GB961573A - An arrangement for measuring carrier lifetimes of a semi-conductor material - Google Patents

An arrangement for measuring carrier lifetimes of a semi-conductor material

Info

Publication number
GB961573A
GB961573A GB35375/61A GB3537561A GB961573A GB 961573 A GB961573 A GB 961573A GB 35375/61 A GB35375/61 A GB 35375/61A GB 3537561 A GB3537561 A GB 3537561A GB 961573 A GB961573 A GB 961573A
Authority
GB
United Kingdom
Prior art keywords
semi
conductor material
carrier life
sept
specimen
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB35375/61A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Schuckertwerke AG
Siemens AG
Original Assignee
Siemens Schuckertwerke AG
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Schuckertwerke AG, Siemens AG filed Critical Siemens Schuckertwerke AG
Publication of GB961573A publication Critical patent/GB961573A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • G01R31/2637Circuits therefor for testing other individual devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Abstract

961,573. Testing semi-conductors. SIEMENS -SCHUCKERTWERKE A.G. Sept. 29,1961 [Sept. 30, 1960], No. 35375/61. Headings G1A and G1U. A method of measuring the carrier life times in a semi-conductor material, comprises placing a specimen 1 of the semi-conductor material between a pair of spaced apart electrical terminals 2 and 3 connected to a first electrical circuit, such that an electrical current flows through the semiconductor material, directing first (15a) and second (15b) beams of light on to the piece of semi-conductor material and a photo-electric device 16, connected in a second electrical circuit, respectively, such as to influence the conductivity of the semiconductor material and produce sinusoidally varying voltage in each circuit, and applying the said two voltages to a phase comparing device 8 which converts the phase difference between the two voltages into a directly displayed indication of the required carrier life time. A single beam of light 15 may be used, sinusoidally modulated by a toothed disc 12 and split by semi-transparent reflector 14, or separate beams may be employed, using separate parts of the periphery of the toothed disc for modulation, Fig. 2, (not shown). High frequency A-C may be sent though the piece of semi-conductor material via capacitive terminals Fig. 3 (not shown). The carrier life time may be displayed on a suitably calibrated meter or, where various parts of the specimen are to be investigated, may be continuously displayed on a recorder.
GB35375/61A 1960-09-30 1961-09-29 An arrangement for measuring carrier lifetimes of a semi-conductor material Expired GB961573A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DES0070741 1960-09-30

Publications (1)

Publication Number Publication Date
GB961573A true GB961573A (en) 1964-06-24

Family

ID=7502002

Family Applications (1)

Application Number Title Priority Date Filing Date
GB35375/61A Expired GB961573A (en) 1960-09-30 1961-09-29 An arrangement for measuring carrier lifetimes of a semi-conductor material

Country Status (2)

Country Link
CH (1) CH401258A (en)
GB (1) GB961573A (en)

Also Published As

Publication number Publication date
CH401258A (en) 1965-10-31

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