GB1305010A - - Google Patents

Info

Publication number
GB1305010A
GB1305010A GB2323371*A GB2323371A GB1305010A GB 1305010 A GB1305010 A GB 1305010A GB 2323371 A GB2323371 A GB 2323371A GB 1305010 A GB1305010 A GB 1305010A
Authority
GB
United Kingdom
Prior art keywords
level
interconnection metallization
usable cells
terminals
heading
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2323371*A
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of GB1305010A publication Critical patent/GB1305010A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00—Encapsulations, e.g. protective coatings
    • H10W74/40—Encapsulations, e.g. protective coatings characterised by their materials
    • H10W74/43—Encapsulations, e.g. protective coatings characterised by their materials comprising oxides, nitrides or carbides, e.g. ceramics or glasses
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/90—Masterslice integrated circuits
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D99/00—Subject matter not provided for in other groups of this subclass
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W20/00—Interconnections in chips, wafers or substrates
    • H10W20/20—Interconnections within wafers or substrates, e.g. through-silicon vias [TSV]

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
GB2323371*A 1968-09-25 1971-04-19 Expired GB1305010A (enExample)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US76245968A 1968-09-25 1968-09-25
US1686770A 1970-03-05 1970-03-05

Publications (1)

Publication Number Publication Date
GB1305010A true GB1305010A (enExample) 1973-01-31

Family

ID=26689162

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2323371*A Expired GB1305010A (enExample) 1968-09-25 1971-04-19

Country Status (1)

Country Link
GB (1) GB1305010A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1983004109A1 (en) * 1982-05-17 1983-11-24 Motorola, Inc. Pad for accelerated memory test
US4479088A (en) * 1981-01-16 1984-10-23 Burroughs Corporation Wafer including test lead connected to ground for testing networks thereon
GB2153590A (en) * 1984-02-01 1985-08-21 Ramesh Chandra Varshney Matrix of functional circuits on a semiconductor wafer

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4479088A (en) * 1981-01-16 1984-10-23 Burroughs Corporation Wafer including test lead connected to ground for testing networks thereon
WO1983004109A1 (en) * 1982-05-17 1983-11-24 Motorola, Inc. Pad for accelerated memory test
US4465973A (en) * 1982-05-17 1984-08-14 Motorola, Inc. Pad for accelerated memory test
GB2153590A (en) * 1984-02-01 1985-08-21 Ramesh Chandra Varshney Matrix of functional circuits on a semiconductor wafer

Similar Documents

Publication Publication Date Title
US3849872A (en) Contacting integrated circuit chip terminal through the wafer kerf
GB1414013A (en) Testing of electrical interconnection networks on substrates
JPS647635A (en) Semiconductor integrated circuit device with gate array and memory
GB1431226A (en) Testing electronic components connector for deformable tubes
ES196297U (es) Un dispositivo semiconductor.
GB1542235A (en) Test pin for testing electrical circuits
GB1485249A (en) Semiconductor integrated circuit
US3801910A (en) Externally accessing mechanical difficult to access circuit nodes using photo-responsive conductors in integrated circuits
GB1399006A (en) Circuit boards
GB1475653A (en) Core memory with noise suppression
DE3684139D1 (de) Sechstorreflektometer-pruefanordnung.
US3882532A (en) Externally accessing mechanically difficult to access circuit nodes in integrated circuits
GB1278632A (en) Improvements relating to measuring and testing electrical circuits
JPS57179997A (en) Semiconductor memory
GB1305010A (enExample)
DE3681666D1 (de) Integrierter halbleiterspeicher.
JPS5440082A (en) Semiconductor test device
GB1475810A (en) Testing an electrical supply installation
GB1283012A (en) Improvements in or relating to electrical signalling apparatus
GB1306189A (enExample)
GB1305319A (enExample)
ES320796A1 (es) Un metodo de fabricacion de un sistema electrico.
JPS52115193A (en) Lsi structure
JPS5481078A (en) Test method for wafer using wafer carrier
JPS564264A (en) Semiconductor integrated circuit device

Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PE20 Patent expired after termination of 20 years