FI73083C - Portabel anordning foer elementaranalys. - Google Patents

Portabel anordning foer elementaranalys. Download PDF

Info

Publication number
FI73083C
FI73083C FI800332A FI800332A FI73083C FI 73083 C FI73083 C FI 73083C FI 800332 A FI800332 A FI 800332A FI 800332 A FI800332 A FI 800332A FI 73083 C FI73083 C FI 73083C
Authority
FI
Finland
Prior art keywords
spectrum
analyzer
radiation
display
detector
Prior art date
Application number
FI800332A
Other languages
English (en)
Finnish (fi)
Swedish (sv)
Other versions
FI800332A7 (fi
FI73083B (fi
Inventor
Iii Benton Clyde Clark
Original Assignee
Martin Marietta Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Martin Marietta Corp filed Critical Martin Marietta Corp
Publication of FI800332A7 publication Critical patent/FI800332A7/fi
Publication of FI73083B publication Critical patent/FI73083B/fi
Application granted granted Critical
Publication of FI73083C publication Critical patent/FI73083C/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Gyroscopes (AREA)
  • Amplifiers (AREA)
  • Bidet-Like Cleaning Device And Other Flush Toilet Accessories (AREA)
  • Control Of El Displays (AREA)
  • Glass Compositions (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Measuring Pulse, Heart Rate, Blood Pressure Or Blood Flow (AREA)
  • Cosmetics (AREA)
  • Spinning Or Twisting Of Yarns (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
FI800332A 1979-02-09 1980-02-04 Portabel anordning foer elementaranalys. FI73083C (fi)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US1071679A 1979-02-09 1979-02-09
US1071679 1979-02-09

Publications (3)

Publication Number Publication Date
FI800332A7 FI800332A7 (fi) 1980-08-10
FI73083B FI73083B (fi) 1987-04-30
FI73083C true FI73083C (fi) 1987-08-10

Family

ID=21747051

Family Applications (1)

Application Number Title Priority Date Filing Date
FI800332A FI73083C (fi) 1979-02-09 1980-02-04 Portabel anordning foer elementaranalys.

Country Status (13)

Country Link
EP (1) EP0014580B1 (en:Method)
JP (1) JPS56500227A (en:Method)
AT (1) ATE2698T1 (en:Method)
AU (1) AU528079B2 (en:Method)
CA (1) CA1134067A (en:Method)
DE (1) DE3062151D1 (en:Method)
FI (1) FI73083C (en:Method)
IL (1) IL59321A (en:Method)
MX (1) MX151134A (en:Method)
NO (1) NO151764C (en:Method)
SU (1) SU1570658A3 (en:Method)
WO (1) WO1980001718A1 (en:Method)
ZA (1) ZA80633B (en:Method)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58184655U (ja) * 1982-06-03 1983-12-08 セイコーインスツルメンツ株式会社 Ｘ線自動較正装置
JPS5967449A (ja) * 1982-09-24 1984-04-17 Seiko Instr & Electronics Ltd Ｘ線自動較正装置
DE3419260C2 (de) * 1984-05-23 1987-01-15 Institut po Techničeska Kibernetika i Robotika, Sofia/Sofija Planetare Drahtzuführeinrichtung
GB8621983D0 (en) * 1986-09-12 1986-10-22 K X Technology Ltd Ore analysis
US5014287A (en) * 1990-04-18 1991-05-07 Thornton Michael G Portable x-ray fluorescence spectrometer for environmental monitoring of inorganic pollutants
US7042978B2 (en) 2001-06-29 2006-05-09 Panalytical B.V. Examination of material samples
ES2359472T3 (es) * 2008-02-04 2011-05-23 Orexplore Ab Método y aparato para el análisis por fluorescencia de rayos x de una muestra mineral.
CZ303228B6 (cs) * 2011-03-23 2012-06-06 Tescan A.S. Zpusob analýzy materiálu fokusovaným elektronovým svazkem s využitím charakteristického rentgenového zárení a zpetne odražených elektronu a zarízení k jeho provádení
US9176080B2 (en) 2011-07-19 2015-11-03 Olympus Ndt, Inc. X-ray analysis apparatus with detector window protection feature
DE102014115383A1 (de) * 2014-08-01 2016-02-04 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Handgerät sowie mobile Einrichtung zur Röntgenfluoreszenzanalyse
RU176238U1 (ru) * 2017-10-04 2018-01-12 Общество с ограниченной ответственностью "Флэш электроникс" Ручной досмотровый сканер
JP7325849B2 (ja) * 2021-10-28 2023-08-15 株式会社リガク ピーク同定解析プログラム及び蛍光ｘ線分析装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3511989A (en) * 1967-02-21 1970-05-12 Solomon Lazarevich Yakubovich Device for x-ray radiometric determination of elements in test specimens
DE1960508A1 (de) * 1969-12-02 1971-06-09 Osoboje K Bjuro Ministerstwa G Radioisotopen-Roentgenfluoreszenzanalysator zur Elementaranalyse von Gesteinen und Erzen unter natuerlichen Lagerungsbedingungen
JPS4730852U (en:Method) * 1971-04-28 1972-12-07
US3925660A (en) * 1972-05-08 1975-12-09 Richard D Albert Selectable wavelength X-ray source, spectrometer and assay method
JPS5325501U (en:Method) * 1976-08-11 1978-03-04
US4063089A (en) * 1976-11-24 1977-12-13 The United States Of America As Represented By The United States Energy Research And Development Administration X-ray chemical analyzer for field applications
JPS5451858A (en) * 1977-09-30 1979-04-24 Nitto Electric Ind Co Photoopermeable and reflection type polarizing body

Also Published As

Publication number Publication date
NO803014L (no) 1980-10-09
AU528079B2 (en) 1983-04-14
WO1980001718A1 (en) 1980-08-21
FI800332A7 (fi) 1980-08-10
EP0014580A1 (en) 1980-08-20
NO151764C (no) 1985-05-29
CA1134067A (en) 1982-10-19
ATE2698T1 (de) 1983-03-15
FI73083B (fi) 1987-04-30
DE3062151D1 (en) 1983-04-07
IL59321A (en) 1985-07-31
ZA80633B (en) 1981-02-25
SU1570658A3 (ru) 1990-06-07
JPS56500227A (en:Method) 1981-02-26
NO151764B (no) 1985-02-18
AU5518580A (en) 1980-08-14
EP0014580B1 (en) 1983-03-02
MX151134A (es) 1984-10-04

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MM Patent lapsed

Owner name: MARTIN MARIETTA CORPORATION