JPS5389677A - Disconnection and shortcircuit checking circuit - Google Patents

Disconnection and shortcircuit checking circuit

Info

Publication number
JPS5389677A
JPS5389677A JP470777A JP470777A JPS5389677A JP S5389677 A JPS5389677 A JP S5389677A JP 470777 A JP470777 A JP 470777A JP 470777 A JP470777 A JP 470777A JP S5389677 A JPS5389677 A JP S5389677A
Authority
JP
Japan
Prior art keywords
disconnection
shortcircuit
checking circuit
shorcircuiting
junctions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP470777A
Other languages
Japanese (ja)
Other versions
JPS5831875B2 (en
Inventor
Hideo Matsui
Masayoshi Hirako
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP52004707A priority Critical patent/JPS5831875B2/en
Publication of JPS5389677A publication Critical patent/JPS5389677A/en
Publication of JPS5831875B2 publication Critical patent/JPS5831875B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE: To check the disconnection and shorcircuiting of the internal wirings of an IC which may be regarded to be constituted fully by PN junctions between ground terminal and respective terminals by way of logic circuits.
COPYRIGHT: (C)1978,JPO&Japio
JP52004707A 1977-01-18 1977-01-18 Open circuit and short circuit check circuit Expired JPS5831875B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP52004707A JPS5831875B2 (en) 1977-01-18 1977-01-18 Open circuit and short circuit check circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP52004707A JPS5831875B2 (en) 1977-01-18 1977-01-18 Open circuit and short circuit check circuit

Publications (2)

Publication Number Publication Date
JPS5389677A true JPS5389677A (en) 1978-08-07
JPS5831875B2 JPS5831875B2 (en) 1983-07-08

Family

ID=11591344

Family Applications (1)

Application Number Title Priority Date Filing Date
JP52004707A Expired JPS5831875B2 (en) 1977-01-18 1977-01-18 Open circuit and short circuit check circuit

Country Status (1)

Country Link
JP (1) JPS5831875B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4418312A (en) * 1981-10-23 1983-11-29 Bell Telephone Laboratories, Incorporated Apparatus for testing multi-conductor cables
JPS6418077A (en) * 1987-07-14 1989-01-20 Nec Corp Screening circuit

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4418312A (en) * 1981-10-23 1983-11-29 Bell Telephone Laboratories, Incorporated Apparatus for testing multi-conductor cables
JPS6418077A (en) * 1987-07-14 1989-01-20 Nec Corp Screening circuit

Also Published As

Publication number Publication date
JPS5831875B2 (en) 1983-07-08

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