SE9402155L - Adapter för användning vid en apparat för testning av kretskort - Google Patents

Adapter för användning vid en apparat för testning av kretskort

Info

Publication number
SE9402155L
SE9402155L SE9402155A SE9402155A SE9402155L SE 9402155 L SE9402155 L SE 9402155L SE 9402155 A SE9402155 A SE 9402155A SE 9402155 A SE9402155 A SE 9402155A SE 9402155 L SE9402155 L SE 9402155L
Authority
SE
Sweden
Prior art keywords
contact
adapter
test
electrically conducting
spots
Prior art date
Application number
SE9402155A
Other languages
English (en)
Swedish (sv)
Other versions
SE504286C2 (sv
SE9402155D0 (sv
Inventor
Reinhold Strandberg
Original Assignee
Reinhold Strandberg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Reinhold Strandberg filed Critical Reinhold Strandberg
Priority to SE9402155A priority Critical patent/SE504286C2/sv
Publication of SE9402155D0 publication Critical patent/SE9402155D0/xx
Priority to PCT/SE1995/000728 priority patent/WO1995035648A1/en
Priority to EP95923630A priority patent/EP0793905A1/en
Publication of SE9402155L publication Critical patent/SE9402155L/
Publication of SE504286C2 publication Critical patent/SE504286C2/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
SE9402155A 1994-06-17 1994-06-17 Adapter för användning vid en apparat för testning av kretskort SE504286C2 (sv)

Priority Applications (3)

Application Number Priority Date Filing Date Title
SE9402155A SE504286C2 (sv) 1994-06-17 1994-06-17 Adapter för användning vid en apparat för testning av kretskort
PCT/SE1995/000728 WO1995035648A1 (en) 1994-06-17 1995-06-15 Adapter for use in an apparatus for testing circuit cards
EP95923630A EP0793905A1 (en) 1994-06-17 1995-06-15 Adapter for use in an apparatus for testing circuit cards

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9402155A SE504286C2 (sv) 1994-06-17 1994-06-17 Adapter för användning vid en apparat för testning av kretskort

Publications (3)

Publication Number Publication Date
SE9402155D0 SE9402155D0 (sv) 1994-06-17
SE9402155L true SE9402155L (sv) 1995-12-18
SE504286C2 SE504286C2 (sv) 1996-12-23

Family

ID=20394443

Family Applications (1)

Application Number Title Priority Date Filing Date
SE9402155A SE504286C2 (sv) 1994-06-17 1994-06-17 Adapter för användning vid en apparat för testning av kretskort

Country Status (3)

Country Link
EP (1) EP0793905A1 ( )
SE (1) SE504286C2 ( )
WO (1) WO1995035648A1 ( )

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5945836A (en) * 1996-10-29 1999-08-31 Hewlett-Packard Company Loaded-board, guided-probe test fixture
US6784675B2 (en) 2002-06-25 2004-08-31 Agilent Technologies, Inc. Wireless test fixture adapter for printed circuit assembly tester
DE10254520A1 (de) * 2002-11-22 2004-06-09 Bruno Ratzky Verfahren zur einfachen Erstellung der Leitungsverbindungen und Erzielung von kleinsten Prüfrastern, auf kleinstem Raum, bei einem Prüfadapter bzw. einer Adaptereinrichtung

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3866119A (en) * 1973-09-10 1975-02-11 Probe Rite Inc Probe head-probing machine coupling adaptor
DE3038665C2 (de) * 1980-10-13 1990-03-29 Riba-Prüftechnik GmbH, 7801 Schallstadt Prüfeinrichtung zum Überprüfen von mit Leiterbahnen versehenen Leiterplatten
JPS6180067A (ja) * 1984-09-21 1986-04-23 インタ−ナショナル　ビジネス　マシ−ンズ　コ−ポレ−ション テスト・プロ−ブ装置
SE458005B (sv) * 1987-11-16 1989-02-13 Reinhold Strandberg Foerfarande foer provning av kretskort samt apparat foer utfoerande av provningen

Also Published As

Publication number Publication date
EP0793905A1 (en) 1997-09-10
SE504286C2 (sv) 1996-12-23
WO1995035648A1 (en) 1995-12-28
SE9402155D0 (sv) 1994-06-17

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Legal Events

Date Code Title Description
NUG Patent has lapsed