HK1021594A1 - High-frequency power amplifier circuit and high-frequency power amplifier module. - Google Patents

High-frequency power amplifier circuit and high-frequency power amplifier module.

Info

Publication number
HK1021594A1
HK1021594A1 HK00100352A HK00100352A HK1021594A1 HK 1021594 A1 HK1021594 A1 HK 1021594A1 HK 00100352 A HK00100352 A HK 00100352A HK 00100352 A HK00100352 A HK 00100352A HK 1021594 A1 HK1021594 A1 HK 1021594A1
Authority
HK
Hong Kong
Prior art keywords
power amplifier
frequency power
amplifier circuit
amplifier module
module
Prior art date
Application number
HK00100352A
Other languages
English (en)
Inventor
Hitoshi Ebihara
Masaki Naganuma
Masanobu Kaneko
Fumitaka Iizuka
Original Assignee
Taiyo Yuden Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiyo Yuden Kk filed Critical Taiyo Yuden Kk
Publication of HK1021594A1 publication Critical patent/HK1021594A1/xx

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/58Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
    • H01L23/64Impedance arrangements
    • H01L23/66High-frequency adaptations
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F3/00Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/20Power amplifiers, e.g. Class B amplifiers, Class C amplifiers
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F1/00Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/56Modifications of input or output impedances, not otherwise provided for
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F3/00Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/189High-frequency amplifiers, e.g. radio frequency amplifiers
    • H03F3/19High-frequency amplifiers, e.g. radio frequency amplifiers with semiconductor devices only
    • H03F3/193High-frequency amplifiers, e.g. radio frequency amplifiers with semiconductor devices only with field-effect devices
    • H03F3/1935High-frequency amplifiers, e.g. radio frequency amplifiers with semiconductor devices only with field-effect devices with junction-FET devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/00014Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01046Palladium [Pd]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01078Platinum [Pt]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304Transistor
    • H01L2924/1306Field-effect transistor [FET]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304Transistor
    • H01L2924/1306Field-effect transistor [FET]
    • H01L2924/13063Metal-Semiconductor Field-Effect Transistor [MESFET]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/19Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/1901Structure
    • H01L2924/1904Component type
    • H01L2924/19041Component type being a capacitor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/30107Inductance
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3011Impedance
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3025Electromagnetic shielding

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Amplifiers (AREA)
  • Microwave Amplifiers (AREA)
HK00100352A 1998-04-10 2000-01-20 High-frequency power amplifier circuit and high-frequency power amplifier module. HK1021594A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP09905398A JP3668610B2 (ja) 1998-04-10 1998-04-10 高周波電力増幅回路

Publications (1)

Publication Number Publication Date
HK1021594A1 true HK1021594A1 (en) 2000-06-16

Family

ID=14236887

Family Applications (1)

Application Number Title Priority Date Filing Date
HK00100352A HK1021594A1 (en) 1998-04-10 2000-01-20 High-frequency power amplifier circuit and high-frequency power amplifier module.

Country Status (7)

Country Link
US (1) US6249186B1 (de)
EP (1) EP0949754B1 (de)
JP (1) JP3668610B2 (de)
KR (1) KR100527223B1 (de)
DE (1) DE69920792T2 (de)
DK (1) DK0949754T3 (de)
HK (1) HK1021594A1 (de)

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US6674337B2 (en) * 2000-03-28 2004-01-06 California Institute Of Technology Concurrent multi-band low noise amplifier architecture
US6798313B2 (en) 2001-06-04 2004-09-28 U.S. Monolithics, L.L.C. Monolithic microwave integrated circuit with bondwire and landing zone bias
DE10161743B4 (de) 2001-12-15 2004-08-05 Hüttinger Elektronik GmbH & Co. KG Hochfrequenzanregungsanordnung
US6670850B1 (en) * 2002-06-13 2003-12-30 Linear Technology Corp. Ultra-wideband constant gain CMOS amplifier
US7064611B2 (en) * 2003-04-12 2006-06-20 Chung-Shan Institute Of Science And Technology IDSS RF amplifier
WO2004112241A1 (en) * 2003-06-10 2004-12-23 Kabushiki Kaisha Toshiba High-frequency power amplifier module
US20070003582A1 (en) * 2003-11-25 2007-01-04 Heng Madalene C Medicine for the treatment of acne and for reversing the signs of age and sun damage and method for using same
US7265630B2 (en) * 2003-12-09 2007-09-04 International Business Machines Corporation Millimeter-wave unilateral low-noise amplifier
US20060038632A1 (en) * 2004-08-20 2006-02-23 Dow-Chih Niu Series-parallel resonant matching circuit and broadband amplifier thereof
US9851414B2 (en) 2004-12-21 2017-12-26 Battelle Energy Alliance, Llc Energy storage cell impedance measuring apparatus, methods and related systems
US8868363B2 (en) * 2009-06-11 2014-10-21 Battelle Energy Alliance, Llc Method of estimating pulse response using an impedance spectrum
US8352204B2 (en) * 2004-12-21 2013-01-08 Battelle Energy Alliance, Llc Method of detecting system function by measuring frequency response
US8150643B1 (en) * 2004-12-21 2012-04-03 Battelle Energy Alliance, Llc Method of detecting system function by measuring frequency response
JP2007150419A (ja) * 2005-11-24 2007-06-14 Mitsubishi Electric Corp 電力増幅器
US8076994B2 (en) * 2007-06-22 2011-12-13 Cree, Inc. RF power transistor packages with internal harmonic frequency reduction and methods of forming RF power transistor packages with internal harmonic frequency reduction
US10379168B2 (en) 2007-07-05 2019-08-13 Battelle Energy Alliance, Llc Apparatuses and methods for testing electrochemical cells by measuring frequency response
WO2011140131A1 (en) 2010-05-03 2011-11-10 Battelle Energy Alliance, Llc Crosstalk compensation in analysis of energy storage devices
JP5541114B2 (ja) * 2010-11-25 2014-07-09 三菱電機株式会社 電力増幅器とそれを用いたmmic
US8466747B1 (en) * 2011-04-08 2013-06-18 Lockheed Martin Corporation Integrated-circuit amplifier with low temperature rise
US8963645B1 (en) 2011-04-08 2015-02-24 Lockheed Martin Corporation Integrated-circuit amplifier with low temperature rise
US9035702B2 (en) * 2012-03-08 2015-05-19 Kabushiki Kaisha Toshiba Microwave semiconductor amplifier
CN103929132B (zh) * 2014-04-24 2016-12-07 成都锦江电子系统工程有限公司 基于带状线方式的小型大功率微波放大模块
US10345384B2 (en) 2016-03-03 2019-07-09 Battelle Energy Alliance, Llc Device, system, and method for measuring internal impedance of a test battery using frequency response
US10656233B2 (en) 2016-04-25 2020-05-19 Dynexus Technology, Inc. Method of calibrating impedance measurements of a battery
US11054481B2 (en) 2019-03-19 2021-07-06 Battelle Energy Alliance, Llc Multispectral impedance determination under dynamic load conditions
US11979117B2 (en) 2019-03-25 2024-05-07 Mitsubishi Electric Corporation High frequency semiconductor amplifier
US11422102B2 (en) 2020-01-10 2022-08-23 Dynexus Technology, Inc. Multispectral impedance measurements across strings of interconnected cells
US11519969B2 (en) 2020-01-29 2022-12-06 Dynexus Technology, Inc. Cross spectral impedance assessment for cell qualification
US11757419B2 (en) * 2020-02-25 2023-09-12 Smarter Microelectronics (Guang Zhou) Co., Ltd. Radio frequency power amplifier circuit and gain control method
US20220393650A1 (en) * 2021-06-02 2022-12-08 Psemi Corporation Wideband Multi Gain LNA Architecture
JP2023053462A (ja) * 2021-10-01 2023-04-13 住友電気工業株式会社 高周波回路

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Also Published As

Publication number Publication date
US6249186B1 (en) 2001-06-19
JPH11298263A (ja) 1999-10-29
KR100527223B1 (ko) 2005-11-08
DE69920792D1 (de) 2004-11-11
EP0949754B1 (de) 2004-10-06
EP0949754A2 (de) 1999-10-13
EP0949754A3 (de) 2002-07-24
JP3668610B2 (ja) 2005-07-06
DK0949754T3 (da) 2004-11-15
KR19990083035A (ko) 1999-11-25
DE69920792T2 (de) 2006-02-23

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20080407