GB1521614A - Apparatus for testing circuit elements - Google Patents

Apparatus for testing circuit elements

Info

Publication number
GB1521614A
GB1521614A GB716276A GB716276A GB1521614A GB 1521614 A GB1521614 A GB 1521614A GB 716276 A GB716276 A GB 716276A GB 716276 A GB716276 A GB 716276A GB 1521614 A GB1521614 A GB 1521614A
Authority
GB
United Kingdom
Prior art keywords
substrate
conductive
input
tracks
contact areas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB716276A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Services Ltd
Original Assignee
Fujitsu Services Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Services Ltd filed Critical Fujitsu Services Ltd
Priority to GB716276A priority Critical patent/GB1521614A/en
Publication of GB1521614A publication Critical patent/GB1521614A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

1521614 Electrical testing INTERNATIONAL COMPUTERS Ltd 17 Feb 1977 [24 Feb 1976] 07162/76 Heading H2E Apparatus for testing an integrated circuit element includes a substrate 1 carrying on an electrically insulating surface an array of contact areas 9 for contacting connections of the element being tested, each of at least some of the contact areas 9 being connected to a conductive input track 3andtoa conductive output track 8, which input track 3 is interrupted and bridged by a diode 6 closely adjacent the associated contact area 9. In one embodiment, one side of a substrate 1 is provided with conductive output tracks 8 terminating at one end in connectors 7 and at the opposite end in contact areas 9 which are adapted to contact the connection pins of an integrated circuit element positioned, when being tested, in an aperture 2. The contact areas 9 of the output tracks 8 are connected by through plated holes 13 to conductive input tracks 3 provided on the opposite side of the substrate 1. The input tracks 3 are provided at one end with connectors 4 and near the opposite end with interruptions 5 which are spurned by diode chips 6. The substrate 1 is also provided with an internal conductive earth plate 11 having a connector 12. The input and output tracks 3, 8 may be provided on the same side of the substrate 1. A multilayered construction may be provided.
GB716276A 1977-02-17 1977-02-17 Apparatus for testing circuit elements Expired GB1521614A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB716276A GB1521614A (en) 1977-02-17 1977-02-17 Apparatus for testing circuit elements

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB716276A GB1521614A (en) 1977-02-17 1977-02-17 Apparatus for testing circuit elements

Publications (1)

Publication Number Publication Date
GB1521614A true GB1521614A (en) 1978-08-16

Family

ID=9827809

Family Applications (1)

Application Number Title Priority Date Filing Date
GB716276A Expired GB1521614A (en) 1977-02-17 1977-02-17 Apparatus for testing circuit elements

Country Status (1)

Country Link
GB (1) GB1521614A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2130383A (en) * 1982-09-14 1984-05-31 Risho Kogyo Kk Test board for semiconductor packages
GB2176063A (en) * 1985-05-22 1986-12-10 Michael Frederick Horgan A probe card
US4731577A (en) * 1987-03-05 1988-03-15 Logan John K Coaxial probe card
US4749362A (en) * 1980-11-24 1988-06-07 The Johns Hopkins University Short-circuit-proof connector clip for a multiterminal circuit
US4870356A (en) * 1987-09-30 1989-09-26 Digital Equipment Corporation Multi-component test fixture

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4749362A (en) * 1980-11-24 1988-06-07 The Johns Hopkins University Short-circuit-proof connector clip for a multiterminal circuit
GB2130383A (en) * 1982-09-14 1984-05-31 Risho Kogyo Kk Test board for semiconductor packages
GB2176063A (en) * 1985-05-22 1986-12-10 Michael Frederick Horgan A probe card
US4731577A (en) * 1987-03-05 1988-03-15 Logan John K Coaxial probe card
US4870356A (en) * 1987-09-30 1989-09-26 Digital Equipment Corporation Multi-component test fixture

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Legal Events

Date Code Title Description
PS Patent sealed
PCNP Patent ceased through non-payment of renewal fee