HK1131437A1 - Time-series conversion pulse spectrometer - Google Patents

Time-series conversion pulse spectrometer

Info

Publication number
HK1131437A1
HK1131437A1 HK09111035A HK09111035A HK1131437A1 HK 1131437 A1 HK1131437 A1 HK 1131437A1 HK 09111035 A HK09111035 A HK 09111035A HK 09111035 A HK09111035 A HK 09111035A HK 1131437 A1 HK1131437 A1 HK 1131437A1
Authority
HK
Hong Kong
Prior art keywords
time
series conversion
conversion pulse
pulse spectrometer
spectrometer
Prior art date
Application number
HK09111035A
Other languages
English (en)
Original Assignee
Japan Science & Tech Agency
Ihi Corp
Ihi
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Science & Tech Agency, Ihi Corp, Ihi filed Critical Japan Science & Tech Agency
Publication of HK1131437A1 publication Critical patent/HK1131437A1/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/08Beam switching arrangements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/42Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G01N21/3586Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/069Supply of sources
    • G01N2201/0696Pulsed
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/069Supply of sources
    • G01N2201/0696Pulsed
    • G01N2201/0698Using reference pulsed source

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Spectrometry And Color Measurement (AREA)
HK09111035A 2003-08-22 2009-11-26 Time-series conversion pulse spectrometer HK1131437A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003299373A JP2005069840A (ja) 2003-08-22 2003-08-22 時系列変換パルス分光計測装置の時系列信号取得のための光路差補償機構

Publications (1)

Publication Number Publication Date
HK1131437A1 true HK1131437A1 (en) 2010-01-22

Family

ID=34213756

Family Applications (1)

Application Number Title Priority Date Filing Date
HK09111035A HK1131437A1 (en) 2003-08-22 2009-11-26 Time-series conversion pulse spectrometer

Country Status (7)

Country Link
US (2) US7507966B2 (xx)
EP (2) EP2442093A3 (xx)
JP (2) JP2005069840A (xx)
KR (2) KR100852453B1 (xx)
CN (2) CN101487793B (xx)
HK (1) HK1131437A1 (xx)
WO (1) WO2005019809A1 (xx)

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JP4783662B2 (ja) * 2006-04-17 2011-09-28 株式会社ミツトヨ 光路差増倍装置
CN101201322B (zh) * 2006-12-14 2011-05-18 上海通微分析技术有限公司 高灵敏度荧光检测装置
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US7910891B2 (en) * 2008-09-24 2011-03-22 James Edward Cannon Method and apparatus for photographing “small” x-ray scintillation images at the same(“full”) camera resolution normally available for “large” scintillation images
JP5717335B2 (ja) * 2009-01-23 2015-05-13 キヤノン株式会社 分析装置
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US8378304B2 (en) 2010-08-24 2013-02-19 Honeywell Asca Inc. Continuous referencing for increasing measurement precision in time-domain spectroscopy
US8638443B2 (en) 2011-05-24 2014-01-28 Honeywell International Inc. Error compensation in a spectrometer
CN103888111B (zh) * 2014-04-11 2016-06-01 北京理工大学 基于迈克尔逊干涉仪的脉冲序列调制方法及调制器
CN105203208B (zh) * 2015-09-15 2018-01-30 中国电子科技集团公司第五十研究所 级联快速旋转延迟扫描装置
WO2017175770A1 (ja) 2016-04-05 2017-10-12 株式会社分光計測 生体組織力学的物性量観測方法および生体組織力学的物性量観測装置
CN106441580B (zh) * 2016-06-16 2018-07-13 电子科技大学 可变角度入射同时测透射和反射的太赫兹时域光谱仪
CN106291507B (zh) * 2016-07-21 2018-10-30 京东方科技集团股份有限公司 检测光测距装置及测距方法
JP6825708B2 (ja) * 2017-07-10 2021-02-03 株式会社島津製作所 フレーム式原子吸光分光光度計
EP3550328B1 (en) * 2018-04-04 2023-05-31 Melexis Technologies NV Pulsed-light detection and ranging apparatus and method of detection and ranging of an object in a pulsed light detection and ranging system
KR102079864B1 (ko) 2018-06-27 2020-02-19 한국전력공사 순간압력센서 시험장치 및 시험방법
CN111045200A (zh) * 2019-11-29 2020-04-21 安徽省生态环境监测中心(安徽省重污染天气预报预警中心) 一种用于延长光程的光反射组件
CN110849809A (zh) * 2019-12-19 2020-02-28 中国科学院长春光学精密机械与物理研究所 一种多档可变气体吸收池
CN117664902A (zh) * 2024-01-31 2024-03-08 合肥中科红外精密仪器有限公司 一种改进的多光程开放式怀特池红外光谱分析系统

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JP2004003902A (ja) 2002-06-03 2004-01-08 Tochigi Nikon Corp テラヘルツ光を用いた平面基板の電気特性測定方法

Also Published As

Publication number Publication date
KR100852453B1 (ko) 2008-08-14
WO2005019809A1 (ja) 2005-03-03
US20090152469A1 (en) 2009-06-18
EP1662249A4 (en) 2008-02-13
JP2005069840A (ja) 2005-03-17
EP2442093A2 (en) 2012-04-18
US20060278830A1 (en) 2006-12-14
KR100800037B1 (ko) 2008-01-31
JPWO2005019809A1 (ja) 2007-11-08
EP2442093A3 (en) 2017-03-15
US7507966B2 (en) 2009-03-24
KR20070052364A (ko) 2007-05-21
EP1662249A1 (en) 2006-05-31
CN1839307A (zh) 2006-09-27
CN101487793B (zh) 2012-08-08
JP4059403B2 (ja) 2008-03-12
CN101487793A (zh) 2009-07-22
EP1662249B1 (en) 2014-10-15
KR20060054443A (ko) 2006-05-22
CN1839307B (zh) 2010-05-05
US7705311B2 (en) 2010-04-27

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