DK108587A - Apparat til maaling af et emnes overfladeprofil - Google Patents

Apparat til maaling af et emnes overfladeprofil

Info

Publication number
DK108587A
DK108587A DK108587A DK108587A DK108587A DK 108587 A DK108587 A DK 108587A DK 108587 A DK108587 A DK 108587A DK 108587 A DK108587 A DK 108587A DK 108587 A DK108587 A DK 108587A
Authority
DK
Denmark
Prior art keywords
measuring
surface profile
subject surface
subject
profile
Prior art date
Application number
DK108587A
Other languages
English (en)
Other versions
DK108587D0 (da
Inventor
Hugh Rogers Lane
Peter Dean Onyon
Original Assignee
Rank Taylor Hobson Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rank Taylor Hobson Ltd filed Critical Rank Taylor Hobson Ltd
Publication of DK108587D0 publication Critical patent/DK108587D0/da
Publication of DK108587A publication Critical patent/DK108587A/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
    • G01B7/282—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures for measuring roundness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/004—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points
    • G01B7/008—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points using coordinate measuring machines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/34—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces
    • G01B7/345—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces for measuring evenness
DK108587A 1986-03-04 1987-03-03 Apparat til maaling af et emnes overfladeprofil DK108587A (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB868605324A GB8605324D0 (en) 1986-03-04 1986-03-04 Metrological apparatus

Publications (2)

Publication Number Publication Date
DK108587D0 DK108587D0 (da) 1987-03-03
DK108587A true DK108587A (da) 1987-09-05

Family

ID=10594021

Family Applications (1)

Application Number Title Priority Date Filing Date
DK108587A DK108587A (da) 1986-03-04 1987-03-03 Apparat til maaling af et emnes overfladeprofil

Country Status (8)

Country Link
US (1) US4807152A (da)
EP (1) EP0240151B1 (da)
JP (2) JPH0648186B2 (da)
CN (1) CN87102434A (da)
DE (3) DE3789872T3 (da)
DK (1) DK108587A (da)
GB (1) GB8605324D0 (da)
IN (1) IN169315B (da)

Families Citing this family (80)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0240150B1 (en) 1986-03-04 1991-04-17 Rank Taylor Hobson Limited Workpiece position control
IT1211390B (it) * 1987-10-06 1989-10-18 Dea Spa Sistema grafico interattivo per la matematizzazione di modelli fisici
JPH0833433B2 (ja) * 1987-11-30 1996-03-29 東京エレクトロン株式会社 プローブ装置
FR2627582B3 (fr) * 1988-02-23 1990-06-15 Renault Automation Machine a mesurer par coordonnees
GB2218227A (en) * 1988-05-05 1989-11-08 Rank Taylor Hobson Ltd Controlling surface sensing apparatus
DE8814393U1 (da) * 1988-11-17 1989-02-02 Dipl.-Ing. Wolfgang Zwicker Gmbh & Co. Elektronische Sensortechnik, 1000 Berlin, De
EP0404597B1 (en) * 1989-06-23 1996-08-21 Rank Taylor Hobson Limited Metrological apparatus and calibration method therefor
IT1232879B (it) * 1989-07-21 1992-03-05 Prima Ind Spa Dispositivo e metodo per la misurazione automatica delle dimensioni di solidi di rivoluzione
US4972090A (en) * 1989-08-03 1990-11-20 Eaton Homer L Method and apparatus for measuring and inspecting articles of manufacture for configuration
JPH07104146B2 (ja) * 1989-08-29 1995-11-13 株式会社ミツトヨ 座標測定用プローブの回転テーブル倣い制御方法
JPH03120410A (ja) * 1989-10-02 1991-05-22 Senjiyou Seiki Kk 自動駆動型比較計測機
US5209131A (en) * 1989-11-03 1993-05-11 Rank Taylor Hobson Metrology
US5198990A (en) * 1990-04-23 1993-03-30 Fanamation, Inc. Coordinate measurement and inspection methods and apparatus
JPH0830978B2 (ja) * 1990-05-22 1996-03-27 株式会社神戸製鋼所 産業用ロボットの教示・再生方法
US5208763A (en) * 1990-09-14 1993-05-04 New York University Method and apparatus for determining position and orientation of mechanical objects
US5696887A (en) 1991-08-05 1997-12-09 Biotek Solutions, Incorporated Automated tissue assay using standardized chemicals and packages
US5355439A (en) * 1991-08-05 1994-10-11 Bio Tek Instruments Method and apparatus for automated tissue assay
GB9120029D0 (en) * 1991-09-19 1991-11-06 System E Controls Ltd Measuring apparatus and method
US5224272A (en) * 1991-10-11 1993-07-06 General Electric Company Rotary runout measuring system
CA2082708C (en) * 1991-12-02 2004-01-13 James Edward Randolph Jr. Tool point compensation for hardware displacement and inclination
DE4238139C2 (de) * 1992-11-12 2002-10-24 Zeiss Carl Koordinatenmeßgerät
US5563808A (en) * 1993-05-03 1996-10-08 General Electric Company Pilger mill mandrel measuring device
US5410817A (en) * 1993-05-18 1995-05-02 Budd Co Measuring tool with concentric point
US5724264A (en) * 1993-07-16 1998-03-03 Immersion Human Interface Corp. Method and apparatus for tracking the position and orientation of a stylus and for digitizing a 3-D object
US5505003A (en) * 1993-10-08 1996-04-09 M&M Precision Systems Corporation Generative measuring system
GB2294327A (en) * 1994-10-18 1996-04-24 Rank Taylor Hobson Ltd Roundness measuring
JP2701141B2 (ja) * 1995-05-23 1998-01-21 株式会社ミツトヨ 真円度測定装置
US6697748B1 (en) 1995-08-07 2004-02-24 Immersion Corporation Digitizing system and rotary table for determining 3-D geometry of an object
GB2306654A (en) * 1995-10-31 1997-05-07 Rank Taylor Hobson Ltd Surface measuring apparatus
GB9612383D0 (en) 1995-12-07 1996-08-14 Rank Taylor Hobson Ltd Surface form measurement
GB2332056B (en) 1997-12-04 2000-08-09 Taylor Hobson Ltd Surface measuring apparatus
US6578276B2 (en) * 1998-01-27 2003-06-17 Eastman Kodak Company Apparatus and method for marking multiple colors on a contoured surface having a complex topography
EP0931649A3 (en) * 1998-01-27 2000-04-26 Eastman Kodak Company Apparatus and method for making a contoured surface having complex topology
GB2339287B (en) * 1998-07-09 2002-12-24 Taylor Hobson Ltd Transducer circuit
US6260285B1 (en) * 1998-08-24 2001-07-17 Nutec Components, Inc. Precision workpiece positioning device
US6195618B1 (en) 1998-10-15 2001-02-27 Microscribe, Llc Component position verification using a probe apparatus
JP3687896B2 (ja) * 2000-09-27 2005-08-24 富士重工業株式会社 無段変速機用プーリの計測装置
US7270785B1 (en) 2001-11-02 2007-09-18 Ventana Medical Systems, Inc. Automated molecular pathology apparatus having fixed slide platforms
US7468161B2 (en) 2002-04-15 2008-12-23 Ventana Medical Systems, Inc. Automated high volume slide processing system
JP4299150B2 (ja) * 2002-04-15 2009-07-22 ベンタナ・メデイカル・システムズ・インコーポレーテツド 大容量のスライドを自動染色するシステム
US11249095B2 (en) 2002-04-15 2022-02-15 Ventana Medical Systems, Inc. Automated high volume slide processing system
ES2556242T3 (es) * 2002-04-26 2016-01-14 Ventana Medical Systems, Inc. Aparato de patología molecular automatizado que tiene plataformas de portaobjetos fijas
US6742273B2 (en) * 2002-08-30 2004-06-01 Tokyo Seimitsu Co., Ltd. Workpiece measuring apparatus
US7140119B2 (en) * 2004-04-23 2006-11-28 Corning Incorporated Measurement of form of spherical and near-spherical optical surfaces
JP4582446B2 (ja) * 2004-11-18 2010-11-17 株式会社東京精密 測定装置
GB2422015B (en) 2005-02-01 2007-02-28 Taylor Hobson Ltd A metrological instrument
JP4568621B2 (ja) * 2005-02-28 2010-10-27 株式会社ミツトヨ 表面性状測定機の真直度補正方法および表面性状測定機
JP4755429B2 (ja) * 2005-03-04 2011-08-24 株式会社ミツトヨ 検出器駆動装置
US7395607B1 (en) * 2005-06-14 2008-07-08 Discovery Technology International, Lllp Rotational and translational microposition apparatus and method
DE102005032749A1 (de) 2005-07-13 2007-01-18 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren zum Antasten eines Werkstücks mit einem Koordinatenmessgerät und Koordinatenmessgeräte
GB2429291B (en) 2005-08-18 2008-08-20 Taylor Hobson Ltd A metrological apparatus
DE102006019382A1 (de) * 2006-04-24 2007-10-25 Carl Zeiss Industrielle Messtechnik Gmbh Scanning einer Oberfläche mit einem Koordinatenmessgerät
GB2437982B (en) * 2006-05-08 2011-07-27 Taylor Hobson Ltd Metrological apparatus
DE502007004028D1 (de) * 2007-10-24 2010-07-15 Klingelnberg Ag Messvorrichtung für schwere Werkstücke
GB2464509C (en) * 2008-10-17 2014-05-21 Taylor Hobson Ltd Surface measurement instrument and method
WO2010056883A1 (en) 2008-11-12 2010-05-20 Ventana Medical Systems, Inc. Methods and apparatuses for heating slides carrying specimens
JP5371532B2 (ja) * 2009-04-23 2013-12-18 株式会社ミツトヨ 三次元測定機
JP5451180B2 (ja) * 2009-05-22 2014-03-26 株式会社ミツトヨ 真円度測定機
US8650939B2 (en) * 2009-10-13 2014-02-18 Mitutoyo Corporation Surface texture measuring machine and a surface texture measuring method
JP5301412B2 (ja) * 2009-10-21 2013-09-25 株式会社ミツトヨ 測定力制御装置
GB2493214B (en) * 2011-07-29 2016-06-08 Taylor Hobson Ltd Metrological apparatus
GB2493786B (en) 2011-08-19 2017-09-27 Taylor Hobson Ltd Metrological apparatus
AT512005A1 (de) * 2012-02-14 2013-04-15 Minebea Co Ltd Verfahren und vorrichtung zur bestimmung des abstands eines punktes auf einer technischen oberfläche
JP5839476B2 (ja) * 2012-03-19 2016-01-06 大和製衡株式会社 計量装置
JP6113963B2 (ja) * 2012-04-26 2017-04-12 株式会社ミツトヨ 形状測定方法、及び形状測定装置
JP6113998B2 (ja) * 2012-10-18 2017-04-12 株式会社ミツトヨ 形状測定機、形状測定機の調整方法および形状測定方法
CN102944190B (zh) * 2012-11-26 2015-08-05 青岛港湾职业技术学院 一种测量大尺寸机械零件圆度的高精度检测仪及方法
WO2014122437A1 (en) 2013-02-05 2014-08-14 Renishaw Plc Method and apparatus for measuring a part
CN117054211A (zh) 2013-12-13 2023-11-14 文塔纳医疗系统公司 生物样本的自动化组织学处理及相关的技术
US9581424B2 (en) 2014-12-09 2017-02-28 Tokyo Seimitsu Co., Ltd. Roundness measuring apparatus
CN106272069A (zh) * 2015-06-11 2017-01-04 徐工集团工程机械股份有限公司 一种外圆柱面磨削的圆度与直线度检测装置及检测方法
US10391712B2 (en) * 2016-02-18 2019-08-27 Xerox Corporation System and method for automated cleaning of parts produced by a three-dimensional object printer
US10352679B2 (en) * 2017-03-31 2019-07-16 Mitutoyo Corporation Compact coordinate measurement machine configuration with large working volume relative to size
CN107101570B (zh) * 2017-06-06 2019-07-05 哈尔滨精达测量仪器有限公司 一种齿轮测量中心的直角校准块布局方法、坐标标定方法和坐标调整方法
CN107726973B (zh) * 2017-11-24 2019-11-26 西安工业大学 一种用于大型齿轮的旁置式测量机的测量坐标系建立方法
CN109238210B (zh) * 2018-09-19 2019-12-27 大连理工大学 一种圆形低刚度工件的平行度及平面度测量装置及方法
CN109238218B (zh) * 2018-09-19 2019-12-27 大连理工大学 一种大型抛光机盘面平面度检测装置及其工作方法
CN109813203A (zh) * 2019-03-19 2019-05-28 广东工业大学 一种轮廓仪
GB201918864D0 (en) * 2019-12-19 2020-02-05 Renishaw Plc Apparatus
DE102022124770B3 (de) * 2022-09-27 2024-02-15 Jenoptik Industrial Metrology Germany Gmbh Oberflächenmessgerät

Family Cites Families (47)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3741659A (en) * 1970-06-19 1973-06-26 Fellows Gear Shaper Co Bias corrected measuring instrument
US3727119A (en) * 1971-02-01 1973-04-10 Information Dev Corp Servo controlled automatic inspection apparatus
GB1401034A (en) * 1971-07-07 1975-07-16 Dea Spa Tridimensional universal tracer point for continuous high-speed copying of profiles of models
CA1004455A (en) * 1973-05-09 1977-02-01 Paul E. Allen Carriage positioning system for coordinate measuring machines
SU528442A2 (ru) * 1974-04-04 1976-09-15 Автоматическое измерительное устройство дл контрол профилей изделий
GB1479621A (en) * 1974-08-07 1977-07-13 Rank Organisation Ltd Measuring apparatus
GB1477508A (en) * 1974-08-21 1977-06-22 Rank Organisation Ltd Measuring apparatus
US4215299A (en) * 1975-05-02 1980-07-29 Minnesota Mining And Manufacturing Company Adaptive path following motion control system for welding head assembly
DD125296A1 (da) * 1976-01-29 1977-04-13
JPS52103868U (da) * 1976-02-04 1977-08-06
JPS5366756A (en) * 1976-11-24 1978-06-14 Hitachi Ltd Measuring method and apparatus of three-dimentional curved surface
DE2701377C2 (de) * 1977-01-14 1978-11-23 W. Ferd. Klingelnberg Soehne, 5630 Remscheid Längenmeßtaster mit steuerbar veränderlicher Meßrichtung
DE2722452A1 (de) * 1977-05-18 1978-11-23 Klingelnberg Soehne Ferd Evolventen- und zahnschraegen-pruefgeraet mit elektronischer kompensation der mechanischen fehler
US4167066A (en) * 1978-04-14 1979-09-11 The Boeing Company Automatic inspection apparatus
US4158258A (en) * 1978-04-24 1979-06-19 The United States Of America As Represented By The Secretary Of The Navy Elevation sampling terrain probe
US4118871A (en) * 1978-06-13 1978-10-10 Kearney & Trecker Corporation Binary inspection probe for numerically controlled machine tools
DE2921166C2 (de) * 1979-05-25 1986-10-16 Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar Verfahren und Anordnung zur automatischen Vermessung eines Werkstückes
DE2937431A1 (de) * 1979-09-15 1981-04-02 Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar Einrichtung zur messwerterfassung an prueflingen
DE2948337C2 (de) * 1979-10-11 1983-07-21 Maag-Zahnräder & -Maschinen AG, 8023 Zürich Schaltungsanordnung zum Festlegen der Grenzen einer Meßstrecke eines Zahnflankenprüfgerätes
US4261107A (en) * 1980-03-06 1981-04-14 Caterpillar Tractor Co. Coordinate locating device
US4443946A (en) * 1980-07-01 1984-04-24 Renishaw Electrical Limited Probe for measuring workpieces
JPS57110913A (en) * 1980-12-27 1982-07-10 Toyota Motor Corp Measurement of curved surface
JPS57154012A (en) * 1981-03-20 1982-09-22 Nippon Steel Corp Non-contact measuring device
IT1144709B (it) * 1981-05-15 1986-10-29 Dea Spa Sistema di misura dimensionale servito da una pluralita di bracci operativi e controllato da un sistema a calcolatore
DE3123489A1 (de) * 1981-06-13 1982-12-30 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Verfahren zur messung der rundheitsabweichungen von rotationskoerpern und einrichtungen zur durchfuehrung des verfahrens
DE3136504C2 (de) * 1981-09-15 1986-11-13 Höfler, Willy, Prof. Dr.-Ing., 7500 Karlsruhe Gerät zum Prüfen der Flankenform und Flankenrichtung von gerade- oder schrägverzahnten Evolventen-Zahnrädern
DE3141350C2 (de) * 1981-10-17 1985-11-28 Höfler, Willy, Prof. Dr.-Ing., 7500 Karlsruhe Verfahren zum Synchronisieren der Tasterbewegung eines Teilungs- und/oder Rundlaufmeßgerätes für Zahnräder
GB2112140B (en) * 1981-12-16 1985-08-07 Mauser Werke Oberndorf Coordinate measuring machine
DE3150977A1 (de) * 1981-12-23 1983-06-30 Fa. Carl Zeiss, 7920 Heidenheim Verfahren und einrichtung zur ermittlung und korrektur von fuehrungsfehlern
DE3210711C2 (de) * 1982-03-24 1986-11-13 Dr.-Ing. Höfler Meßgerätebau GmbH, 7505 Ettlingen Mehrkoordinatentaster mit einstellbarer Meßkraft zum Abtasten von mehrdimensionalen, stillstehenden Gegenständen
US4483293A (en) * 1982-04-06 1984-11-20 Mitsubishi Denki Kabushiki Kaisha Ignition time control device
JPS58221462A (ja) * 1982-06-17 1983-12-23 Fuji Electric Co Ltd マルチプロセツサシステム
DE3320983C2 (de) * 1983-06-10 1985-12-05 Willy Prof. Dr.-Ing. 7500 Karlsruhe Höfler Transportables Gerät zur Prüfung des Zahnflankenprofils und der Zahnflankenlinien (Zahnschräge) von Zahnrädern auf Verzahnmaschinen oder Zahnflankenschleifmaschinen sowie zur Positionierung dieses Gerätes und zum Orientieren des Meßtasters an der Verzahnung für den Meßvorgang
JPS6014101A (ja) * 1983-07-05 1985-01-24 Toyota Motor Corp 被加工物の加工形状測定方法
JPS6027809A (ja) * 1983-07-25 1985-02-12 Toyota Motor Corp 表面形状測定装置
US4630215A (en) * 1983-10-31 1986-12-16 Graham Jr Merrill E Machine tool tracer assembly and control system
US4665739A (en) * 1984-04-10 1987-05-19 Mitutoyo Mfg. Co., Ltd Surface roughness measuring instrument
DE3590167T (de) * 1984-04-20 1986-05-15 Mitutoyo Mfg. Co., Ltd., Tokio/Tokyo Koordinatenmeßgerät
FR2564485B1 (fr) * 1984-05-17 1986-08-14 Pechiney Aluminium Procede de purification en continu de metaux par cristallisation fractionnee sur un cylindre tournant
JPS61105411A (ja) * 1984-10-29 1986-05-23 Mitsutoyo Mfg Co Ltd 多次元測定機の測定方法
GB8431746D0 (en) * 1984-12-17 1985-01-30 Renishaw Plc Contact-sensing probe
JPS61209309A (ja) * 1985-03-14 1986-09-17 Mitsutoyo Mfg Co Ltd 部品検査装置
GB2174216B (en) * 1985-03-19 1988-10-26 Mitutoyo Mfg Co Ltd Method of operating a coordinate measuring instrument
US4679331A (en) * 1985-08-26 1987-07-14 Ppg Industries, Inc. Apparatus and method for determining contour characteristics of a contoured article
GB2180117B (en) * 1985-09-05 1989-09-06 Ferranti Plc Three-dimensional position measuring apparatus
US4663852A (en) * 1985-09-19 1987-05-12 Digital Electronic Automation, Inc Active error compensation in a coordinated measuring machine
US4702652A (en) * 1985-12-30 1987-10-27 Mitsubishi Jukogyo Kabushiki Kaisha Advanced memory type profiling control method for a machine tool

Also Published As

Publication number Publication date
JPH0791949A (ja) 1995-04-07
GB8605324D0 (en) 1986-04-09
JPH0648186B2 (ja) 1994-06-22
JP2606787B2 (ja) 1997-05-07
DE3764135D1 (de) 1990-09-13
DK108587D0 (da) 1987-03-03
DE3789875D1 (de) 1994-06-23
DE3789872T2 (de) 1994-09-01
IN169315B (da) 1991-09-28
US4807152A (en) 1989-02-21
EP0240151A2 (en) 1987-10-07
EP0240151B1 (en) 1990-08-08
DE3789875T2 (de) 1994-09-01
DE3789872D1 (de) 1994-06-23
CN87102434A (zh) 1987-11-25
JPS62276405A (ja) 1987-12-01
DE3789872T3 (de) 1999-11-25
EP0240151A3 (en) 1988-03-02

Similar Documents

Publication Publication Date Title
DK108587D0 (da) Apparat til maaling af et emnes overfladeprofil
DK148485A (da) Apparat til afproevning af et borehul
DK58689D0 (da) Apparat til etablering af oesofagoenterostomier
DK21583A (da) Apparat til niveaumaalinger
DK468088D0 (da) Indretning til fastgoerelse af signaltekniske forbindelseslister
DK646488D0 (da) Apparat til identifikation af moenter
DK157155C (da) Fremgangsmaade til maaling af fortrinsvis hoejviskose vaeskers flydeegenskaber samt apparat til udfoerelse af fremgangsmaaden
DK319488A (da) Apparat til maaling af en recessus
DK571586A (da) Apparat til registrering af en beroering
KR870010384A (ko) 표층두께 측정장치
KR860005216A (ko) 광계측장치
DK161227C (da) Apparat til synkronisering af tyveridetektorer
DK394886D0 (da) Apparat til rensning af overflader
DK314186D0 (da) Apparat til samling af genstande med en samlemasse
DK155075C (da) Apparat til afkimning af et fluidum
DK12682A (da) Apparat til vulkanisering af doek
DK514289A (da) Indretning til maaling af et medieniveau
DK604486A (da) Foeleranordning til maaling af en fysisk stoerrelse
DK448082A (da) Apparat til maaling af en skrues forlaengelse
DK297688A (da) Apparat til maaling af konsistens
DK407288A (da) Apparat til bestemmelse af en blodproeves blodtype
DK332787D0 (da) Indretning til bibeholdelse af et adskillende vaeskelag
DK197189D0 (da) Apparat til faerdigbearbejdning af et emne
DK297186A (da) Apparat til maaling af hudelasticitet
DK591386A (da) Apparat til venestimulation

Legal Events

Date Code Title Description
AHS Application shelved for other reasons than non-payment