JPS5389677A - Disconnection and shortcircuit checking circuit - Google Patents
Disconnection and shortcircuit checking circuitInfo
- Publication number
- JPS5389677A JPS5389677A JP470777A JP470777A JPS5389677A JP S5389677 A JPS5389677 A JP S5389677A JP 470777 A JP470777 A JP 470777A JP 470777 A JP470777 A JP 470777A JP S5389677 A JPS5389677 A JP S5389677A
- Authority
- JP
- Japan
- Prior art keywords
- disconnection
- shortcircuit
- checking circuit
- shorcircuiting
- junctions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE: To check the disconnection and shorcircuiting of the internal wirings of an IC which may be regarded to be constituted fully by PN junctions between ground terminal and respective terminals by way of logic circuits.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP52004707A JPS5831875B2 (en) | 1977-01-18 | 1977-01-18 | Open circuit and short circuit check circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP52004707A JPS5831875B2 (en) | 1977-01-18 | 1977-01-18 | Open circuit and short circuit check circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5389677A true JPS5389677A (en) | 1978-08-07 |
JPS5831875B2 JPS5831875B2 (en) | 1983-07-08 |
Family
ID=11591344
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP52004707A Expired JPS5831875B2 (en) | 1977-01-18 | 1977-01-18 | Open circuit and short circuit check circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5831875B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4418312A (en) * | 1981-10-23 | 1983-11-29 | Bell Telephone Laboratories, Incorporated | Apparatus for testing multi-conductor cables |
JPS6418077A (en) * | 1987-07-14 | 1989-01-20 | Nec Corp | Screening circuit |
-
1977
- 1977-01-18 JP JP52004707A patent/JPS5831875B2/en not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4418312A (en) * | 1981-10-23 | 1983-11-29 | Bell Telephone Laboratories, Incorporated | Apparatus for testing multi-conductor cables |
JPS6418077A (en) * | 1987-07-14 | 1989-01-20 | Nec Corp | Screening circuit |
Also Published As
Publication number | Publication date |
---|---|
JPS5831875B2 (en) | 1983-07-08 |
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