GB1294025A - Rf sputtering - Google Patents
Rf sputteringInfo
- Publication number
- GB1294025A GB1294025A GB21474/70A GB2147470A GB1294025A GB 1294025 A GB1294025 A GB 1294025A GB 21474/70 A GB21474/70 A GB 21474/70A GB 2147470 A GB2147470 A GB 2147470A GB 1294025 A GB1294025 A GB 1294025A
- Authority
- GB
- United Kingdom
- Prior art keywords
- chamber
- electrode
- sputtering
- area
- target
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Abstract
1294025 R. F. Sputtering INTERNATIONAL BUSINESS MACHINES CORP 5 May 1970 [2 June 1969] 21474/70 Heading C7F R.F. sputtering apparatus comprises a vacuum chamber, a target holder electrode 12 in the chamber for supporting target 14, a substrate holder electrode 18 opposing and spaced from electrode 12, electrodes 12 and 18 being arranged so as to substantially enclose a region of the chamber between them to prevent the glow discharge from extending to the remainder of the chamber, the ratio of the area of 18 to the area of 12 being above 1 but less than 2À5, and means for applying R. F. potential to 12 and 18. The surface area of electrode 18 may be increased by providing annular recesses 20; sputtering of quartz on to silicon and metal in argon gas is referred to.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US82963369A | 1969-06-02 | 1969-06-02 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1294025A true GB1294025A (en) | 1972-10-25 |
Family
ID=25255069
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB21474/70A Expired GB1294025A (en) | 1969-06-02 | 1970-05-05 | Rf sputtering |
Country Status (5)
Country | Link |
---|---|
US (1) | US3661761A (en) |
JP (1) | JPS4822901B1 (en) |
DE (1) | DE2026321A1 (en) |
FR (1) | FR2052341A5 (en) |
GB (1) | GB1294025A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20140174919A1 (en) * | 2012-12-24 | 2014-06-26 | Hon Hai Precision Industry Co., Ltd. | Electrode having heat sinks and coating device |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3767559A (en) * | 1970-06-24 | 1973-10-23 | Eastman Kodak Co | Sputtering apparatus with accordion pleated anode means |
FR2119930B1 (en) * | 1970-12-31 | 1974-08-19 | Ibm | |
JPS536963Y2 (en) * | 1973-05-08 | 1978-02-22 | ||
JPS5441522Y2 (en) * | 1973-10-25 | 1979-12-05 | ||
JPS50119203U (en) * | 1974-03-14 | 1975-09-29 | ||
US4036723A (en) * | 1975-08-21 | 1977-07-19 | International Business Machines Corporation | RF bias sputtering method for producing insulating films free of surface irregularities |
GB1544172A (en) * | 1976-03-03 | 1979-04-11 | Int Plasma Corp | Gas plasma reactor and process |
US4035276A (en) * | 1976-04-29 | 1977-07-12 | Ibm Corporation | Making coplanar layers of thin films |
US4029562A (en) * | 1976-04-29 | 1977-06-14 | Ibm Corporation | Forming feedthrough connections for multi-level interconnections metallurgy systems |
DE2705611A1 (en) * | 1977-02-10 | 1978-08-17 | Siemens Ag | METHOD OF COVERING A FIRST LAYER OR SEQUENCE OF LAYERS ON A SUBSTRATE WITH A FURTHER SECOND LAYER BY SPUTTERING |
US4153528A (en) * | 1978-06-26 | 1979-05-08 | International Business Machines Corporation | Contoured quartz anode plate |
US4349409A (en) * | 1980-05-12 | 1982-09-14 | Fujitsu Limited | Method and apparatus for plasma etching |
US4396458A (en) * | 1981-12-21 | 1983-08-02 | International Business Machines Corporation | Method for forming planar metal/insulator structures |
EP0202572B1 (en) * | 1985-05-13 | 1993-12-15 | Nippon Telegraph And Telephone Corporation | Method for forming a planarized aluminium thin film |
CH668565A5 (en) * | 1986-06-23 | 1989-01-13 | Balzers Hochvakuum | METHOD AND ARRANGEMENT FOR SPRAYING A MATERIAL AT HIGH FREQUENCY. |
US6248219B1 (en) * | 1986-06-23 | 2001-06-19 | Unaxis Balzers Aktiengesellschaft | Process and apparatus for sputter etching or sputter coating |
US4756810A (en) * | 1986-12-04 | 1988-07-12 | Machine Technology, Inc. | Deposition and planarizing methods and apparatus |
US5490910A (en) * | 1992-03-09 | 1996-02-13 | Tulip Memory Systems, Inc. | Circularly symmetric sputtering apparatus with hollow-cathode plasma devices |
US6942764B1 (en) | 1995-08-24 | 2005-09-13 | Taiwan Semiconductor Manufacturing Company, Ltd. | Arc-sprayed shield for pre-sputter etching chamber |
US6342135B1 (en) * | 1995-11-02 | 2002-01-29 | Taiwan Semiconductor Manufacturing Company | Sputter etching chamber with improved uniformity |
US6436253B1 (en) | 1998-05-20 | 2002-08-20 | Taiwan Semiconductor Manufacturing Company | Sputter etching chamber with improved uniformity |
US6475400B2 (en) | 2001-02-26 | 2002-11-05 | Trw Inc. | Method for controlling the sheet resistance of thin film resistors |
US20040226516A1 (en) * | 2003-05-13 | 2004-11-18 | Daniel Timothy J. | Wafer pedestal cover |
EP2368258B1 (en) * | 2008-11-24 | 2017-12-20 | Evatec AG | Rf sputtering arrangement |
WO2010073207A1 (en) | 2008-12-23 | 2010-07-01 | Oc Oerlikon Balzers Ag | Rf sputtering arrangement |
US11217434B2 (en) | 2016-12-27 | 2022-01-04 | Evatec Ag | RF capacitive coupled dual frequency etch reactor |
-
1969
- 1969-06-02 US US829633A patent/US3661761A/en not_active Expired - Lifetime
-
1970
- 1970-04-28 FR FR7015372A patent/FR2052341A5/fr not_active Expired
- 1970-05-05 GB GB21474/70A patent/GB1294025A/en not_active Expired
- 1970-05-08 JP JP45038775A patent/JPS4822901B1/ja active Pending
- 1970-05-29 DE DE19702026321 patent/DE2026321A1/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20140174919A1 (en) * | 2012-12-24 | 2014-06-26 | Hon Hai Precision Industry Co., Ltd. | Electrode having heat sinks and coating device |
Also Published As
Publication number | Publication date |
---|---|
JPS4822901B1 (en) | 1973-07-10 |
FR2052341A5 (en) | 1971-04-09 |
DE2026321A1 (en) | 1970-12-10 |
US3661761A (en) | 1972-05-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed [section 19, patents act 1949] | ||
PCNP | Patent ceased through non-payment of renewal fee |