IL59321A - Field portable element analysis unit such as a spectrometer - Google Patents
Field portable element analysis unit such as a spectrometerInfo
- Publication number
- IL59321A IL59321A IL59321A IL5932180A IL59321A IL 59321 A IL59321 A IL 59321A IL 59321 A IL59321 A IL 59321A IL 5932180 A IL5932180 A IL 5932180A IL 59321 A IL59321 A IL 59321A
- Authority
- IL
- Israel
- Prior art keywords
- spectrum
- analyzer
- shutter
- sensor head
- cursor
- Prior art date
Links
- 238000001228 spectrum Methods 0.000 abstract 7
- 230000005855 radiation Effects 0.000 abstract 4
- 238000009826 distribution Methods 0.000 abstract 1
- 238000010606 normalization Methods 0.000 abstract 1
- 230000004044 response Effects 0.000 abstract 1
- 230000003595 spectral effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Gyroscopes (AREA)
- Amplifiers (AREA)
- Bidet-Like Cleaning Device And Other Flush Toilet Accessories (AREA)
- Control Of El Displays (AREA)
- Glass Compositions (AREA)
- Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
- Measuring Pulse, Heart Rate, Blood Pressure Or Blood Flow (AREA)
- Cosmetics (AREA)
- Spinning Or Twisting Of Yarns (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US1071679A | 1979-02-09 | 1979-02-09 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IL59321A true IL59321A (en) | 1985-07-31 |
Family
ID=21747051
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IL59321A IL59321A (en) | 1979-02-09 | 1980-02-05 | Field portable element analysis unit such as a spectrometer |
Country Status (13)
| Country | Link |
|---|---|
| EP (1) | EP0014580B1 (en:Method) |
| JP (1) | JPS56500227A (en:Method) |
| AT (1) | ATE2698T1 (en:Method) |
| AU (1) | AU528079B2 (en:Method) |
| CA (1) | CA1134067A (en:Method) |
| DE (1) | DE3062151D1 (en:Method) |
| FI (1) | FI73083C (en:Method) |
| IL (1) | IL59321A (en:Method) |
| MX (1) | MX151134A (en:Method) |
| NO (1) | NO151764C (en:Method) |
| SU (1) | SU1570658A3 (en:Method) |
| WO (1) | WO1980001718A1 (en:Method) |
| ZA (1) | ZA80633B (en:Method) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58184655U (ja) * | 1982-06-03 | 1983-12-08 | セイコーインスツルメンツ株式会社 | Ｘ線自動較正装置 |
| JPS5967449A (ja) * | 1982-09-24 | 1984-04-17 | Seiko Instr & Electronics Ltd | Ｘ線自動較正装置 |
| DE3419260C2 (de) * | 1984-05-23 | 1987-01-15 | Institut po Techničeska Kibernetika i Robotika, Sofia/Sofija | Planetare Drahtzuführeinrichtung |
| GB8621983D0 (en) * | 1986-09-12 | 1986-10-22 | K X Technology Ltd | Ore analysis |
| US5014287A (en) * | 1990-04-18 | 1991-05-07 | Thornton Michael G | Portable x-ray fluorescence spectrometer for environmental monitoring of inorganic pollutants |
| US7042978B2 (en) | 2001-06-29 | 2006-05-09 | Panalytical B.V. | Examination of material samples |
| ES2359472T3 (es) * | 2008-02-04 | 2011-05-23 | Orexplore Ab | Método y aparato para el análisis por fluorescencia de rayos x de una muestra mineral. |
| CZ303228B6 (cs) * | 2011-03-23 | 2012-06-06 | Tescan A.S. | Zpusob analýzy materiálu fokusovaným elektronovým svazkem s využitím charakteristického rentgenového zárení a zpetne odražených elektronu a zarízení k jeho provádení |
| US9176080B2 (en) | 2011-07-19 | 2015-11-03 | Olympus Ndt, Inc. | X-ray analysis apparatus with detector window protection feature |
| DE102014115383A1 (de) * | 2014-08-01 | 2016-02-04 | Helmut Fischer GmbH Institut für Elektronik und Messtechnik | Handgerät sowie mobile Einrichtung zur Röntgenfluoreszenzanalyse |
| RU176238U1 (ru) * | 2017-10-04 | 2018-01-12 | Общество с ограниченной ответственностью "Флэш электроникс" | Ручной досмотровый сканер |
| JP7325849B2 (ja) * | 2021-10-28 | 2023-08-15 | 株式会社リガク | ピーク同定解析プログラム及び蛍光ｘ線分析装置 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3511989A (en) * | 1967-02-21 | 1970-05-12 | Solomon Lazarevich Yakubovich | Device for x-ray radiometric determination of elements in test specimens |
| DE1960508A1 (de) * | 1969-12-02 | 1971-06-09 | Osoboje K Bjuro Ministerstwa G | Radioisotopen-Roentgenfluoreszenzanalysator zur Elementaranalyse von Gesteinen und Erzen unter natuerlichen Lagerungsbedingungen |
| JPS4730852U (en:Method) * | 1971-04-28 | 1972-12-07 | ||
| US3925660A (en) * | 1972-05-08 | 1975-12-09 | Richard D Albert | Selectable wavelength X-ray source, spectrometer and assay method |
| JPS5325501U (en:Method) * | 1976-08-11 | 1978-03-04 | ||
| US4063089A (en) * | 1976-11-24 | 1977-12-13 | The United States Of America As Represented By The United States Energy Research And Development Administration | X-ray chemical analyzer for field applications |
| JPS5451858A (en) * | 1977-09-30 | 1979-04-24 | Nitto Electric Ind Co | Photoopermeable and reflection type polarizing body |
-
1980
- 1980-02-04 ZA ZA00800633A patent/ZA80633B/xx unknown
- 1980-02-04 DE DE8080300322T patent/DE3062151D1/de not_active Expired
- 1980-02-04 EP EP80300322A patent/EP0014580B1/en not_active Expired
- 1980-02-04 AT AT80300322T patent/ATE2698T1/de not_active IP Right Cessation
- 1980-02-04 FI FI800332A patent/FI73083C/fi not_active IP Right Cessation
- 1980-02-04 AU AU55185/80A patent/AU528079B2/en not_active Ceased
- 1980-02-04 MX MX181075A patent/MX151134A/es unknown
- 1980-02-05 JP JP50054680A patent/JPS56500227A/ja active Pending
- 1980-02-05 CA CA345,097A patent/CA1134067A/en not_active Expired
- 1980-02-05 WO PCT/US1980/000103 patent/WO1980001718A1/en unknown
- 1980-02-05 IL IL59321A patent/IL59321A/xx unknown
- 1980-10-08 SU SU802991604A patent/SU1570658A3/ru active
- 1980-10-09 NO NO803014A patent/NO151764C/no unknown
Also Published As
| Publication number | Publication date |
|---|---|
| NO803014L (no) | 1980-10-09 |
| AU528079B2 (en) | 1983-04-14 |
| WO1980001718A1 (en) | 1980-08-21 |
| FI800332A7 (fi) | 1980-08-10 |
| EP0014580A1 (en) | 1980-08-20 |
| NO151764C (no) | 1985-05-29 |
| CA1134067A (en) | 1982-10-19 |
| ATE2698T1 (de) | 1983-03-15 |
| FI73083B (fi) | 1987-04-30 |
| DE3062151D1 (en) | 1983-04-07 |
| ZA80633B (en) | 1981-02-25 |
| SU1570658A3 (ru) | 1990-06-07 |
| JPS56500227A (en:Method) | 1981-02-26 |
| NO151764B (no) | 1985-02-18 |
| AU5518580A (en) | 1980-08-14 |
| FI73083C (fi) | 1987-08-10 |
| EP0014580B1 (en) | 1983-03-02 |
| MX151134A (es) | 1984-10-04 |
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