FR2862157B1 - Procede et dispositif pour la fabrication d'un film multicouche magnetoresistif avec utilisation d'argon ou d'un gaz de numero atomique superieur - Google Patents
Procede et dispositif pour la fabrication d'un film multicouche magnetoresistif avec utilisation d'argon ou d'un gaz de numero atomique superieurInfo
- Publication number
- FR2862157B1 FR2862157B1 FR0411023A FR0411023A FR2862157B1 FR 2862157 B1 FR2862157 B1 FR 2862157B1 FR 0411023 A FR0411023 A FR 0411023A FR 0411023 A FR0411023 A FR 0411023A FR 2862157 B1 FR2862157 B1 FR 2862157B1
- Authority
- FR
- France
- Prior art keywords
- argon
- multilayer film
- atomic number
- number gas
- magnetoresistive multilayer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 title 2
- 229910052786 argon Inorganic materials 0.000 title 1
- 239000007789 gas Substances 0.000 title 1
- 238000004519 manufacturing process Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F41/00—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
- H01F41/14—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates
- H01F41/30—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates for applying nanostructures, e.g. by molecular beam epitaxy [MBE]
- H01F41/302—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates for applying nanostructures, e.g. by molecular beam epitaxy [MBE] for applying spin-exchange-coupled multilayers, e.g. nanostructured superlattices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/26—Thin magnetic films, e.g. of one-domain structure characterised by the substrate or intermediate layers
- H01F10/30—Thin magnetic films, e.g. of one-domain structure characterised by the substrate or intermediate layers characterised by the composition of the intermediate layers, e.g. seed, buffer, template, diffusion preventing, cap layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3254—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the spacer being semiconducting or insulating, e.g. for spin tunnel junction [STJ]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3268—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being asymmetric, e.g. by use of additional pinning, by using antiferromagnetic or ferromagnetic coupling interface, i.e. so-called spin-valve [SV] structure, e.g. NiFe/Cu/NiFe/FeMn
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F41/00—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
- H01F41/14—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates
- H01F41/18—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates by cathode sputtering
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/01—Manufacture or treatment
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/4902—Electromagnet, transformer or inductor
- Y10T29/49021—Magnetic recording reproducing transducer [e.g., tape head, core, etc.]
- Y10T29/49025—Making disc drive
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/4902—Electromagnet, transformer or inductor
- Y10T29/49021—Magnetic recording reproducing transducer [e.g., tape head, core, etc.]
- Y10T29/49032—Fabricating head structure or component thereof
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/4902—Electromagnet, transformer or inductor
- Y10T29/49021—Magnetic recording reproducing transducer [e.g., tape head, core, etc.]
- Y10T29/49032—Fabricating head structure or component thereof
- Y10T29/49034—Treating to affect magnetic properties
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/4902—Electromagnet, transformer or inductor
- Y10T29/49021—Magnetic recording reproducing transducer [e.g., tape head, core, etc.]
- Y10T29/49032—Fabricating head structure or component thereof
- Y10T29/49036—Fabricating head structure or component thereof including measuring or testing
- Y10T29/49043—Depositing magnetic layer or coating
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/4902—Electromagnet, transformer or inductor
- Y10T29/49021—Magnetic recording reproducing transducer [e.g., tape head, core, etc.]
- Y10T29/49032—Fabricating head structure or component thereof
- Y10T29/49036—Fabricating head structure or component thereof including measuring or testing
- Y10T29/49043—Depositing magnetic layer or coating
- Y10T29/49044—Plural magnetic deposition layers
Landscapes
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Computer Hardware Design (AREA)
- Hall/Mr Elements (AREA)
- Magnetic Heads (AREA)
- Thin Magnetic Films (AREA)
- Semiconductor Memories (AREA)
- Mram Or Spin Memory Techniques (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003357108A JP2005123412A (ja) | 2003-10-16 | 2003-10-16 | 磁気抵抗多層膜製造方法及び製造装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2862157A1 FR2862157A1 (fr) | 2005-05-13 |
FR2862157B1 true FR2862157B1 (fr) | 2009-06-12 |
Family
ID=34509819
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR0411023A Expired - Fee Related FR2862157B1 (fr) | 2003-10-16 | 2004-10-18 | Procede et dispositif pour la fabrication d'un film multicouche magnetoresistif avec utilisation d'argon ou d'un gaz de numero atomique superieur |
FR0503506A Expired - Fee Related FR2868194B1 (fr) | 2003-10-16 | 2005-04-07 | Procede et dispositif pour la fabrication d'un film multicouche magnetoresistif avec utilisation d'oxygene |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR0503506A Expired - Fee Related FR2868194B1 (fr) | 2003-10-16 | 2005-04-07 | Procede et dispositif pour la fabrication d'un film multicouche magnetoresistif avec utilisation d'oxygene |
Country Status (3)
Country | Link |
---|---|
US (4) | US7603763B2 (fr) |
JP (1) | JP2005123412A (fr) |
FR (2) | FR2862157B1 (fr) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005123412A (ja) * | 2003-10-16 | 2005-05-12 | Anelva Corp | 磁気抵抗多層膜製造方法及び製造装置 |
US7646569B2 (en) * | 2006-07-20 | 2010-01-12 | Hitachi Global Storage Technologies Netherlands B.V. | Pinned layer in magnetoresistive sensor |
US20100173174A1 (en) * | 2007-06-11 | 2010-07-08 | Kenichi Imakita | Process for producing magnetic device, apparatus for producing magnetic device, and magnetic device |
US7990659B2 (en) | 2007-07-09 | 2011-08-02 | International Business Machines Corporation | Magnetic head with protective films |
WO2009154009A1 (fr) * | 2008-06-20 | 2009-12-23 | キヤノンアネルバ株式会社 | Procédé de fabrication d’un dispositif magnétorésistif, chambre de formation de pellicule par pulvérisation, appareil de fabrication d’un dispositif magnétorésistif comportant une chambre de formation de pellicule par pulvérisation, programme et support d’enregistrement |
US8432645B2 (en) * | 2011-01-31 | 2013-04-30 | Tdk Corporation | Magneto-resistive effect element, magnetic head, magnetic head slider, head gimbal assembly and hard disk drive apparatus |
KR101881932B1 (ko) | 2011-12-07 | 2018-07-27 | 삼성전자주식회사 | 자기 소자 및 그 제조 방법 |
US9287322B2 (en) * | 2014-05-12 | 2016-03-15 | Samsung Electronics Co., Ltd. | Method for controlling magnetic properties through ion diffusion in a magnetic junction usable in spin transfer torque magnetic random access memory applications |
CN107208249B (zh) | 2015-02-03 | 2019-08-20 | 卡迪奈尔镀膜玻璃公司 | 包括气体分配系统的喷溅装置 |
Family Cites Families (38)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3207638A (en) * | 1963-11-22 | 1965-09-21 | Du Pont | Manganese, gallium, iron magnetic alloy and method of producing particular crystal structure thereof |
JPH0752305B2 (ja) | 1985-12-11 | 1995-06-05 | キヤノン株式会社 | 電子写真感光体の製造方法 |
JPH06259729A (ja) * | 1993-03-03 | 1994-09-16 | Tdk Corp | 磁気ヘッド |
US5465185A (en) * | 1993-10-15 | 1995-11-07 | International Business Machines Corporation | Magnetoresistive spin valve sensor with improved pinned ferromagnetic layer and magnetic recording system using the sensor |
JPH08129721A (ja) | 1994-09-08 | 1996-05-21 | Sumitomo Metal Ind Ltd | NiO反強磁性膜の製造方法並びに磁気抵抗効果素子の製造方法とその素子 |
US5616218A (en) * | 1994-09-12 | 1997-04-01 | Matereials Research Corporation | Modification and selection of the magnetic properties of magnetic recording media through selective control of the crystal texture of the recording layer |
US5891586A (en) * | 1995-01-27 | 1999-04-06 | Alps Electric Co., Ltd. | Multilayer thin-film for magnetoresistive device |
JP2990036B2 (ja) * | 1995-02-13 | 1999-12-13 | ティーディーケイ株式会社 | 光記録媒体およびその製造方法 |
DE69619166T2 (de) * | 1995-06-15 | 2002-06-20 | Tdk Corp., Tokio/Tokyo | Magnetoresistiver Wandler mit "Spin-Valve" Struktur und Herstellungsverfahren |
SG46731A1 (en) * | 1995-06-30 | 1998-02-20 | Ibm | Spin valve magnetoresistive sensor with antiparallel pinned layer and improved exchange bias layer and magnetic recording system using the senor |
JP3593761B2 (ja) | 1995-10-26 | 2004-11-24 | 富士通株式会社 | 酸化物磁性体及びその製造方法 |
US5764567A (en) * | 1996-11-27 | 1998-06-09 | International Business Machines Corporation | Magnetic tunnel junction device with nonferromagnetic interface layer for improved magnetic field response |
JP2924785B2 (ja) * | 1996-04-25 | 1999-07-26 | 日本電気株式会社 | 磁気抵抗効果素子薄膜及びその製造方法 |
JP3137580B2 (ja) | 1996-06-14 | 2001-02-26 | ティーディーケイ株式会社 | 磁性多層膜、磁気抵抗効果素子および磁気変換素子 |
WO1998022636A1 (fr) * | 1996-11-20 | 1998-05-28 | Kabushiki Kaisha Toshiba | Cible pour pulverisation, et film antiferromagnetique et element a effet magnetoresistant formes a l'aide de ladite cible |
US5998016A (en) * | 1997-01-16 | 1999-12-07 | Tdk Corporation | Spin valve effect magnetoresistive sensor and magnetic head with the sensor |
JP3761287B2 (ja) | 1997-05-29 | 2006-03-29 | Tdk株式会社 | 光記録媒体およびその製造方法 |
US5768071A (en) * | 1997-06-19 | 1998-06-16 | International Business Machines Corporation | Spin valve sensor with improved magnetic stability of the pinned layer |
JP2962415B2 (ja) * | 1997-10-22 | 1999-10-12 | アルプス電気株式会社 | 交換結合膜 |
JPH11296823A (ja) | 1998-04-09 | 1999-10-29 | Nec Corp | 磁気抵抗効果素子およびその製造方法、ならびに磁気抵抗効果センサ,磁気記録システム |
JPH11330588A (ja) * | 1998-05-20 | 1999-11-30 | Sony Corp | 磁気抵抗効果素子およびその製造方法、ならびに磁気記録再生装置 |
US6268036B1 (en) * | 1998-06-26 | 2001-07-31 | International Business Machines Corporation | Thin film disk with highly faulted crystalline underlayer |
US6201671B1 (en) * | 1998-12-04 | 2001-03-13 | International Business Machines Corporation | Seed layer for a nickel oxide pinning layer for increasing the magnetoresistance of a spin valve sensor |
US6567246B1 (en) * | 1999-03-02 | 2003-05-20 | Matsushita Electric Industrial Co., Ltd. | Magnetoresistance effect element and method for producing the same, and magnetoresistance effect type head, magnetic recording apparatus, and magnetoresistance effect memory element |
JP3601690B2 (ja) | 1999-03-02 | 2004-12-15 | 松下電器産業株式会社 | 磁気抵抗効果素子とその製造方法、磁気抵抗効果型ヘッド、磁気記録装置、磁気抵抗効果メモリ素子 |
US6770382B1 (en) * | 1999-11-22 | 2004-08-03 | Headway Technologies, Inc. | GMR configuration with enhanced spin filtering |
US20020101689A1 (en) * | 2000-04-05 | 2002-08-01 | Xuefei Tang | High sensitivity spin valve stacks using oxygen in spacer layer deposition |
JP3686572B2 (ja) * | 2000-04-12 | 2005-08-24 | アルプス電気株式会社 | 交換結合膜の製造方法と、前記交換結合膜を用いた磁気抵抗効果素子の製造方法、ならびに前記磁気抵抗効果素子を用いた薄膜磁気ヘッドの製造方法 |
JP4403337B2 (ja) | 2000-05-30 | 2010-01-27 | ソニー株式会社 | トンネル磁気抵抗効果素子、及びトンネル磁気抵抗効果型磁気ヘッド |
JP3839644B2 (ja) * | 2000-07-11 | 2006-11-01 | アルプス電気株式会社 | 交換結合膜と、この交換結合膜を用いた磁気抵抗効果素子、ならびに前記磁気抵抗効果素子を用いた薄膜磁気ヘッド |
US6437950B1 (en) * | 2000-10-12 | 2002-08-20 | International Business Machines Corporation | Top spin valve sensor that has an iridium manganese (IrMn) pinning layer and an iridium manganese oxide (IrMnO) seed layer |
JP3995072B2 (ja) * | 2000-11-16 | 2007-10-24 | 富士通株式会社 | Cpp構造スピンバルブヘッド |
JP2002167661A (ja) * | 2000-11-30 | 2002-06-11 | Anelva Corp | 磁性多層膜作製装置 |
US6721144B2 (en) * | 2001-01-04 | 2004-04-13 | International Business Machines Corporation | Spin valves with co-ferrite pinning layer |
US6709767B2 (en) * | 2001-07-31 | 2004-03-23 | Hitachi Global Storage Technologies Netherlands B.V. | In-situ oxidized films for use as cap and gap layers in a spin-valve sensor and methods of manufacture |
JP2003086866A (ja) | 2001-09-13 | 2003-03-20 | Anelva Corp | スピンバルブ型巨大磁気抵抗薄膜の製造方法 |
US7041200B2 (en) * | 2002-04-19 | 2006-05-09 | Applied Materials, Inc. | Reducing particle generation during sputter deposition |
JP2005123412A (ja) * | 2003-10-16 | 2005-05-12 | Anelva Corp | 磁気抵抗多層膜製造方法及び製造装置 |
-
2003
- 2003-10-16 JP JP2003357108A patent/JP2005123412A/ja not_active Withdrawn
-
2004
- 2004-10-18 FR FR0411023A patent/FR2862157B1/fr not_active Expired - Fee Related
- 2004-10-18 US US10/965,796 patent/US7603763B2/en active Active
-
2005
- 2005-04-07 FR FR0503506A patent/FR2868194B1/fr not_active Expired - Fee Related
-
2007
- 2007-03-20 US US11/688,739 patent/US7914654B2/en active Active
- 2007-11-30 US US11/948,822 patent/US7771570B2/en active Active
-
2008
- 2008-04-29 US US12/111,861 patent/US20080202917A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
FR2868194B1 (fr) | 2009-10-16 |
US20050083612A1 (en) | 2005-04-21 |
FR2862157A1 (fr) | 2005-05-13 |
FR2868194A1 (fr) | 2005-09-30 |
US20080142156A1 (en) | 2008-06-19 |
US20070169699A1 (en) | 2007-07-26 |
US7914654B2 (en) | 2011-03-29 |
JP2005123412A (ja) | 2005-05-12 |
US20080202917A1 (en) | 2008-08-28 |
US7603763B2 (en) | 2009-10-20 |
US7771570B2 (en) | 2010-08-10 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
FR2868194B1 (fr) | Procede et dispositif pour la fabrication d'un film multicouche magnetoresistif avec utilisation d'oxygene | |
NO20006299L (no) | Undervanns brönnanordning og fremgangsmåte for produksjon av fluider fra en undervanns brönn | |
GB2377395B (en) | Superconducting magnesium diboride thin film and method and apparatus for fabricating the same | |
FR2817106B1 (fr) | Dispositif photosensible et procede de commande du dispositif photosensible | |
NO20025187L (no) | En metode og et system for separasjon av vaeske | |
FR2816091B1 (fr) | Procede de guidage d'un aeronef dans le cadre d'un vol en convoi | |
FR2864698B1 (fr) | Procede et dispositif de fabrication d'un affichage a ecran plat | |
AU2003220611A8 (en) | Method and system for providing a thin film | |
FR2849241B1 (fr) | Procede et dispositif d'imagerie radiographique | |
FR2825464B1 (fr) | Procede et dispositif de jaugeage d'un liquide | |
AU2003235192A8 (en) | The operational method and system of the telecommunication device for the electronic cash | |
AU2002329048A8 (en) | A tripod for supporting apparatus in general and, in particular, for optical or photographic apparatus and the like | |
FR2830613B1 (fr) | Procede d'ajustage automatique pour un goniometre et dispositif associe | |
FR2867233B1 (fr) | Dispositif d'etancheite et procede pour le fabriquer | |
FR2856791B1 (fr) | Procede et dispositif d'imagerie magneto-optique | |
DK1315096T3 (da) | Fremgangsmåde og indretning til at hente relevant information | |
FR2858252B1 (fr) | Dispositif et procede d'enduction | |
NO20033475D0 (no) | Fremgangsmåte for reduksjon av störrelsen til tverrsnittet av en åpning i en hul innretning plassert i et strömningsrör | |
FR2825502B1 (fr) | Dispositif electronique d'aide a la navigation et procede utilisant un tel dispositif | |
NO20000816D0 (no) | Anordning og fremgangsmåte for separasjon av gass og væske i en brønnstrøm | |
FR2832220B1 (fr) | Procede et dispositif d'imagerie radiologique | |
FR2840500B1 (fr) | Dispositif permettant de tele relever l'index d'un compteur a gaz | |
FR2831148B1 (fr) | Procede et dispositif de manipulation d'un wafer | |
FR2829282B1 (fr) | Procede de formation d'un noyau stratifie et dispositif d'entrainement de soupape du type electromagnetique | |
FR2838402B1 (fr) | Dispositif d'aide a l'evacuation d'urgence d'un aeronef |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
CA | Change of address | ||
CD | Change of name or company name | ||
PLFP | Fee payment |
Year of fee payment: 13 |
|
PLFP | Fee payment |
Year of fee payment: 14 |
|
PLFP | Fee payment |
Year of fee payment: 15 |
|
PLFP | Fee payment |
Year of fee payment: 16 |
|
PLFP | Fee payment |
Year of fee payment: 17 |
|
PLFP | Fee payment |
Year of fee payment: 18 |
|
ST | Notification of lapse |
Effective date: 20230606 |