HK1199932A1 - 具有絕緣構件之電氣連接器 - Google Patents

具有絕緣構件之電氣連接器

Info

Publication number
HK1199932A1
HK1199932A1 HK15100247.4A HK15100247A HK1199932A1 HK 1199932 A1 HK1199932 A1 HK 1199932A1 HK 15100247 A HK15100247 A HK 15100247A HK 1199932 A1 HK1199932 A1 HK 1199932A1
Authority
HK
Hong Kong
Prior art keywords
electrical connector
insulation member
insulation
connector
electrical
Prior art date
Application number
HK15100247.4A
Other languages
English (en)
Inventor
Jiachun Zhou
Caiyun Yang
Original Assignee
Interconnect Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Interconnect Devices Inc filed Critical Interconnect Devices Inc
Publication of HK1199932A1 publication Critical patent/HK1199932A1/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2435—Contacts for co-operating by abutting resilient; resiliently-mounted with opposite contact points, e.g. C beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/0675—Needle-like
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/40—Securing contact members in or to a base or case; Insulating of contact members
    • H01R13/42—Securing in a demountable manner
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49117—Conductor or circuit manufacturing
    • Y10T29/49204—Contact or terminal manufacturing
    • Y10T29/49208—Contact or terminal manufacturing by assembling plural parts

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Connecting Device With Holders (AREA)
HK15100247.4A 2012-02-03 2015-01-09 具有絕緣構件之電氣連接器 HK1199932A1 (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/365,931 US8758066B2 (en) 2012-02-03 2012-02-03 Electrical connector with insulation member
PCT/US2013/022893 WO2013116077A1 (en) 2012-02-03 2013-01-24 Electrical connector with insulation member

Publications (1)

Publication Number Publication Date
HK1199932A1 true HK1199932A1 (zh) 2015-07-24

Family

ID=47679056

Family Applications (1)

Application Number Title Priority Date Filing Date
HK15100247.4A HK1199932A1 (zh) 2012-02-03 2015-01-09 具有絕緣構件之電氣連接器

Country Status (10)

Country Link
US (1) US8758066B2 (zh)
EP (1) EP2810085B1 (zh)
JP (1) JP6231994B2 (zh)
KR (1) KR101593572B1 (zh)
HK (1) HK1199932A1 (zh)
MY (1) MY184305A (zh)
PH (1) PH12014501745A1 (zh)
SG (1) SG11201403777VA (zh)
TW (1) TWI474007B (zh)
WO (1) WO2013116077A1 (zh)

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US20140115891A1 (en) * 2012-10-25 2014-05-01 Po-Kai Hsu Connector terminal preparation method
KR200473045Y1 (ko) * 2014-01-17 2014-06-27 (주)에스피에스 이중접점스위치 및 이중접점스위치를 갖는 마그네틱 커넥터
US9209548B2 (en) * 2014-04-01 2015-12-08 Interconnect Devices, Inc. Electrical probe with rotatable plunger
US9673539B2 (en) * 2015-09-23 2017-06-06 Texas Instruments Incorporated Spring biased contact pin assembly
US9590359B1 (en) * 2015-09-30 2017-03-07 Raytheon Company Coaxial electrical interconnect
JP6837283B2 (ja) * 2016-02-29 2021-03-03 株式会社ヨコオ ソケット
KR101882209B1 (ko) * 2016-03-23 2018-07-27 리노공업주식회사 동축 테스트소켓 조립체
JP6717687B2 (ja) * 2016-06-28 2020-07-01 株式会社エンプラス コンタクトピンおよび電気部品用ソケット
JP6850583B2 (ja) * 2016-10-24 2021-03-31 株式会社ヨコオ ソケット
WO2018103074A1 (en) * 2016-12-09 2018-06-14 Telefonaktiebolaget Lm Ericsson (Publ) Electrical test probe and testing system using the same
KR101767240B1 (ko) * 2017-03-29 2017-08-11 (주)마이크로티에스 인쇄 회로 기판에 설치되는 통전 검사용 장치
JP2020521986A (ja) * 2017-05-26 2020-07-27 スミスズ インターコネクト アメリカズ インコーポレイテッドＳｍｉｔｈｓ Ｉｎｔｅｒｃｏｎｎｅｃｔ Ａｍｅｒｉｃａｓ， Ｉｎｃ． インピーダンス制御テストソケット
SG11202002097UA (en) * 2017-09-08 2020-04-29 Enplas Corp Electric connection socket
TWI640783B (zh) * 2017-09-15 2018-11-11 中華精測科技股份有限公司 探針卡裝置及其圓形探針
US10367279B2 (en) * 2017-10-26 2019-07-30 Xilinx, Inc. Pusher pin having a non-electrically conductive portion
JP7153670B2 (ja) * 2017-11-30 2022-10-14 株式会社エンプラス 電気接続用ソケットの製造方法
TWI638166B (zh) * 2018-01-24 2018-10-11 中華精測科技股份有限公司 探針卡裝置及矩形探針
CN110068711B (zh) * 2018-01-24 2022-04-26 台湾中华精测科技股份有限公司 探针卡装置及矩形探针
JP7068578B2 (ja) 2018-03-30 2022-05-17 山一電機株式会社 検査用ソケット
CN109061245B (zh) * 2018-10-12 2023-12-05 上海军友射频技术有限公司 一种测试pcb板阻抗射频探针
CN110109001B (zh) * 2019-04-30 2024-03-15 北京大学 一种原位气氛热电两场测试用样品台及芯片电极自密封结构
CN111951878A (zh) * 2019-05-16 2020-11-17 第一检测有限公司 检测设备、芯片承载装置及电连接单元
JP7489264B2 (ja) 2020-08-24 2024-05-23 株式会社ニチベイ 制御装置及び制御方法
KR102413287B1 (ko) * 2020-10-21 2022-06-27 주식회사 오킨스전자 테스트 소켓
KR102645620B1 (ko) * 2021-08-30 2024-03-08 주식회사 오킨스전자 포고 핀 및 이의 제조 방법
US20230180397A1 (en) * 2021-12-06 2023-06-08 R&D Circuits Method and process for creating high-performance coax sockets
WO2023229627A1 (en) * 2022-05-25 2023-11-30 Rakuten Symphony Uk Ltd Spring pin rf coaxial interconnect

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IT1023139B (it) * 1974-10-31 1978-05-10 Marchetti Silvano Dispositivo a membrane piane espandibili per la misura in sito del modulo di deformabilita dei terreni non richiedente la esecuzione dei fori di sondaggio
US5576631A (en) 1992-03-10 1996-11-19 Virginia Panel Corporation Coaxial double-headed spring contact probe assembly
US5768089A (en) * 1997-01-10 1998-06-16 Varian Associates, Inc. Variable external capacitor for NMR probe
KR100429057B1 (ko) * 1998-11-25 2004-04-29 리카 일렉트로닉스 인터내셔널, 인크. 전기 접촉 시스템
JP2004504703A (ja) 2000-07-13 2004-02-12 リカ　エレクトロニクス　インターナショナル　インコーポレイテッド 試験機器に特に有用な接点器具
JP4242199B2 (ja) * 2003-04-25 2009-03-18 株式会社ヨコオ Ｉｃソケット
JP2004325306A (ja) * 2003-04-25 2004-11-18 Yokowo Co Ltd 検査用同軸プローブおよびそれを用いた検査ユニット
JP4438601B2 (ja) * 2004-10-28 2010-03-24 株式会社ヨコオ 検査ユニットの製法
US7116121B1 (en) 2005-10-27 2006-10-03 Agilent Technologies, Inc. Probe assembly with controlled impedance spring pin or resistor tip spring pin contacts
JP4800804B2 (ja) 2006-03-14 2011-10-26 日置電機株式会社 プローブおよび測定装置
JP2008070146A (ja) * 2006-09-12 2008-03-27 Yokowo Co Ltd 検査用ソケット
US7862391B2 (en) * 2007-09-18 2011-01-04 Delaware Capital Formation, Inc. Spring contact assembly
JP2009129877A (ja) * 2007-11-28 2009-06-11 S Ii R:Kk 電子部品用ソケット
JP5960383B2 (ja) * 2010-06-01 2016-08-02 スリーエム イノベイティブ プロパティズ カンパニー 接触子ホルダ

Also Published As

Publication number Publication date
KR20140123514A (ko) 2014-10-22
EP2810085A1 (en) 2014-12-10
MY184305A (en) 2021-03-31
WO2013116077A1 (en) 2013-08-08
PH12014501745B1 (en) 2014-11-10
PH12014501745A1 (en) 2014-11-10
EP2810085B1 (en) 2021-11-10
KR101593572B1 (ko) 2016-02-18
SG11201403777VA (en) 2014-08-28
TW201339586A (zh) 2013-10-01
JP2015507198A (ja) 2015-03-05
TWI474007B (zh) 2015-02-21
US20130203298A1 (en) 2013-08-08
US8758066B2 (en) 2014-06-24
JP6231994B2 (ja) 2017-11-15

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