IN169315B - - Google Patents
Info
- Publication number
- IN169315B IN169315B IN147/MAS/87A IN147MA1987A IN169315B IN 169315 B IN169315 B IN 169315B IN 147MA1987 A IN147MA1987 A IN 147MA1987A IN 169315 B IN169315 B IN 169315B
- Authority
- IN
- India
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
- G01B7/282—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures for measuring roundness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/004—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points
- G01B7/008—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points using coordinate measuring machines
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/34—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces
- G01B7/345—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces for measuring evenness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB868605324A GB8605324D0 (en) | 1986-03-04 | 1986-03-04 | Metrological apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
IN169315B true IN169315B (no) | 1991-09-28 |
Family
ID=10594021
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IN147/MAS/87A IN169315B (no) | 1986-03-04 | 1987-03-03 |
Country Status (8)
Country | Link |
---|---|
US (1) | US4807152A (no) |
EP (1) | EP0240151B1 (no) |
JP (2) | JPH0648186B2 (no) |
CN (1) | CN87102434A (no) |
DE (3) | DE3764135D1 (no) |
DK (1) | DK108587A (no) |
GB (1) | GB8605324D0 (no) |
IN (1) | IN169315B (no) |
Families Citing this family (80)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0240150B1 (en) | 1986-03-04 | 1991-04-17 | Rank Taylor Hobson Limited | Workpiece position control |
IT1211390B (it) * | 1987-10-06 | 1989-10-18 | Dea Spa | Sistema grafico interattivo per la matematizzazione di modelli fisici |
JPH0833433B2 (ja) * | 1987-11-30 | 1996-03-29 | 東京エレクトロン株式会社 | プローブ装置 |
FR2627582B3 (fr) * | 1988-02-23 | 1990-06-15 | Renault Automation | Machine a mesurer par coordonnees |
GB2218227A (en) * | 1988-05-05 | 1989-11-08 | Rank Taylor Hobson Ltd | Controlling surface sensing apparatus |
DE8814393U1 (de) * | 1988-11-17 | 1989-02-02 | Dipl.-Ing. Wolfgang Zwicker GmbH & Co. Elektronische Sensortechnik, 1000 Berlin | Ausrichtbarer Sensor |
JPH03115902A (ja) * | 1989-06-23 | 1991-05-16 | Rank Taylor Hobson Ltd | 度量衡装置およびその校正の方法 |
IT1232879B (it) * | 1989-07-21 | 1992-03-05 | Prima Ind Spa | Dispositivo e metodo per la misurazione automatica delle dimensioni di solidi di rivoluzione |
US4972090A (en) * | 1989-08-03 | 1990-11-20 | Eaton Homer L | Method and apparatus for measuring and inspecting articles of manufacture for configuration |
JPH07104146B2 (ja) * | 1989-08-29 | 1995-11-13 | 株式会社ミツトヨ | 座標測定用プローブの回転テーブル倣い制御方法 |
JPH03120410A (ja) * | 1989-10-02 | 1991-05-22 | Senjiyou Seiki Kk | 自動駆動型比較計測機 |
US5209131A (en) * | 1989-11-03 | 1993-05-11 | Rank Taylor Hobson | Metrology |
US5198990A (en) * | 1990-04-23 | 1993-03-30 | Fanamation, Inc. | Coordinate measurement and inspection methods and apparatus |
JPH0830978B2 (ja) * | 1990-05-22 | 1996-03-27 | 株式会社神戸製鋼所 | 産業用ロボットの教示・再生方法 |
US5208763A (en) * | 1990-09-14 | 1993-05-04 | New York University | Method and apparatus for determining position and orientation of mechanical objects |
US5355439A (en) * | 1991-08-05 | 1994-10-11 | Bio Tek Instruments | Method and apparatus for automated tissue assay |
US5696887A (en) * | 1991-08-05 | 1997-12-09 | Biotek Solutions, Incorporated | Automated tissue assay using standardized chemicals and packages |
GB9120029D0 (en) * | 1991-09-19 | 1991-11-06 | System E Controls Ltd | Measuring apparatus and method |
US5224272A (en) * | 1991-10-11 | 1993-07-06 | General Electric Company | Rotary runout measuring system |
CA2082708C (en) * | 1991-12-02 | 2004-01-13 | James Edward Randolph Jr. | Tool point compensation for hardware displacement and inclination |
DE4238139C2 (de) * | 1992-11-12 | 2002-10-24 | Zeiss Carl | Koordinatenmeßgerät |
US5563808A (en) * | 1993-05-03 | 1996-10-08 | General Electric Company | Pilger mill mandrel measuring device |
US5410817A (en) * | 1993-05-18 | 1995-05-02 | Budd Co | Measuring tool with concentric point |
US5724264A (en) * | 1993-07-16 | 1998-03-03 | Immersion Human Interface Corp. | Method and apparatus for tracking the position and orientation of a stylus and for digitizing a 3-D object |
US5505003A (en) * | 1993-10-08 | 1996-04-09 | M&M Precision Systems Corporation | Generative measuring system |
GB2294327A (en) * | 1994-10-18 | 1996-04-24 | Rank Taylor Hobson Ltd | Roundness measuring |
JP2701141B2 (ja) * | 1995-05-23 | 1998-01-21 | 株式会社ミツトヨ | 真円度測定装置 |
US6697748B1 (en) | 1995-08-07 | 2004-02-24 | Immersion Corporation | Digitizing system and rotary table for determining 3-D geometry of an object |
GB2306654A (en) * | 1995-10-31 | 1997-05-07 | Rank Taylor Hobson Ltd | Surface measuring apparatus |
GB9612383D0 (en) | 1995-12-07 | 1996-08-14 | Rank Taylor Hobson Ltd | Surface form measurement |
GB2332056B (en) * | 1997-12-04 | 2000-08-09 | Taylor Hobson Ltd | Surface measuring apparatus |
US6578276B2 (en) * | 1998-01-27 | 2003-06-17 | Eastman Kodak Company | Apparatus and method for marking multiple colors on a contoured surface having a complex topography |
EP0931649A3 (en) * | 1998-01-27 | 2000-04-26 | Eastman Kodak Company | Apparatus and method for making a contoured surface having complex topology |
GB2339287B (en) * | 1998-07-09 | 2002-12-24 | Taylor Hobson Ltd | Transducer circuit |
US6260285B1 (en) * | 1998-08-24 | 2001-07-17 | Nutec Components, Inc. | Precision workpiece positioning device |
US6195618B1 (en) | 1998-10-15 | 2001-02-27 | Microscribe, Llc | Component position verification using a probe apparatus |
JP3687896B2 (ja) * | 2000-09-27 | 2005-08-24 | 富士重工業株式会社 | 無段変速機用プーリの計測装置 |
US7270785B1 (en) | 2001-11-02 | 2007-09-18 | Ventana Medical Systems, Inc. | Automated molecular pathology apparatus having fixed slide platforms |
US7468161B2 (en) * | 2002-04-15 | 2008-12-23 | Ventana Medical Systems, Inc. | Automated high volume slide processing system |
DK1890127T3 (da) * | 2002-04-15 | 2013-09-23 | Ventana Med Syst Inc | Automatiseret objektglasfarvningssystem med høj kapacitet |
US11249095B2 (en) | 2002-04-15 | 2022-02-15 | Ventana Medical Systems, Inc. | Automated high volume slide processing system |
ES2548158T3 (es) * | 2002-04-26 | 2015-10-14 | Ventana Medical Systems, Inc. | Aparato de procesamiento de portaobjetos automático |
US6742273B2 (en) * | 2002-08-30 | 2004-06-01 | Tokyo Seimitsu Co., Ltd. | Workpiece measuring apparatus |
US7140119B2 (en) * | 2004-04-23 | 2006-11-28 | Corning Incorporated | Measurement of form of spherical and near-spherical optical surfaces |
JP4582446B2 (ja) * | 2004-11-18 | 2010-11-17 | 株式会社東京精密 | 測定装置 |
GB2422015B (en) | 2005-02-01 | 2007-02-28 | Taylor Hobson Ltd | A metrological instrument |
JP4568621B2 (ja) * | 2005-02-28 | 2010-10-27 | 株式会社ミツトヨ | 表面性状測定機の真直度補正方法および表面性状測定機 |
JP4755429B2 (ja) * | 2005-03-04 | 2011-08-24 | 株式会社ミツトヨ | 検出器駆動装置 |
US7395607B1 (en) * | 2005-06-14 | 2008-07-08 | Discovery Technology International, Lllp | Rotational and translational microposition apparatus and method |
DE102005032749A1 (de) | 2005-07-13 | 2007-01-18 | Carl Zeiss Industrielle Messtechnik Gmbh | Verfahren zum Antasten eines Werkstücks mit einem Koordinatenmessgerät und Koordinatenmessgeräte |
GB2429291B (en) | 2005-08-18 | 2008-08-20 | Taylor Hobson Ltd | A metrological apparatus |
DE102006019382A1 (de) * | 2006-04-24 | 2007-10-25 | Carl Zeiss Industrielle Messtechnik Gmbh | Scanning einer Oberfläche mit einem Koordinatenmessgerät |
GB2437982B (en) * | 2006-05-08 | 2011-07-27 | Taylor Hobson Ltd | Metrological apparatus |
DE502007004028D1 (de) * | 2007-10-24 | 2010-07-15 | Klingelnberg Ag | Messvorrichtung für schwere Werkstücke |
GB2464509C (en) * | 2008-10-17 | 2014-05-21 | Taylor Hobson Ltd | Surface measurement instrument and method |
KR101548407B1 (ko) | 2008-11-12 | 2015-08-28 | 벤타나 메디컬 시스템즈, 인코포레이티드 | 시료 운반 슬라이드를 가열하기 위한 방법 및 장치 |
JP5371532B2 (ja) * | 2009-04-23 | 2013-12-18 | 株式会社ミツトヨ | 三次元測定機 |
JP5451180B2 (ja) * | 2009-05-22 | 2014-03-26 | 株式会社ミツトヨ | 真円度測定機 |
US8650939B2 (en) * | 2009-10-13 | 2014-02-18 | Mitutoyo Corporation | Surface texture measuring machine and a surface texture measuring method |
JP5301412B2 (ja) * | 2009-10-21 | 2013-09-25 | 株式会社ミツトヨ | 測定力制御装置 |
GB2493214B (en) * | 2011-07-29 | 2016-06-08 | Taylor Hobson Ltd | Metrological apparatus |
GB2493786B (en) | 2011-08-19 | 2017-09-27 | Taylor Hobson Ltd | Metrological apparatus |
AT512005A1 (de) * | 2012-02-14 | 2013-04-15 | Minebea Co Ltd | Verfahren und vorrichtung zur bestimmung des abstands eines punktes auf einer technischen oberfläche |
JP5839476B2 (ja) * | 2012-03-19 | 2016-01-06 | 大和製衡株式会社 | 計量装置 |
JP6113963B2 (ja) * | 2012-04-26 | 2017-04-12 | 株式会社ミツトヨ | 形状測定方法、及び形状測定装置 |
JP6113998B2 (ja) * | 2012-10-18 | 2017-04-12 | 株式会社ミツトヨ | 形状測定機、形状測定機の調整方法および形状測定方法 |
CN102944190B (zh) * | 2012-11-26 | 2015-08-05 | 青岛港湾职业技术学院 | 一种测量大尺寸机械零件圆度的高精度检测仪及方法 |
JP6574137B2 (ja) | 2013-02-05 | 2019-09-11 | レニショウ パブリック リミテッド カンパニーRenishaw Public Limited Company | 部品を測定する方法および装置 |
ES2927378T3 (es) | 2013-12-13 | 2022-11-04 | Ventana Med Syst Inc | Aparato de procesamiento de portaobjetos automatizado |
US9581424B2 (en) | 2014-12-09 | 2017-02-28 | Tokyo Seimitsu Co., Ltd. | Roundness measuring apparatus |
CN106272069A (zh) * | 2015-06-11 | 2017-01-04 | 徐工集团工程机械股份有限公司 | 一种外圆柱面磨削的圆度与直线度检测装置及检测方法 |
US10391712B2 (en) * | 2016-02-18 | 2019-08-27 | Xerox Corporation | System and method for automated cleaning of parts produced by a three-dimensional object printer |
US10352679B2 (en) * | 2017-03-31 | 2019-07-16 | Mitutoyo Corporation | Compact coordinate measurement machine configuration with large working volume relative to size |
CN107101570B (zh) * | 2017-06-06 | 2019-07-05 | 哈尔滨精达测量仪器有限公司 | 一种齿轮测量中心的直角校准块布局方法、坐标标定方法和坐标调整方法 |
CN107726973B (zh) * | 2017-11-24 | 2019-11-26 | 西安工业大学 | 一种用于大型齿轮的旁置式测量机的测量坐标系建立方法 |
CN109238210B (zh) * | 2018-09-19 | 2019-12-27 | 大连理工大学 | 一种圆形低刚度工件的平行度及平面度测量装置及方法 |
CN109238218B (zh) * | 2018-09-19 | 2019-12-27 | 大连理工大学 | 一种大型抛光机盘面平面度检测装置及其工作方法 |
CN109813203A (zh) * | 2019-03-19 | 2019-05-28 | 广东工业大学 | 一种轮廓仪 |
GB201918864D0 (en) * | 2019-12-19 | 2020-02-05 | Renishaw Plc | Apparatus |
DE102022124770B3 (de) * | 2022-09-27 | 2024-02-15 | Jenoptik Industrial Metrology Germany Gmbh | Oberflächenmessgerät |
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US3741659A (en) * | 1970-06-19 | 1973-06-26 | Fellows Gear Shaper Co | Bias corrected measuring instrument |
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SU528442A2 (ru) * | 1974-04-04 | 1976-09-15 | Автоматическое измерительное устройство дл контрол профилей изделий | |
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DE2921166C2 (de) * | 1979-05-25 | 1986-10-16 | Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar | Verfahren und Anordnung zur automatischen Vermessung eines Werkstückes |
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DE2948337C2 (de) * | 1979-10-11 | 1983-07-21 | Maag-Zahnräder & -Maschinen AG, 8023 Zürich | Schaltungsanordnung zum Festlegen der Grenzen einer Meßstrecke eines Zahnflankenprüfgerätes |
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IT1144709B (it) * | 1981-05-15 | 1986-10-29 | Dea Spa | Sistema di misura dimensionale servito da una pluralita di bracci operativi e controllato da un sistema a calcolatore |
DE3123489A1 (de) * | 1981-06-13 | 1982-12-30 | Dr. Johannes Heidenhain Gmbh, 8225 Traunreut | Verfahren zur messung der rundheitsabweichungen von rotationskoerpern und einrichtungen zur durchfuehrung des verfahrens |
DE3136504C2 (de) * | 1981-09-15 | 1986-11-13 | Höfler, Willy, Prof. Dr.-Ing., 7500 Karlsruhe | Gerät zum Prüfen der Flankenform und Flankenrichtung von gerade- oder schrägverzahnten Evolventen-Zahnrädern |
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DE3150977A1 (de) * | 1981-12-23 | 1983-06-30 | Fa. Carl Zeiss, 7920 Heidenheim | Verfahren und einrichtung zur ermittlung und korrektur von fuehrungsfehlern |
DE3210711C2 (de) * | 1982-03-24 | 1986-11-13 | Dr.-Ing. Höfler Meßgerätebau GmbH, 7505 Ettlingen | Mehrkoordinatentaster mit einstellbarer Meßkraft zum Abtasten von mehrdimensionalen, stillstehenden Gegenständen |
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JPS6014101A (ja) * | 1983-07-05 | 1985-01-24 | Toyota Motor Corp | 被加工物の加工形状測定方法 |
JPS6027809A (ja) * | 1983-07-25 | 1985-02-12 | Toyota Motor Corp | 表面形状測定装置 |
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FR2564485B1 (fr) * | 1984-05-17 | 1986-08-14 | Pechiney Aluminium | Procede de purification en continu de metaux par cristallisation fractionnee sur un cylindre tournant |
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GB8431746D0 (en) * | 1984-12-17 | 1985-01-30 | Renishaw Plc | Contact-sensing probe |
JPS61209309A (ja) * | 1985-03-14 | 1986-09-17 | Mitsutoyo Mfg Co Ltd | 部品検査装置 |
GB2174216B (en) * | 1985-03-19 | 1988-10-26 | Mitutoyo Mfg Co Ltd | Method of operating a coordinate measuring instrument |
US4679331A (en) * | 1985-08-26 | 1987-07-14 | Ppg Industries, Inc. | Apparatus and method for determining contour characteristics of a contoured article |
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-
1986
- 1986-03-04 GB GB868605324A patent/GB8605324D0/en active Pending
-
1987
- 1987-02-26 EP EP87301712A patent/EP0240151B1/en not_active Expired
- 1987-02-26 DE DE8787301712T patent/DE3764135D1/de not_active Expired - Lifetime
- 1987-02-26 DE DE3789872T patent/DE3789872T3/de not_active Expired - Fee Related
- 1987-02-26 DE DE3789875T patent/DE3789875T2/de not_active Expired - Fee Related
- 1987-03-02 US US07/020,436 patent/US4807152A/en not_active Expired - Lifetime
- 1987-03-03 IN IN147/MAS/87A patent/IN169315B/en unknown
- 1987-03-03 DK DK108587A patent/DK108587A/da not_active Application Discontinuation
- 1987-03-04 JP JP62049892A patent/JPH0648186B2/ja not_active Expired - Fee Related
- 1987-03-04 CN CN198787102434A patent/CN87102434A/zh active Pending
-
1993
- 1993-12-01 JP JP5301920A patent/JP2606787B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0240151A3 (en) | 1988-03-02 |
DE3789872T2 (de) | 1994-09-01 |
JPH0791949A (ja) | 1995-04-07 |
US4807152A (en) | 1989-02-21 |
JPS62276405A (ja) | 1987-12-01 |
DE3764135D1 (de) | 1990-09-13 |
EP0240151A2 (en) | 1987-10-07 |
JP2606787B2 (ja) | 1997-05-07 |
CN87102434A (zh) | 1987-11-25 |
DE3789875T2 (de) | 1994-09-01 |
EP0240151B1 (en) | 1990-08-08 |
DK108587A (da) | 1987-09-05 |
GB8605324D0 (en) | 1986-04-09 |
DE3789872T3 (de) | 1999-11-25 |
DE3789875D1 (de) | 1994-06-23 |
DK108587D0 (da) | 1987-03-03 |
JPH0648186B2 (ja) | 1994-06-22 |
DE3789872D1 (de) | 1994-06-23 |