JPS5745473A - Device and method for testing printed circuit board - Google Patents

Device and method for testing printed circuit board

Info

Publication number
JPS5745473A
JPS5745473A JP55121866A JP12186680A JPS5745473A JP S5745473 A JPS5745473 A JP S5745473A JP 55121866 A JP55121866 A JP 55121866A JP 12186680 A JP12186680 A JP 12186680A JP S5745473 A JPS5745473 A JP S5745473A
Authority
JP
Japan
Prior art keywords
elastomer structure
tested
printed
elastomer
printed circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55121866A
Other languages
Japanese (ja)
Inventor
Mikiyuki Mitsuhashi
Satoru Yamabe
Mikio Furukawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shin Etsu Polymer Co Ltd
Shin Etsu Chemical Co Ltd
Original Assignee
Shin Etsu Polymer Co Ltd
Shin Etsu Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shin Etsu Polymer Co Ltd, Shin Etsu Chemical Co Ltd filed Critical Shin Etsu Polymer Co Ltd
Priority to JP55121866A priority Critical patent/JPS5745473A/en
Publication of JPS5745473A publication Critical patent/JPS5745473A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards

Abstract

PURPOSE:To perform a test of a printed board without damaging the board to be tested, by electrically connecting the printed substrate to be tested through an elastomer structure having anisotropy. CONSTITUTION:An elastomer structure 2 having anisotropic conductivity 2 is pressure-welded between a printed circuit substrate 1 to be tested and a hard insulating plate 3 either by mounting a testing circuit on the surface of the circuit substrate 1 with the elastomer structure 2 interposed or by arranging the hard insulating plate 3 connected to a separately provided testing circuit through lead wires. As the elastomer structure 2, a known laminate structure or a structure prepared by forming the dispersion of varios conductive linear bodies or fibrous substances in rubber in orientation to a certain direction is usable. In the inspecting method of the present invention, the elastomer structure having anisotropic conductivily is only press-contacted, so the corrosion due to the damage of a pattern surface does not proceed.
JP55121866A 1980-09-03 1980-09-03 Device and method for testing printed circuit board Pending JPS5745473A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55121866A JPS5745473A (en) 1980-09-03 1980-09-03 Device and method for testing printed circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55121866A JPS5745473A (en) 1980-09-03 1980-09-03 Device and method for testing printed circuit board

Publications (1)

Publication Number Publication Date
JPS5745473A true JPS5745473A (en) 1982-03-15

Family

ID=14821857

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55121866A Pending JPS5745473A (en) 1980-09-03 1980-09-03 Device and method for testing printed circuit board

Country Status (1)

Country Link
JP (1) JPS5745473A (en)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59206776A (en) * 1983-05-10 1984-11-22 Ibiden Co Ltd Method and apparatus for testing printed circuit board
JPS59228174A (en) * 1983-06-09 1984-12-21 Ibiden Co Ltd Jig circuit board for inspecting printed circuit board
JPS601574A (en) * 1983-06-20 1985-01-07 Ibiden Co Ltd Jig circuit board for inspection of printed circuit board
JPS6042661A (en) * 1983-08-17 1985-03-06 Ibiden Co Ltd Positioning device for inspecting printed wiring board
US4571542A (en) * 1982-06-30 1986-02-18 Japan Synthetic Rubber Co., Ltd. Method and unit for inspecting printed wiring boards
JPS6172900U (en) * 1984-10-19 1986-05-17
JPS61120072A (en) * 1984-11-14 1986-06-07 リバ‐プリユーフテヒニク・ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツング Inspection device for printed wiring board
FR2617977A1 (en) * 1987-07-08 1989-01-13 Centre Nat Rech Scient PRINTED CIRCUIT TEST APPARATUS
JPH0232068U (en) * 1988-08-22 1990-02-28
US5497103A (en) * 1995-01-25 1996-03-05 International Business Machines Corporation Test apparatus for circuitized substrate
KR100504467B1 (en) * 2001-11-30 2005-08-01 엘지전자 주식회사 Pcb test board and test apparatus using the same
JP2012237594A (en) * 2011-05-10 2012-12-06 Micronics Japan Co Ltd Insulation measuring probe unit and insulation measuring apparatus

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54148275A (en) * 1978-05-15 1979-11-20 Fujikura Ltd Method of testing printed circuit board
JPS5520466B2 (en) * 1974-06-19 1980-06-03

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5520466B2 (en) * 1974-06-19 1980-06-03
JPS54148275A (en) * 1978-05-15 1979-11-20 Fujikura Ltd Method of testing printed circuit board

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4571542A (en) * 1982-06-30 1986-02-18 Japan Synthetic Rubber Co., Ltd. Method and unit for inspecting printed wiring boards
JPS59206776A (en) * 1983-05-10 1984-11-22 Ibiden Co Ltd Method and apparatus for testing printed circuit board
JPH047475B2 (en) * 1983-05-10 1992-02-12 Ibiden Co Ltd
JPH047476B2 (en) * 1983-06-09 1992-02-12 Ibiden Co Ltd
JPS59228174A (en) * 1983-06-09 1984-12-21 Ibiden Co Ltd Jig circuit board for inspecting printed circuit board
JPS601574A (en) * 1983-06-20 1985-01-07 Ibiden Co Ltd Jig circuit board for inspection of printed circuit board
JPS6042661A (en) * 1983-08-17 1985-03-06 Ibiden Co Ltd Positioning device for inspecting printed wiring board
JPS6172900U (en) * 1984-10-19 1986-05-17
JPS61120072A (en) * 1984-11-14 1986-06-07 リバ‐プリユーフテヒニク・ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツング Inspection device for printed wiring board
FR2617977A1 (en) * 1987-07-08 1989-01-13 Centre Nat Rech Scient PRINTED CIRCUIT TEST APPARATUS
JPH0232068U (en) * 1988-08-22 1990-02-28
US5497103A (en) * 1995-01-25 1996-03-05 International Business Machines Corporation Test apparatus for circuitized substrate
KR100504467B1 (en) * 2001-11-30 2005-08-01 엘지전자 주식회사 Pcb test board and test apparatus using the same
JP2012237594A (en) * 2011-05-10 2012-12-06 Micronics Japan Co Ltd Insulation measuring probe unit and insulation measuring apparatus

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