B (zh) * 2012-12-27 2018-03-30 东芝医疗系统株式会社 X射线ct装置以及控制方法
JP6289223B2 (ja) * 2013-04-04 2018-03-07 キヤノンメディカルシステムズ株式会社 Ｘ線コンピュータ断層撮影装置
EP2871496B1 (en) * 2013-11-12 2020-01-01 Samsung Electronics Co., Ltd Radiation detector and computed tomography apparatus using the same
WO2015078753A1 (en) * 2013-11-27 2015-06-04 Koninklijke Philips N.V. Detection device for detecting photons and method therefore
KR101635980B1 (ko) * 2013-12-30 2016-07-05 삼성전자주식회사 방사선 디텍터 및 그에 따른 컴퓨터 단층 촬영 장치
US10788594B2 (en) * 2014-09-02 2020-09-29 Koninklijke Philips N.V. Window-based spectrum measurement in a spectral CT detector
US10159450B2 (en) * 2014-10-01 2018-12-25 Toshiba Medical Systems Corporation X-ray CT apparatus including a photon-counting detector, and an image processing apparatus and an image processing method for correcting detection signals detected by the photon-counting detector
JP6495450B2 (ja) * 2014-11-10 2019-04-03 プリズマティック、センサーズ、アクチボラグＰｒｉｓｍａｔｉｃ Ｓｅｎｓｏｒｓ Ａｂ 光子計数マルチビンｘ線検知器からの画像データに基づくｘ線撮像
KR101725099B1 (ko) * 2014-12-05 2017-04-26 삼성전자주식회사 컴퓨터 단층 촬영장치 및 그 제어방법
CN106796302B (zh) * 2014-12-05 2018-11-13 皇家飞利浦有限公司 用于倾斜角度x射线辐射的x射线探测器设备
US10098595B2 (en) * 2015-08-06 2018-10-16 Texas Instruments Incorporated Low power photon counting system
US10725188B2 (en) * 2015-10-20 2020-07-28 Koninklijke Philips N.V. Polarization correction for direct conversion x-ray detectors
JP6633201B2 (ja) * 2015-11-12 2020-01-22 プリズマティック、センサーズ、アクチボラグＰｒｉｓｍａｔｉｃ Ｓｅｎｓｏｒｓ Ａｂ 時間オフセット深度セグメントを有するエッジオン検出器を用いた高分解能コンピュータ断層撮影
WO2018044214A1 (en) * 2016-08-31 2018-03-08 Prismatic Sensors Ab Method and system for estimating the relative gain and offset of a converter
US10067240B1 (en) * 2017-03-06 2018-09-04 Prismatic Sensors Ab X-ray detector system based on photon counting
CN106989835B (zh) * 2017-04-12 2023-07-11 东北大学 基于压缩感知的光子计数x射线能谱探测装置及成像系统
US10151845B1 (en) 2017-08-02 2018-12-11 Texas Instruments Incorporated Configurable analog-to-digital converter and processing for photon counting
US10024979B1 (en) 2017-11-01 2018-07-17 Texas Instruments Incorporated Photon counting with coincidence detection
CN108897030B (zh) * 2018-05-09 2020-12-25 中国科学院近代物理研究所 信号的定时提取装置及方法
CN108903961A (zh) * 2018-07-19 2018-11-30 深圳市倍康美医疗电子商务有限公司 一种cbct成像方法、存储介质及系统
US11219114B2 (en) * 2018-10-03 2022-01-04 Konica Minolta, Inc. Radiation generation control device, radiation generation control system, and radiography system
US10890674B2 (en) 2019-01-15 2021-01-12 Texas Instruments Incorporated Dynamic noise shaping in a photon counting system
CN110412644A (zh) * 2019-08-14 2019-11-05 苏州瑞迈斯医疗科技有限公司 光子计数方法和装置
CN110456404B (zh) * 2019-08-14 2023-07-28 苏州瑞迈斯科技有限公司 辐射探测装置和成像系统
EP4495636A1 (en) * 2023-07-21 2025-01-22 Koninklijke Philips N.V. Photon counting detector flicker noise correction

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JP2004325183A (ja) * 2003-04-23 2004-11-18 M & C:Kk 放射線検出方法、放射線検出器、及び、この検出器を搭載した放射線撮像システム
JP2009513220A (ja) * 2005-10-28 2009-04-02 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 分光コンピュータ断層撮影の方法および装置
WO2010024967A1 (en) * 2008-08-27 2010-03-04 General Electric Company Apparatus and method for channel-specific configuration in a readout asic
JP2011085479A (ja) * 2009-10-15 2011-04-28 Tele Systems:Kk 光子計数型放射線検出器のキャリブレーション装置及びそのキャリブレーション方法
WO2011077302A2 (en) * 2009-12-21 2011-06-30 Koninklijke Philips Electronics N.V. Radiation detector assembly with test circuitry
JP2011521212A (ja) * 2008-04-30 2011-07-21 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 計数検出器

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JP5340524B2 (ja) * 2006-03-23 2013-11-13 浜松ホトニクス株式会社 放射線検出器及び放射線検出方法
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US5943388A (en) * 1996-07-30 1999-08-24 Nova R & D, Inc. Radiation detector and non-destructive inspection
JP2004325183A (ja) * 2003-04-23 2004-11-18 M & C:Kk 放射線検出方法、放射線検出器、及び、この検出器を搭載した放射線撮像システム
JP2009513220A (ja) * 2005-10-28 2009-04-02 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 分光コンピュータ断層撮影の方法および装置
JP2011521212A (ja) * 2008-04-30 2011-07-21 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 計数検出器
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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6277331B1 (ja) * 2014-12-11 2018-02-07 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． Ｘ線検出器、イメージング装置及び較正方法
JP2018506019A (ja) * 2014-12-11 2018-03-01 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． Ｘ線検出器、イメージング装置及び較正方法
JP2018506023A (ja) * 2014-12-16 2018-03-01 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 処理ユニット、ｘ線検査装置、判定方法、プログラム・エレメント及び記憶媒体
JP2019010426A (ja) * 2017-06-30 2019-01-24 ゼネラル・エレクトリック・カンパニイ 放射線断層撮影装置およびプログラム
JP2023553762A (ja) * 2020-12-09 2023-12-25 エーエムエス・インターナショナル・アーゲー 光子計数システムにおける基線抽出のための電気回路機構
JP7610030B2 (ja) 2020-12-09 2025-01-07 エーエムエス・インターナショナル・アーゲー 光子計数システムにおける基線抽出のための電気回路機構

Also Published As

Publication number Publication date
EP2745143A2 (en) 2014-06-25
RU2594602C2 (ru) 2016-08-20
EP3290959A1 (en) 2018-03-07
WO2013057645A2 (en) 2013-04-25
RU2014119870A (ru) 2015-11-27
US9301378B2 (en) 2016-03-29
WO2013057645A3 (en) 2014-03-06
EP3290959B1 (en) 2020-05-27
EP2745143B1 (en) 2019-04-03
US20140254749A1 (en) 2014-09-11
IN2014CN02540A (enExample) 2015-08-07
CN103890610A (zh) 2014-06-25
CN103890610B (zh) 2017-08-29

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