TW200724926A - Probe card apparatus with protection circuit function - Google Patents
Probe card apparatus with protection circuit functionInfo
- Publication number
- TW200724926A TW200724926A TW094147337A TW94147337A TW200724926A TW 200724926 A TW200724926 A TW 200724926A TW 094147337 A TW094147337 A TW 094147337A TW 94147337 A TW94147337 A TW 94147337A TW 200724926 A TW200724926 A TW 200724926A
- Authority
- TW
- Taiwan
- Prior art keywords
- circuit
- probe card
- welding spots
- card apparatus
- electric
- Prior art date
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The present invention provides a probe card apparatus with protection circuit function, which comprises a circuit board, a plurality of probes, and a protection body; wherein, the circuit board is configured with electric circuit, and provided with two opposite up and down surfaces, and these two surfaces are configured with a plurality of welding spots electrically connected with the circuit, in which the upper surface could be divided into a probe area and a test area, and these probes are configured at the welding spots on the lower surface corresponding to the probe area for touching with the electric components to be detected; and, the protection body is configured on the circuit board, and provided with a plurality of through-holes configured correspondingly to the welding spots in the test area; and, the electrical testing machine employs the measuring pins to electrically connect with the corresponding welding spots through these through-holes for sending out the measurement signal, and transmitting to the electric components through the circuit, so as to conduct the electric measurement on the electric components with the probe card apparatus.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW94147337A TWI274162B (en) | 2005-12-29 | 2005-12-29 | Probe card apparatus with protection circuit function |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW94147337A TWI274162B (en) | 2005-12-29 | 2005-12-29 | Probe card apparatus with protection circuit function |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI274162B TWI274162B (en) | 2007-02-21 |
TW200724926A true TW200724926A (en) | 2007-07-01 |
Family
ID=38623071
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW94147337A TWI274162B (en) | 2005-12-29 | 2005-12-29 | Probe card apparatus with protection circuit function |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI274162B (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102215627B (en) * | 2010-04-08 | 2013-02-27 | 旺矽科技股份有限公司 | Multilayer circuit board |
TWI579566B (en) * | 2015-08-10 | 2017-04-21 | 創意電子股份有限公司 | Circuit probing system and its circuit probing device |
-
2005
- 2005-12-29 TW TW94147337A patent/TWI274162B/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
TWI274162B (en) | 2007-02-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
MY192337A (en) | Test socket assembly | |
TW201129814A (en) | Electrical connecting apparatus and testing system using the same | |
WO2007008790A3 (en) | Probe card assembly with an interchangeable probe insert | |
TW200704935A (en) | Inspection device for display panel and interface used therein | |
MY146841A (en) | Probe card | |
TW200942844A (en) | Electronic device testing system and method | |
TW200801527A (en) | Probe, testing head having a plurality of probes, and circuit board tester having the testing head | |
TW200641377A (en) | Apparatus and method for testing component built in circuit board | |
ATE519119T1 (en) | ELECTRICAL FEEDBACK DETECTION SYSTEM FOR MULTI-POINT PROBE | |
WO2011087215A3 (en) | Probe card | |
WO2010093517A3 (en) | Integrated unit for electrical/reliability testing with improved thermal control | |
CN203595732U (en) | Test probe stand | |
MY162914A (en) | Wiring board for testing loaded printed circuit board | |
TW200706878A (en) | High frequency cantilever type probe card | |
CN201867426U (en) | Electrical testing device | |
CN102236031A (en) | Test fixture for printed circuit board | |
HK1163821A1 (en) | Contact-connection unit for a test apparatus for testing printed circuit boards | |
TW200801530A (en) | Air bridge structures and method of making and using air bridge structures | |
TW200724926A (en) | Probe card apparatus with protection circuit function | |
TW200709316A (en) | Substrate and testing method thereof | |
TW200601401A (en) | Dut interface of semiconductor test apparatus | |
TW200716997A (en) | Electrical testing device | |
CN205484693U (en) | A smelting tool for circuit board detects | |
CN204269713U (en) | Multi input impedance operating voltage proving installation | |
TW200718946A (en) | Electrical test clamping fixture |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |