IL158340A0 - High pressure processing chamber for semiconductor substrate including flow enhancing features - Google Patents
High pressure processing chamber for semiconductor substrate including flow enhancing featuresInfo
- Publication number
- IL158340A0 IL158340A0 IL15834002A IL15834002A IL158340A0 IL 158340 A0 IL158340 A0 IL 158340A0 IL 15834002 A IL15834002 A IL 15834002A IL 15834002 A IL15834002 A IL 15834002A IL 158340 A0 IL158340 A0 IL 158340A0
- Authority
- IL
- Israel
- Prior art keywords
- semiconductor substrate
- high pressure
- processing chamber
- substrate including
- pressure processing
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/02—Cleaning by the force of jets or sprays
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67069—Apparatus for fluid treatment for etching for drying etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67075—Apparatus for fluid treatment for etching for wet etching
- H01L21/6708—Apparatus for fluid treatment for etching for wet etching using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67126—Apparatus for sealing, encapsulating, glassing, decapsulating or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/6715—Apparatus for applying a liquid, a resin, an ink or the like
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US28313201P | 2001-04-10 | 2001-04-10 | |
PCT/US2002/011461 WO2002084709A2 (en) | 2001-04-10 | 2002-04-10 | High pressure processing chamber for semiconductor substrate including flow enhancing features |
Publications (1)
Publication Number | Publication Date |
---|---|
IL158340A0 true IL158340A0 (en) | 2004-05-12 |
Family
ID=23084672
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IL15834002A IL158340A0 (en) | 2001-04-10 | 2002-04-10 | High pressure processing chamber for semiconductor substrate including flow enhancing features |
Country Status (10)
Country | Link |
---|---|
US (1) | US20020189543A1 (xx) |
EP (1) | EP1573779A4 (xx) |
JP (1) | JP4047727B2 (xx) |
KR (1) | KR100777892B1 (xx) |
CN (1) | CN100392796C (xx) |
AU (1) | AU2002252637A1 (xx) |
CA (1) | CA2444296A1 (xx) |
IL (1) | IL158340A0 (xx) |
TW (1) | TW589657B (xx) |
WO (1) | WO2002084709A2 (xx) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6722642B1 (en) * | 2002-11-06 | 2004-04-20 | Tokyo Electron Limited | High pressure compatible vacuum chuck for semiconductor wafer including lift mechanism |
DE10255231B4 (de) * | 2002-11-26 | 2006-02-02 | Uhde High Pressure Technologies Gmbh | Hochdruckvorrichtung zum Verschließen eines Druckbehälters im Reinraum |
US7225820B2 (en) * | 2003-02-10 | 2007-06-05 | Tokyo Electron Limited | High-pressure processing chamber for a semiconductor wafer |
US7767145B2 (en) | 2005-03-28 | 2010-08-03 | Toyko Electron Limited | High pressure fourier transform infrared cell |
US7789971B2 (en) | 2005-05-13 | 2010-09-07 | Tokyo Electron Limited | Treatment of substrate using functionalizing agent in supercritical carbon dioxide |
KR100794588B1 (ko) * | 2006-08-10 | 2008-01-17 | 세메스 주식회사 | 매엽식 기판 처리 장치 및 방법 |
US8298338B2 (en) * | 2007-12-26 | 2012-10-30 | Samsung Electronics Co., Ltd. | Chemical vapor deposition apparatus |
KR101932035B1 (ko) * | 2012-02-08 | 2018-12-26 | 삼성전자주식회사 | 기판 처리용 유체 공급 시스템 및 방법 |
CN105336723B (zh) | 2014-07-28 | 2018-09-14 | 通用电气公司 | 半导体模块、半导体模块组件及半导体装置 |
KR101623411B1 (ko) | 2014-11-03 | 2016-05-24 | 세메스 주식회사 | 기판 처리 장치 |
KR101910801B1 (ko) * | 2016-10-26 | 2019-01-07 | 세메스 주식회사 | 기판 처리 장치 및 방법 |
KR102358561B1 (ko) | 2017-06-08 | 2022-02-04 | 삼성전자주식회사 | 기판 처리 장치 및 집적회로 소자 제조 장치 |
FI128855B (en) * | 2019-09-24 | 2021-01-29 | Picosun Oy | FLUID DISTRIBUTOR FOR THIN FILM GROWING EQUIPMENT, RELATED EQUIPMENT AND METHODS |
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-
2002
- 2002-04-10 WO PCT/US2002/011461 patent/WO2002084709A2/en active Search and Examination
- 2002-04-10 AU AU2002252637A patent/AU2002252637A1/en not_active Abandoned
- 2002-04-10 TW TW091107232A patent/TW589657B/zh not_active IP Right Cessation
- 2002-04-10 KR KR1020037013332A patent/KR100777892B1/ko not_active IP Right Cessation
- 2002-04-10 CN CNB028116585A patent/CN100392796C/zh not_active Expired - Fee Related
- 2002-04-10 CA CA002444296A patent/CA2444296A1/en not_active Abandoned
- 2002-04-10 US US10/121,791 patent/US20020189543A1/en not_active Abandoned
- 2002-04-10 JP JP2002581561A patent/JP4047727B2/ja not_active Expired - Fee Related
- 2002-04-10 IL IL15834002A patent/IL158340A0/xx unknown
- 2002-04-10 EP EP02721721A patent/EP1573779A4/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
KR100777892B1 (ko) | 2007-11-21 |
EP1573779A2 (en) | 2005-09-14 |
WO2002084709A2 (en) | 2002-10-24 |
US20020189543A1 (en) | 2002-12-19 |
EP1573779A4 (en) | 2006-11-15 |
AU2002252637A1 (en) | 2002-10-28 |
TW589657B (en) | 2004-06-01 |
JP4047727B2 (ja) | 2008-02-13 |
AU2002252637A8 (en) | 2012-03-08 |
KR20040067871A (ko) | 2004-07-30 |
CN100392796C (zh) | 2008-06-04 |
JP2005504431A (ja) | 2005-02-10 |
CN1630931A (zh) | 2005-06-22 |
WO2002084709A3 (en) | 2012-02-16 |
CA2444296A1 (en) | 2002-10-24 |
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