FR2379802A1 - Jauge de mesure d'epaisseur et procede - Google Patents
Jauge de mesure d'epaisseur et procedeInfo
- Publication number
- FR2379802A1 FR2379802A1 FR7802847A FR7802847A FR2379802A1 FR 2379802 A1 FR2379802 A1 FR 2379802A1 FR 7802847 A FR7802847 A FR 7802847A FR 7802847 A FR7802847 A FR 7802847A FR 2379802 A1 FR2379802 A1 FR 2379802A1
- Authority
- FR
- France
- Prior art keywords
- measurement
- measured
- gauge
- thickness
- measured value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
- G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
La présente invention concerne un procédé et une jauge de mesure des épaisseurs. L'invention se caractérise essentiellememt par le fait que le calibrage de la jauge est effectué avant toute mesure et qu'il consiste à élaborer une première fonction définissant la relation entre l'épaisseur des étalons en métal pur et des valeurs de mesure déterminées avec ceux-ci, une seconde fonction qui représente la relative atténuation obtenue entre des échantillons du matériel à mesurer d'épaisseur connue et celle des étalons, et qu'après mémorisation d'une épaisseur nominale pré-déterminée pour le matériel à mesurer, la valeur mesurée espérée qui devrait être obtenue avec insertion du matériel dans le champ d'inspection, est calculée à partir de l'épaisseur nominale predéterminée en relation avec les première et deuxième fonctions. La source et/ou le détecteur sont alors ajustés en fonction de la valeur mesurée espérée calculée. L'invention trouve une application particulièrement avantageuse dans la mesure des épaisseurs de matériau d'alliage.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US05/765,180 US4119846A (en) | 1977-02-03 | 1977-02-03 | Non-contacting gage apparatus and method |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2379802A1 true FR2379802A1 (fr) | 1978-09-01 |
FR2379802B1 FR2379802B1 (fr) | 1981-06-26 |
Family
ID=25072865
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7802847A Granted FR2379802A1 (fr) | 1977-02-03 | 1978-02-02 | Jauge de mesure d'epaisseur et procede |
Country Status (6)
Country | Link |
---|---|
US (1) | US4119846A (fr) |
JP (1) | JPS53124468A (fr) |
CA (1) | CA1093709A (fr) |
DE (1) | DE2804454A1 (fr) |
FR (1) | FR2379802A1 (fr) |
GB (1) | GB1597010A (fr) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SE401733B (sv) * | 1976-12-06 | 1978-05-22 | Atomenergi Ab | Forfarande och apparat vid metning av plattjocklek |
DE2840819A1 (de) * | 1978-09-20 | 1980-04-03 | Philips Patentverwaltung | Verfahren zum ermitteln des innenmasses von langgestreckten hohlkoerpern, insbesondere von rohren |
JPS5740604A (en) * | 1980-08-25 | 1982-03-06 | Toshiba Corp | Thickness measuring apparatus with radiation |
JPS57197408A (en) * | 1981-05-29 | 1982-12-03 | Toshiba Corp | Measuring method of plate thickness |
US4574387A (en) * | 1981-09-18 | 1986-03-04 | Data Measurement Corporation | Apparatus and method for measuring thickness |
US4510577A (en) * | 1982-02-18 | 1985-04-09 | Tokyo Shibaura Denki Kabushiki Kaisha | Non-contact radiation thickness gauge |
JPS58150809A (ja) * | 1982-02-25 | 1983-09-07 | Toshiba Corp | 非接触放射線厚み計及びその校正方法 |
US4777610A (en) * | 1986-01-23 | 1988-10-11 | Amp Incorporated | Thickness monitor |
JPH01178990A (ja) * | 1987-12-29 | 1989-07-17 | Toshiba Corp | オートトナーセンサ |
JP2750935B2 (ja) * | 1990-03-20 | 1998-05-18 | 富士通株式会社 | 分子線制御方法及び分子線結晶成長装置 |
US5379237A (en) * | 1990-05-31 | 1995-01-03 | Integrated Diagnostic Measurement Corporation | Automated system for controlling the quality of regularly-shaped products during their manufacture |
GB9105639D0 (en) * | 1991-03-18 | 1991-05-01 | Data Measurement Corp | Dynamic alloy correction gauge |
DE4226179A1 (de) * | 1992-08-07 | 1994-02-10 | Amtec Analysenmestechnik Gmbh | Verfahren zur Korrektur lang- und kurzzeitiger Veränderungen der Betriebsparameter bei der Schichtanalyse mittels RFA |
JP3517388B2 (ja) * | 2000-06-14 | 2004-04-12 | 新光電気工業株式会社 | バンプの検査方法及びバンプの検査装置 |
CN105032953B (zh) * | 2015-08-19 | 2017-04-26 | 山西太钢不锈钢股份有限公司 | γ射线测厚仪样板快速标定方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3524063A (en) * | 1967-10-12 | 1970-08-11 | Bethlehem Steel Corp | Multirange radiation thickness gauge |
US3611408A (en) * | 1969-04-07 | 1971-10-05 | Industrial Nucleonics Corp | Digital setup apparatus for radiation gauging and controlling systems |
US4009376A (en) * | 1972-02-15 | 1977-02-22 | Sangamo Weston, Inc. | Method and apparatus for measuring material thickness |
CA990417A (en) * | 1972-02-15 | 1976-06-01 | Claude Faraguet | Method and apparatus for measuring material thickness |
US3832550A (en) * | 1972-06-22 | 1974-08-27 | Bethlehem Steel Corp | Wide-range radiation gage for determining deviation of a material property with a controlled-gain detector in an interruptable self-balancing measuring loop |
-
1977
- 1977-02-03 US US05/765,180 patent/US4119846A/en not_active Expired - Lifetime
-
1978
- 1978-01-26 GB GB3213/78A patent/GB1597010A/en not_active Expired
- 1978-02-02 FR FR7802847A patent/FR2379802A1/fr active Granted
- 1978-02-02 DE DE19782804454 patent/DE2804454A1/de active Granted
- 1978-02-02 CA CA296,042A patent/CA1093709A/fr not_active Expired
- 1978-02-03 JP JP1135778A patent/JPS53124468A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
US4119846A (en) | 1978-10-10 |
DE2804454A1 (de) | 1978-08-24 |
FR2379802B1 (fr) | 1981-06-26 |
DE2804454C2 (fr) | 1988-01-14 |
JPS53124468A (en) | 1978-10-30 |
JPS635683B2 (fr) | 1988-02-04 |
GB1597010A (en) | 1981-09-03 |
CA1093709A (fr) | 1981-01-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |