FI935022A0 - Blaogroenlaserdiod - Google Patents

Blaogroenlaserdiod

Info

Publication number
FI935022A0
FI935022A0 FI935022A FI935022A FI935022A0 FI 935022 A0 FI935022 A0 FI 935022A0 FI 935022 A FI935022 A FI 935022A FI 935022 A FI935022 A FI 935022A FI 935022 A0 FI935022 A0 FI 935022A0
Authority
FI
Finland
Prior art keywords
blaogroenlaserdiod
Prior art date
Application number
FI935022A
Other languages
English (en)
Other versions
FI110971B (fi
FI935022A (fi
Inventor
Michael A Haase
Hwa Cheng
James M Depuydt
Jun Qiu
Original Assignee
Minnesota Mining & Mfg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US07/700,606 external-priority patent/US5274269A/en
Priority claimed from US07/700,580 external-priority patent/US5213998A/en
Application filed by Minnesota Mining & Mfg filed Critical Minnesota Mining & Mfg
Publication of FI935022A0 publication Critical patent/FI935022A0/fi
Publication of FI935022A publication Critical patent/FI935022A/fi
Application granted granted Critical
Publication of FI110971B publication Critical patent/FI110971B/fi

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/36—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
    • H01L33/40—Materials therefor
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/005—Processes
    • H01L33/0083—Processes for devices with an active region comprising only II-VI compounds
    • H01L33/0087—Processes for devices with an active region comprising only II-VI compounds with a substrate not being a II-VI compound
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/26—Materials of the light emitting region
    • H01L33/28—Materials of the light emitting region containing only elements of Group II and Group VI of the Periodic Table
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/26—Materials of the light emitting region
    • H01L33/28—Materials of the light emitting region containing only elements of Group II and Group VI of the Periodic Table
    • H01L33/285—Materials of the light emitting region containing only elements of Group II and Group VI of the Periodic Table characterised by the doping materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/36—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
    • H01L33/38—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes with a particular shape
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
    • H01S5/042—Electrical excitation ; Circuits therefor
    • H01S5/0421—Electrical excitation ; Circuits therefor characterised by the semiconducting contacting layers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/30—Structure or shape of the active region; Materials used for the active region
    • H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
    • H01S5/327—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIBVI compounds, e.g. ZnCdSe-laser
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/30—Structure or shape of the active region; Materials used for the active region
    • H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
    • H01S5/347—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIBVI compounds, e.g. ZnCdSe- laser
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/14—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a carrier transport control structure, e.g. highly-doped semiconductor layer or current-blocking structure
    • H01L33/145—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a carrier transport control structure, e.g. highly-doped semiconductor layer or current-blocking structure with a current-blocking structure
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
    • H01S5/2205—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
    • H01S5/2213—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers based on polyimide or resin
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
    • H01S5/223—Buried stripe structure
    • H01S5/2231—Buried stripe structure with inner confining structure only between the active layer and the upper electrode
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/30—Structure or shape of the active region; Materials used for the active region
    • H01S5/305—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure
    • H01S5/3054—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure p-doping
    • H01S5/3059—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure p-doping in II-VI materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/30—Structure or shape of the active region; Materials used for the active region
    • H01S5/305—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure
    • H01S5/3068—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure deep levels
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/30—Structure or shape of the active region; Materials used for the active region
    • H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
    • H01S5/3403—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers having a strained layer structure in which the strain performs a special function, e.g. general strain effects, strain versus polarisation

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Optics & Photonics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biophysics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Semiconductor Lasers (AREA)
  • Led Devices (AREA)
  • Luminescent Compositions (AREA)
FI935022A 1991-05-15 1993-11-12 Siniviherlaserdiodi FI110971B (fi)

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
US70060191A 1991-05-15 1991-05-15
US07/700,606 US5274269A (en) 1991-05-15 1991-05-15 Ohmic contact for p-type group II-IV compound semiconductors
US70060191 1991-05-15
US70060691 1991-05-15
US70058091 1991-05-15
US07/700,580 US5213998A (en) 1991-05-15 1991-05-15 Method for making an ohmic contact for p-type group II-VI compound semiconductors
US9203782 1992-05-12
PCT/US1992/003782 WO1992021170A2 (en) 1991-05-15 1992-05-12 Blue-green laser diode

Publications (3)

Publication Number Publication Date
FI935022A0 true FI935022A0 (fi) 1993-11-12
FI935022A FI935022A (fi) 1993-11-12
FI110971B FI110971B (fi) 2003-04-30

Family

ID=27418708

Family Applications (1)

Application Number Title Priority Date Filing Date
FI935022A FI110971B (fi) 1991-05-15 1993-11-12 Siniviherlaserdiodi

Country Status (16)

Country Link
EP (2) EP0670593A3 (fi)
JP (1) JP3269558B2 (fi)
KR (1) KR100247682B1 (fi)
CN (2) CN1097317C (fi)
AU (1) AU654726B2 (fi)
BR (1) BR9205993A (fi)
CA (1) CA2109310C (fi)
DE (1) DE69220942T2 (fi)
ES (1) ES2104931T3 (fi)
FI (1) FI110971B (fi)
HK (1) HK1001353A1 (fi)
IL (1) IL101857A (fi)
MY (2) MY111574A (fi)
RU (1) RU2127478C1 (fi)
SG (1) SG46466A1 (fi)
WO (1) WO1992021170A2 (fi)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5396103A (en) * 1991-05-15 1995-03-07 Minnesota Mining And Manufacturing Company Graded composition ohmic contact for P-type II-VI semiconductors
US5341001A (en) * 1992-02-13 1994-08-23 Matsushita Electric Industrial Co., Ltd. Sulfide-selenide manganese-zinc mixed crystal photo semiconductor and laser diode
JP3453787B2 (ja) * 1993-06-18 2003-10-06 ソニー株式会社 半導体レーザ及びその製造方法
US5422902A (en) * 1993-07-02 1995-06-06 Philips Electronics North America Corporation BeTe-ZnSe graded band gap ohmic contact to p-type ZnSe semiconductors
US5640409A (en) * 1993-07-02 1997-06-17 Sony Corporation Semiconductor laser
MY111898A (en) * 1993-07-02 2001-02-28 Sony Corp Semiconductor laser
JPH07231142A (ja) * 1994-02-18 1995-08-29 Mitsubishi Electric Corp 半導体発光素子
JPH07263372A (ja) * 1994-03-24 1995-10-13 Sharp Corp Ｉｉ−ｖｉ族化合物半導体装置およびその製造方法
US5442204A (en) * 1994-05-12 1995-08-15 Philips Electronics North America Corporation III-V Semiconductor heterostructure contacting a P-type II-VI compound
US6876003B1 (en) 1999-04-15 2005-04-05 Sumitomo Electric Industries, Ltd. Semiconductor light-emitting device, method of manufacturing transparent conductor film and method of manufacturing compound semiconductor light-emitting device
DE10260183A1 (de) * 2002-12-20 2004-07-15 Osram Opto Semiconductors Gmbh Vertikal emittierender, optisch gepumpter Halbleiterlaser mit externem Resonator
JP4085953B2 (ja) * 2003-10-22 2008-05-14 住友電気工業株式会社 半導体光素子
JP4411540B2 (ja) * 2005-09-15 2010-02-10 ソニー株式会社 半導体レーザ装置
CN103003961B (zh) * 2010-04-30 2015-11-25 波士顿大学理事会 具有能带结构电位波动的高效紫外发光二极管
CN102185058B (zh) * 2011-04-02 2013-09-25 映瑞光电科技(上海)有限公司 一种氮化物led结构及其制备方法
CN102185060B (zh) * 2011-04-15 2014-07-16 映瑞光电科技(上海)有限公司 一种氮化物led结构及其制备方法
WO2014188149A1 (en) 2013-05-20 2014-11-27 Milan Momcilo Popovich Holographic waveguide eye tracker
EP3245444B1 (en) 2015-01-12 2021-09-08 DigiLens Inc. Environmentally isolated waveguide display
EP3245551B1 (en) 2015-01-12 2019-09-18 DigiLens Inc. Waveguide light field displays
US10690916B2 (en) 2015-10-05 2020-06-23 Digilens Inc. Apparatus for providing waveguide displays with two-dimensional pupil expansion
DE102019205376B4 (de) * 2019-04-15 2024-10-10 Forschungszentrum Jülich Herstellen eines ohmschen Kontakts sowie elektronisches Bauelement mit ohmschem Kontakt
JP7207365B2 (ja) * 2019-06-19 2023-01-18 株式会社デンソー 半導体レーザ光源モジュール、半導体レーザ装置
WO2021041949A1 (en) 2019-08-29 2021-03-04 Digilens Inc. Evacuating bragg gratings and methods of manufacturing
DE102021004609A1 (de) 2021-09-11 2023-03-16 Eques Consulting GmbH Vorrichtung und damit durchführbares Verfahren zur non-invasiven Konzentrationsbestimmung von Komponenten im menschlichen Blutkreislauf und Verwendung des Verfahrens.
CN115247979B (zh) * 2022-06-08 2024-10-25 天津电力机车有限公司 一种应用于复合式散热器高级修的预防性维修方法
CN115498077B (zh) * 2022-09-22 2024-09-06 深圳市思坦科技有限公司 红光微型led芯片制备方法、红光微型led芯片以及显示装置

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Publication number Priority date Publication date Assignee Title
JPS5863183A (ja) * 1981-10-09 1983-04-14 Semiconductor Res Found ２−６族間化合物の結晶成長法
JPS60178684A (ja) * 1984-02-24 1985-09-12 Nec Corp 半導体レ−ザ
JPH0728052B2 (ja) * 1986-01-27 1995-03-29 株式会社東芝 半導体発光素子およびその製造方法
JPS63185077A (ja) * 1987-01-27 1988-07-30 Matsushita Electric Ind Co Ltd 青色発光ダイオ−ド
DE3810245A1 (de) * 1987-03-27 1988-10-06 Japan Incubator Inc Lichtemittierendes element und verfahren zu seiner herstellung
JPS63288072A (ja) * 1987-05-20 1988-11-25 Seiko Epson Corp 半導体発光装置
JPH01140663A (ja) * 1987-11-27 1989-06-01 Toshiba Corp 半導体装置の電極
JPH01184977A (ja) * 1988-01-20 1989-07-24 Inkiyuubeetaa Japan:Kk 可視発光半導体レーザ装置
US4992837A (en) * 1988-11-15 1991-02-12 Kokusai Denshin Denwa Co., Ltd. Light emitting semiconductor device
US5081632A (en) * 1989-01-26 1992-01-14 Hitachi, Ltd. Semiconductor emitting device
US5028561A (en) * 1989-06-15 1991-07-02 Hughes Aircraft Company Method of growing p-type group II-VI material
US5248631A (en) * 1990-08-24 1993-09-28 Minnesota Mining And Manufacturing Company Doping of iib-via semiconductors during molecular beam epitaxy using neutral free radicals

Also Published As

Publication number Publication date
EP0584236A1 (en) 1994-03-02
CA2109310C (en) 2001-10-02
FI110971B (fi) 2003-04-30
AU2026492A (en) 1992-12-30
CN1097317C (zh) 2002-12-25
WO1992021170A2 (en) 1992-11-26
MY110622A (en) 1998-09-30
ES2104931T3 (es) 1997-10-16
CA2109310A1 (en) 1992-11-16
EP0670593A3 (en) 1996-02-07
BR9205993A (pt) 1994-08-02
HK1001353A1 (en) 1998-06-12
IL101857A (en) 1998-12-06
AU654726B2 (en) 1994-11-17
EP0670593A2 (en) 1995-09-06
EP0584236B1 (en) 1997-07-16
RU2127478C1 (ru) 1999-03-10
IL101857A0 (en) 1992-12-30
MY111574A (en) 2000-08-30
DE69220942T2 (de) 1998-03-05
CN1474485A (zh) 2004-02-11
WO1992021170A3 (en) 1993-03-04
CN1321488C (zh) 2007-06-13
CN1066936A (zh) 1992-12-09
JP3269558B2 (ja) 2002-03-25
DE69220942D1 (de) 1997-08-21
JPH06508003A (ja) 1994-09-08
FI935022A (fi) 1993-11-12
SG46466A1 (en) 1998-02-20
KR100247682B1 (ko) 2000-03-15

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