GB1010456A - Means for measuring and/or controlling the evaporation rate in vacuum evaporation processes - Google Patents

Means for measuring and/or controlling the evaporation rate in vacuum evaporation processes

Info

Publication number
GB1010456A
GB1010456A GB3722462A GB3722462A GB1010456A GB 1010456 A GB1010456 A GB 1010456A GB 3722462 A GB3722462 A GB 3722462A GB 3722462 A GB3722462 A GB 3722462A GB 1010456 A GB1010456 A GB 1010456A
Authority
GB
United Kingdom
Prior art keywords
vapour
electrode
evaporation
ion electrode
ion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3722462A
Inventor
Donald Fulton
Alexander Machachlan
Michael St John Burden
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GV Planer Ltd
Original Assignee
GV Planer Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GV Planer Ltd filed Critical GV Planer Ltd
Priority to GB3722462A priority Critical patent/GB1010456A/en
Publication of GB1010456A publication Critical patent/GB1010456A/en
Expired legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/54Controlling or regulating the coating process
    • C23C14/542Controlling the film thickness or evaporation rate
    • C23C14/544Controlling the film thickness or evaporation rate using measurement in the gas phase

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)

Abstract

<PICT:1010456/C6-C7/1> <PICT:1010456/C6-C7/2> <PICT:1010456/C6-C7/3> In a vapour deposition process using an electron beam emitter to evaporate the source material, the rate of evaporation is controlled by regulating the current through the emitter according to the ionization current resulting from the evaporation, the ionization current being registered by a vapour ion electrode exposed to part of the evaporant stream. A residual ion electrode outside the path of the evaporant stream registers the background ionization current and the electrodes are mounted in an assembly comprising an earthed shielding electrode 1, residual ion electrode 2 and a vapour ion electrode 3 insulated by spacers 4, 5 and 6. A collimator tube 7 passes through electrodes 1 and 2 and shields the residual ion electrode from the evaporant. The electrode assembly is mounted on pillars 10 in a vacuum chamber between the source material and the substrate and an electron beam emitter 25 vaporizes the source material, the vapour material passing through the tube 7 and aperture 18 in the vapour ion electrode 3 which thus acquires a positive charge. As shown in Fg. 4 the difference in the outputs of the vapour ion and residual ion electrodes is amplified at 21 and fed to a controller meter 22 which indicates the rate of evaporation and/or opertes pre-set relays to actuate motor 23 of transformer 24 which controls the current input to the emitter 25. Alternatively (Fig. 5, not shown) the output from 21 may be applied to a saturable reactor which controls the source temperture at constant high tension. Timing mechanisms may also be incorporated in the control gear. An alternative arrangement of the electrode assembly is also described (Fig. 6, not shown).
GB3722462A 1962-10-02 1962-10-02 Means for measuring and/or controlling the evaporation rate in vacuum evaporation processes Expired GB1010456A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB3722462A GB1010456A (en) 1962-10-02 1962-10-02 Means for measuring and/or controlling the evaporation rate in vacuum evaporation processes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB3722462A GB1010456A (en) 1962-10-02 1962-10-02 Means for measuring and/or controlling the evaporation rate in vacuum evaporation processes

Publications (1)

Publication Number Publication Date
GB1010456A true GB1010456A (en) 1965-11-17

Family

ID=10394775

Family Applications (1)

Application Number Title Priority Date Filing Date
GB3722462A Expired GB1010456A (en) 1962-10-02 1962-10-02 Means for measuring and/or controlling the evaporation rate in vacuum evaporation processes

Country Status (1)

Country Link
GB (1) GB1010456A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3467057A (en) * 1966-07-27 1969-09-16 Hitachi Ltd Electron beam evaporator
US4024376A (en) * 1975-06-13 1977-05-17 Leybold-Heraeus Gmbh & Co. Kg Device for measuring the evaporation rate in vacuum evaporation processes
US4408563A (en) * 1978-08-09 1983-10-11 Leybold-Heraeus Gmbh Apparatus for regulating the evaporation rate of oxidizable substances in reactive vacuum deposition
EP0160479A2 (en) * 1984-04-24 1985-11-06 Hitachi, Ltd. Method and apparatus for forming a thin film
US4587134A (en) * 1984-05-28 1986-05-06 Nisshin Steel Company, Ltd. Method of rapidly changing deposition amount in a continuous vacuum deposition process

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3467057A (en) * 1966-07-27 1969-09-16 Hitachi Ltd Electron beam evaporator
US4024376A (en) * 1975-06-13 1977-05-17 Leybold-Heraeus Gmbh & Co. Kg Device for measuring the evaporation rate in vacuum evaporation processes
US4408563A (en) * 1978-08-09 1983-10-11 Leybold-Heraeus Gmbh Apparatus for regulating the evaporation rate of oxidizable substances in reactive vacuum deposition
EP0160479A2 (en) * 1984-04-24 1985-11-06 Hitachi, Ltd. Method and apparatus for forming a thin film
EP0160479A3 (en) * 1984-04-24 1988-03-30 Hitachi, Ltd. Method and apparatus for forming a thin film
US4587134A (en) * 1984-05-28 1986-05-06 Nisshin Steel Company, Ltd. Method of rapidly changing deposition amount in a continuous vacuum deposition process

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