GB2306699A - Phase shifting mask - Google Patents
Phase shifting mask Download PDFInfo
- Publication number
- GB2306699A GB2306699A GB9622163A GB9622163A GB2306699A GB 2306699 A GB2306699 A GB 2306699A GB 9622163 A GB9622163 A GB 9622163A GB 9622163 A GB9622163 A GB 9622163A GB 2306699 A GB2306699 A GB 2306699A
- Authority
- GB
- United Kingdom
- Prior art keywords
- phase shifting
- mask
- thin film
- shifting mask
- transparent substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/26—Phase shift masks [PSM]; PSM blanks; Preparation thereof
- G03F1/32—Attenuating PSM [att-PSM], e.g. halftone PSM or PSM having semi-transparent phase shift portion; Preparation thereof
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/54—Absorbers, e.g. of opaque materials
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950037190A KR0147493B1 (ko) | 1995-10-25 | 1995-10-25 | 하프톤 위상반전마스크 제조방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
GB9622163D0 GB9622163D0 (en) | 1996-12-18 |
GB2306699A true GB2306699A (en) | 1997-05-07 |
Family
ID=19431360
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB9622163A Withdrawn GB2306699A (en) | 1995-10-25 | 1996-10-24 | Phase shifting mask |
Country Status (5)
Country | Link |
---|---|
JP (1) | JPH09171960A (ko) |
KR (1) | KR0147493B1 (ko) |
CN (1) | CN1159073A (ko) |
DE (1) | DE19644287A1 (ko) |
GB (1) | GB2306699A (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6511778B2 (en) | 2000-01-05 | 2003-01-28 | Shin-Etsu Chemical Co., Ltd. | Phase shift mask blank, phase shift mask and method of manufacture |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5658435B2 (ja) * | 2009-03-31 | 2015-01-28 | リンテック株式会社 | マスクフィルム用部材、それを用いたマスクフィルムの製造方法及び感光性樹脂印刷版の製造方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6381426A (ja) * | 1986-09-26 | 1988-04-12 | Hoya Corp | フオトマスクブランクとフオトマスク |
JPH02242252A (ja) * | 1989-03-15 | 1990-09-26 | Toppan Printing Co Ltd | フオトマスクブランクおよびフオトマスク |
WO1994011786A1 (en) * | 1992-11-16 | 1994-05-26 | E.I. Du Pont De Nemours And Company | Photomask blanks |
EP0643331A2 (en) * | 1993-08-17 | 1995-03-15 | Dai Nippon Printing Co., Ltd. | Halftone phase shift photomask, halftone phase shift photomask blank, and method of producing the blank |
US5415953A (en) * | 1994-02-14 | 1995-05-16 | E. I. Du Pont De Nemours And Company | Photomask blanks comprising transmissive embedded phase shifter |
-
1995
- 1995-10-25 KR KR1019950037190A patent/KR0147493B1/ko not_active IP Right Cessation
-
1996
- 1996-10-24 DE DE19644287A patent/DE19644287A1/de not_active Ceased
- 1996-10-24 GB GB9622163A patent/GB2306699A/en not_active Withdrawn
- 1996-10-25 CN CN96121183A patent/CN1159073A/zh active Pending
- 1996-10-25 JP JP28418196A patent/JPH09171960A/ja active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6381426A (ja) * | 1986-09-26 | 1988-04-12 | Hoya Corp | フオトマスクブランクとフオトマスク |
JPH02242252A (ja) * | 1989-03-15 | 1990-09-26 | Toppan Printing Co Ltd | フオトマスクブランクおよびフオトマスク |
WO1994011786A1 (en) * | 1992-11-16 | 1994-05-26 | E.I. Du Pont De Nemours And Company | Photomask blanks |
EP0643331A2 (en) * | 1993-08-17 | 1995-03-15 | Dai Nippon Printing Co., Ltd. | Halftone phase shift photomask, halftone phase shift photomask blank, and method of producing the blank |
US5415953A (en) * | 1994-02-14 | 1995-05-16 | E. I. Du Pont De Nemours And Company | Photomask blanks comprising transmissive embedded phase shifter |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6511778B2 (en) | 2000-01-05 | 2003-01-28 | Shin-Etsu Chemical Co., Ltd. | Phase shift mask blank, phase shift mask and method of manufacture |
Also Published As
Publication number | Publication date |
---|---|
KR970022525A (ko) | 1997-05-30 |
CN1159073A (zh) | 1997-09-10 |
KR0147493B1 (ko) | 1998-08-01 |
GB9622163D0 (en) | 1996-12-18 |
DE19644287A1 (de) | 1997-04-30 |
JPH09171960A (ja) | 1997-06-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR101824291B1 (ko) | 위상 시프트 마스크 블랭크 및 그 제조 방법, 위상 시프트 마스크 및 그 제조 방법과 표시 장치의 제조 방법 | |
KR100334921B1 (ko) | 하프톤위상쉬프트포토마스크용블랭크,하프톤위상쉬프트포토마스크및이들의제조방법 | |
KR100484262B1 (ko) | 위상전이마스크및위상전이마스크블랭크 | |
JPH07134392A (ja) | 露光用マスクとパターン形成方法 | |
JP2003195483A (ja) | フォトマスクブランク、フォトマスク、及びそれらの製造方法 | |
US20070037073A1 (en) | Process for manufacturing half-tone phase shifting mask blanks | |
US5876877A (en) | Patterned mask having a transparent etching stopper layer | |
KR20030084665A (ko) | 포토마스크 블랭크의 제조방법 | |
JP3993005B2 (ja) | ハーフトーン型位相シフトマスクブランク、ハーフトーン型位相シフトマスク及びその製造方法、並びにパターン転写方法 | |
EP1132772B1 (en) | Halftone phase shift photomask and blank for it, and pattern forming method using this mask | |
JP3339716B2 (ja) | 露光用マスクの製造方法 | |
KR100781621B1 (ko) | 감쇠된 매입형 위상변이 포토마스크 블랭크 | |
JPH0695363A (ja) | フォトマスクブランク及びその製造方法並びにフォトマスク | |
US6946199B2 (en) | Optical, additional films and optical elements | |
JP2989156B2 (ja) | スパッタターゲット、該スパッタターゲットを用いた位相シフトマスクブランク及び位相シフトマスクの製造方法 | |
GB2306699A (en) | Phase shifting mask | |
US5543252A (en) | Method for manufacturing exposure mask and the exposure mask | |
US5468576A (en) | Method for manufacturing exposure mask | |
JPS60184672A (ja) | クロム化合物層の製造方法 | |
JP2002189283A (ja) | 位相シフトマスクブランク、位相シフトマスク及び位相シフトマスクの製造方法 | |
CN112981316A (zh) | 相移反位膜掩模基版的制作方法 | |
JPH1026820A (ja) | ハーフトーン型位相シフトマスク用ブランク及びハーフトーン型位相シフトマスク | |
KR100274149B1 (ko) | 금속막 패턴닝 방법 | |
KR102537003B1 (ko) | 블랭크 마스크 및 이를 이용한 포토마스크 | |
JPH0980736A (ja) | 露光用マスク及びその製造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
WAP | Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1) |