FR2510757B1 - Procede et appareil pour la detection de defauts dans un objet - Google Patents
Procede et appareil pour la detection de defauts dans un objetInfo
- Publication number
- FR2510757B1 FR2510757B1 FR8213173A FR8213173A FR2510757B1 FR 2510757 B1 FR2510757 B1 FR 2510757B1 FR 8213173 A FR8213173 A FR 8213173A FR 8213173 A FR8213173 A FR 8213173A FR 2510757 B1 FR2510757 B1 FR 2510757B1
- Authority
- FR
- France
- Prior art keywords
- detecting defects
- defects
- detecting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
- G01N21/9054—Inspection of sealing surface and container finish
Landscapes
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56118607A JPS5821146A (ja) | 1981-07-30 | 1981-07-30 | 欠陥検査方法および装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2510757A1 FR2510757A1 (fr) | 1983-02-04 |
FR2510757B1 true FR2510757B1 (fr) | 1985-11-22 |
Family
ID=14740740
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR8213173A Expired FR2510757B1 (fr) | 1981-07-30 | 1982-07-28 | Procede et appareil pour la detection de defauts dans un objet |
Country Status (9)
Country | Link |
---|---|
US (1) | US4454542A (fr) |
JP (1) | JPS5821146A (fr) |
AU (1) | AU550122B2 (fr) |
CA (1) | CA1189951A (fr) |
DE (1) | DE3228010C2 (fr) |
DK (1) | DK156924C (fr) |
FR (1) | FR2510757B1 (fr) |
GB (1) | GB2104651B (fr) |
NL (1) | NL8203062A (fr) |
Families Citing this family (54)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2114285B (en) * | 1982-01-29 | 1985-08-29 | Warren Peter Neal Bailey | Optical inspection of machined surfaces |
US4488648A (en) * | 1982-05-06 | 1984-12-18 | Powers Manufacturing, Inc. | Flaw detector |
ATE36194T1 (de) * | 1982-05-27 | 1988-08-15 | I2S | Verfahren und vorrichtung zur automatischen kontrolle von behaeltern durch transparenzvergleich. |
GB2129547B (en) * | 1982-11-02 | 1986-05-21 | Cambridge Instr Ltd | Reticle inspection |
GB2135768A (en) * | 1983-02-22 | 1984-09-05 | Ti Fords Ltd | Bottle inspection method and apparatus |
US4532650A (en) * | 1983-05-12 | 1985-07-30 | Kla Instruments Corporation | Photomask inspection apparatus and method using corner comparator defect detection algorithm |
US4598420A (en) * | 1983-12-08 | 1986-07-01 | Mts Systems Corporation | Optical grid analyzer system for automatically determining strain in deformed sheet metal |
JPS60159637A (ja) * | 1984-01-31 | 1985-08-21 | Kirin Brewery Co Ltd | 欠陥検出方法および装置 |
NL8401416A (nl) * | 1984-05-03 | 1985-12-02 | Thomassen & Drijver | Inrichting voor het opsporen van houders met een afwijkende eigenschap. |
JPS60249204A (ja) * | 1984-05-24 | 1985-12-09 | 肇産業株式会社 | 照明装置 |
US4633504A (en) * | 1984-06-28 | 1986-12-30 | Kla Instruments Corporation | Automatic photomask inspection system having image enhancement means |
JPS6180374A (ja) * | 1984-09-21 | 1986-04-23 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | 可変走査領域による細線化処理の方法及び装置 |
JPH0616013B2 (ja) * | 1984-11-22 | 1994-03-02 | 肇産業株式会社 | 自動検査装置 |
US4655349A (en) * | 1984-12-27 | 1987-04-07 | Brockway, Inc. | System for automatically inspecting transparent containers for sidewall and dimensional defects |
JPS61193009A (ja) * | 1985-02-22 | 1986-08-27 | Toyo Glass Kk | 容器の開口天面欠陥検査方法 |
JPS61207952A (ja) * | 1985-03-12 | 1986-09-16 | Hajime Sangyo Kk | 透明材よりなるビンの欠陥検査方法 |
JPS61223542A (ja) * | 1985-03-28 | 1986-10-04 | Eisai Co Ltd | アンプルの溶閉不良検出方法及び装置 |
US4697088A (en) * | 1985-06-24 | 1987-09-29 | Beltronics, Inc. | Method of and apparatus for discriminating sharp edge transitions produced during optical scanning of differently reflective regions |
JPS6212845A (ja) * | 1985-07-10 | 1987-01-21 | Kirin Brewery Co Ltd | 壜のねじ口部欠陥検出装置 |
JPS6269154A (ja) * | 1985-09-21 | 1987-03-30 | Hajime Sangyo Kk | 壜口欠陥検査装置 |
US4731649A (en) * | 1986-09-11 | 1988-03-15 | Vistech Corp. | Oblique illumination for video rim inspection |
US4759074A (en) * | 1986-10-28 | 1988-07-19 | General Motors Corporation | Method for automatically inspecting parts utilizing machine vision and system utilizing same |
JPS63133045A (ja) * | 1986-11-25 | 1988-06-04 | Matsushita Electric Works Ltd | 検査用照明器具 |
US4786801A (en) * | 1987-07-21 | 1988-11-22 | Emhart Industries Inc. | Finish Leak Detector having vertically movable light source |
US4972494A (en) * | 1988-02-26 | 1990-11-20 | R. J. Reynolds Tobacco Company | Package inspection system |
JPH0641924B2 (ja) * | 1988-05-27 | 1994-06-01 | 株式会社キリンテクノシステム | 壜胴部の欠陥検出装置 |
DE3819183A1 (de) * | 1988-06-06 | 1989-12-07 | Sick Optik Elektronik Erwin | Verfahren zur fehlererkennung bei laufenden materialbahnen |
EP0356680A1 (fr) * | 1988-08-11 | 1990-03-07 | Siemens Aktiengesellschaft | Appareil d'enregistrement optique pour système de traitement d'image |
US5113454A (en) * | 1988-08-19 | 1992-05-12 | Kajaani Electronics Ltd. | Formation testing with digital image analysis |
WO1990002326A1 (fr) * | 1988-08-23 | 1990-03-08 | Bio-Mediq (Australia) Pty. Ltd. | Appareil d'imagerie et de positionnement pour l'analyse optique de fluides |
US4931632A (en) * | 1988-10-07 | 1990-06-05 | Brandt Manufacturing Systems, Inc. | Variable parameter optical bottle checker |
US4914289A (en) * | 1988-10-26 | 1990-04-03 | Inex-Vistech Technologies Incorporated | Article inspection system for analyzing end and adjacent sides |
US4945228A (en) * | 1989-03-23 | 1990-07-31 | Owens-Illinois Glass Container Inc. | Inspection of container finish |
DE3938471A1 (de) * | 1989-11-20 | 1991-05-23 | Freudenberg Carl Fa | Verfahren zur optischen oberflaechenkontrolle |
JPH0739999B2 (ja) * | 1991-01-24 | 1995-05-01 | 肇産業株式会社 | 欠陥検出方法 |
JPH07102978B2 (ja) * | 1991-03-13 | 1995-11-08 | 石塚硝子株式会社 | ガラス壜の検査方法 |
GB2262339B (en) * | 1991-12-13 | 1995-09-06 | Honda Motor Co Ltd | Method of inspecting the surface of a workpiece |
GB9219550D0 (en) * | 1992-09-16 | 1992-10-28 | British Nuclear Fuels Plc | The inspection of cylindrical |
US5354984A (en) * | 1993-09-03 | 1994-10-11 | Emhart Glass Machinery Investments Inc. | Glass container inspection machine having means for defining the center and remapping the acquired image |
US5422476A (en) * | 1993-09-15 | 1995-06-06 | Emhart Glass Machinery Investments Inc. | Glass container inspection machine |
GB9321850D0 (en) * | 1993-10-22 | 1993-12-15 | Roke Manor Research | Improvements relating to optical measuring system |
US5566244A (en) * | 1993-11-22 | 1996-10-15 | Honda Giken Kogyo Kabushiki Kaisha | Method of inspecting a workpiece surface including a picturing system with a shortened focal plane |
CH688663A5 (de) * | 1994-10-20 | 1997-12-31 | Elpatronic Ag | Verfahren und Vorrichtung zur Inspektion von Gegenstaenden, insbesondere von Flaschen. |
EP0987541B1 (fr) * | 1998-09-16 | 2008-07-09 | Mannesmann Präzisrohr GmbH | Dispositif de contrôle optique de qualité de la surface interne d'un tube |
FR2860873B1 (fr) * | 2003-10-13 | 2008-10-17 | Bsn Glasspack | Procede et dispositif optoelectronique d'inspection d'une surface de revolution d'un recipient |
US20080013820A1 (en) | 2006-07-11 | 2008-01-17 | Microview Technology Ptd Ltd | Peripheral inspection system and method |
KR100863700B1 (ko) * | 2008-02-18 | 2008-10-15 | 에스엔유 프리시젼 주식회사 | 비전 검사 시스템 및 이것을 이용한 피검사체의 검사 방법 |
US8621194B2 (en) | 2010-08-31 | 2013-12-31 | Conexant Systems, Inc. | Processor NAND flash boot system and method |
WO2012122498A1 (fr) * | 2011-03-09 | 2012-09-13 | Rolls-Royce Corporation | Système d'éclairage à écran d'éclairage |
US9188545B2 (en) * | 2011-10-28 | 2015-11-17 | Owens-Brockway Glass Container Inc. | Container inspection apparatus and method |
JP5974575B2 (ja) * | 2012-03-26 | 2016-08-23 | 凸版印刷株式会社 | 口栓検査装置および口栓検査方法 |
CN103257144A (zh) * | 2013-05-15 | 2013-08-21 | 华南理工大学 | 一种基于机器视觉的塑料瓶瓶口余料检测方法及装置 |
FR3027391B1 (fr) * | 2014-10-17 | 2024-05-24 | Msc & Sgcc | Procedes, dispositif et ligne d'inspection pour visualiser la planeite d'une surface de bague de recipient |
JP6556848B2 (ja) * | 2015-08-18 | 2019-08-07 | 荏原実業株式会社 | 蛍光可視化装置、蛍光可視化方法ならびにコンピュータプログラム |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51108881A (ja) * | 1975-03-20 | 1976-09-27 | Yamamura Glass Co Ltd | Garasubinnochobukensahohoto sonosochi |
JPS5317779A (en) * | 1976-08-02 | 1978-02-18 | Mitsubishi Heavy Ind Ltd | Bottle mouth chipping detector |
DE2706726A1 (de) * | 1977-02-17 | 1978-08-24 | Kronseder Hermann | Vorrichtung zum ueberpruefen von getraenkeflaschen auf sauberkeit |
GB1585919A (en) * | 1977-08-11 | 1981-03-11 | Ti Fords Ltd | Bottle inspection apparatus |
FR2401415A1 (fr) * | 1977-08-24 | 1979-03-23 | Emballage Ste Gle Pour | Inspection et controle d'objets transparents |
JPS54140791U (fr) * | 1978-03-24 | 1979-09-29 | ||
JPS5520123A (en) * | 1978-07-17 | 1980-02-13 | Nippon Pirooburotsuku Seizou K | Crack detector for bottle head |
JPS5546172A (en) * | 1978-09-29 | 1980-03-31 | Kirin Brewery Co Ltd | Detector for foreign material |
US4213702A (en) * | 1978-10-02 | 1980-07-22 | Powers Manufacturing, Inc | Glass inspection method and apparatus |
JPS5650682A (en) * | 1979-09-11 | 1981-05-07 | Nippon Keisoku Kogyo Kk | Image-split type television video test device |
IT1129509B (it) * | 1980-01-14 | 1986-06-04 | Tasco Spa | Procedimento ed apparecchiatura per il ritrovamento in tempo reale di difetti in oggetti industriali |
DE3014191A1 (de) * | 1980-04-14 | 1981-10-15 | Siemens AG, 1000 Berlin und 8000 München | Schaltungsanordnung zum feststellen von flecken auf einem von einer elektrooptischen abtasteinrichtung in ein videosignal umgesetzten objektbild |
US4448526A (en) * | 1980-06-27 | 1984-05-15 | Kirin Beer Kabushiki Kaisha | Defect detecting method and device |
DE3031120A1 (de) * | 1980-08-18 | 1982-04-01 | Siemens AG, 1000 Berlin und 8000 München | Anordnung zum feststellen von unregelmaessigkeiten des randes von prueflingen |
US4492476A (en) * | 1981-02-20 | 1985-01-08 | Kirin Beer Kabushiki Kaisha | Defect detecting method and apparatus |
US4385233A (en) * | 1981-03-18 | 1983-05-24 | Owens-Illinois, Inc. | Fused glass detector |
US4414566A (en) * | 1981-04-03 | 1983-11-08 | Industrial Automation Corporation | Sorting and inspection apparatus and method |
-
1981
- 1981-07-30 JP JP56118607A patent/JPS5821146A/ja active Pending
-
1982
- 1982-07-23 US US06/401,180 patent/US4454542A/en not_active Expired - Lifetime
- 1982-07-23 AU AU86353/82A patent/AU550122B2/en not_active Ceased
- 1982-07-27 DK DK334382A patent/DK156924C/da not_active IP Right Cessation
- 1982-07-27 DE DE3228010A patent/DE3228010C2/de not_active Expired
- 1982-07-28 GB GB08221844A patent/GB2104651B/en not_active Expired
- 1982-07-28 FR FR8213173A patent/FR2510757B1/fr not_active Expired
- 1982-07-29 CA CA000408380A patent/CA1189951A/fr not_active Expired
- 1982-07-30 NL NL8203062A patent/NL8203062A/nl not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
AU550122B2 (en) | 1986-03-06 |
DK156924B (da) | 1989-10-16 |
DK334382A (da) | 1983-01-31 |
AU8635382A (en) | 1983-02-03 |
CA1189951A (fr) | 1985-07-02 |
GB2104651B (en) | 1985-04-11 |
JPS5821146A (ja) | 1983-02-07 |
US4454542A (en) | 1984-06-12 |
GB2104651A (en) | 1983-03-09 |
DE3228010A1 (de) | 1983-02-17 |
FR2510757A1 (fr) | 1983-02-04 |
NL8203062A (nl) | 1983-02-16 |
DK156924C (da) | 1990-03-12 |
DE3228010C2 (de) | 1986-05-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
TP | Transmission of property |