GB789712A - Methods of determining the location of p or n zones in semiconductor bodies - Google Patents

Methods of determining the location of p or n zones in semiconductor bodies

Info

Publication number
GB789712A
GB789712A GB2470/56A GB247056A GB789712A GB 789712 A GB789712 A GB 789712A GB 2470/56 A GB2470/56 A GB 2470/56A GB 247056 A GB247056 A GB 247056A GB 789712 A GB789712 A GB 789712A
Authority
GB
United Kingdom
Prior art keywords
probe
display
pulses
junction
semi
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2470/56A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
Western Electric Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Western Electric Co Inc filed Critical Western Electric Co Inc
Publication of GB789712A publication Critical patent/GB789712A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67121—Apparatus for making assemblies not otherwise provided for, e.g. package constructions
    • C—CHEMISTRY; METALLURGY
    • C10—PETROLEUM, GAS OR COKE INDUSTRIES; TECHNICAL GASES CONTAINING CARBON MONOXIDE; FUELS; LUBRICANTS; PEAT
    • C10K—PURIFYING OR MODIFYING THE CHEMICAL COMPOSITION OF COMBUSTIBLE GASES CONTAINING CARBON MONOXIDE
    • C10K1/00—Purifying combustible gases containing carbon monoxide
    • C10K1/08—Purifying combustible gases containing carbon monoxide by washing with liquids; Reviving the used wash liquors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2637—Circuits therefor for testing other individual devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Combustion & Propulsion (AREA)
  • Power Engineering (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • Organic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

789,712. Electric tests. WESTERN ELECTRIC CO., Inc. Jan. 25,1956 [Feb. 4, 1955], No. 2470/56. Class 37. In order to locate the exact position of a P-N junction in a semi-conductor body, the body 1 (Fig. 1) is fed with an alternating voltage through end electrodes 2, 3 and a probe 7, connected to a battery 13, is slowly moved along the semi-conductor body while the current/voltage characteristic is continuously indicated on a cathode-ray oscilloscope 16, the effect of the bias voltage on the probe 7 being to change the C.R.O. display when the probe passes over the P-N junction. The body 1 is illuminated by a lamp 17 so that its photodiode characteristic is utilized to accentuate the in the display. To make the change in the display occur at a more precise location the bias voltage on probe 7 is augmented by pulses of opposite polarity from a further battery 20, the pulses being produced by manual operation of a switch 22. Specifications 727,678 and 748,414 are referred to.
GB2470/56A 1955-02-04 1956-01-25 Methods of determining the location of p or n zones in semiconductor bodies Expired GB789712A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US486073A US2748349A (en) 1955-02-04 1955-02-04 Fabrication of junction transistors

Publications (1)

Publication Number Publication Date
GB789712A true GB789712A (en) 1958-01-29

Family

ID=23930493

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2470/56A Expired GB789712A (en) 1955-02-04 1956-01-25 Methods of determining the location of p or n zones in semiconductor bodies

Country Status (5)

Country Link
US (1) US2748349A (en)
BE (1) BE543825A (en)
FR (1) FR1147942A (en)
GB (1) GB789712A (en)
NL (2) NL98752C (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2951204A (en) * 1957-04-08 1960-08-30 Texas Instruments Inc Method and apparatus for locating the base section of a transistor bar
BE571509A (en) * 1957-09-26 1900-01-01
US2956230A (en) * 1958-08-29 1960-10-11 Texas Instruments Inc Method for locating p-n junctions in semiconductor bodies
US3067387A (en) * 1959-07-14 1962-12-04 Ibm P-n junction position determination
US3185927A (en) * 1961-01-31 1965-05-25 Kulicke & Soffa Mfg Co Probe instrument for inspecting semiconductor wafers including means for marking defective zones
US3351733A (en) * 1963-08-21 1967-11-07 Hitachi Ltd Welding method
US3548491A (en) * 1967-02-03 1970-12-22 Ibm Mass production of electronic devices

Also Published As

Publication number Publication date
BE543825A (en)
NL98752C (en)
FR1147942A (en) 1957-12-02
NL201406A (en)
US2748349A (en) 1956-05-29

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