FR2704690B1 - Method for encapsulating semiconductor wafers, device obtained by this process and application to the interconnection of wafers in three dimensions. - Google Patents

Method for encapsulating semiconductor wafers, device obtained by this process and application to the interconnection of wafers in three dimensions.

Info

Publication number
FR2704690B1
FR2704690B1 FR9304962A FR9304962A FR2704690B1 FR 2704690 B1 FR2704690 B1 FR 2704690B1 FR 9304962 A FR9304962 A FR 9304962A FR 9304962 A FR9304962 A FR 9304962A FR 2704690 B1 FR2704690 B1 FR 2704690B1
Authority
FR
France
Prior art keywords
chips
wafers
interconnection
dimensions
application
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9304962A
Other languages
French (fr)
Other versions
FR2704690A1 (en
Inventor
Val Christian
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
Thomson CSF SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson CSF SA filed Critical Thomson CSF SA
Priority to FR9304962A priority Critical patent/FR2704690B1/en
Priority to PCT/FR1994/000427 priority patent/WO1994025987A1/en
Priority to EP94913654A priority patent/EP0647357A1/en
Priority to JP6523941A priority patent/JPH07509104A/en
Publication of FR2704690A1 publication Critical patent/FR2704690A1/en
Application granted granted Critical
Publication of FR2704690B1 publication Critical patent/FR2704690B1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
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    • H01L24/93Batch processes
    • H01L24/95Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
    • H01L24/97Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/482Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body
    • H01L23/4824Pads with extended contours, e.g. grid structure, branch structure, finger structure
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    • H01L24/96Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being encapsulated in a common layer, e.g. neo-wafer or pseudo-wafer, said common layer being separable into individual assemblies after connecting
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    • H01L2224/48472Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond the other connecting portion not on the bonding area also being a wedge bond, i.e. wedge-to-wedge
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Abstract

According to the method of the invention, conductive leads are directly wired onto a semiconductor wafer carrying a large number of chips, the wafer is bonded to a resilient film and cut to separate each chip, after which the film is stretched to space the chips; the totality of the chips and leads are then held in an insulating material such as a polymerizable resin, and, after polishing, metal plating is applied over the leads to connect them to the sides of the chips; the assembly is then cut in order to separate the chips.
FR9304962A 1993-04-27 1993-04-27 Method for encapsulating semiconductor wafers, device obtained by this process and application to the interconnection of wafers in three dimensions. Expired - Fee Related FR2704690B1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FR9304962A FR2704690B1 (en) 1993-04-27 1993-04-27 Method for encapsulating semiconductor wafers, device obtained by this process and application to the interconnection of wafers in three dimensions.
PCT/FR1994/000427 WO1994025987A1 (en) 1993-04-27 1994-04-15 Semiconductor chip encapsulation method, device produced by this method and its application to three dimensional chip interconnection
EP94913654A EP0647357A1 (en) 1993-04-27 1994-04-15 Semiconductor chip encapsulation method, device produced by this method and its application to three dimensional chip interconnection
JP6523941A JPH07509104A (en) 1993-04-27 1994-04-15 Method for encapsulating semiconductor chips, device obtained by this method, and application to three-dimensional chip interconnection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9304962A FR2704690B1 (en) 1993-04-27 1993-04-27 Method for encapsulating semiconductor wafers, device obtained by this process and application to the interconnection of wafers in three dimensions.

Publications (2)

Publication Number Publication Date
FR2704690A1 FR2704690A1 (en) 1994-11-04
FR2704690B1 true FR2704690B1 (en) 1995-06-23

Family

ID=9446488

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9304962A Expired - Fee Related FR2704690B1 (en) 1993-04-27 1993-04-27 Method for encapsulating semiconductor wafers, device obtained by this process and application to the interconnection of wafers in three dimensions.

Country Status (4)

Country Link
EP (1) EP0647357A1 (en)
JP (1) JPH07509104A (en)
FR (1) FR2704690B1 (en)
WO (1) WO1994025987A1 (en)

Cited By (17)

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Publication number Priority date Publication date Assignee Title
US7829438B2 (en) 2006-10-10 2010-11-09 Tessera, Inc. Edge connect wafer level stacking
US7901989B2 (en) 2006-10-10 2011-03-08 Tessera, Inc. Reconstituted wafer level stacking
US7943952B2 (en) 2006-07-31 2011-05-17 Cree, Inc. Method of uniform phosphor chip coating and LED package fabricated using method
US8043895B2 (en) 2007-08-09 2011-10-25 Tessera, Inc. Method of fabricating stacked assembly including plurality of stacked microelectronic elements
US8167674B2 (en) 2007-12-14 2012-05-01 Cree, Inc. Phosphor distribution in LED lamps using centrifugal force
US8232564B2 (en) 2007-01-22 2012-07-31 Cree, Inc. Wafer level phosphor coating technique for warm light emitting diodes
US8337071B2 (en) 2005-12-21 2012-12-25 Cree, Inc. Lighting device
US8513789B2 (en) 2006-10-10 2013-08-20 Tessera, Inc. Edge connect wafer level stacking with leads extending along edges
US8637883B2 (en) 2008-03-19 2014-01-28 Cree, Inc. Low index spacer layer in LED devices
US8680662B2 (en) 2008-06-16 2014-03-25 Tessera, Inc. Wafer level edge stacking
US8878219B2 (en) 2008-01-11 2014-11-04 Cree, Inc. Flip-chip phosphor coating method and devices fabricated utilizing method
US8969908B2 (en) 2006-04-04 2015-03-03 Cree, Inc. Uniform emission LED package
US9024349B2 (en) 2007-01-22 2015-05-05 Cree, Inc. Wafer level phosphor coating method and devices fabricated utilizing method
US9041285B2 (en) 2007-12-14 2015-05-26 Cree, Inc. Phosphor distribution in LED lamps using centrifugal force
US9093616B2 (en) 2003-09-18 2015-07-28 Cree, Inc. Molded chip fabrication method and apparatus
US9159888B2 (en) 2007-01-22 2015-10-13 Cree, Inc. Wafer level phosphor coating method and devices fabricated utilizing method
US9166126B2 (en) 2011-01-31 2015-10-20 Cree, Inc. Conformally coated light emitting devices and methods for providing the same

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000124354A (en) * 1998-10-21 2000-04-28 Matsushita Electric Ind Co Ltd Chip-size package and its manufacture
JP3235586B2 (en) * 1999-02-25 2001-12-04 日本電気株式会社 Semiconductor device and method of manufacturing semiconductor device
JP3065309B1 (en) * 1999-03-11 2000-07-17 沖電気工業株式会社 Method for manufacturing semiconductor device
AU6001599A (en) * 1999-10-01 2001-05-10 Hitachi Limited Semiconductor device and method of manufacture thereof
DE10023539B4 (en) * 2000-05-13 2009-04-09 Micronas Gmbh Method for producing a component
DE60115437T2 (en) * 2000-06-20 2006-07-27 Nanonexus, Inc., Fremont TEST SYSTEM OF INTEGRATED CIRCUITS
US20020100600A1 (en) * 2001-01-26 2002-08-01 Albert Douglas M. Stackable microcircuit layer formed from a plastic encapsulated microcircuit and method of making the same
DE10137184B4 (en) * 2001-07-31 2007-09-06 Infineon Technologies Ag Method for producing an electronic component with a plastic housing and electronic component
DE10149689A1 (en) 2001-10-09 2003-04-10 Philips Corp Intellectual Pty Electrical/electronic component has lateral, rear cover materials at least partly of electrically conductive material and/or of electrically conductive material in layers but in connected manner
JP4688679B2 (en) * 2003-09-09 2011-05-25 三洋電機株式会社 Semiconductor module
ATE522953T1 (en) * 2003-09-30 2011-09-15 Ibm FLEXIBLE ASSEMBLY OF STACKED CHIPS
US20050104027A1 (en) * 2003-10-17 2005-05-19 Lazarev Pavel I. Three-dimensional integrated circuit with integrated heat sinks
US7215018B2 (en) 2004-04-13 2007-05-08 Vertical Circuits, Inc. Stacked die BGA or LGA component assembly
US7217583B2 (en) 2004-09-21 2007-05-15 Cree, Inc. Methods of coating semiconductor light emitting elements by evaporating solvent from a suspension
US7759166B2 (en) 2006-10-17 2010-07-20 Tessera, Inc. Microelectronic packages fabricated at the wafer level and methods therefor
US10295147B2 (en) 2006-11-09 2019-05-21 Cree, Inc. LED array and method for fabricating same
US7952195B2 (en) 2006-12-28 2011-05-31 Tessera, Inc. Stacked packages with bridging traces
US8723332B2 (en) 2007-06-11 2014-05-13 Invensas Corporation Electrically interconnected stacked die assemblies
US10505083B2 (en) 2007-07-11 2019-12-10 Cree, Inc. Coating method utilizing phosphor containment structure and devices fabricated using same
US8461672B2 (en) 2007-07-27 2013-06-11 Tessera, Inc. Reconstituted wafer stack packaging with after-applied pad extensions
CN101861646B (en) * 2007-08-03 2015-03-18 泰塞拉公司 Stack packages using reconstituted wafers
WO2009035849A2 (en) 2007-09-10 2009-03-19 Vertical Circuits, Inc. Semiconductor die mount by conformal die coating
WO2009114670A2 (en) 2008-03-12 2009-09-17 Vertical Circuits, Inc. Support mounted electrically interconnected die assembly
US9153517B2 (en) 2008-05-20 2015-10-06 Invensas Corporation Electrical connector between die pad and z-interconnect for stacked die assemblies
US7863159B2 (en) 2008-06-19 2011-01-04 Vertical Circuits, Inc. Semiconductor die separation method
WO2010026527A2 (en) 2008-09-08 2010-03-11 Koninklijke Philips Electronics N.V. Radiation detector with a stack of converter plates and interconnect layers
FR2940521B1 (en) 2008-12-19 2011-11-11 3D Plus COLLECTIVE MANUFACTURING METHOD OF ELECTRONIC MODULES FOR SURFACE MOUNTING
EP2406821A2 (en) 2009-03-13 2012-01-18 Tessera, Inc. Stacked microelectronic assemblies having vias extending through bond pads
CN102473697B (en) 2009-06-26 2016-08-10 伊文萨思公司 The electrical interconnection of the stacked die of tortuous configuration
WO2011056668A2 (en) 2009-10-27 2011-05-12 Vertical Circuits, Inc. Selective die electrical insulation additive process
TWI544604B (en) 2009-11-04 2016-08-01 英維瑟斯公司 Stacked die assembly having reduced stress electrical interconnects
US10546846B2 (en) 2010-07-23 2020-01-28 Cree, Inc. Light transmission control for masking appearance of solid state light sources
US9825002B2 (en) 2015-07-17 2017-11-21 Invensas Corporation Flipped die stack
US9490195B1 (en) 2015-07-17 2016-11-08 Invensas Corporation Wafer-level flipped die stacks with leadframes or metal foil interconnects
US9871019B2 (en) 2015-07-17 2018-01-16 Invensas Corporation Flipped die stack assemblies with leadframe interconnects
US9508691B1 (en) 2015-12-16 2016-11-29 Invensas Corporation Flipped die stacks with multiple rows of leadframe interconnects
US10566310B2 (en) 2016-04-11 2020-02-18 Invensas Corporation Microelectronic packages having stacked die and wire bond interconnects
US9595511B1 (en) 2016-05-12 2017-03-14 Invensas Corporation Microelectronic packages and assemblies with improved flyby signaling operation
US9728524B1 (en) 2016-06-30 2017-08-08 Invensas Corporation Enhanced density assembly having microelectronic packages mounted at substantial angle to board
CN110382216B (en) * 2016-12-01 2021-10-26 洛桑联邦理工学院 Reversible elasticity of engineered ductile or brittle films and products resulting from such engineering
US10615057B1 (en) 2018-12-11 2020-04-07 Northrop Grumman Systems Corporation Encapsulation process for semiconductor devices

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0257119B1 (en) * 1986-08-22 1991-02-20 Ibm Deutschland Gmbh Integrated wiring system for vlsi
US5098305A (en) * 1987-05-21 1992-03-24 Cray Research, Inc. Memory metal electrical connector
DE3719742A1 (en) * 1987-06-12 1988-12-29 Siemens Ag Arrangement and method for separation of the semiconductor chips contained in a wafer whilst maintaining their order
FR2645681B1 (en) * 1989-04-07 1994-04-08 Thomson Csf DEVICE FOR VERTICALLY INTERCONNECTING PADS OF INTEGRATED CIRCUITS AND ITS MANUFACTURING METHOD
WO1991000619A1 (en) * 1989-06-30 1991-01-10 Raychem Corporation Flying leads for integrated circuits
WO1992017901A1 (en) * 1991-03-27 1992-10-15 Integrated System Assemblies Corporation Multichip integrated circuit module and method of fabrication

Cited By (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9105817B2 (en) 2003-09-18 2015-08-11 Cree, Inc. Molded chip fabrication method and apparatus
US9093616B2 (en) 2003-09-18 2015-07-28 Cree, Inc. Molded chip fabrication method and apparatus
US8337071B2 (en) 2005-12-21 2012-12-25 Cree, Inc. Lighting device
US8969908B2 (en) 2006-04-04 2015-03-03 Cree, Inc. Uniform emission LED package
US7943952B2 (en) 2006-07-31 2011-05-17 Cree, Inc. Method of uniform phosphor chip coating and LED package fabricated using method
US7901989B2 (en) 2006-10-10 2011-03-08 Tessera, Inc. Reconstituted wafer level stacking
US7829438B2 (en) 2006-10-10 2010-11-09 Tessera, Inc. Edge connect wafer level stacking
US8513789B2 (en) 2006-10-10 2013-08-20 Tessera, Inc. Edge connect wafer level stacking with leads extending along edges
US9024349B2 (en) 2007-01-22 2015-05-05 Cree, Inc. Wafer level phosphor coating method and devices fabricated utilizing method
US8232564B2 (en) 2007-01-22 2012-07-31 Cree, Inc. Wafer level phosphor coating technique for warm light emitting diodes
US9159888B2 (en) 2007-01-22 2015-10-13 Cree, Inc. Wafer level phosphor coating method and devices fabricated utilizing method
US8043895B2 (en) 2007-08-09 2011-10-25 Tessera, Inc. Method of fabricating stacked assembly including plurality of stacked microelectronic elements
US8167674B2 (en) 2007-12-14 2012-05-01 Cree, Inc. Phosphor distribution in LED lamps using centrifugal force
US9041285B2 (en) 2007-12-14 2015-05-26 Cree, Inc. Phosphor distribution in LED lamps using centrifugal force
US8878219B2 (en) 2008-01-11 2014-11-04 Cree, Inc. Flip-chip phosphor coating method and devices fabricated utilizing method
US8637883B2 (en) 2008-03-19 2014-01-28 Cree, Inc. Low index spacer layer in LED devices
US8680662B2 (en) 2008-06-16 2014-03-25 Tessera, Inc. Wafer level edge stacking
US9166126B2 (en) 2011-01-31 2015-10-20 Cree, Inc. Conformally coated light emitting devices and methods for providing the same

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