IL162847A0 - Electrical feedback detection system for multi-point probes - Google Patents

Electrical feedback detection system for multi-point probes

Info

Publication number
IL162847A0
IL162847A0 IL16284703A IL16284703A IL162847A0 IL 162847 A0 IL162847 A0 IL 162847A0 IL 16284703 A IL16284703 A IL 16284703A IL 16284703 A IL16284703 A IL 16284703A IL 162847 A0 IL162847 A0 IL 162847A0
Authority
IL
Israel
Prior art keywords
electrical
detection system
test sample
sample surface
point probe
Prior art date
Application number
IL16284703A
Other languages
English (en)
Original Assignee
Capres As
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=8160957&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=IL162847(A0) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Capres As filed Critical Capres As
Publication of IL162847A0 publication Critical patent/IL162847A0/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/06—Probe tip arrays
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/041—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04—Fine scanning or positioning
    • G01Q10/06—Circuits or algorithms therefor
    • G01Q10/065—Feedback mechanisms, i.e. wherein the signal for driving the probe is modified by a signal coming from the probe itself
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/30—Scanning potential microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06794—Devices for sensing when probes are in contact, or in position to contact, with measured object
IL16284703A 2002-01-07 2003-01-07 Electrical feedback detection system for multi-point probes IL162847A0 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DKPA200200020 2002-01-07
PCT/DK2003/000006 WO2003058260A1 (en) 2002-01-07 2003-01-07 Electrical feedback detection system for multi-point probes

Publications (1)

Publication Number Publication Date
IL162847A0 true IL162847A0 (en) 2005-11-20

Family

ID=8160957

Family Applications (1)

Application Number Title Priority Date Filing Date
IL16284703A IL162847A0 (en) 2002-01-07 2003-01-07 Electrical feedback detection system for multi-point probes

Country Status (9)

Country Link
US (2) US7135876B2 (zh)
EP (1) EP1466182B1 (zh)
JP (1) JP4500546B2 (zh)
KR (1) KR100978699B1 (zh)
CN (1) CN1628251B (zh)
AT (1) ATE519119T1 (zh)
AU (1) AU2003206667A1 (zh)
IL (1) IL162847A0 (zh)
WO (1) WO2003058260A1 (zh)

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AU2003206667A1 (en) 2002-01-07 2003-07-24 Capres A/S Electrical feedback detection system for multi-point probes
CN102305896B (zh) * 2004-06-21 2015-05-13 卡普雷斯股份有限公司 一种用于提供探头对准的方法
US7541219B2 (en) * 2004-07-02 2009-06-02 Seagate Technology Llc Integrated metallic contact probe storage device
JP4665704B2 (ja) * 2005-10-17 2011-04-06 セイコーインスツル株式会社 計測プローブ及び表面特性計測装置並びに表面特性計測方法
US7268571B1 (en) * 2006-03-20 2007-09-11 Texas Instruments Incorporated Method for validating and monitoring automatic test equipment contactor
JP5744401B2 (ja) * 2006-04-24 2015-07-08 カプレス・アクティーゼルスカブＣａｐｒｅｓ Ａ／Ｓ 浅い半導体注入のシート抵抗およびリーク電流密度の測定方法
KR100868071B1 (ko) * 2006-09-27 2008-11-10 연세대학교 산학협력단 차동 전극 임피던스의 상대적인 측정을 이용한 전극의 접촉모니터링 방법
US8113038B2 (en) * 2006-12-20 2012-02-14 International Business Machines Corporation Systems and methods for detecting a coating on an item such as a magnetic head
EP1970714A1 (en) * 2007-03-12 2008-09-17 Capres Aps Device including a contact detector
EP2237052A1 (en) 2009-03-31 2010-10-06 Capres A/S Automated multi-point probe manipulation
CN102436334A (zh) * 2011-10-27 2012-05-02 苏州瀚瑞微电子有限公司 电容触摸屏系统测试机
EP2677324A1 (en) 2012-06-20 2013-12-25 Capres A/S Deep-etched multipoint probe
US9194888B2 (en) 2012-10-11 2015-11-24 Tektronix, Inc. Automatic probe ground connection checking techniques
US9170273B2 (en) * 2013-12-09 2015-10-27 Globalfoundries U.S. 2 Llc High frequency capacitance-voltage nanoprobing characterization
CN105445557A (zh) * 2015-01-04 2016-03-30 宁波英飞迈材料科技有限公司 一种高通量电阻率测试装置
DE102015105075A1 (de) * 2015-04-01 2016-10-06 Infineon Technologies Ag Stromsensor
EP3411880A4 (en) * 2016-02-01 2019-10-09 Bio-Rad Laboratories, Inc. DIRECT CONTACT INSTRUMENT CALIBRATION SYSTEM
CN107656146B (zh) * 2016-07-25 2019-10-18 中核建中核燃料元件有限公司 一种预防测头触碰格架的测量装置的测量方法
CN108982950B (zh) * 2018-07-02 2021-10-22 东北大学 测试ybco膜超导环流电压信号的传感器及其制作方法
CN110850126B (zh) * 2018-08-03 2022-12-27 均豪精密工业股份有限公司 检测系统、探针装置及面板检测方法
TWI827809B (zh) * 2019-04-04 2024-01-01 丹麥商卡普雷斯股份有限公司 測量測試樣本之電性的方法，以及多層測試樣本
KR102512651B1 (ko) * 2021-03-25 2023-03-23 연세대학교 산학협력단 주사탐침 현미경용 프로브 및 이를 포함하는 이진 상태 주사탐침 현미경
EP4332558A1 (en) * 2022-09-05 2024-03-06 Stichting IMEC Nederland Methods and devices for liquid impedance measurement using a four-electrode device

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DE3246669A1 (de) 1982-12-16 1984-06-20 Siemens AG, 1000 Berlin und 8000 München Leckwaechter
JPS59119276A (ja) * 1982-12-27 1984-07-10 Hitachi Ltd 絶縁抵抗測定装置
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US5214389A (en) * 1992-01-06 1993-05-25 Motorola, Inc. Multi-dimensional high-resolution probe for semiconductor measurements including piezoelectric transducer arrangement for controlling probe position
US5627522A (en) * 1992-03-27 1997-05-06 Abbott Laboratories Automated liquid level sensing system
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US5691648A (en) * 1992-11-10 1997-11-25 Cheng; David Method and apparatus for measuring sheet resistance and thickness of thin films and substrates
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US6091248A (en) * 1994-08-29 2000-07-18 Imec Vzw Method for measuring the electrical potential in a semiconductor element
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CA2336531A1 (en) 1998-07-08 2000-01-20 Capres Aps Multi-point probe
EP0974845A1 (en) 1998-07-08 2000-01-26 Christian Leth Petersen Apparatus for testing electric properties using a multi-point probe
JP2000214181A (ja) * 1999-01-21 2000-08-04 Hioki Ee Corp コンタクトプロ―ブおよび回路基板検査装置
DK1085327T3 (da) * 1999-09-15 2006-10-09 Capres As Flerpunktsprobe
CA2309412A1 (en) * 2000-05-24 2001-11-24 Michael Thompson Scanning of biochemical microassays by kelvin microprobe
JP3638865B2 (ja) * 2000-07-13 2005-04-13 喜萬 中山 ナノチューブ端子を用いた四端子測定装置
AU2003206667A1 (en) 2002-01-07 2003-07-24 Capres A/S Electrical feedback detection system for multi-point probes

Also Published As

Publication number Publication date
US20050127929A1 (en) 2005-06-16
EP1466182B1 (en) 2011-08-03
JP2005514625A (ja) 2005-05-19
EP1466182A1 (en) 2004-10-13
ATE519119T1 (de) 2011-08-15
US20070024301A1 (en) 2007-02-01
US7135876B2 (en) 2006-11-14
AU2003206667A1 (en) 2003-07-24
CN1628251A (zh) 2005-06-15
US7307436B2 (en) 2007-12-11
CN1628251B (zh) 2010-08-18
KR100978699B1 (ko) 2010-08-30
WO2003058260A1 (en) 2003-07-17
JP4500546B2 (ja) 2010-07-14
KR20040085146A (ko) 2004-10-07

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