TW200724926A - Probe card apparatus with protection circuit function - Google Patents

Probe card apparatus with protection circuit function

Info

Publication number
TW200724926A
TW200724926A TW094147337A TW94147337A TW200724926A TW 200724926 A TW200724926 A TW 200724926A TW 094147337 A TW094147337 A TW 094147337A TW 94147337 A TW94147337 A TW 94147337A TW 200724926 A TW200724926 A TW 200724926A
Authority
TW
Taiwan
Prior art keywords
circuit
probe card
welding spots
card apparatus
electric
Prior art date
Application number
TW094147337A
Other languages
Chinese (zh)
Other versions
TWI274162B (en
Inventor
wei-zheng Gu
zhi-hao He
Original Assignee
Mjc Probe Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mjc Probe Inc filed Critical Mjc Probe Inc
Priority to TW94147337A priority Critical patent/TWI274162B/en
Application granted granted Critical
Publication of TWI274162B publication Critical patent/TWI274162B/en
Publication of TW200724926A publication Critical patent/TW200724926A/en

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The present invention provides a probe card apparatus with protection circuit function, which comprises a circuit board, a plurality of probes, and a protection body; wherein, the circuit board is configured with electric circuit, and provided with two opposite up and down surfaces, and these two surfaces are configured with a plurality of welding spots electrically connected with the circuit, in which the upper surface could be divided into a probe area and a test area, and these probes are configured at the welding spots on the lower surface corresponding to the probe area for touching with the electric components to be detected; and, the protection body is configured on the circuit board, and provided with a plurality of through-holes configured correspondingly to the welding spots in the test area; and, the electrical testing machine employs the measuring pins to electrically connect with the corresponding welding spots through these through-holes for sending out the measurement signal, and transmitting to the electric components through the circuit, so as to conduct the electric measurement on the electric components with the probe card apparatus.
TW94147337A 2005-12-29 2005-12-29 Probe card apparatus with protection circuit function TWI274162B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW94147337A TWI274162B (en) 2005-12-29 2005-12-29 Probe card apparatus with protection circuit function

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW94147337A TWI274162B (en) 2005-12-29 2005-12-29 Probe card apparatus with protection circuit function

Publications (2)

Publication Number Publication Date
TWI274162B TWI274162B (en) 2007-02-21
TW200724926A true TW200724926A (en) 2007-07-01

Family

ID=38623071

Family Applications (1)

Application Number Title Priority Date Filing Date
TW94147337A TWI274162B (en) 2005-12-29 2005-12-29 Probe card apparatus with protection circuit function

Country Status (1)

Country Link
TW (1) TWI274162B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102215627B (en) * 2010-04-08 2013-02-27 旺矽科技股份有限公司 Multilayer circuit board
TWI579566B (en) * 2015-08-10 2017-04-21 創意電子股份有限公司 Circuit probing system and its circuit probing device

Also Published As

Publication number Publication date
TWI274162B (en) 2007-02-21

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees