SE9402155D0 - Adapter for use with a circuit board testing device - Google Patents
Adapter for use with a circuit board testing deviceInfo
- Publication number
- SE9402155D0 SE9402155D0 SE9402155A SE9402155A SE9402155D0 SE 9402155 D0 SE9402155 D0 SE 9402155D0 SE 9402155 A SE9402155 A SE 9402155A SE 9402155 A SE9402155 A SE 9402155A SE 9402155 D0 SE9402155 D0 SE 9402155D0
- Authority
- SE
- Sweden
- Prior art keywords
- contact
- adapter
- test
- electrically conducting
- spots
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
Abstract
An adapter for use in an apparatus for testing circuit cards, said apparatus comprising a set of test contact spots (3) in a certain distribution for application of test signals, comprises contact members (4) arranged to contact electrically conducting places (5) on the circuit card (6) and means (7) for bringing the test contact spots and the contact members into conducting contact with each other. The contact means (7) is formed by an adapter plate, which on a first side comprises first electrically conducting places (9) in correspondence to the actual occurrence of contact members (4) and adapted to be contacted by the latter and which on its other side (10) comprises second electrically conducting places (11) having a distribution corresponding to the distribution of the test contact spots and intended to contact actual ones of said test contact spots. Between first and second electrically conducting places (9, 11) belonging to each other and being present on the two sides of the plate (7) there are electrical conducting paths (12).
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9402155A SE504286C2 (en) | 1994-06-17 | 1994-06-17 | Adapter for use with a circuit board testing device |
EP95923630A EP0793905A1 (en) | 1994-06-17 | 1995-06-15 | Adapter for use in an apparatus for testing circuit cards |
PCT/SE1995/000728 WO1995035648A1 (en) | 1994-06-17 | 1995-06-15 | Adapter for use in an apparatus for testing circuit cards |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9402155A SE504286C2 (en) | 1994-06-17 | 1994-06-17 | Adapter for use with a circuit board testing device |
Publications (3)
Publication Number | Publication Date |
---|---|
SE9402155D0 true SE9402155D0 (en) | 1994-06-17 |
SE9402155L SE9402155L (en) | 1995-12-18 |
SE504286C2 SE504286C2 (en) | 1996-12-23 |
Family
ID=20394443
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE9402155A SE504286C2 (en) | 1994-06-17 | 1994-06-17 | Adapter for use with a circuit board testing device |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0793905A1 (en) |
SE (1) | SE504286C2 (en) |
WO (1) | WO1995035648A1 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5945836A (en) * | 1996-10-29 | 1999-08-31 | Hewlett-Packard Company | Loaded-board, guided-probe test fixture |
US6784675B2 (en) | 2002-06-25 | 2004-08-31 | Agilent Technologies, Inc. | Wireless test fixture adapter for printed circuit assembly tester |
DE10254520A1 (en) * | 2002-11-22 | 2004-06-09 | Bruno Ratzky | Line connections formation method for test adapter for non-multiplexed and multiplexed test system for electronic board, involves pressing pins of needle carrier plate into direct route contact plate |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3866119A (en) * | 1973-09-10 | 1975-02-11 | Probe Rite Inc | Probe head-probing machine coupling adaptor |
DE3038665C2 (en) * | 1980-10-13 | 1990-03-29 | Riba-Prüftechnik GmbH, 7801 Schallstadt | Testing device for testing printed circuit boards provided with conductor tracks |
JPS6180067A (en) * | 1984-09-21 | 1986-04-23 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | Test-probe device |
SE458005B (en) * | 1987-11-16 | 1989-02-13 | Reinhold Strandberg | PROCEDURE FOR TESTING CIRCUIT AND APPARATUS FOR PERFORMANCE OF TEST |
-
1994
- 1994-06-17 SE SE9402155A patent/SE504286C2/en not_active IP Right Cessation
-
1995
- 1995-06-15 WO PCT/SE1995/000728 patent/WO1995035648A1/en not_active Application Discontinuation
- 1995-06-15 EP EP95923630A patent/EP0793905A1/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
SE504286C2 (en) | 1996-12-23 |
EP0793905A1 (en) | 1997-09-10 |
SE9402155L (en) | 1995-12-18 |
WO1995035648A1 (en) | 1995-12-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
NUG | Patent has lapsed |