FR2214962A1 - - Google Patents

Info

Publication number
FR2214962A1
FR2214962A1 FR7412881A FR7412881A FR2214962A1 FR 2214962 A1 FR2214962 A1 FR 2214962A1 FR 7412881 A FR7412881 A FR 7412881A FR 7412881 A FR7412881 A FR 7412881A FR 2214962 A1 FR2214962 A1 FR 2214962A1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7412881A
Other versions
FR2214962B1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of FR2214962A1 publication Critical patent/FR2214962A1/fr
Application granted granted Critical
Publication of FR2214962B1 publication Critical patent/FR2214962B1/fr
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/06Electron sources; Electron guns
    • H01J37/073Electron guns using field emission, photo emission, or secondary emission electron sources
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/09Diaphragms; Shields associated with electron or ion-optical arrangements; Compensation of disturbing fields
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/06Sources
    • H01J2237/063Electron sources
    • H01J2237/06308Thermionic sources
    • H01J2237/06316Schottky emission

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Cold Cathode And The Manufacture (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR7412881A 1972-08-17 1974-04-04 Expired FR2214962B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US00281375A US3809899A (en) 1972-08-17 1972-08-17 Electron-beam tube including a thermionic-field emission cathode for a scanning electron microscope

Publications (2)

Publication Number Publication Date
FR2214962A1 true FR2214962A1 (fr) 1974-08-19
FR2214962B1 FR2214962B1 (fr) 1978-07-07

Family

ID=23077025

Family Applications (2)

Application Number Title Priority Date Filing Date
FR7330655A Expired FR2199613B1 (fr) 1972-08-17 1973-08-16
FR7412881A Expired FR2214962B1 (fr) 1972-08-17 1974-04-04

Family Applications Before (1)

Application Number Title Priority Date Filing Date
FR7330655A Expired FR2199613B1 (fr) 1972-08-17 1973-08-16

Country Status (7)

Country Link
US (1) US3809899A (fr)
JP (3) JPS557661B2 (fr)
CA (1) CA1031080A (fr)
DE (2) DE2366144C2 (fr)
FR (2) FR2199613B1 (fr)
GB (2) GB1433944A (fr)
NL (2) NL7311344A (fr)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2514266C2 (de) * 1975-03-27 1977-04-28 Siemens Ag Korpuskularstrahloptisches geraet mit zwei in strahlrichtung aufeinanderfolgenden teilraeumen unterschiedlicher druecke
US4175234A (en) * 1977-08-05 1979-11-20 University Of Virginia Apparatus for producing ions of thermally labile or nonvolatile solids
US4139773A (en) * 1977-11-04 1979-02-13 Oregon Graduate Center Method and apparatus for producing bright high resolution ion beams
JPS5648028A (en) * 1979-09-26 1981-05-01 Toshiba Corp Electron gun
DE3039283A1 (de) * 1979-10-19 1981-05-14 Hitachi, Ltd., Tokyo Feldemissionskathode und verfahren zu ihrer herstellung
US4468586A (en) * 1981-05-26 1984-08-28 International Business Machines Corporation Shaped electron emission from single crystal lanthanum hexaboride with intensity distribution
DE3570012D1 (en) * 1985-01-29 1989-06-08 Ibm Field-emission scanning auger electron microscope
DE69132441T2 (de) * 1990-06-20 2001-06-07 Hitachi Ltd Ladungsträgerstrahlgerät
DE69125229T2 (de) * 1990-08-10 1997-08-28 Koninkl Philips Electronics Nv Ladungspartikelstrahlanordnung
JP3148353B2 (ja) * 1991-05-30 2001-03-19 ケーエルエー・インストルメンツ・コーポレーション 電子ビーム検査方法とそのシステム
US5616926A (en) * 1994-08-03 1997-04-01 Hitachi, Ltd. Schottky emission cathode and a method of stabilizing the same
JP2951610B2 (ja) * 1997-01-20 1999-09-20 株式会社日立製作所 欠陥検査方法
JP2951609B2 (ja) * 1997-01-20 1999-09-20 株式会社日立製作所 電子ビーム検査装置
JP2969091B2 (ja) * 1997-01-20 1999-11-02 株式会社日立製作所 電子ビーム検査装置
EP2365511B1 (fr) * 2010-03-10 2013-05-08 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Boucle de rétroaction pour le nettoyage tout d'un coup d'un émetteur

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3678333A (en) * 1970-06-15 1972-07-18 American Optical Corp Field emission electron gun utilizing means for protecting the field emission tip from high voltage discharges

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE438468A (fr) * 1939-05-08
NL112758C (fr) * 1942-10-28
NL102095C (fr) * 1955-07-01
NL289910A (fr) * 1962-03-08
US3174026A (en) * 1962-06-20 1965-03-16 Budd Co Method and means of circumventing cathode maintenance in electron beam devices
US3374386A (en) * 1964-11-02 1968-03-19 Field Emission Corp Field emission cathode having tungsten miller indices 100 plane coated with zirconium, hafnium or magnesium on oxygen binder
JPS5852244B2 (ja) * 1977-05-04 1983-11-21 松下電器産業株式会社 モ−タの回転数調整装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3678333A (en) * 1970-06-15 1972-07-18 American Optical Corp Field emission electron gun utilizing means for protecting the field emission tip from high voltage discharges

Also Published As

Publication number Publication date
JPS54161263A (en) 1979-12-20
NL7908479A (nl) 1980-03-31
GB1433945A (en) 1976-04-28
JPS49132975A (fr) 1974-12-20
NL7311344A (fr) 1974-02-19
FR2199613A1 (fr) 1974-04-12
FR2214962B1 (fr) 1978-07-07
CA1031080A (fr) 1978-05-09
JPS5661960U (fr) 1981-05-26
DE2366144C2 (de) 1982-12-30
JPS557661B2 (fr) 1980-02-27
FR2199613B1 (fr) 1977-02-25
US3809899A (en) 1974-05-07
DE2341377A1 (de) 1974-03-07
GB1433944A (en) 1976-04-28

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Legal Events

Date Code Title Description
ST Notification of lapse