SE9402155L - Adapter for use with a circuit board testing device - Google Patents

Adapter for use with a circuit board testing device

Info

Publication number
SE9402155L
SE9402155L SE9402155A SE9402155A SE9402155L SE 9402155 L SE9402155 L SE 9402155L SE 9402155 A SE9402155 A SE 9402155A SE 9402155 A SE9402155 A SE 9402155A SE 9402155 L SE9402155 L SE 9402155L
Authority
SE
Sweden
Prior art keywords
contact
adapter
test
electrically conducting
spots
Prior art date
Application number
SE9402155A
Other languages
Unknown language ( )
Swedish (sv)
Other versions
SE504286C2 (en
SE9402155D0 (en
Inventor
Reinhold Strandberg
Original Assignee
Reinhold Strandberg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Reinhold Strandberg filed Critical Reinhold Strandberg
Priority to SE9402155A priority Critical patent/SE504286C2/en
Publication of SE9402155D0 publication Critical patent/SE9402155D0/en
Priority to PCT/SE1995/000728 priority patent/WO1995035648A1/en
Priority to EP95923630A priority patent/EP0793905A1/en
Publication of SE9402155L publication Critical patent/SE9402155L/en
Publication of SE504286C2 publication Critical patent/SE504286C2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers

Abstract

An adapter for use in an apparatus for testing circuit cards, said apparatus comprising a set of test contact spots (3) in a certain distribution for application of test signals, comprises contact members (4) arranged to contact electrically conducting places (5) on the circuit card (6) and means (7) for bringing the test contact spots and the contact members into conducting contact with each other. The contact means (7) is formed by an adapter plate, which on a first side comprises first electrically conducting places (9) in correspondence to the actual occurrence of contact members (4) and adapted to be contacted by the latter and which on its other side (10) comprises second electrically conducting places (11) having a distribution corresponding to the distribution of the test contact spots and intended to contact actual ones of said test contact spots. Between first and second electrically conducting places (9, 11) belonging to each other and being present on the two sides of the plate (7) there are electrical conducting paths (12).
SE9402155A 1994-06-17 1994-06-17 Adapter for use with a circuit board testing device SE504286C2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
SE9402155A SE504286C2 (en) 1994-06-17 1994-06-17 Adapter for use with a circuit board testing device
PCT/SE1995/000728 WO1995035648A1 (en) 1994-06-17 1995-06-15 Adapter for use in an apparatus for testing circuit cards
EP95923630A EP0793905A1 (en) 1994-06-17 1995-06-15 Adapter for use in an apparatus for testing circuit cards

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9402155A SE504286C2 (en) 1994-06-17 1994-06-17 Adapter for use with a circuit board testing device

Publications (3)

Publication Number Publication Date
SE9402155D0 SE9402155D0 (en) 1994-06-17
SE9402155L true SE9402155L (en) 1995-12-18
SE504286C2 SE504286C2 (en) 1996-12-23

Family

ID=20394443

Family Applications (1)

Application Number Title Priority Date Filing Date
SE9402155A SE504286C2 (en) 1994-06-17 1994-06-17 Adapter for use with a circuit board testing device

Country Status (3)

Country Link
EP (1) EP0793905A1 (en)
SE (1) SE504286C2 (en)
WO (1) WO1995035648A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5945836A (en) * 1996-10-29 1999-08-31 Hewlett-Packard Company Loaded-board, guided-probe test fixture
US6784675B2 (en) 2002-06-25 2004-08-31 Agilent Technologies, Inc. Wireless test fixture adapter for printed circuit assembly tester
DE10254520A1 (en) * 2002-11-22 2004-06-09 Bruno Ratzky Line connections formation method for test adapter for non-multiplexed and multiplexed test system for electronic board, involves pressing pins of needle carrier plate into direct route contact plate

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3866119A (en) * 1973-09-10 1975-02-11 Probe Rite Inc Probe head-probing machine coupling adaptor
DE3038665C2 (en) * 1980-10-13 1990-03-29 Riba-Prüftechnik GmbH, 7801 Schallstadt Testing device for testing printed circuit boards provided with conductor tracks
JPS6180067A (en) * 1984-09-21 1986-04-23 インタ−ナショナル　ビジネス　マシ−ンズ　コ−ポレ−ション Test-probe device
SE458005B (en) * 1987-11-16 1989-02-13 Reinhold Strandberg PROCEDURE FOR TESTING CIRCUIT AND APPARATUS FOR PERFORMANCE OF TEST

Also Published As

Publication number Publication date
SE504286C2 (en) 1996-12-23
WO1995035648A1 (en) 1995-12-28
SE9402155D0 (en) 1994-06-17
EP0793905A1 (en) 1997-09-10

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Legal Events

Date Code Title Description
NUG Patent has lapsed