GB1448610A - Semiconductor devices having refractory metal and silicon layers - Google Patents

Semiconductor devices having refractory metal and silicon layers

Info

Publication number
GB1448610A
GB1448610A GB4562174A GB4562174A GB1448610A GB 1448610 A GB1448610 A GB 1448610A GB 4562174 A GB4562174 A GB 4562174A GB 4562174 A GB4562174 A GB 4562174A GB 1448610 A GB1448610 A GB 1448610A
Authority
GB
United Kingdom
Prior art keywords
silicon
metal
layer
refractory metal
semiconductor devices
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB4562174A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RCA Corp
Original Assignee
RCA Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RCA Corp filed Critical RCA Corp
Publication of GB1448610A publication Critical patent/GB1448610A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/283Deposition of conductive or insulating materials for electrodes conducting electric current
    • H01L21/285Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
    • H01L21/28506Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
    • H01L21/28512Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table
    • H01L21/28518Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table the conductive layers comprising silicides
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/0682Silicides
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target
    • C23C14/3414Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Silicon Compounds (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
GB4562174A 1973-11-01 1974-10-22 Semiconductor devices having refractory metal and silicon layers Expired GB1448610A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US41181973A 1973-11-01 1973-11-01

Publications (1)

Publication Number Publication Date
GB1448610A true GB1448610A (en) 1976-09-08

Family

ID=23630455

Family Applications (1)

Application Number Title Priority Date Filing Date
GB4562174A Expired GB1448610A (en) 1973-11-01 1974-10-22 Semiconductor devices having refractory metal and silicon layers

Country Status (9)

Country Link
JP (1) JPS5080790A (enrdf_load_stackoverflow)
BE (1) BE821564A (enrdf_load_stackoverflow)
DE (1) DE2450341A1 (enrdf_load_stackoverflow)
FR (1) FR2250198B1 (enrdf_load_stackoverflow)
GB (1) GB1448610A (enrdf_load_stackoverflow)
IN (1) IN140056B (enrdf_load_stackoverflow)
IT (1) IT1022138B (enrdf_load_stackoverflow)
NL (1) NL7414233A (enrdf_load_stackoverflow)
SE (1) SE7413660L (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0070751A1 (en) * 1981-07-13 1983-01-26 FAIRCHILD CAMERA & INSTRUMENT CORPORATION Method for lpcvd co-deposition of metal and silicon to form metal silicide
EP0093246A1 (en) * 1982-04-30 1983-11-09 Texas Instruments Incorporated Process for adhering a metal on the surface of an insulator
GB2139419A (en) * 1983-05-05 1984-11-07 Standard Telephones Cables Ltd Semiconductor devices

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53114366A (en) * 1977-03-16 1978-10-05 Toshiba Corp Semiconductor device
US4180596A (en) * 1977-06-30 1979-12-25 International Business Machines Corporation Method for providing a metal silicide layer on a substrate
JPS58202553A (ja) * 1982-05-21 1983-11-25 Toshiba Corp 半導体装置
JPS6014852U (ja) * 1983-07-07 1985-01-31 屋敷 静雄 スベリドメ付きドライバ−
NL9000795A (nl) * 1990-04-04 1991-11-01 Imec Inter Uni Micro Electr Werkwijze voor het aanbrengen van metaalsilicides op silicium.

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0070751A1 (en) * 1981-07-13 1983-01-26 FAIRCHILD CAMERA & INSTRUMENT CORPORATION Method for lpcvd co-deposition of metal and silicon to form metal silicide
EP0093246A1 (en) * 1982-04-30 1983-11-09 Texas Instruments Incorporated Process for adhering a metal on the surface of an insulator
GB2139419A (en) * 1983-05-05 1984-11-07 Standard Telephones Cables Ltd Semiconductor devices

Also Published As

Publication number Publication date
IT1022138B (it) 1978-03-20
JPS5080790A (enrdf_load_stackoverflow) 1975-07-01
FR2250198A1 (enrdf_load_stackoverflow) 1975-05-30
DE2450341A1 (de) 1975-05-07
FR2250198B1 (enrdf_load_stackoverflow) 1978-06-09
SE7413660L (enrdf_load_stackoverflow) 1975-05-02
NL7414233A (nl) 1975-05-06
IN140056B (enrdf_load_stackoverflow) 1976-09-04
BE821564A (fr) 1975-02-17

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Legal Events

Date Code Title Description
PS Patent sealed
PCNP Patent ceased through non-payment of renewal fee