MX2018013244A - Sistema de procesamiento de señal de radiacion. - Google Patents

Sistema de procesamiento de señal de radiacion.

Info

Publication number
MX2018013244A
MX2018013244A MX2018013244A MX2018013244A MX2018013244A MX 2018013244 A MX2018013244 A MX 2018013244A MX 2018013244 A MX2018013244 A MX 2018013244A MX 2018013244 A MX2018013244 A MX 2018013244A MX 2018013244 A MX2018013244 A MX 2018013244A
Authority
MX
Mexico
Prior art keywords
signal processing
detectors
processing system
radiation signal
transmitted
Prior art date
Application number
MX2018013244A
Other languages
English (en)
Inventor
James Morton Edward
Original Assignee
Rapiscan Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rapiscan Systems Inc filed Critical Rapiscan Systems Inc
Publication of MX2018013244A publication Critical patent/MX2018013244A/es

Links

Classifications

    • G01V5/224—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G01N23/087—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/423—Imaging multispectral imaging-multiple energy imaging
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10116—X-ray image

Abstract

Un sistema de escaneo de rayos X basado en energía dual tiene un tiene un arreglo de detectores lineal con detectores de alta y baja energía; se emplea un método de procesamiento de señal que considera diversos ángulos a los cuales inciden los rayos X transmitidos sobre los detectores y también el orden variable en el cual los rayos X transmitidos pasan a través de los detectores de alta y baja energía; esto produce una alta resolución en las imágenes generadas y un mejor desempeño de penetración.
MX2018013244A 2016-05-03 2017-05-02 Sistema de procesamiento de señal de radiacion. MX2018013244A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201662330905P 2016-05-03 2016-05-03
PCT/US2017/030651 WO2017192597A1 (en) 2016-05-03 2017-05-02 Radiation signal processing system

Publications (1)

Publication Number Publication Date
MX2018013244A true MX2018013244A (es) 2019-08-12

Family

ID=60203448

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2018013244A MX2018013244A (es) 2016-05-03 2017-05-02 Sistema de procesamiento de señal de radiacion.

Country Status (12)

Country Link
US (2) US10386532B2 (es)
EP (1) EP3452813A4 (es)
JP (1) JP2019515280A (es)
KR (1) KR20190003960A (es)
CN (1) CN109073572A (es)
AU (1) AU2017260252A1 (es)
BR (1) BR112018072665A2 (es)
CA (1) CA3022305A1 (es)
EA (1) EA201892471A1 (es)
GB (1) GB2565026B (es)
MX (1) MX2018013244A (es)
WO (1) WO2017192597A1 (es)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017192597A1 (en) * 2016-05-03 2017-11-09 Rapiscan Systems, Inc. Radiation signal processing system
GB2577737B (en) * 2018-10-05 2022-09-07 Smiths Heimann Sas Determination of material
KR102230737B1 (ko) * 2020-06-25 2021-03-22 대한민국 4색 X-ray 장비를 이용한 원자의 판별 방법
GB2598137A (en) * 2020-08-20 2022-02-23 Smiths Detection France S A S Self-aligning array of detector cells
CN112748133B (zh) * 2020-12-24 2023-06-16 北京航星机器制造有限公司 一种高能稀疏的ct探测器、ct检测系统及检测方法
CN112858167B (zh) * 2021-01-07 2024-01-02 上海奕瑞光电子科技股份有限公司 多排双能线阵探测器扫描方法、系统、介质及装置
US20230017006A1 (en) * 2021-07-16 2023-01-19 Voti Inc. Material detection in x-ray security screening
KR102551054B1 (ko) * 2021-08-05 2023-07-05 한국원자력연구원 엑스선 촬영 장치 및 그것의 동작 방법
CN116183639A (zh) * 2021-11-26 2023-05-30 同方威视技术股份有限公司 面阵探测器、探测方法及相应的集装箱/车辆检查系统

Family Cites Families (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4709382A (en) * 1984-11-21 1987-11-24 Picker International, Inc. Imaging with focused curved radiation detectors
JPS63247870A (ja) * 1987-04-02 1988-10-14 Konica Corp Ｘ線画像処理方法
US5841833A (en) * 1991-02-13 1998-11-24 Lunar Corporation Dual-energy x-ray detector providing spatial and temporal interpolation
US5305368A (en) * 1992-09-14 1994-04-19 Lunar Corporation Method and apparatus for piece-wise radiographic scanning
US5490196A (en) * 1994-03-18 1996-02-06 Metorex International Oy Multi energy system for x-ray imaging applications
US6315445B1 (en) * 1996-02-21 2001-11-13 Lunar Corporation Densitometry adapter for compact x-ray fluoroscopy machine
US6102567A (en) * 1996-05-17 2000-08-15 Hologic, Inc. X-ray bone densitometry using a vertically scanning gantry
GB9720658D0 (en) * 1997-09-29 1997-11-26 Univ Nottingham Trent Detecting, improving and charecterising material in 3-D space
US6069362A (en) * 1998-05-14 2000-05-30 The University Of Akron Multi-density and multi-atomic number detector media for applications
CN1131702C (zh) * 1999-08-17 2003-12-24 高级光学技术股份有限公司 用于双能量x射线成像的设备和方法
US7164750B2 (en) * 2003-03-26 2007-01-16 Smiths Detection, Inc. Non-destructive inspection of material in container
CN101019042B (zh) * 2004-03-01 2010-05-12 瓦润医药系统公司 通过双能量辐射扫描和缓发中子探测来检查物体
US7453987B1 (en) * 2004-03-04 2008-11-18 Science Applications International Corporation Method and system for high energy, low radiation power X-ray imaging of the contents of a target
CN100594376C (zh) * 2005-07-15 2010-03-17 北京中盾安民分析技术有限公司 便携式双能量x射线检查装置
CN1997256B (zh) * 2005-12-31 2010-08-25 清华大学 一种高低能x射线输出装置
US7526064B2 (en) * 2006-05-05 2009-04-28 Rapiscan Security Products, Inc. Multiple pass cargo inspection system
CN101074935B (zh) * 2006-05-19 2011-03-23 清华大学 探测器阵列及设备
CN1916611A (zh) * 2006-09-08 2007-02-21 清华大学 集装箱多重dr/ct检测装置
US7742568B2 (en) * 2007-06-09 2010-06-22 Spectrum San Diego, Inc. Automobile scanning system
CN102608135B (zh) * 2007-10-05 2015-02-18 清华大学 在危险品检查系统中确定ct扫描位置的方法和设备
CN101435783B (zh) * 2007-11-15 2011-01-26 同方威视技术股份有限公司 物质识别方法和设备
GB0803641D0 (en) * 2008-02-28 2008-04-02 Rapiscan Security Products Inc Scanning systems
GB0803642D0 (en) * 2008-02-28 2008-04-02 Rapiscan Security Products Inc Drive-through scanning systems
CN101647706B (zh) * 2008-08-13 2012-05-30 清华大学 高能双能ct系统的图象重建方法
US20110170661A1 (en) * 2008-08-26 2011-07-14 General Electric Company Inspection system and method
CN101696947B (zh) * 2009-10-13 2011-08-17 公安部第一研究所 一种x射线双能量透射与康普顿背散射图像智能融合方法
JP2011145127A (ja) * 2010-01-13 2011-07-28 Yokogawa Electric Corp 放射線測定装置
WO2011091070A2 (en) * 2010-01-19 2011-07-28 Rapiscan Systems, Inc. Multi-view cargo scanner
US9274065B2 (en) * 2012-02-08 2016-03-01 Rapiscan Systems, Inc. High-speed security inspection system
CN103308535B (zh) * 2012-03-09 2016-04-13 同方威视技术股份有限公司 用于射线扫描成像的设备和方法
US9390523B2 (en) * 2012-05-01 2016-07-12 Analogic Corporation Determination of z-effective value for set of voxels using CT density image and sparse multi-energy data
WO2017192597A1 (en) * 2016-05-03 2017-11-09 Rapiscan Systems, Inc. Radiation signal processing system

Also Published As

Publication number Publication date
AU2017260252A1 (en) 2019-09-26
JP2019515280A (ja) 2019-06-06
CA3022305A1 (en) 2017-11-09
EA201892471A1 (ru) 2019-04-30
GB2565026A (en) 2019-01-30
EP3452813A4 (en) 2019-12-18
US20200158909A1 (en) 2020-05-21
GB2565026B (en) 2021-08-18
WO2017192597A1 (en) 2017-11-09
US10386532B2 (en) 2019-08-20
BR112018072665A2 (pt) 2019-02-19
KR20190003960A (ko) 2019-01-10
US20170329036A1 (en) 2017-11-16
CN109073572A (zh) 2018-12-21
GB201819388D0 (en) 2019-01-09
EP3452813A1 (en) 2019-03-13

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